SIST EN ISO 23243:2021

SLOVENSKI STANDARD
SIST EN ISO 23243:2021
01-marec-2021
Nadomešča:
SIST EN 16018:2012
Neporušitvene preiskave - Terminologija - Izrazi, ki se uporabljajo pri ultrazvočnih
preiskavah z matrično postavitvijo (phased array) (ISO 23243:2020)
Non-destructive testing - Terminology - Terms used in ultrasonic testing with phased
arrays (ISO 23243:2020)
Zerstörungsfreie Prüfung - Terminologie - Begriffe der Ultraschallprüfung mit
phasengesteuerten Arrays (ISO 23243:2020)
Essais non-destructifs - Terminologie - Termes utilisés pour le contrôle par ultrasons en
multiéléments (ISO 23243:2020)
Ta slovenski standard je istoveten z: EN ISO 23243:2020
ICS:
01.040.19 Preskušanje (Slovarji) Testing (Vocabularies)
19.100 Neporušitveno preskušanje Non-destructive testing
SIST EN ISO 23243:2021 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN ISO 23243:2021

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SIST EN ISO 23243:2021


EN ISO 23243
EUROPEAN STANDARD

NORME EUROPÉENNE

December 2020
EUROPÄISCHE NORM
ICS 01.040.19; 19.100 Supersedes EN 16018:2011
English Version

Non-destructive testing - Ultrasonic testing with arrays -
Vocabulary (ISO 23243:2020)
Essais non destructifs - Contrôle à l'aide de réseaux Zerstörungsfreie Prüfung - Ultraschallprüfung mit
ultrasonores - Vocabulaire (ISO 23243:2020) Arrays - Terminologie (ISO 23243:2020)
This European Standard was approved by CEN on 16 November 2020.

CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this
European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references
concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN
member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by
translation under the responsibility of a CEN member into its own language and notified to the CEN-CENELEC Management
Centre has the same status as the official versions.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway,
Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and
United Kingdom.





EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION

EUROPÄISCHES KOMITEE FÜR NORMUNG

CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2020 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO 23243:2020 E
worldwide for CEN national Members.

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SIST EN ISO 23243:2021
EN ISO 23243:2020 (E)
Contents Page
European foreword . 3

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SIST EN ISO 23243:2021
EN ISO 23243:2020 (E)
European foreword
This document (EN ISO 23243:2020) has been prepared by Technical Committee ISO/TC 135 "Non-
destructive testing" in collaboration with Technical Committee CEN/TC 138 “Non-destructive testing”
the secretariat of which is held by AFNOR.
This European Standard shall be given the status of a national standard, either by publication of an
identical text or by endorsement, at the latest by June 2021, and conflicting national standards shall be
withdrawn at the latest by June 2021.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN shall not be held responsible for identifying any or all such patent rights.
This document supersedes EN 16018:2011.
According to the CEN-CENELEC Internal Regulations, the national standards organizations of the
following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland,
Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of
North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the
United Kingdom.
Endorsement notice
The text of ISO 23243:2020 has been approved by CEN as EN ISO 23243:2020 without any modification.

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SIST EN ISO 23243:2021
INTERNATIONAL ISO
STANDARD 23243
First edition
2020-11
Non-destructive testing — Ultrasonic
testing with arrays — Vocabulary
Essais non destructifs — Contrôle à l’aide de réseaux ultrasonores —
Vocabulaire
Reference number
ISO 23243:2020(E)
©
ISO 2020

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SIST EN ISO 23243:2021
ISO 23243:2020(E)

COPYRIGHT PROTECTED DOCUMENT
© ISO 2020
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO 2020 – All rights reserved

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ISO 23243:2020(E)

Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
3.1 Terms related to sound . 1
3.2 Terms related to the test equipment . 1
3.2.1 Probes. 1
3.2.2 Instruments .10
3.3 Terms related to testing .11
3.3.1 Testing techniques .11
3.3.2 Signals, presentations and indications .16
3.3.3 Evaluation of indications .19
Bibliography .20
© ISO 2020 – All rights reserved iii

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SIST EN ISO 23243:2021
ISO 23243:2020(E)

Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www .iso .org/ patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to the
World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www .iso .org/
iso/ foreword .html.
This document was prepared by Technical Committee ISO/TC 135, Non-destructive testing, Subcommittee
SC 3, Ultrasonic testing, in collaboration with the European Committee for Standardization (CEN)
Technical Committee CEN/TC 138, Non-destructive testing, in accordance with the Agreement on
technical cooperation between ISO and CEN (Vienna Agreement).
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www .iso .org/ members .html.
iv © ISO 2020 – All rights reserved

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ISO 23243:2020(E)

Introduction
This document follows a structure similar to that in ISO 5577 but only takes into account terms related
to ultrasonic arrays.
The general terms already defined in ISO 5577 are also valid for ultrasonic arrays.
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SIST EN ISO 23243:2021
INTERNATIONAL STANDARD ISO 23243:2020(E)
Non-destructive testing — Ultrasonic testing with arrays —
Vocabulary
1 Scope
This document defines terms used in ultrasonic testing with arrays. This includes phased array
technology and signal processing technology using arrays, e. g. the full-matrix capture (FMC) (3.3.1.28)
and the total focusing technique (TFM) (3.3.1.35).
2 Normative references
There are no normative references in this document.
3 Terms and definitions
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
3.1 Terms related to sound
3.1.1
main lobe
main beam
sound beam in the intended direction, typically with the highest pressure within the sound field
Note 1 to entry: This applies to conventional and array probes (3.2.1.3).
3.1.2
side lobe
part of the sound field which corresponds to a local maximum in the far field, deviating from the
direction of the main lobe (3.1.1) and typically lower in amplitude
Note 1 to entry: This applies to conventional and array probes (3.2.1.3).
3.1.3
grating lobe
parasitic replication of the main lobe (3.1.1) caused by spatial undersampling (low ratio between
wavelength and pitch (3.2.1.16)), deviating from the direction of the main lobe and possibly of similar
amplitude
Note 1 to entry: This applies to array probes (3.2.1.3) only.
3.2 Terms related to the test equipment
3.2.1 Probes
3.2.1.1
array
piezoelectric plate divided into several elements (3.2.1.2), which are acoustically and electrically
separated
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3.2.1.2
array element
element
smallest part of the array (3.2.1.1) acting as a transducer
Note 1 to entry: See Figure 1.
Key
1 array element
2 wedge
α wedge angle
β natural refracted beam angle (3.2.1.26)
Figure 1 — Wedge and array with relevant parameters
3.2.1.3
array probe
probe with an array (3.2.1.1) of elements (3.2.1.2) for transmitting and/or receiving
3.2.1.4
arrangement of the array
spatial distribution of all the elements (3.2.1.2) in an array (3.2.1.1)
3.2.1.5
linear array
1-D-linear array
array (3.2.1.1) of elements (3.2.1.2) arranged in a single straight line allowing steering in one
direction (primary axis (3.2.1.18)) and focusing in the depth direction
Note 1 to entry: See Figure 2.
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Key
X primary axis
Figure 2 — Linear array; 1-D-linear array
3.2.1.6
annular array
array (3.2.1.1) of ring-shaped elements (3.2.1.2) arranged concentrically allowing focusing in the depth
direction
Note 1 to entry: See Figure 3.
Figure 3 — Annular array
3.2.1.7
sectorial annular array
annular array (3.2.1.6) with the rings divided into sectors allowing steering in two directions and
focusing in the depth direction
Note 1 to entry: See Figure 4 and Figure 5.
Figure 4 — Sectorial annular array
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Figure 5 — Partial sectorial annular array
3.2.1.8
1-D-curved array
array (3.2.1.1) arranged on a complete or partial cylinder, where the major transmitting axis is radial
Note 1 to entry: See Figure 6 and Figure 7.
Figure 6 — 1-D-curved array covering a complete circle
Figure 7 — 1-D-curved array covering part of a circle
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3.2.1.9
convex array
1-D-curved array (3.2.1.8) typically used for the testing of tubes from the inside
3.2.1.10
concave array
1-D-curved array (3.2.1.8) typically used for the testing of tubes from the outside
3.2.1.11
dual-array probe
probe with separate arrays (3.2.1.1) for transmitting and receiving
Note 1 to entry: See Figure 8.
Figure 8 — Example of a dual-array probe
3.2.1.12
2-D-array
matrix array
array (3.2.1.1) of elements (3.2.1.2) arranged in a rectangular pattern allowing steering in both
directions (primary axis (3.2.1.18) and secondary axis (3.2.1.19)) and focusing in the depth direction
Note 1 to entry: See Figure 9 and Figure 10.
Key
X primary axis
Y secondary axis
Figure 9 — Example of a 2-D-matrix array
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Key
X primary axis
Y secondary axis
Figure 10 — Axes of a 2-D-matrix array
3.2.1.13
sparse array
array (3.2.1.1) with a limited number of elements (3.2.1.2) distributed over a relatively large area, with
irregular distances between the elements, for example according to a Poisson-disk distribution
3.2.1.14
width of an element
dimension of the element (3.2.1.2) along the primary axis of an array (3.2.1.18)
Note 1 to entry: For linear arrays (3.2.1.5) see Figure 11.
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Key
a width of an element
b length of an element (3.2.1.15)
c pitch (3.2.1.16)
d space/gap between elements (3.2.1.17)
X primary axis
Figure 11 — Linear array
3.2.1.15
length of an element
dimension of the element (3.2.1.2) along the secondary axis of an array (3.2.1.19)
Note 1 to entry: For linear arrays (3.2.1.5) see Figure 11.
3.2.1.16
pitch
distance between the same edges or between centres of two adjacent elements (3.2.1.2)
Note 1 to entry: For linear arrays (3.2.1.5) see Figure 11.
3.2.1.17
space between elements
gap between elements
distance between two adjacent elements (3.2.1.2)
Note 1 to entry: For linear arrays (3.2.1.5) see Figure 11.
3.2.1.18
primary axis of an array
primary axis
active direction
main axis for beam steering parallel to the width of the elements (3.2.1.14)
Note 1 to entry: See Figure 10 and Figure 11.
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3.2.1.19
secondary axis of an array
secondary axis
passive direction
axis perpendicular to the primary axis (3.2.1.18)
Note 1 to entry: See Figure 10.
Note 2 to entry: Typically the term "passive direction" is only used for 1-D linear arrays (3.2.1.5) and 1-D curved
arrays (3.2.1.8).
3.2.1.20
reference point on the wedge
coordinates of the point on the wedge which is used to position a defined point of the array (3.2.1.1)
Note 1 to entry: Typically the distances from the reference point to the wedge contact surface and to the front of
the wedge are used.
3.2.1.21
active aperture
group of active elements (3.2.1.2) operated together when transmitting and/or receiving
3.2.1.22
elementary aperture
active aperture (3.2.1.21) made of only one element (3.2.1.2)
3.2.1.23
virtual probe
active aperture (3.2.1.21) operated with one delay law (3.2.2.12)
3.2.1.24
virtual source aperture
VSA
group of active elements (3.2.1.2) operated together during transmission using a delay law (3.2.2.12)
chosen to mimic a source at a virtual point
3.2.1.25
sensitivity curve of an array
representation of the sensitivity of each element (3.2.1.2) successively connected to the same channel
(3.2.2.1)
Note 1 to entry: Typically a flat reflector much larger than the aperture of the array (3.2.1.1) is used.
3.2.1.26
natural refracted beam angle
angle between the refracted beam axis and the normal to the interface without electronic beam steering
(3.3.1.13)
Note 1 to entry: See Figure 1.
Note 2 to entry: The natural refracted beam angle corresponds to the nominal probe angle (see ISO 5577) of a
conventional probe.
3.2.1.27
natural refracted beam
...