IEC 60384-20-1:2008

IEC 60384-20-1 ®
Edition 2.0 2008-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 20-1: Blank detail specification – Fixed metallized polyphenylene sulfide film
dielectric surface mount d.c. capacitors – Assessment level EZ

Condensateurs fixes utilisés dans les équipements électroniques –
Partie 20-1: Spécification particulière cadre – Condensateurs fixes pour montage
en surface pour courant continu à diélectrique en film de sulfure de
polyphénylène métallisé – Niveau d’assurance EZ

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IEC 60384-20-1 ®
Edition 2.0 2008-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –

Part 20-1: Blank detail specification – Fixed metallized polyphenylene sulfide film

dielectric surface mount d.c. capacitors – Assessment level EZ

Condensateurs fixes utilisés dans les équipements électroniques –

Partie 20-1: Spécification particulière cadre – Condensateurs fixes pour montage

en surface pour courant continu à diélectrique en film de sulfure de

polyphénylène métallisé – Niveau d’assurance EZ

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX M
ICS 31.060.10 ISBN 978-2-83220-701-7

– 2 – 60384-20-1  IEC:2008
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 20-1: Blank detail specification –
Fixed metallized polyphenylene sulfide film
dielectric surface mount d.c. capacitors –
Assessment level EZ
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60384-20-1 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
This second edition cancels and replaces the first edition published in 1996 and constitutes a
minor revision related to tables and references.
This bilingual version (2013-05) corresponds to the monolingual English version, published in
2008-01.
60384-20-1  IEC:2008 – 3 –
The text of this standard is based on the following documents:
FDIS Report on voting
40/1872/FDIS 40/1889/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The French version of this standard has not been voted upon.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The list of all parts of the IEC 60384 series, under the (new) general title Fixed capacitors for
use in electronic equipment, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
The contents of the corrigendum of February 2008 have been included in this copy.

– 4 – 60384-20-1  IEC:2008
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 20-1: Blank detail specification –
Fixed metallized polyphenylene sulfide film
dielectric surface mount d.c. capacitors –
Assessment level EZ
Blank detail specification
A blank detail specification is a supplementary document to the sectional specification and
contains requirements for style and layout and minimum content of detail specifications. Detail
specifications not complying with these requirements may not be considered as being in
accordance with IEC specifications nor shall they so be described.
In the preparation of detail specifications, the content of 1.4 of the sectional specification shall
be taken into account.
The numbers between brackets on the first page correspond to the following information
which shall be inserted in the position indicated.
Identification of the detail specification
[1] The "International Electrotechnical Commission" or the National Standards Organization
under whose authority the detail specification is drafted.
[2] The IEC or National Standards number of the detail specification, date of issue and any
further information required by the national system.
[3] The number and issue number of the IEC or national generic specification.
[4] The IEC number of the blank detail specification.
Identification of the capacitor
[5] A short description of the type of capacitor.
[6] Information on typical construction (when applicable).
When the capacitor is not designed for use in printed-board applications, this shall be
clearly stated in the detail specification in this position.
[7] Outline drawing with main dimensions which are of importance for interchangeability
and/or reference to the national or international documents for outlines. Alternatively,
this drawing may be given in an annex to the detail specification.
[8] Application or group of applications covered and/or assessment level.
NOTE The assessment level(s) to be used in a detail specification are selected from 3.5.4 of the sectional
specification. This implies that one blank detail specification may be used in combination with several assessment
levels, provided the grouping of the tests does not change.
[9] Reference data on the most important properties, to allow comparison between the
various capacitor types.
60384-20-1  IEC:2008 – 5 –
IEC 60384-20-1XX
[2]
[1] QC 302001XXXXXX
ELECTRONIC COMPONENTS OF ASSESSED IEC 60384-20-1  [4]
QUALITY IN ACCORDANCE WITH: QC 302001

FIXED METALLIZED  [5]
[3] POLYETHYLENE SULFIDE
FILM DIELECTRIC SURFACE MOUNT D.C.
Outline drawing: (see Table 1) CAPACITORS
[.angle projection]
[6]
[7]
Assessment level(s): EZ  [8]
[Other shapes are permitted within the dimensions given.]

Information on the availability of components qualified to this
detail specification is given in the Register of Approvals

(9)
1 General data
1.1 Recommended method(s) of mounting (to be inserted)
See 1.4.2 of IEC 60384-20.
1.2 Dimensions
Table 1 – Dimensions
Dimensions
Case size
mm
reference
L W H L L L .
1 1 1 2 3 4
When there is no case size reference, Table 1 may be omitted and the dimensions shall be
given in Table 2, which then becomes Table 1.
The dimensions shall be given as maximum dimensions or as nominal dimensions with a
tolerance.
– 6 – 60384-20-1  IEC:2008
1.3 Ratings and characteristics
Capacitance range (see Table 2)
Tolerance on rated capacitance
Rated voltage (see Table 2)
Category voltage (if applicable) (see Table 2)
Climatic category
Rated temperature
Maximum a.c. voltage (if applicable)
Maximum pulse load (if applicable)
Tangent of loss angle
Insulation resistance
Table 2 – Values of capacitance and of voltage related to case sizes
Rated voltage
a
Category voltage
Case size Case size Case size Case size
Rated capacitance
(in nF and/or µF)
a
If different from the rated voltage.

1.4 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60384-1, Fixed capacitors for use in electronic equipment – Part 1: Generic specification
IEC 60384-20, Fixed capacitors for use in electronic equipment – Part 20: Sectional
specification – Fixed metallized polyphenylene sulfide film dielectric surface mount d.c.
capacitors
1.5 Marking
The marking of the capacitor and the package shall be in accordance with the requirements of
1.6 of IEC 60384-20.
The details of the marking of the component and package shall be given in full in the detail
specification.
1.6 Ordering information
Orders for capacitors covered by this specification shall contain, in clear or in coded form, the
following minimum information:
a) rated capacitance;
b) tolerance on rated capacitance;
c) rated d.c. voltage;
d) number and issue reference of the detail specification and style reference;
e) packaging instructions.
60384-20-1  IEC:2008 – 7 –
1.7 Certified records of released lots
Required/not required.
1.8 Additional information (not for inspection purposes)
1.9 Additional or increased severities or requirements to those specified in the
generic and/or sectional specification
NOTE Additions or increased requirements should be specified only when essential.
Table 3 – Other characteristics
This table is to be used for defining characteristics which are additional to,
or more severe than, those given in the sectional specification.

2 Inspection requirements
2.1 Procedures
2.1.1 For qualification approval, the procedures shall be in accordance with 3.4 of the
sectional specification IEC 60384-20.
2.1.2 For quality conformance inspection, the test schedule (Table 4) includes sampling,
periodicity, severities and requirements. The formation of inspection lots is covered by 3.5.1
of IEC 60384-20.
– 8 – 60384-20-1  IEC:2008
Table 4 – Test schedule for quality conformance inspection
D IL n c
Subclause number or Performance
a
a c Conditions of test a
c
and test ND requirements
Group A inspection
(lot-by-lot)
d
Sub-group A0 ND 100 %
4.3.2 Capacitance   Within specified tolerance
4.3.3 Tangent of loss Frequency: 1 kHz for all  As in 4.3.3.2
angle capacitance values
4.3.1 Voltage proof Method:.  No breakdown or flashover.
(Test A) Measuring point 1a Self-healing breakdowns
allowed
4.3.4 Insulation resis- Measuring point 1a  As in 4.3.4.3
tance (Test A)
b
Sub-group A1 ND S-4 0
4.2.1 Visual   As in 4.2.2
examination Legible marking (if appli-
cable) and as specified in
1.5 of this specification
b
Sub-group A2 ND S-3 0
e
4.2 Dimensions   As specified in Table 1 of
this specification
Group B inspection
(lot-by-lot)
b
Sub-group B1
D S-3 0
4.7 Solderability No ageing
method:.
Visual examination As in 4.7.2
4.7.2 Final measure-
ments
b
Sub-group B2 D S-3 0
4.14 Solvent resis- Solvent:. Legible marking
tance of the Solvent temperature:.
marking (if Method 1
f
applicable) Rubbing material: cotton
wool
Recovery: …
60384-20-1  IEC:2008 – 9 –
Table 4 (continued)
Sample size
D
and acceptance
Subclause number or Performance
a
c
a c Conditions of test a
criterion
and test ND requirements
p n c
Group C inspection
(periodic)
g
Sub-group C1 D 3 12 0
4.6 Resistance to Method:.
soldering heat
Capacitance
4.6.1 Initial Duration:.
measurements
4.6.2 Test  If Method 1 is applied
conditions immersion and withdrawal
speed shall be
25 mm/s ± 2,5 mm/s
Recovery: 24 h ± 2 h
Visual examination As in 4.6.3
4.6.3 Final Capacitance
∆C/C for Grade 1 and
measurements
Grade 2: ≤ 2 %,
Grade 3: ≤ 3 %
of value measured in
4.6.1
Solvent:.
See detail specification
4.13 Component   Solvent temperature:.
solvent resis-
Method 2
tance
Recovery:.
(if applicable)
g
Sub-group C2
D 3 12 0
4.5 Bond strength of
the end face
plating
4.5.1 Initial Capacitance
measurements
4.5.2 Final inspection Capacitance (with board in
∆C/C for Grade 1 and
bent position)
Grade 2: ≤ 2 %,
Grade 3: ≤ 5 %
of value measured in
4.5.1
Visual examination
No visible damage
Sub-group C3 D
4.1 Mounting *
Substrate material: …
4.2.1 Visual  As in detail specification
examination
4.3.2 Capacitance  ∆C/C ≤ 2% of value

measured in Sub-group A0
4.3.3 Tangent of loss Frequency: As in 4.3.3.2
angle 1 kHz (for all capacitance
(Reference values for
values)
final measurements in
10 kHz for capacitors with
sub-groups C3.1, C3.3
C ≤ 1 µF (in addition, see
R
and C3.4)
4.3.3.3)
4.3.4 Insulation  As in 4.3.4.3
resistance
—————————
*
When different substrate materials are used for the individual sub-groups, the detail specification shall indicate
which substrate material is used in each sub-group.

– 10 – 60384-20-1  IEC:2008
Table 4 (continued)
Sample size
D
and acceptance
Subclause number or Performance
a
c
a c Conditions of test a
criterion
and test ND requirements
p n c
g
Sub-group C3.1
D 6 27 0
4.4 Adhesion
4.4.1 Intermediate Visual examination  No visible damage
inspection
4.8 Rapid change
of temperature
4.8.1 Initial  Not required, see Sub-
measurements group C3
4.8.2 Test  T = Lower category
A
conditions
temperature
T = Upper category
B
temperature
Five cycles
Duration t = 30 min
4.8.3 Intermediate  Visual examination  No visible damage
inspection
4.9 Climatic
sequence
4.9.1 Initial Not required, see Sub-
measurements group 3
4.9.2 Dry heat Temperature:
upper category
temperature
Duration: 16 h
4.9.3 Damp heat,
cyclic, test Db,
first cycle
4.9.4 Cold Temperature: lower
category temperature
Duration: 2 h
4.9.5 Damp heat,  Within 15 min after
cyclic, test Db, removal from test chamber
remaining cycles U to be applied for 1 min
R
No visible damage
4.9.6 Final Visual examination
Legible marking
measurements
Capacitance  ∆C/C for Grade 1 and
Grade 2: ≤ 3 %,
Grade 3: ≤ 5 %
of value measured in
Sub-group C3.
Tangent of loss angle:  Increase of tan δ:
at 10 kHz for C ≤ 1 µF ≤ 0,0025 for Grade 1
R
≤ 0,004 for Grade 2
≤ 0,005 for Grade 3
at 1 kHz for CR > 1 µF ≤ 0,0015 for Grade 1
≤ 0,0025 for Grade 2
≤ 0,003 for Grade 3
compared to values
measured in
Sub-group C3
Insulation resistance  ≥ 50 % of values in
4.3.4.3
however, ≥ 25 % for
Grade 3
60384-20-1  IEC:2008 – 11 –
Table 4 (continued)
Sample size
D
and acceptance
Subclause number or Performance
a
c
a c Conditions of test a
criterion
and test ND requirements
p n c
g
Sub-group C3.2 D 6 15 0
4.10 Damp heat,
steady state
Not required, see Group 3
4.10.1 Initial
measurements
Recovery:.
No visible damage
4.10.2 Final Visual examination
measurements
Capacitance  ∆C/C for Grade 1 and
Grade 2: ≤ 3 %,
Grade 3: ≤ 5 %
of value measured in
Sub-group C3
Tangent of loss angle at   Increase of tan δ:
1 kHz ≤ 0,0025 compared to
values measured in
Sub-group 3
Insulation resistance  ≥ 50 % of values in
4.3.4.3, however, ≥ 25 %
for Grade 3
g
Sub-group C3.3
D
3 15 0
4.11 Endurance
Not required, see Sub-
4.11.1 Initial
group C3
measurements
4.11.2 Test conditions See 4.11.2, 4.11.3 and
4.11.4
4.11.5 Final  Visual examination  No visible damage
measurements Legible marking
Capacitance  ∆C/C ≤ 5 % for Grade 1
∆C/C ≤ 8 % for Grade 2
and Grade 3 compared to
measurements in
Sub-group 3
Tangent of loss angle:  Increase of tan δ:
at 10 kHz for C ≤ 1 µF ≤ 0,003 for Grade 1
R
≤ 0,005 for Grade 2 and
Grade 3
at 1 kHz for C > 1 µF  ≤ 0,002 for Grade 1
R
≤ 0,003 for Grade 2 and
Grade 3 compared to
values measured in Sub-
group C3
Insulation resistance  ≥ 50 % of values in
4.3.4.3
however, ≥ 30 % for
Grade 3
g
Sub-group C3.4
6 9 0
D
4.12 Charge and
discharge
Not required, see
4.12.1 Initial
Sub-group 3
measurement
4.12.2 Test conditions 10 000 cycles

– 12 – 60384-20-1  IEC:2008
Table 4 (continued)
Sample size
D
and acceptance
Subclause number or Performance
a
c
a c Conditions of test a
criterion
and test ND requirements
p n c
4.12.3 Final  Capacitance ∆C/C ≤ 3 % for Grade 1
measurements ∆C/C ≤ 5 % for Grade 2
however, ≤ 8 % for Grade 3
compared to values
measured in Sub-group C3
δ:
Tangent of loss angle: Increase of tan
≤ 0,003 for Grade 1
at 10 kHz for C ≤ 1 µF
R
≤ 0,005 for Grade 2 and
Grade 3
at 1 kHz for C > 1 µF ≤ 0,002 for Grade 1
R
≤ 0,003 for Grade 2 and
Grade 3 compared to values
measured in Sub-group C3
Insula
...