SIST EN 61338-1:2005

SLOVENSKI SIST EN 61338-1:2005

STANDARD
december 2005
Dielektrični resonatorji valovodnega tipa – 1. del: Generična specifikacija (IEC
61338-1:2004)
Waveguide type dielectric resonators – Part 1: Generic specification (IEC 61338-
1:2004)
ICS 31.140; 33.120.10 Referenčna številka
SIST EN 61338-1:2005(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

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EUROPEAN STANDARD EN 61338-1
NORME EUROPÉENNE
EUROPÄISCHE NORM January 2005

ICS 31.140 Supersedes EN 170000:1999


English version


Waveguide type dielectric resonators
Part 1: Generic specification
(IEC 61338-1:2004)


Résonateurs diélectriques  Dielektrische Resonatoren
à modes guidés vom Wellenleitertyp
Partie 1: Spécification générique Teil 1: Fachgrundspezifikation
(CEI 61338-1:2004) (IEC 61338-1:2004)






This European Standard was approved by CENELEC on 2004-12-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden,
Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2005 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 61338-1:2005 E

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EN 61338-1:2005 - 2 -
Foreword
The text of document 48/690/FDIS, future edition 1 of IEC 61338-1, prepared by IEC TC 49,
Piezoelectric and dielectric devices for frequency control and selection, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as EN 61338-1 on 2004-12-01.
This European Standard supersedes EN 170000:1999.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2005-09-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2007-12-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61338-1:2004 was approved by CENELEC as a European
Standard without any modification.
__________

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- 3 - EN 61338-1:2005

Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE Where an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
IEC 60027 Series Letter symbols to be used in electrical HD 245 Series
technology HD 60027 Series

IEC 60050-561 1991 International Electrotechnical - -
Vocabulary (IEV)
Chapter 561: Piezoelectric devices for
frequency control and selection

1)
IEC 60068-1 1988 Environmental testing EN 60068-1 1994
Part 1: General and guidance

IEC 60068-2-1 1990 Part 2: Tests - Tests A: Cold EN 60068-2-1 1993

2)
IEC 60068-2-2 1974 Part 2: Tests - Tests B: Dry heat EN 60068-2-2 1993

IEC 60068-2-6 1995 Part 2: Tests - Test Fc: Vibration EN 60068-2-6 1995
+ corr. March 1995 (sinusoidal)

3)
IEC 60068-2-7 1983 Part 2: Tests - Test Ga: Acceleration, EN 60068-2-7 1993
steady state

IEC 60068-2-13 1983 Part 2: Tests - Test M: Low air pressure EN 60068-2-13 1999

4)
IEC 60068-2-14 1984 Part 2: Tests - Test N: Change of EN 60068-2-14 1999
temperature

5)
IEC 60068-2-20 1979 Part 2: Tests - Test T: Soldering HD 323.2.20 S3 1988

IEC 60068-2-21 1999 Part 2-21: Tests - Test U: Robustness EN 60068-2-21 1999
of terminations and integral mounting
devices

IEC 60068-2-27 1987 Part 2: Tests - Test Ea and guidance: EN 60068-2-27 1993
Shock


1)
EN 60068-1 includes corrigendum October 1988 + A1:1992 to IEC 60068-1.
2)
EN 60068-2-2 includes supplement A:1976 to IEC 60068-2-2.
3)
EN 60068-2-7 includes A1:1986 to IEC 60068-2-7.
4)
EN 60068-2-14 includes A1:1986 to IEC 60068-2-14.
5)
HD 323.2.20 S3 includes A2:1987 to IEC 60068-2-20.

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EN 61338-1:2005 - 4 -
Publication Year Title EN/HD Year
IEC 60068-2-29 1987 Part 2: Tests - Test Eb and guidance: EN 60068-2-29 1993
+ corr. Bump

6)
IEC 60068-2-30 1980 Part 2: Tests - Test Db and guidance: EN 60068-2-30 1999
Damp heat, cyclic (12 + 12-hour cycle)

IEC 60068-2-58 2004 Part 2-58: Tests - Test Td: Test EN 60068-2-58 2004
methods for solderability, resistance to + corr. December 2004
dissolution of metallization and to
soldering heat of surface mounting
devices (SMD)

7) 8)
IEC 60068-2-78 - Part 2-78: Tests - Test Cab: Damp heat, EN 60068-2-78 2001
steady state

IEC 60617 database Graphical symbols for diagrams - -

IEC 61338-1-3 1999 Waveguide type dielectric resonators EN 61338-1-3 2000
Part 1-3: General information and test
conditions - Measurement method of
complex relative permittivity for
dielectric resonator materials at
microwave frequency

9)
IEC 61338-4 - Part 4: Sectional specification - -

ISO 1000 1992 SI units and recommendations for the - -
use of their multiples and of certain
other units

IEC QC 001001 2000 IEC Quality Assessment System for - -
Electronic Components (IECQ)- Basic
rules

IEC QC 001002-1 1998 IEC quality assessment system for - -
electronic components (IECQ) - Rules
of procedure
Part 1: Administration

IEC QC 001002-2 1998 Part 2: Documentation - -

IEC QC 001002-3 1998 Part 3: Approval procedures - -

IEC QC 001005 2000 Register of firms, products and services - -
approved under the IECQ system,
including ISO 9000



6)
EN 60068-2-30 includes A1:1985 to IEC 60068-2-30.
7)
Undated reference.
8)
Valid edition at date of issue.
9)
At draft stage.

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INTERNATIONAL IEC


STANDARD 61338-1





First edition
2004-11


Waveguide type dielectric resonators –
Part 1:
Generic specification

 IEC 2004  Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
PRICE CODE
Commission Electrotechnique Internationale V
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
For price, see current catalogue

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– 2 – 61338-1  IEC:2004(E)
CONTENTS

FOREWORD.4

1 General.6
1.1 Scope.6
1.2 Normative references.6
1.3 Order of precedence.7
2 Terminology and general requirements .7
2.1 General.7
2.2 Definitions.8
2.3 Preferred values for ratings and characteristics.18
2.4 Marking.19
3 Quality assessment procedures .19
3.1 General.19
3.2 Primary stage of manufacture .19
3.3 Structurally similar components .19
3.4 Sub-contracting.19
3.5 Manufacturer’s approval.20
3.6 Approval procedures.20
3.7 Procedures for capability approval .21
3.8 Procedures for qualification approval .21
3.9 Test procedures.21
3.10 Screening requirements.22
3.11 Rework and repair work .22
3.12 Certified records of released lots .22
3.13 Validity of release .22
3.14 Release for delivery.22
3.15 Unchecked parameters.22
4 Test and measurement procedures .23
4.1 General.23
4.2 Test and measurement conditions.23
4.3 Visual inspection.23
4.4 Dimension and gauging procedure .23
4.5 Electrical test procedures .24
4.6 Mechanical and environmental test procedures. .30

Figure 1 – TE mode dielectric resonator.10
01δ
Figure 2 – TM mode dielectric resonator.10
Figure 3 – TM mode dielectric resonator .11
01δ
Figure 4 – Hybrid mode dielectric resonator.12
Figure 5 – Multimode dielectric resonators.13
Figure 6 – TEM mode coaxial dielectric resonator.14
Figure 7 – Half wavelength stripline resonator .15
Figure 8 – Half wavelength microstripline resonator .16

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61338-1  IEC:2004(E) – 3 –
Figure 9 – Coplanar resonator .17
Figure 10 – Transmission measurement .24
Figure 11 – Resonator test fixture .27
Figure 12 – Frequency response for test fixture A, B and D .28
Figure 13 – Frequency response for test fixture C.28

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– 4 – 61338-1  IEC:2004(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________

WAVEGUIDE TYPE DIELECTRIC RESONATORS –

Part 1: Generic specification


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
This International Standard IEC 61338-1 has been prepared by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
IEC 61338-1 cancels and replaces the first edition of IEC 61338-1-1 published in 1996 and the
first edition of IEC 61338-1-2 published in 1998.
The text of this standard is based on the following documents:
FDIS Report on voting
49/690/FDIS 49/ 699/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

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61338-1  IEC:2004(E) – 5 –
IEC 61338 consists of the following parts, under the general title Waveguide type dielectric
resonators:
Part 1: Generic specification
Part 1-3: General information and test conditions – Measurement method of complex relative
permittivity for dielectric resonator materials at microwave frequency
Part 2: Guidelines for oscillator and filter applications
Part 4: Sectional specification
Part 4-1: Blank detail specification
The committee has decided that the contents of this publication will remain unchanged until the
maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

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– 6 – 61338-1  IEC:2004(E)
WAVEGUIDE TYPE DIELECTRIC RESONATORS –

Part 1: Generic specification



1 General
1.1 Scope
This part of IEC 61338 applies to waveguide type dielectric resonators of assessed quality
using either capability approval or qualification approval procedures. It also lists the test and
measurement procedures which may be selected for use in detail specifications for such
resonators.
1.2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology
IEC 60050(561):1991, International Electrotechnical Vocabulary (IEV) – Chapter 561: Piezo-
electric devices for frequency control and selection
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 60068-2-1:1990, Environmental testing – Part 2: Tests – Tests A: Cold
IEC 60068-2-2:1974, Environmental testing – Part 2: Tests – Tests B: Dry Heat
IEC 60068-2-6:1995, Environmental testing – Part 2: Tests – Tests Fc: Vibration (sinusoidal)
IEC 60068-2-7:1983, Environmental testing – Part 2: Tests – Tests Ga and guidance:
Acceleration, steady state
IEC 60068-2-13:1983, Environmental testing – Part 2: Tests – Tests M: Low air pressure
IEC 60068-2-14:1984, Environmental testing – Part 2: Tests – Tests N: Change of temperature
IEC 60068-2-20:1979, Environmental testing – Part 2: Tests – Tests T: Soldering
IEC 60068-2-21:1999, Environmental testing – Part 2: Tests – Tests U: Robustness of
terminations and integral mounting devices
IEC 60068-2-27:1987, Environmental testing – Part 2: Tests – Tests Ea and guidance: Shock
IEC 60068-2-29:1987, Environmental testing – Part 2: Tests – Tests Eb and guidance: Bump
IEC 60068-2-30:1980, Environmental testing – Part 2: Tests – Tests Db and guidance: Damp
heat, cyclic (12 +12 hour cycle)

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61338-1  IEC:2004(E) – 7 –
IEC 60068-2-58:2004, Environmental testing – Part 2-58: Tests – Test Td: Test methods for
solderability, resistance to dissolution of metallization and to soldering heat of surface
mounting devices (SMD)
IEC 60068-2-78, Environmental testing – Part 2: Tests – Test Cab: Damp heat, steady state
IEC 60617, Graphical symbols for diagrams
IEC 61338-1-3:1999, Waveguide type dielectric resonators – Part 1-3: General information and
test conditions – Measurement method of complex relative permittivity for dielectric resonator
materials at microwave frequency
IEC 61338-4, Waveguide type dielectric resonators of assessed quality – Part 4: Sectional
1
specification
ISO 1000:1992, SI units and recommendation for the use of their multiples and of certain other
units
QC 001001:2000, IEC Quality Assessment System for Electronic Components (IECQ) – Basic
Rules
QC 001002-1:1998, IEC Quality Assessment System for Electronic Components (IECQ) –
Rules of Procedure – Part 1: Administration
QC 001002-2:1998, IEC Quality Assessment System for Electronic Components (IECQ) –
Rules of Procedure – Part 2: Documentation
QC 001002-3:1998, IEC Quality Assessment System for Electronic Components (IECQ) –
Rules of Procedure – Part 3: Approval Procedures
QC 001005:2000, Register of Firms, Products and Services approved under the IECQ System,
including ISO 9000
1.3 Order of precedence
Where any discrepancies occur for any reason, documents shall rank in the following order of
priority:
– detail specification;
– sectional specification;
– generic specification;
– any other international documents (for example, of the IEC) to which reference is made.
The same order of preference shall apply to equivalent national documents.
2 Terminology and general requirements
2.1 General
Units, graphical symbols, letter symbols and terminology shall whenever possible, be taken
from the following documents:
ISO 1000 SI units and recommendations for the use of their multiples and of certain other
units
IEC 60617 Graphical symbols for diagrams
IEC 60027 Letter symbols to be used in electrical technology
IEC 60050 International Electrotechnical Vocabulary
___________
1
To be published.

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– 8 – 61338-1  IEC:2004(E)
Any other units, symbols and terminology peculiar to one of the components covered by this
generic specification, shall be taken from the relevant IEC or ISO documents listed under 1.2,
Normative references.
The following paragraphs contain additional terminology applicable to waveguide type dielectric
resonators.
2.2 Definitions
The following paragraphs contain additional terminology applicable to waveguide type dielectric
resonators.
2.2.1 Dielectric material
Material which predominantly exhibits dielectric properties.
NOTE The dielectric material defined herein is intended to be used for resonator applications at high frequency.
i.e. UHF or SHF range. Therefore, the dielectric material is required to have high dielectric constant, a low loss
factor and a low temperature coefficient of permittivity.
2.2.2 Electric constant (εε )
εε
0
–12 –1 –1
Constant equal to 8,8542 × 10 As V m , defined by the permittivity of vacuum.
2.2.3 Relative permittivity (εεεε )
r
Absolute permittivity of a material or medium divided by the electric constant ε .
0
NOTE The complex relative permittivity ε is defined as
r
ε = ε′ – jε″, ε’= Re (ε), ε″ = – Im (ε)
r
where
ε′ is usually called dielectric constant;
ε″ corresponds to the dielectric loss of the material.
2.2.4 Absolute permittivity (εεεε)
Quantity which when multiplied by the electric field strength E is equal to the electric flux
density D.
D = εE, ε = ε ε
0 r
2.2.5 Loss angle (δδδδ)
Phase displacement between the component of the electric flux density and the electric field
strength.
2.2.6 Loss factor
Tangent of the loss angle δ.
tan δ = ε″/ε′
NOTE The loss factor can be determined by the ratio of the magnitude of the negative part to the real part of the
complex relative permittivity.

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61338-1  IEC:2004(E) – 9 –
2.2.7 Quality factor of a material (Q )
o
Reciprocal of the tangent of the loss angle,
Q = ε′/ε″ = 1/tan δ
o
NOTE The quality factor of a material is also defined as 2π times the ratio of the stored electromagnetic energy to
the energy dissipated in the material per cycle. It is frequency dependent.
2.2.8 Temperature coefficient of permittivity (TCεε)
εε
Fractional change of permittivity due to a change in temperature divided by the change in
temperature.
ε − ε
T ref 6  
−6

TCε = ×10 1×10 /K
 
ε()T − T  
ref ref
where
ε is the permittivity at temperature T;
Τ
ε is the permittivity at reference T .
ref ref
2.2.9 Coefficient of linear thermal expansion (αααα)
Fractional change of dimension due to a change in temperature divided by the change in
temperature.
l −l
T ref 6 −6
α = ×10 ()1×10 /K
l()T − T
ref ref
where
l is the dimension at temperature T;
T
l is the dimension at reference temperature T .
ref ref
2.2.10 Dielectric resonator
Resonator using dielectrics with a high dielectric constant and the structure of which is a
dielectric waveguide of finite length.
NOTE The dielectric resonators in use are always shielded with conductors.
2.2.11 Dielectric support
Element supporting a dielectric resonator. The support is generally used for TE mode
01δ
resonators and has a low dielectric constant (see Figure 1).
2.2.12 TE mode dielectric resonator
Dielectric resonator characterized by a transverse electric mode (TE mode) field distribution
and usually having a high unloaded quality factor Q .
u

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– 10 – 61338-1  IEC:2004(E)
2.2.13 TE mode dielectric resonator
01δδδδ
Dielectric resonator characterized by a dominant TE mode field distribution, whose field leaks
in the direction of wave propagation (see Figure 1).

X
X ε X
r
X
Z
Dielectric
resonator
X
Shielding
X
conductor
Dielectric
support
Electric field
Magnetic field
IEC  1424/04

Figure 1 – TE mode dielectric resonator
01δδδδ
2.2.14 TM mode dielectric resonator
Dielectric resonator characterized by a transverse magnetic mode (TM mode) field distribution
(see Figure 2).

ε ε
r r
Dielectric
Z
resonator Z
Shielding
conductor
X
X X
XX X
XX X
IEC  1425/04

Figure 2 – TM mode dielectric resonator

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61338-1  IEC:2004(E) – 11 –
2.2.15 TM mode dielectric resonator
01δδδδ
Dielectric resonator characterized by a dominant TM mode field distribution, whose field leaks
in the direction of wave propagation (see Figure 3).

X
εεεε X
X
r
X
Z
X
Shielding
conductor
X
IEC  1426/04

Figure 3 – TM mode dielectric resonator
01δδδδ
2.2.16 Hybrid mode dielectric resonator
Dielectric resonator characterized by a hybrid mode field distribution. Hybrid mode is the mode
which has axial components both of the electric and magnetic fields (see Figure 4).

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– 12 – 61338-1  IEC:2004(E)

X
X
X X
X X X
X
X X
X
X
Shielding
conductor
X
X
X
X
X
X
X
X
IEC  1427/04 IEC  1428/04
Figure 4a −−−− EH mode Figure 4b −−−− HE mode
11δδδδ 11δδδδ

Figure 4 – Hybrid mode dielectric resonator

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61338-1  IEC:2004(E) – 13 –
2.2.17 Multimode dielectric resonator
Dielectric resonator characterized by the existence of several orthogonal resonance modes, the
resonance frequencies of which coincide in such a way that any of which cannot be obtained by
the superposition of others (see Figure 5). Any electromagnetic field perturbation affects
independence of certain of these modes and causes energy coupling between them. This
allows realization of reduced volume filters.

Mode 1
X
X
ε
r
Mode 2
Shielding
conductor
Mode 1
Mode 3
Mode 2
ε
r
IEC  1429/04 IEC  1430/04
Figure 5b −−−− Triple mode of EH
11δδ
Figure 5a −−−− TM dual mode δδ
11δδδδ
dual mode and TM mode
11δδδδ

Figure 5 – Multimode dielectric resonators
2.2.18 TEM mode dielectric resonator
Dielectric resonator characterized by a transverse electromagnetic mode (TEM mode) field
distribution causing significant size reduction effect (see Figure 6).
2.2.19 Coaxial dielectric resonator
Dielectric resonator characterized by a TEM mode field distribution with a coaxial waveguide
structure of finite length (see Figure 6).
2.2.20 Quarter wavelength resonator
Resonator characterized by any guided mode field distribution with standing wave of a quarter
wavelength (see Figure 6a in the case of TEM mode).

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– 14 – 61338-1  IEC:2004(E)
2.2.21 Half wavelength resonator
Resonator characterized by any guided mode field dist
...