Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors

IEC TS 62686-1:2020 is available as IEC TS 62686-1:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC TS 62686-1:2020 defines the minimum requirements for general purpose "off the shelf" COTS (commercial off-the-shelf) integrated circuits and discrete semiconductors for ADHP (aerospace, defence and high performance) applications. This Technical Specification applies to all components that can be operated in ADHP applications within the manufacturers' publicly available data sheet limits in conjunction with IEC TS 62239-1. It may be used by other high performance and high reliability industries, at their discretion. This new edition includes the following significant technical changes with respect to the previous edition:
- update related to obsolescence of STACK Specification S/0001 revision 14 notice 3;
- addition of alternative automotive methods of compliance and revision of Annex B initially related to cross-reference to STACK Specification S/0001;
- addition of an Annex C to include a requirement matrix for IEC TS 62686-1 verification.

General Information

Status
Published
Publication Date
19-Apr-2020
Drafting Committee
Current Stage
PPUB - Publication issued
Start Date
30-Mar-2020
Completion Date
20-Apr-2020
Ref Project

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Technical specification
IEC TS 62686-1:2020 - Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
English language
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Technical specification
IEC TS 62686-1:2020 RLV - Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors Released:4/20/2020 Isbn:9782832282465
English language
176 pages
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Standards Content (Sample)


IEC TS 62686-1 ®
Edition 3.0 2020-04
TECHNICAL
SPECIFICATION
Process management for avionics – Electronic components for aerospace,
defence and high performance (ADHP) applications –
Part 1: General requirements for high reliability integrated circuits and discrete
semiconductors
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and Definitions clause of
IEC publications issued since 2002. Some entries have been
IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and
If you wish to give us your feedback on this publication or CISPR.

need further assistance, please contact the Customer Service

Centre: sales@iec.ch.
IEC TS 62686-1 ®
Edition 3.0 2020-04
TECHNICAL
SPECIFICATION
Process management for avionics – Electronic components for aerospace,

defence and high performance (ADHP) applications –

Part 1: General requirements for high reliability integrated circuits and discrete

semiconductors
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 03.100.50; 31.020; 49.060 ISBN 978-2-8322-8011-9

– 2 – IEC TS 62686-1:2020 © IEC 2020
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative references . 9
3 Terms, definitions and abbreviated terms . 10
3.1 Terms and definitions . 10
3.2 Abbreviated terms . 12
4 Technical requirements . 14
4.1 General . 14
4.1.1 Overview . 14
4.1.2 Automotive components . 15
4.2 Procedures . 15
4.2.1 General . 15
4.2.2 Product discontinuance . 15
4.2.3 ESD protection during manufacture . 15
4.2.4 Specification control . 16
4.2.5 Traceability including anti-counterfeit measures . 16
4.3 Product or process change notification (PCN) . 16
4.3.1 General . 16
4.3.2 Notification . 16
4.3.3 Notification details . 16
4.3.4 Notifiable changes . 17
4.4 Shipment controls . 17
4.4.1 General . 17
4.4.2 Shipping container and date code marking . 17
4.4.3 Date code remarking . 17
4.4.4 Inner container formation . 17
4.4.5 Date code age on delivery . 18
4.4.6 ESD marking . 18
4.4.7 MSL . 18
4.4.8 Lead-free marking . 18
4.4.9 Labels . 18
4.5 Electrical . 19
4.5.1 General . 19
4.5.2 Electrical test . 19
4.5.3 Electrical parameter assessment . 19
4.5.4 SDRAM memories . 20
4.5.5 Logic families . 20
4.5.6 Power MOSFETs . 20
4.5.7 Silicon rectifier diodes . 20
4.6 Mechanical . 20
4.6.1 General . 20
4.6.2 Device marking . 20
4.6.3 Small packages . 20
4.6.4 Moisture sensitivity . 20
4.6.5 Robustness of hermetic seals . 21

4.6.6 Termination finishes . 21
4.7 Audit capability . 21
4.7.1 General . 21
4.7.2 Internal quality audits . 21
4.7.3 Subcontract manufacturing . 22
4.8 Quality assurance . 22
4.8.1 General . 22
4.8.2 Quality system . 22
4.8.3 Sampling plans . 22
4.8.4 Failure analysis support . 22
4.8.5 Outgoing quality . 22
4.9 Qualification . 23
4.9.1 General . 23
4.9.2 Methodology . 24
4.9.3 Test samples . 25
4.9.4 Qualification categories . 26
4.9.5 Maintenance of qualification standard . 26
4.9.6 In-process test results . 26
4.9.7 Product monitor results . 30
4.9.8 References . 30
4.9.9 Qualification report . 30
4.9.10 Archiving . 30
4.9.11 Qualification by similarity . 30
4.9.12 Similarity assessment . 30
4.10 Reliability . 31
4.10.1 General . 31
4.10.2 Operating reliability. 31
4.10.3 Failure criteria . 31
4.10.4 Corrective action . 32
4.10.5 Warranty . 32
4.10.6 Single event effects (SEEs) . 32
4.11 Product monitor . 32
4.11.1 General . 32
4.11.2 Monitor programme . 32
4.11.3 Problem notification . 32
4.11.4 Data reporting. 33
4.11.5 Samples . 33
4.11.6 Corrective action . 33
4.11.7 Product monitor results . 33
4.11.8 Accumulated test data . 33
4.12 Environmental health and safety (EHS) . 34
4.12.1 General . 34
4.12.2 EHS compliance . 34
4.12.3 Device handling . 34
4.12.4 Device materials . 34
4.13 Shipping containers . 34
4.13.1 General .
...


IEC TS 62686-1 ®
Edition 3.0 2020-04
REDLINE VERSION
TECHNICAL
SPECIFICATION
colour
inside
Process management for avionics – Electronic components for aerospace,
defence and high performance (ADHP) applications –
Part 1: General requirements for high reliability integrated circuits and discrete
semiconductors
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and Definitions clause of
IEC publications issued since 2002. Some entries have been
IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and
If you wish to give us your feedback on this publication or CISPR.

need further assistance, please contact the Customer Service

Centre: sales@iec.ch.
IEC TS 62686-1 ®
Edition 3.0 2020-04
REDLINE VERSION
TECHNICAL
SPECIFICATION
colour
inside
Process management for avionics – Electronic components for aerospace,

defence and high performance (ADHP) applications –

Part 1: General requirements for high reliability integrated circuits and discrete

semiconductors
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 03.100.50; 31.020; 49.060 ISBN 978-2-8322-8246-5

– 2 – IEC TS 62686-1:2020 RLV © IEC 2020
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative references . 9
3 Terms, definitions and abbreviated terms . 10
3.1 Terms and definitions . 10
3.2 Abbreviated terms . 12
4 Technical requirements . 15
4.1 General . 15
4.1.1 Overview . 15
4.1.2 Automotive components . 15
4.2 Procedures . 15
4.2.1 General . 15
4.2.2 Product discontinuance . 16
4.2.3 ESD protection during manufacture . 16
4.2.4 Specification control . 16
4.2.5 Traceability including anti-counterfeit measures . 16
4.3 Product or process change notification (PCN) . 16
4.3.1 General . 16
4.3.2 Notification . 17
4.3.3 Notification details . 17
4.3.4 Notifiable changes . 17
4.4 Shipment controls . 17
4.4.1 General . 17
4.4.2 Shipping container and date code marking . 18
4.4.3 Date code remarking . 18
4.4.4 Inner container formation . 18
4.4.5 Date code age on delivery . 18
4.4.6 ESD marking . 18
4.4.7 MSL . 18
4.4.8 Lead-free marking . 18
4.4.9 Labels . 18
4.5 Electrical . 19
4.5.1 General . 19
4.5.2 Electrical test . 19
4.5.3 Electrical parameter assessment . 20
4.5.4 SDRAM memories . 20
4.5.5 Logic families . 20
4.5.6 Power MOSFETs . 20
4.5.7 Silicon rectifier diodes . 20
4.6 Mechanical . 20
4.6.1 General . 20
4.6.2 Device marking . 20
4.6.3 Small packages . 20
4.6.4 Moisture sensitivity . 21
4.6.5 Robustness of hermetic seals . 21

4.6.6 Termination finishes . 21
4.7 Audit capability . 21
4.7.1 General . 21
4.7.2 Internal quality audits . 21
4.7.3 Subcontract manufacturing . 22
4.8 Quality assurance . 22
4.8.1 General . 22
4.8.2 Quality system . 22
4.8.3 Sampling plans . 22
4.8.4 Failure analysis support . 23
4.8.5 Outgoing quality . 23
4.9 Supplier performance monitoring by the user .
4.9.1 General .
4.9.2 Lot acceptance .
4.9.3 Suspension of deliveries .
4.9.4 Loss of approval .
4.9.5 AQL figures .
4.9.6 100 % screening .
4.9.7 Termination determination .
4.9 Qualification . 25
4.9.1 General . 25
4.9.2 Methodology . 25
4.9.3 Test samples . 27
4.9.4 Qualification categories . 27
4.9.5 Maintenance of qualification standards . 27
4.9.6 In-process test results . 27
4.9.7 Product monitor results . 32
4.9.8 References . 32
4.9.9 Qualification report . 32
4.9.10 Archiving . 32
4.9.11 Qualification by similarity . 32
4.9.12 Similarity assessment . 32
4.10 Reliability . 33
4.10.1 General . 33
4.10.2 Operating reliability. 33
4.10.3 Failure criteria . 33
4.10.4 Corrective action . 34
4.10.5 Warranty . 34
Suspension of certification .
4.10.6 Single event effects (SEEs) . 34
4.11 Product monitor . 34
4.11.1 General . 34
4.11.2 Monitor programme . 34
4.11.3 Problem notification . 35
4.11.4 Data reporting. 35
4.11.5 Samples . 35
4.11.6 Corrective acti
...

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