IEC 61000-4-11:2004

NORME CEI
INTERNATIONALE 61000-4-11
Deuxième édition
2004-03
PUBLICATION FONDAMENTALE EN CEM
Compatibilité électromagnétique (CEM) –
Partie 4-11:
Techniques d'essai et de mesure –
Essais d’immunité aux creux de tension,
coupures brèves et variations de tension

Cette version française découle de la publication d’origine
bilingue dont les pages anglaises ont été supprimées.
Les numéros de page manquants sont ceux des pages
supprimées.
Numéro de référence
CEI 61000-4-11:2004(F)
Numérotation des publications
Depuis le 1er janvier 1997, les publications de la CEI sont numérotées à partir de

60000. Ainsi, la CEI 34-1 devient la CEI 60034-1.

Editions consolidées
Les versions consolidées de certaines publications de la CEI incorporant les

amendements sont disponibles. Par exemple, les numéros d’édition 1.0, 1.1 et 1.2

indiquent respectivement la publication de base, la publication de base incorporant

l’amendement 1, et la publication de base incorporant les amendements 1 et 2

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NORME CEI
INTERNATIONALE 61000-4-11
Deuxième édition
2004-03
PUBLICATION FONDAMENTALE EN CEM
Compatibilité électromagnétique (CEM) –
Partie 4-11:
Techniques d'essai et de mesure –
Essais d’immunité aux creux de tension,
coupures brèves et variations de tension

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CODE PRIX
U
Commission Electrotechnique Internationale
International Electrotechnical Commission
Международная Электротехническая Комиссия
Pour prix, voir catalogue en vigueur

– 2 – 61000-4-11  CEI:2004
SOMMAIRE
AVANT-PROPOS .4

INTRODUCTION.8

1 Domaine d’application.10

2 Références normatives.10

3 Termes et définitions .10

4 Généralités.14

5 Niveaux d'essai.14
6 Instruments d'essai.22
7 Montage d'essai.26
8 Procédures d'essai.28
9 Evaluation des résultats d'essai .32
10 Rapport d'essai.34

Annexe A (normative) Détails sur les circuits d’essai .36
Annexe B (informative) Classes d'environnement électromagnétique .42
Annexe C (informative) Instruments d’essai.44

Bibliographie .50

Figure 1 – Creux de tension - Exemples .20
Figure 2 – Coupure brève.20
Figure 3 – Variation de tension.22
Figure 4 – Essai phase neutre et phase phase des systèmes triphasés.32
Figure A.1 – Circuit utilisé pour déterminer le courant d’appel crête du générateur
de coupures brèves.38
Figure A.2 – Circuit utilisé pour déterminer les conditions requises sur la valeur crête
du courant d’appel d’un EST .40
Figure C.1 – Schémas des instruments d’essai pour les creux de tension, les coupures
brèves et les variations de tension.46

Figure C.2 – Schéma des instruments d’essai pour les creux de tension, les coupures
brèves et les variations de tension triphasés à l’aide d’un amplificateur de puissance .48

Tableau 1 – Durées et niveaux d’essai préférés pour les creux de tension .16
Tableau 2 – Durées et niveaux d’essai préférés pour les coupures brèves .16
Tableau 3 – Durée des variations de tension d’alimentation à court terme.18
Tableau 4 – Spécifications du générateur .24

– 4 – 61000-4-11  CEI:2004
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE

___________
COMPATIBILITÉ ÉLECTROMAGNÉTIQUE (CEM) –

Partie 4-11: Techniques d'essai et de mesure –

Essais d'immunité aux creux de tension,

coupures brèves et variations de tension

AVANT-PROPOS
1) La Commission Electrotechnique Internationale (CEI) est une organisation mondiale de normalisation composée
de l'ensemble des comités électrotechniques nationaux (Comités nationaux de la CEI). La CEI a pour objet de
favoriser la coopération internationale pour toutes les questions de normalisation dans les domaines de
l'électricité et de l'électronique. A cet effet, la CEI – entre autres activités – publie des Normes internationales,
des Spécifications techniques, des Rapports techniques, des Spécifications accessibles au public (PAS) et des
Guides (ci-après dénommés "Publication(s) de la CEI"). Leur élaboration est confiée à des comités d'études,
aux travaux desquels tout Comité national intéressé par le sujet traité peut participer. Les organisations
internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, participent également aux
travaux. La CEI collabore étroitement avec l'Organisation Internationale de Normalisation (ISO), selon des
conditions fixées par accord entre les deux organisations.
2) Les décisions ou accords officiels de la CEI concernant les questions techniques représentent, dans la mesure
du possible, un accord international sur les sujets étudiés, étant donné que les Comités nationaux de la CEI
intéressés sont représentés dans chaque comité d’études.
3) Les Publications de la CEI se présentent sous la forme de recommandations internationales et sont agréées
comme telles par les Comités nationaux de la CEI. Tous les efforts raisonnables sont entrepris afin que la CEI
s'assure de l'exactitude du contenu technique de ses publications; la CEI ne peut pas être tenue responsable de
l'éventuelle mauvaise utilisation ou interprétation qui en est faite par un quelconque utilisateur final.
4) Dans le but d'encourager l'uniformité internationale, les Comités nationaux de la CEI s'engagent, dans toute la
mesure possible, à appliquer de façon transparente les Publications de la CEI dans leurs publications
nationales et régionales. Toutes divergences entre toutes Publications de la CEI et toutes publications
nationales ou régionales correspondantes doivent être indiquées en termes clairs dans ces dernières.
5) La CEI n’a prévu aucune procédure de marquage valant indication d’approbation et n'engage pas sa
responsabilité pour les équipements déclarés conformes à une de ses Publications.
6) Tous les utilisateurs doivent s'assurer qu'ils sont en possession de la dernière édition de cette publication.
7) Aucune responsabilité ne doit être imputée à la CEI, à ses administrateurs, employés, auxiliaires ou
mandataires, y compris ses experts particuliers et les membres de ses comités d'études et des Comités
nationaux de la CEI, pour tout préjudice causé en cas de dommages corporels et matériels, ou de tout autre
dommage de quelque nature que ce soit, directe ou indirecte, ou pour supporter les coûts (y compris les frais
de justice) et les dépenses découlant de la publication ou de l'utilisation de cette Publication de la CEI ou de
toute autre Publication de la CEI, ou au crédit qui lui est accordé.
8) L'attention est attirée sur les références normatives citées dans cette publication. L'utilisation de publications
référencées est obligatoire pour une application correcte de la présente publication.
9) L’attention est attirée sur le fait que certains des éléments de la présente Publication de la CEI peuvent faire

l’objet de droits de propriété intellectuelle ou de droits analogues. La CEI ne saurait être tenue pour
responsable de ne pas avoir identifié de tels droits de propriété et de ne pas avoir signalé leur existence.
La Norme internationale CEI 61000-4-11 a été établie par le sous-comité 77A: Phénomènes
basse fréquence, du comité d'études 77 de la CEI: Compatibilité électromagnétique.
Cette deuxième édition annule et remplace la première édition parue en 1994 et son
amendement 1 (2000). Cette deuxième édition constitue une révision technique dans laquelle
1) des durées et niveaux d'essai préférés pour les différentes classes d'environnement ont
été ajoutées ;
2) les essais pour les systèmes triphasés ont été précisés.
Elle constitue la partie 4-11 de la CEI 61000. Elle a le statut de publication fondamentale en
CEM conformément au Guide 107 de la CEI.

– 6 – 61000-4-11  CEI:2004
Le texte de cette norme est issu des documents suivants:

FDIS Rapport de vote
77A/452/FDIS 77A/455/RVD
Le rapport de vote indiqué dans le tableau ci-dessus donne toute information sur le vote ayant

abouti à l'approbation de cette norme.

Cette publication a été rédigée selon les Directives ISO/CEI, Partie 2.

Le comité a décidé que le contenu de cette publication ne sera pas modifié avant 2008. A cette
date, la publication sera:
• reconduite;
• supprimée;
• remplacée par une édition révisée, ou
• amendée.
– 8 – 61000-4-11  CEI:2004
INTRODUCTION
La CEI 61000 est publiée sous forme de plusieurs parties, conformément à la structure

suivante:
Partie 1: Généralités
Considérations générales (introduction, principes fondamentaux)

Définitions, terminologie
Partie 2: Environnement
Description de l'environnement
Classification de l'environnement
Niveaux de compatibilité
Partie 3: Limites
Limites d'émissions
Limites d'immunité (dans la mesure où elles ne relèvent pas de la responsabilité des
comités de produits)
Partie 4: Techniques d'essai et de mesure
Techniques de mesure
Techniques d'essai
Partie 5: Directives d'installation et d'atténuation
Directives d'installation
Méthodes et dispositifs d'atténuation
Partie 6: Normes génériques
Partie 9: Divers
Chaque partie est à son tour subdivisée en plusieurs parties, publiées soit comme Normes
internationales, soit comme spécifications techniques ou rapports techniques, dont certaines
ont déjà été publiées en tant que sections. D’autres seront publiées sous le numéro de la
partie, suivi d’un tiret et complété d’un second chiffre identifiant la subdivision (exemple:
61000-6-1).
– 10 – 61000-4-11  CEI:2004
COMPATIBILITÉ ÉLECTROMAGNÉTIQUE (CEM) –

Partie 4-11: Techniques d'essai et de mesure –

Essais d'immunité aux creux de tension,

coupures brèves et variations de tension

1 Domaine d’application
La présente partie de la CEI 61000 définit les méthodes d'essai d'immunité ainsi que la
gamme des niveaux d'essais préférés pour les matériels électriques et électroniques
connectés à des réseaux d'alimentation basse tension pour les creux de tension, les
coupures brèves et les variations de tension.
La présente norme s’applique aux matériels électriques et électroniques dont le courant
nominal d’entrée ne dépasse pas 16 A par phase et destinés à être reliés à des réseaux
électriques alternatifs de 50 Hz ou 60 Hz.
Elle ne s'applique pas aux matériels électriques et électroniques destinés à être reliés à des
réseaux électriques à courant alternatif de 400 Hz. Les essais pour ces réseaux seront traités
dans des normes CEI à venir.
Le but de cette norme est d'établir une référence commune pour l'évaluation de l'immunité
fonctionnelle des matériels électriques et électroniques soumis à des creux de tension, à des
coupures brèves et à des variations de tension.
NOTE Les essais d’immunité aux fluctuations de tension sont traités dans la CEI 61000-4-14.
La méthode d’essai décrite dans la présente partie de la CEI 61000 détaille une méthode sans
faille pour estimer l’immunité d’un matériel ou d’un système à un phénomène prédéfini.
Comme décrit dans le Guide 107 de la CEI, ce document est une publication fondamentale en
CEM destinée à l’usage des comités de produit de la CEI. Comme également mentionné dans
le Guide 107, les comités de produit de la CEI sont responsables du choix d’utilisation ou non
de cette norme d’essai d’immunité et, si elle est utilisée, les comités sont responsables de la
définition des niveaux d’essai appropriés. Le comité d’études 77 et ses sous-comités sont
prêts à coopérer avec les comités de produit pour l’évaluation de la pertinence des essais
particuliers d’immunité pour leurs produits.
2 Références normatives
Les documents de référence suivants sont indispensables pour l'application du présent
document. Pour les références datées, seule l'édition citée s'applique. Pour les références non
datées, la dernière édition du document de référence s'applique (y compris les éventuels
amendements).
CEI 61000-2-8, Compatibilité électromagnétique (CEM) – Partie 2-8: Environnement – Creux
de tension et coupures brèves sur les réseaux d’électricité publics incluant des résultats de
mesures statistiques
3 Termes et définitions
Pour les besoins du présent document, les termes et définitions suivants s'appliquent:

– 12 – 61000-4-11  CEI:2004
3.1
norme fondamentale en CEM
norme relative aux conditions ou aux règlements fondamentaux et généraux nécessaires à la

réalisation de la CEM liés ou s’appliquant à tous les produits et systèmes et que les comités de

produits peuvent utiliser comme document de référence

NOTE Comme déterminé par le Comité Consultatif de la Compatibilité Electromagnétique (ACEC) – voir le
Guide 107 de la CEI.
3.2
immunité (contre une perturbation)

aptitude d'un dispositif, d'un appareil ou d'un système à fonctionner sans dégradation en

présence d'une perturbation électromagnétique
[VEI 161-01-20]
3.3
creux de tension
diminution brusque de la tension à un endroit particulier d’un système d’alimentation électrique
qui devient inférieure à un seuil de creux spécifié, puis reprend une valeur supérieure au seuil
après un bref intervalle de temps
NOTE 1 Typiquement, un creux est associé à l’apparition et à la disparition d’un court-circuit ou de toute autre
cause de surintensité dans le système ou les installations connectées à celui-ci.
NOTE 2 Un creux de tension est une perturbation électromagnétique en deux dimensions, dont le niveau est
déterminé par la tension et la durée.
3.4
coupure brève
diminution brusque de la tension sur toutes les phases à un endroit particulier d’un système
d’alimentation électrique qui devient inférieure à un seuil d’interruption spécifié, puis reprend
une valeur supérieure au seuil après un bref intervalle de temps
NOTE Les coupures brèves sont souvent liées aux dispositifs de commutation dont le fonctionnement est lié à
l’apparition et à la disparition de courts-circuits dans le système ou les installations connectées à celui-ci.
3.5
tension résiduelle (d’un creux de tension)
valeur minimale de la tension efficace enregistrée pendant un creux de tension ou une coupure
brève
NOTE La tension résiduelle peut être exprimée en volts, en pourcentage ou en valeur unitaire par rapport à la
tension de référence.
3.6
dysfonctionnement
cessation de l’aptitude d’un matériel à accomplir ses fonctions ou exécution de fonctions

incorrectes par le matériel
3.7
étalonnage
méthode qui garantit que l’appareil de mesure est conforme à ses spécifications
NOTE Dans le cadre de cette norme, l’étalonnage s’applique au générateur d’essai.
3.8
vérification
ensemble des opérations utilisées qui s’appliquent à l’ensemble des matériels d’essais (par
exemple le générateur d’essai et les câbles d’interconnexion) pour démontrer que le système
d’essai fonctionne conformément aux spécifications décrites à l’Article 6
NOTE 1 Les méthodes de vérification ne sont pas nécessairement les mêmes que les méthodes d’étalonnage.
NOTE 2 Les procédures de vérification décrites en 6.1.2 servent à vérifier que le générateur d’essai fonctionne
correctement, les autres éléments constituant le montage d’essai servent à vérifier qu’une forme d’onde correcte
est délivrée à l’EST.
– 14 – 61000-4-11  CEI:2004
4 Généralités
Les creux de tension, les coupures brèves et les variations de tension de l’alimentation

électrique peuvent avoir une incidence sur les matériels électriques et électroniques.

Les creux de tension et les coupures brèves sont causés par des défaillances au niveau du

réseau, essentiellement des courts-circuits (voir également la CEI 61000-2-8), dans les

installations ou par d’importantes variations brusques de charge. Dans certains cas, plusieurs
creux ou coupures consécutifs peuvent survenir. Les variations de tension sont causées par

des variations continues des charges connectées au réseau.

Ces phénomènes, aléatoires par nature, peuvent être caractérisés de manière minimale en
vue d’être utilisés pour des simulations en laboratoire en termes d’écart par rapport à la
tension nominale et de durée.
En conséquence, différents types d’essais sont spécifiés dans cette norme pour simuler les
effets des variations brusques de tension. Ces essais doivent uniquement être utilisés pour
des cas particuliers et justifiés, et relèvent de la responsabilité des comités de produits ou
de spécifications.
Le comité de produits est responsable d’établir les phénomènes concernés parmi ceux
traités dans cette norme et de décider des conditions d’application de l’essai.
5 Niveaux d'essai
Les tensions données dans la présente norme ont comme base la tension nominale du
matériel (U ) pour les spécifications des tensions des niveaux d’essai.
T
Lorsque le matériel présente une gamme de tensions nominales, les points suivants doivent
s’appliquer:
– si la gamme de tensions est inférieure à 20 % de la plus basse tension spécifiée pour la
gamme de tensions nominales, une seule tension de cette gamme peut être spécifiée
comme base pour les spécifications des niveaux d’essai (U );
T
– dans tous les autres cas, la procédure d’essai doit s’appliquer à la fois aux tensions les
plus élevées et aux tensions les plus faibles de la gamme de tensions;
– la CEI 61000-2-8 donne une sélection de durées et de niveaux d’essai.
5.1 Creux de tension et coupures brèves
Le passage de la tension U à la nouvelle tension est brusque. Ce changement peut
T
commencer et se terminer quel que soit l’angle de phase de la tension du réseau. Les
niveaux de tension d’essai suivants (en % de U ) sont utilisés: 0 %, 40 %, 70 % et 80 %, ce
T
qui correspond à des creux de tension résiduelle de 0 %, 40 %, 70 % et 80 %.
Pour les creux de tension, les durées et les niveaux d’essai préférés sont indiqués dans le
Tableau 1 et un exemple est représenté à la Figure 1a) et à la Figure 1b).
Pour les coupures brèves, les durées et les niveaux d’essai préférés sont indiqués dans le
Tableau 2 et un exemple est représenté à la Figure 2.
Les durées et niveaux d’essai préférés indiqués dans les Tableaux 1 et 2 tiennent compte des
informations indiquées dans la CEI 61000-2-8.
Les niveaux d'essai préférés indiqués dans le Tableau 1 sont raisonnablement sévères et sont
représentatifs de nombreux creux de tension réels, mais n'ont pas pour but de garantir
l'immunité pour n'importe quel creux de tension. Des creux de tension plus sévères, par
exemple 0 % pendant 1 s et des creux de tension triphasé, peuvent être considérés par les
comités produits.
– 16 – 61000-4-11  CEI:2004
Le temps de montée, t , et le temps de descente, t , pendant les variations brusques sont

r f
indiqués dans le Tableau 4.
Les durées et niveaux doivent être indiqués dans les spécifications des produits. Un niveau

d’essai de 0 % correspond à une coupure totale de la tension d’alimentation. En pratique, une

tension d’essai comprise entre 0 % et 20 % de la tension nominale peut être considérée

comme une coupure totale.
Il convient que les durées plus courtes du tableau, et en particulier la demi-période, soient

testées pour confirmer que l’équipement soumis aux essais (EST) fonctionne conformément

aux limites spécifiées pour celui-ci.

Lors de la définition des critères de performances pour des perturbations dont la durée est une
demi-période pour des produits équipés d’un transformateur de réseau, il convient que les
comités de produits soient particulièrement attentifs aux effets causés par les courants
d’appel. Pour de tels produits, ces courants peuvent être 10 à 40 fois plus élevés que le
courant nominal en raison de la saturation du flux magnétique du noyau du transformateur
après le creux de tension.
Tableau 1 – Durées et niveaux d’essai préférés pour les creux de tension
a
Classes Durée et niveau d’essai pour des creux de tension (t ) (50 Hz/60 Hz)
s
Classe 1 Au cas par cas en fonction des exigences du matériel
c
Classe 2 0 % pendant 0 % pendant 70 % pendant 25/30 périodes
½ période 1 période
Classe 3 0 % pendant 0 % pendant 40 % pendant 70 % pendant 80 % pendant
c c c
½ période 1 période 10/12 périodes 25/30 périodes 250/300 périodes
b
Classe X X X X X X
a
Classes similaires à la CEI 61000-2-4; voir l’Annexe B.
b
À définir par le comité de produits. Pour des matériels connectés directement ou indirectement au réseau
public, il ne faut pas que les niveaux soient moins sévères que ceux de la Classe 2.
c
"25/30 périodes" signifie "25 périodes pour des essais à 50 Hz" et "30 périodes pour des essais à 60 Hz".

Tableau 2 – Durées et niveaux d’essai préférés pour les coupures brèves
a
Classes Durée et niveau d’essai pour des coupures brèves (t ) (50 Hz/60 Hz)
s
Classe 1 Au cas par cas en fonction des exigences du matériel
c
Classe 2 0 % pendant 250/300 périodes

c
Classe 3 0 % pendant 250/300 périodes
b
Classe X X
a
Classes similaires à la CEI 61000-2-4; voir l’Annexe B.
b
À définir par le comité de produits. Pour des matériels connectés directement ou indirectement au réseau
public, il ne faut pas que les niveaux soient moins sévères que ceux de la Classe 2.
c
"250/300 périodes" signifie "250 périodes pour des essais à 50 Hz" et "300 périodes pour des essais à 60 Hz".

– 18 – 61000-4-11  CEI:2004
5.2 Variations de tension (facultatif)

Cet essai porte sur une transition définie entre une tension nominale U et la valeur de la
T
tension après la variation.
NOTE La durée de la variation de tension est courte et peut être causée par une variation de charge.

La durée préférée des variations de tension et la durée pendant laquelle les tensions réduites

doivent être conservées sont indiquées dans le Tableau 3. Il convient que le taux de variation

soit constant; toutefois, la tension peut être échelonnée. Il convient que les échelons se situent

aux points de passage à zéro et qu’ils ne soient pas supérieurs à 10 % de U . Les échelons
T
inférieurs à 1 % de U sont considérés comme des taux de variation de tension constants.
T
Tableau 3 – Durée des variations de tension d’alimentation à court terme
Niveau d'essai Temps de diminution Durée Temps d’augmentation de
de la tension de la tension (t ) de la tension réduite (t ) la tension (t )
d s i
(50 Hz /60 Hz)
b
70 % Brusque 1 période 25/30 périodes
a a a a
X X X X
a
À définir par le comité de produits.
b
"25/30périodes" signifie "25 périodes pour des essais à 50 Hz" et "30 périodes pour des essais à 60 Hz".

Il s’agit de la forme typique du démarrage d’un moteur.
La Figure 3 représente la tension efficace en fonction du temps. D’autres valeurs peuvent être
considérées dans des cas justifiés et doivent être spécifiées par le comité de produits.
U
05 25
t  (périodes)
IEC  270/04
NOTE La tension diminue jusqu’à 70 % pour 25 périodes. Échelon au passage à zéro.

Figure 1a) – Creux de tension – graphique montrant la forme d'onde
d'un creux de tension de 70 %
– 20 – 61000-4-11  CEI:2004
U (eff.)
T
100 %
40 %
0 %
t
f t t
s r
IEC  271/04
Légende
t
r Temps de montée
t
f Temps de descente
t
s Durée de la tension réduite
Figure 1b) – Creux de tension – graphique montrant la valeur efficace
d'un creux de tension de 40 %
Figure 1 – Creux de tension - Exemples
U
(eff.)
T
100 %
0 %
t
t t
f
s r
IEC  272/04
Légende
t
r Temps de montée
t
f Temps de descente
t
s Durée de la tension réduite
Figure 2 – Coupure brève
– 22 – 61000-4-11  CEI:2004
U (eff.)
T
100 %
70 %
0 %
t
d t
t
s
i
IEC  273/04
Légende
t
d Temps de diminution de la tension
t
i Temps d’augmentation de la tension
t
s Durée de la tension réduite
Figure 3 – Variation de tension
6 Instruments d'essai
6.1 Générateur d’essai
Les caractéristiques suivantes sont communes aux générateurs pour les creux de tension, les
coupures brèves et les variations de tension, sauf indication contraire.
Des exemples de générateurs sont indiqués à l’Annexe C.

Le générateur doit être équipé pour ne pas émettre d’importantes perturbations, qui, si elles
sont envoyées sur le réseau d’alimentation, peuvent influencer les résultats des essais.
Tout générateur produisant un creux de tension dont les caractéristiques sont supérieures ou
égales (en durée et en amplitude) à celles stipulées par la présente norme est autorisé.

– 24 – 61000-4-11  CEI:2004
6.1.1 Caractéristiques et performances du générateur

Tableau 4 – Spécifications du générateur

Tension de sortie à vide Comme stipulé dans le Tableau 1, ± 5 % de la valeur de

la tension résiduelle
Variation de la tension avec la charge à la sortie du

générateur
100 % de la sortie, 0 A à 16 A moins de 5 % de U
T
80 % de la sortie, 0 A à 20 A moins de 5 % de U
T
70 % de la sortie, 0 A à 23 A
moins de 5 % de U
T
40 % de la sortie, 0 A à 40 A
moins de 5 % de U
T
Courant de sortie admissible 16 A efficace par phase à la tension nominale. Le
générateur doit être capable de délivrer 20 A à 80 % de
la valeur nominale pendant une durée de 5 s. Il doit être
capable de délivrer 23 A à 70 % de la valeur nominale
et 40 A à 40 % de la valeur nominale pendant 3 s.
(Cette exigence peut être réduite en fonction du courant
d’alimentation en régime permanent nominal de l’EST,
voir Article A.3).
Valeur crête du courant d’appel (pas de condition Ne doit pas être limitée par le générateur. Toutefois, il
requise pour les essais de variation de tension) n'est pas nécessaire que la valeur crête du générateur
dépasse 1 000 A pour un réseau de 250 V à 600 V,
500 A pour
...

IEC 61000-4-11
Edition 2.0 2004-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-11: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests

Compatibilité électromagnétique (CEM) –
Partie 4-11: Techniques d'essai et de mesure – Essais d'immunité aux creux
de tension, coupures brèves et variations de tension

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IEC 61000-4-11
Edition 2.0 2004-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-11: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests

Compatibilité électromagnétique (CEM) –
Partie 4-11: Techniques d'essai et de mesure – Essais d'immunité aux creux
de tension, coupures brèves et variations de tension

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
U
CODE PRIX
ICS 33.100.20 ISBN 2-8318-7449-1

– 1 –
SC 77A/Publication 61000-4-11 (2004), Second edition/I-SH 01

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-11: Testing and measurement techniques –

Voltage dips, short interruptions and voltage variations immunity tests

INTERPRETATION SHEET 1
This interpretation sheet has been prepared by subcommittee 77A: Low frequency

phenomena, of IEC technical committee 77: Electromagnetic compatibility.
The text of this interpretation sheet is based on the following documents:
ISH Report on voting
77A/726/ISH 77A/731/RVD
Full information on the voting for the approval of this interpretation sheet can be found in the
report on voting indicated in the above table.
___________
Interpretation of the rise-time and fall-time requirements during EUT testing in IEC
61000-4-11:2004: Electromagnetic compatibility (EMC) – Part 4-11: Testing and
measurement techniques – Voltage dips, short interruptions and voltage variations
immunity tests.
1) In IEC 61000-4-11:2004, Table 4 does not apply to EUT (equipment under test) testing.
Table 4 is for generator calibration and design only.
2) With reference to Table 1 and Table 2, there is no requirement in 61000-4-11:2004 for
rise-time and fall-time when testing EUT; therefore, it is not necessary to measure these
parameters during tests.
3) With reference to Table 4, all of the requirements apply to design and calibration of the
generator. The requirements of Table 4 only apply when the load is a non-inductive 100 Ω
resistor. The requirements of Table 4 do not apply during EUT testing.

August 2010 ICS 33.100.20 French text overleaf

61000-4-11  IEC:2004 – 3 – – 2 – 61000-4-11 © IEC:2004

CONTENTS
FOREWORD.3

INTRODUCTION.5

1 Scope.6

2 Normative references.6

3 Terms and definitions .6

4 General.8

5 Test levels.8
6 Test instrumentation.12
7 Test set-up.14
8 Test procedures.15
9 Evaluation of test results.17
10 Test report.18

Annex A (normative) Test circuit details.19
Annex B (informative) Electromagnetic environment classes.22
Annex C (informative) Test instrumentation .23

Bibliography .26

Figure 1 – Voltage dip - Examples .11
Figure 2 – Short interruption.11
Figure 3 – Voltage variation.12
Figure 4 – Phase-to-neutral and phase-to-phase testing on three-phase systems.17
Figure A.1 – Circuit for determining the inrush current drive capability of the short
interruptions generator .20
Figure A.2 – Circuit for determining the peak inrush current requirement of an EUT .21
Figure C.1 – Schematics of test instrumentation for voltage dips, short interruptions
and voltage variations .24
Figure C.2 – Schematic of test instrumentation for three-phase voltage dips, short

interruptions and voltage variations using power amplifier.25

Table 1 – Preferred test level and durations for voltage dips .9
Table 2 – Preferred test level and durations for short interruptions.9
Table 3 – Timing of short-term supply voltage variations.10
Table 4 – Generator specifications .13

61000-4-11 © IEC:2004 61000-4-11  IEC:2004 – 5 – – 3 –

INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-11: Testing and measurement techniques –

Voltage dips, short interruptions and

voltage variations immunity tests

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 61000-4-11 has been prepared by subcommittee 77A: Low
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
This second edition cancels and replaces the first edition published in 1994 and its amendment
1 (2000). This second edition constitutes a technical revision in which
1) preferred test values and durations have been added for the different environment classes;
2) the tests for the three-phase systems have been specified.
It forms part 4-11 of IEC 61000. It has the status of a Basic EMC Publication in accordance
with IEC Guide 107.
61000-4-11  IEC:2004 – 7 – – 4 – 61000-4-11 © IEC:2004

The text of this standard is based on the following documents:

FDIS Report on voting
77A/452/FDIS 77A/455/RVD
Le rFull apporinfort de vote indiqué dansmation on the voting le tableau cfor the approval ofi-dessus this donne standartoute d cinfan be formation ound in the rsur le vote eporayant t on

abouti à l'approbation de cette norme.
voting indicated in the above table.

Cette publicThis publication a été ration has been drédigée safted in acelon lesc Dirordancectivese w ISOith the ISO/CEI, Par/IEC Dirtie 2. ectives, Part 2.

Le comité a décidé que le contenu de cette publication ne sera pas modifié avant 2008. A cette
The committee has decided that the contents of this publication will remain unchanged until
date, la public2008. At this date, the publication sera: ation will be
• reconduite;
• reconfirmed;
• supprimée;
• withdrawn;
• remplacée par une édition révisée, ou
• replaced by a revised edition, or
• amendée.
• amended.
The contents of the interpretation sheet 1 of August 2010 have been included in this copy.

61000-4-11 © IEC:2004 61000-4-11  IEC:2004 – 9 – – 5 –

INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:

Part 1: General
General considerations (introduction, fundamental principles)

Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as International Standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: 61000-6-1).

61000-4-11  IEC:2004 – 11 – – 6 – 61000-4-11 © IEC:2004

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-11: Testing and measurement techniques –

Voltage dips, short interruptions and

voltage variations immunity tests

1 Scope
This part of IEC 61000 defines the immunity test methods and range of preferred test levels
for electrical and electronic equipment connected to low-voltage power supply networks for
voltage dips, short interruptions, and voltage variations.
This standard applies to electrical and electronic equipment having a rated input current not
exceeding 16 A per phase, for connection to 50 Hz or 60 Hz a.c. networks.
It does not apply to electrical and electronic equipment for connection to 400 Hz a.c. networks.
Tests for these networks will be covered by future IEC standards.
The object of this standard is to establish a common reference for evaluating the immunity of
electrical and electronic equipment when subjected to voltage dips, short interruptions and
voltage variations.
NOTE Voltage fluctuation immunity tests are covered by IEC 61000-4-14.
The test method documented in this part of IEC 61000 describes a consistent method to
assess the immunity of equipment or a system against a defined phenomenon. As described in
IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As
also stated in Guide 107, the IEC product committees are responsible for determining whether
this immunity test standard should be applied or not, and, if applied, they are responsible for
defining the appropriate test levels. Technical committee 77 and its sub-committees are
prepared to co-operate with product committees in the evaluation of the value of particular
immunity tests for their products.
2 Normative references
The following referenced documents are indispensable for the application of this document. For

dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 61000-2-8, Electromagnetic compatibility (EMC) − Part 2-8: Environment − Voltage dips
and short interruptions on public electric power supply systems with statistical measurement
results
3 Terms and definitions
For the purpose of this document, the following terms and definitions apply:

61000-4-11 © IEC:2004 61000-4-11  IEC:2004 – 13 – – 7 –

3.1
basic EMC standard
standard giving general and fundamental conditions or rules for the achievement of EMC,

which are related or applicable to all products and systems and serve as reference documents

for product committees
NOTE As determined by the Advisory Committee on Electromagnetic Compatibility (ACEC) – see IEC Guide 107.

3.2
immunity (to a disturbance)
the ability of a device, equipment or system to perform without degradation in the presence of

an electromagnetic disturbance

[IEV 161-01-20]
3.3
voltage dip
a sudden reduction of the voltage at a particular point of an electricity supply system below a
specified dip threshold followed by its recovery after a brief interval
NOTE 1 Typically, a dip is associated with the occurrence and termination of a short circuit or other extreme
current increase on the system or installations connected to it.
NOTE 2 A voltage dip is a two-dimensional electromagnetic disturbance, the level of which is determined by both
voltage and time (duration).
3.4
short interruption
a sudden reduction of the voltage on all phases at a particular point of an electric supply
system below a specified interruption threshold followed by its restoration after a brief interval
NOTE Short interruptions are typically associated with switchgear operations related to the occurrence and
termination of short circuits on the system or on installations connected to it.
3.5
residual voltage (of voltage dip)
the minimum value of r.m.s. voltage recorded during a voltage dip or short interruption
NOTE The residual voltage may be expressed as a value in volts or as a percentage or per unit value relative to
the reference voltage.
3.6
malfunction
the termination of the ability of equipment to carry out intended functions or the execution of
unintended functions by the equipment

3.7
calibration
method to prove that the measurement equipment is in compliance with its specifications
NOTE For the purposes of this standard, calibration is applied to the test generator.
3.8
verification
set of operations which is used to check the test equipment system (e.g. the test generator
and the interconnecting cables) to demonstrate that the test system is functioning within the
specifications given in Clause 6
NOTE 1 The methods used for verification may be different from those used for calibration.
NOTE 2 The verification procedure of 6.1.2 is meant as a guide to insure the correct operation of the test
generator, and other items making up the test set-up that the intended waveform is delivered to the EUT.

61000-4-11  IEC:2004 – 15 – – 8 – 61000-4-11 © IEC:2004

4 General
Electrical and electronic equipment may be affected by voltage dips, short interruptions or

voltage variations of power supply.

Voltage dips and short interruptions are caused by faults in the network, primarily short circuits

(see also IEC 61000-2-8), in installations or by sudden large changes of load. In certain cases,

two or more consecutive dips or interruptions may occur. Voltage variations are caused by

continuously varying loads connected to the network.

These phenomena are random in nature and can be minimally characterized for the purpose of
laboratory simulation in terms of the deviation from the rated voltage and duration.
Consequently, different types of tests are specified in this standard to simulate the effects of
abrupt voltage change. These tests are to be used only for particular and justified cases,
under the responsibility of product specification or product committees.
It is the responsibility of the product committees to establish which phenomena among the
ones considered in this standard are relevant and to decide on the applicability of the test.
5 Test levels
The voltages in this standard use the rated voltage for the equipment (U ) as a basis for
T
voltage test level specification.
Where the equipment has a rated voltage range the following shall apply:
− if the voltage range does not exceed 20 % of the lower voltage specified for the rated
voltage range, a single voltage within that range may be specified as a basis for test level
specification (U );
T
− in all other cases, the test procedure shall be applied for both the lowest and highest
voltages declared in the voltage range;
− guidance for the selection of test levels and durations is given in IEC 61000-2-8.
5.1 Voltage dips and short interruptions
The change between U and the changed voltage is abrupt. The step can start and stop at any
T
phase angle on the mains voltage. The following test voltage levels (in % U ) are used: 0 %,
T
40 %, 70 % and 80 %, corresponding to dips with residual voltages of 0 %, 40 %, 70 % and

80 %.
For voltage dips, the preferred test levels and durations are given in Table 1, and an example
is shown in Figure 1a) and Figure 1b).
For short interruptions, the preferred test levels and durations are given in Table 2, and an
example is shown in Figure 2.
The preferred test levels and durations given in Tables 1 and 2 take into account the
information given in IEC 61000-2-8.
The preferred test levels in Table 1 are reasonably severe, and are representative of many real
world dips, but are not intended to guarantee immunity to all voltage dips. More severe dips, for
example 0 % for 1 s and balanced three-phase dips, may be considered by product
committees.
61000-4-11 © IEC:2004 61000-4-11  IEC:2004 – 17 – – 9 –

The voltage rise time, t , and voltage fall time, t , during abrupt changes are indicated in
r f
Table 4.
The levels and durations shall be given in the product specification. A test level of 0 %
corresponds to a total supply voltage interruption. In practice, a test voltage level from 0 % to

20 % of the rated voltage may be considered as a total interruption.

Shorter durations in the table, in particular the half-cycle, should be tested to be sure that the

equipment under test (EUT) operates within the performance limits specified for it.

When setting performance criteria for disturbances of 0,5 period duration for products with a

mains transformer, product committees should pay particular attention to effects which may
result from inrush currents. For such products, these may reach 10 to 40 times the rated
current because of magnetic flux saturation of the transformer core after the voltage dip.
Table 1 – Preferred test level and durations for voltage dips
a
Class Test level and durations for voltage dips (t ) (50 Hz/60 Hz)
s
Class 1 Case-by-case according to the equipment requirements
c
Class 2 0 % during 0 % during 70 % during 25/30 cycles
½ cycle 1 cycle
Class 3 0 % during 0 % during 40 % during 70 % during 80 % during
c c c
½ cycle 1 cycle 10/12 cycles 25/30 cycles 250/300 cycles
b
Class X X X X X X
a
Classes as per IEC 61000-2-4; see Annex B.
b
To be defined by product committee. For equipment connected directly or indirectly to the public network, the
levels must not be less severe than Class 2.
c
"25/30 cycles" means "25 cycles for 50 Hz test" and "30 cycles for 60 Hz test".

Table 2 – Preferred test level and durations for short interruptions
a
Class Test level and durations for short interruptions (t ) (50 Hz/60 Hz)
s
Class 1 Case-by-case according to the equipment requirements
c
Class 2 0 % during 250/300 cycles
c
Class 3 0 % during 250/300 cycles
b
Class X X
a
Classes as per IEC 61000-2-4; see Annex B.
b
To be defined by product committee. For equipment connected directly or indirectly to the public network, the
levels must not be less severe than Class 2.
c
"250/300 cycles" means "250 cycles for 50 Hz test" and "300 cycles for 60 Hz test".

61000-4-11  IEC:2004 – 19 – – 10 – 61000-4-11 © IEC:2004

5.2 Voltage variations (optional)

This test considers a defined transition between rated voltage U and the changed voltage.
T
NOTE The voltage change takes place over a short period, and may occur due to change of load.

The preferred duration of the voltage changes and the time for which the reduced voltages are
to be maintained are given in Table 3. The rate of change should be constant; however, the

voltage may be stepped. The steps should be positioned at zero crossings, and should be no

larger than 10 % of U . Steps under 1 % of U are considered as constant rates of change of
T T
voltage.
Table 3 – Timing of short-term supply voltage variations
Voltage test level Time for decreasing Time at reduced Time for increasing
voltage (t ) voltage(t ) voltage (t ) (50 Hz/60 Hz)
d s i
b
70 % Abrupt 1 cycle 25/30 cycles
a a a a
X X X X
a
To be defined by product committee.
b
"25/30 cycles" means "25 cycles for 50 Hz test" and "30 cycles for 60 Hz test".

This shape is the typical shape of a motor starting.
Figure 3 shows the r.m.s. voltage as a function of time. Other values may be taken in justified
cases and shall be specified by the product committee.
U
t  (periods)
05 25
IEC  270/04
NOTE The voltage decreases to 70 % for 25 periods. Step at zero crossing.
Figure 1a) – Voltage dip – 70 % voltage dip sine wave graph

61000-4-11 © IEC:2004 61000-4-11  IEC:2004 – 21 – – 11 –

U (r.m.s.)
T
100 %
40 %
0 %
t
f t t
s r
IEC  271/04
Key
t Voltage rising time
r
t Voltage fall time
f
t Time at reduced voltage
s
Figure 1b) – Voltage dip – 40 % voltage dip r.m.s. graph

Figure 1 – Voltage dip - Examples
U
T (r.m.s.)
100 %
0 %
t
t
f t
s
r
IEC  272/04
Key
t Voltage rising time
r
t Voltage fall time
f
t Time at reduced voltage
s
Figure 2 – Short interruption
61000-4-11  IEC:2004 – 23 – – 12 – 61000-4-11 © IEC:2004

U (r.m.s.)
T
100 %
70 %
0 %
t
d t
s t
i
IEC  273/04
Key
t Time for decreasing voltage
d
t Time for increasing voltage
i
t Time at reduced voltage
s
Figure 3 – Voltage variation
6 Test instrumentation
6.1 Test generator
The following features are common to the generator for voltage dips, short interruptions and
voltage variations, except as indicated.
Examples of generators are given in Annex C.
The generator shall have provision to prevent the emission of heavy disturbances, which, if
injected in the power supply network, may influence the test results.

Any generator creating a voltage dip of equal or more severe characteristics (amplitude and
duration) than that prescribed by the present standard is permitted.

61000-4-11 © IEC:2004 61000-4-11  IEC:2004 – 25 – – 13 –

6.1.1 Characteristics and performance of the generator

Table 4 – Generator specifications

Output voltage at no load As required in Table 1, ± 5 % of residual voltage value

Voltage change with load at the output of the generator

100 % output, 0 A to 16 A less than 5 % of U
T
80 % output 0 A to 20 A less than 5 % of U
T
70 % output, 0 A to 23 A less than 5 % of U
T
40 % output, 0 A to 40 A
less than 5 % of U
T
Output current capability 16 A r.m.s. per phase at rated voltage. The generator
shall be capable of carrying 20 A at 80 % of rated value
for a duration of 5 s. It shall be capable of carrying 23 A
at 70 % of rated voltage and 40 A at 40 % of rated
voltage for a duration of 3 s. (This requirement may be
reduced according to the EUT rated steady-state supply
current, see Clause A.3).
Peak inrush current capability (no requirement for Not to be limited by the generator. However, the
voltage variation tests) maximum peak capability of the generator need not
exceed 1 000 A for 250 V to 600 V mains, 500 A for
200 V to 240 V mains, or 250 A for 100 V to 120 V
mains.
Instantaneous peak overshoot/undershoot of the Less than 5 % of U
T
actual voltage, generator loaded with 100 Ω resistive
load
Voltage rise (and fall) time t (and t ), see Figures 1b)
Between 1 μs and 5 μs
r f
and 2, during abrupt change, generator loaded with
100 Ω resistive load
Phase shifting (if necessary) 0° to 360°
Phase relationship of voltage dips and interruptions Less than +10 °
with the power frequency
Zero crossing control of the generators ±10°

Output impedance shall be predominantly resistive.
The output impedance of the test voltage generator shall be low even during transitions (for
example, less than 0,4 + j0,25 Ω).
NOTE 1 The 100 Ω resistive load used to test the generator should not have additional inductivity.
NOTE 2 To test equipment which regenerates energy, an external resistor connected in parallel to the load can be
added. The test result must not be influenced by this load.

6.1.2 Verification of the characteristics of the voltage dips, short interruptions
generators
In order to compare the test results obtained from different test generators, the generator
characteristics shall be verified according to the following:
– the 100 %, 80 %, 70 % and 40 % r.m.s. output voltages of the generator shall conform to
those percentages of the selected operating voltage: 230 V, 120 V, etc.;
– the 100 %, 80 %, 70 % and 40 % r.m.s. output voltages of the generator shall be measured
at no load, and shall be maintained within a specified percentage of the U ;
T
61000-4-11  IEC:2004 – 27 – – 14 – 61000-4-11 © IEC:2004

– load regulation shall be verified at nominal load current at each of the output voltages and

the variation shall not exceed 5 % of the nominal power supply voltage at 100 %, 80 %,

70 % and 40 % of the nominal power supply voltage.

For output voltage of 80 % of the nominal value, the above requirements need only be verified

for a maximum of 5 s duration.

For output voltages of 70 % and 40 % of the nominal value, the above requirements need only
be verified for a maximum of 3 s duration.

If it is necessary to verify the peak inrush drive current capability, the generator shall be
switched from 0 % to 100 % of full output, when driving a load consisting of a suitable rectifier
with an uncharged capacitor whose value is 1 700 μF on the d.c. side. The test shall be carried
out at phase angles of both 90° and 270°. The circuit required to measure generator inrush
current drive capability is given in Figure A.1.
When it is believed that a generator with less than the specified standard generator peak
inrush current may be used because the EUT may draw less than the specified standard
generator peak inrush current (e.g., 500 A for 220 V-240 V mains), this shall first be confirmed
by measuring the EUT peak inrush current. When power is applied from the test generator,
measured EUT peak inrush current shall be less than 70 % of the peak current drive capability
of the generator, as already verified according to Annex A. The actual EUT inrush current shall
be measured both from a cold start and after a 5 s turn-off, using the procedure of Clause A.3.
Generator switching characteristics shall be measured with a 100 Ω load of suitable power-
dissipation rating.
NOTE The 100 Ω resistive load used to test the generator should not have additional inductivity.
Rise and fall time, as well as overshoot and undershoot, shall be verified for switching at both
90° and 270°, from 0 % to 100 %, 100 % to 80 %, 100 % to 70 %, 100 % to 40 %, and 100 % to
0 %.
Phase angle accuracy shall be verified for switching from 0 % to 100 % and 100 % to 0 %, at
nine phase angles from 0° to 360° in 45° increments. It shall also be verified for switching
from 100 % to 80 % and 80 % to 100 %, 100 % to 70 % and 70 % to 100 %, as well as from
100 % to 40 % and 40 % to 100 %, at 90° and 180°.
The voltage generators shall, preferably, be recalibrated at defined time periods in accordance
with a recognized quality assurance system.
6.2 Power source
The frequency of the test voltage shall be within ± 2% of rated frequency.
7 Test set-up
The test shall be performed with the EUT connected to the test generator with the shortest
power supply cable as specified by the EUT manufacturer. If no cable length is specified, it
shall be the shortest possible length suitable to the application of the EUT.

61000-4-11 © IEC:2004 61000-4-11  IEC:2004 – 29 – – 15 –

The test set-ups for the three types of phenomena described in this standard are:

– voltage dips;
– short interruptions;
– voltage variations with gradual transition between the rated voltage and the changed

voltage (option).
Examples of test set-ups are given in Annex C.

Figure C.1a) shows a schematic for the generation of voltage dips, short interruptions and
voltage variations with gradual transition between rated and changed voltage using a

generator with internal switching, and Figure C.1b) using a generator and a power amplifier.
Figure C.2 shows a schematic for the generation of voltage dips, short interruptions and
voltage variations using a generator and a power amplifier for three-phase equipment.
8 Test procedures
Before starting the test of a given EUT, a test plan shall be prepared.
The test plan should be representative of the way the system is actually used.
Systems may require a precise pre-analysis to define which system configurations must be
tested to reproduce field situations.
Test cases must be explained and indicated in the Test report.
It is recommended that the test plan include the following items:
– the type designation of the EUT;
– information on possible connections (plugs, terminals, etc.) and corresponding cables, and
peripherals;
– input power port of equipment to be tested;
– representative operational modes of the EUT for the test;
– performance criteria used and defined in the technical specifications;
– operational mode(s) of equipment;
– description of the test set-up.

If the actual operating signal sources are not available to the EUT, they may be simulated.
For each test, any degradation of performance shall be recorded. The monitoring equipment
should be capable of displaying the status of the operational mode of the EUT during and after
the tests. After each group of tests, a full functional check shall be performed.

61000-4-11  IEC:2004 – 31 – – 16 – 61000-4-11 © IEC:2004

8.1 Laboratory reference conditions

8.1.1 Climatic conditions
Unless otherwise specified by the committee responsible for the generic or product standard,

the climatic conditions in the laboratory shall be within any limits specified for the operation of

the EUT and the test equipment by their respective manufacturers.

Tests shall not be performed if the relative humidity is so high as to cause condensation on the

EUT or the test equipment.
NOTE Where it is considered that there is sufficient evidence to demonstrate that the effects of the phenomenon

covered by this standard are influenced by climatic conditions, this should be brought to the attention of the
committee responsible for this standard.
8.1.2 Electromagnetic conditions
The electromagnetic conditions of the laboratory shall be such as to guarantee the correct
operation of the EUT in order not to influence the test results.
8.2 Execution of the test
During the tests, the mains voltage for testing shall be monitored within an accuracy of 2 %.
8.2.1 Voltage dips and short interruptions
The EUT shall be tested for each selected combination of test level and duration with a
sequence of three dips/interruptions with intervals of 10 s minimum (between each test event).
Each representative mode of operation shall be tested.
For voltage dips, changes in supply voltage shall occur at zero crossings of the voltage, and at
additional angles considered critical by product committees or individual product specifications
preferably selected from 45°, 90°, 135°, 180°, 225°, 270° and 315° on each phase.
For short interruptions, the angle shall be defined by the product committee as the worst case.
In the absence of definition, it is recommended to use 0° for one of the phases.
For the short interruption test of three-phase systems, all the three phases shall be
simultaneously tested as per 5.1.
For the voltage dips test of single-phase systems, the voltage shall be tested as per 5.1. This
implies one series of tests.
For the voltage dips test of three-phase systems with neutral, each individual voltage (phase-

to-neutral and phase-to-phase) shall be tested, one at a time, as per 5.1. This implies six
different series of tests. See Figure 4b).
For the voltage dips test of three-phase systems without neutral, each phase-to-phase voltage
shall be tested, one at a time, as per 5.1. This implies three different series of tests. See
Figure 4b).
NOTE For three-phase systems, during a dip on a phase-to-phase voltage a change will occur on one or two of the
other voltages as well.
For EUTs with more than one power cord, each power cord should be tested individually.

61000-4-11 © IEC:2004 61000-4-11  IEC:2004 – 33 – – 17 –

70 %
70 %
70 %
IEC  274/04
NOTE Phase-to-neutral testing on three-phase systems is performed one phase at a time.

Figure 4a) – Phase-to-neutral testing on three-phase systems
70 %
70 %
(A) (B)
IEC  275/04
NOTE Phase-to-phase testing on three-phase phase systems is also performed one phase at a time. Both (A) and
(B) show a 70 % dip. (A) is preferred, but (B) is also acceptable.
Figure 4b) – Phase-to-phase testing on three-phase systems
Figure 4 – Phase-to-neutral and phase-to-phase testing on three-phase systems
8.2.2 Voltage variations (optional)
The EUT is tested to each of the specified voltage variations, three times at 10 s interval for
the most representative modes of operations.
9 Evaluation of test results
The test results shall be classified in terms of the loss of function or degradation of
performance of the equipment under test, relative to a performance level defined by its
manufacturer or the requestor of the test, or agreed between the manufacturer and the
purchaser of the product. The recommended classification is as follows:

a) normal performance within limits specified by the manufacturer, requestor or purchaser;
b) temporary loss of function or degradation of performance which ceases after the
disturbance ceases, and from which the equipment under test recovers its normal
performance, without operator intervention;
c) temporary loss of function or degradation of performance, the correction of which requires
operator intervention;
d) loss of function or degradation of performance which is not recoverable, owing to damage
to hardware or software, or loss of data.
The manufacturer's specification may define effects on the EUT which may be considered
insignificant, and therefore acceptable.

61000-4-11  IEC:2004 – 35 – – 18 – 61000-4-11 © IEC:2004

This classification may be used as a guide in formulating performance criteria, by committees
responsible for generic, product and product-family standards, or as a framework for the

agreement on performance criteria between the manufacturer and the purchaser, for example

where no suitable generic, product or product-family standard exists.

NOTE The performance levels may be different for voltage dip tests and short interruption tests as well as for
voltage variations tests, if this optional test has been required.

10 Test report
The test report shall contain all the information necessary to reproduce the test. In particular,

the following shall be recorded:
– the items specified in the test plan required by Clause 8;
– identification of the EUT and any associated equipment, e.g. brand name, product type,
serial number;
– identification of the test equipment, e.g. brand name, product type, serial number;
– any special environmental conditions in which the test was performed, for example shielded
enclosure;
– any specific con
...

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Edition 2.1 2017-05
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Part 4-11: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests

Compatibilité électromagnétique (CEM) –
Partie 4-11: Techniques d'essai et de mesure – Essais d'immunité aux creux de
tension, coupures brèves et variations de tension

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IEC 61000-4-11 ®
Edition 2.1 2017-05
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE
Electromagnetic compatibility (EMC) –

Part 4-11: Testing and measurement techniques – Voltage dips, short

interruptions and voltage variations immunity tests

Compatibilité électromagnétique (CEM) –

Partie 4-11: Techniques d'essai et de mesure – Essais d'immunité aux creux de

tension, coupures brèves et variations de tension

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.20 ISBN 978-2-8322-4402-9

IEC 61000-4-11 ®
Edition 2.1 2017-05
CONSOLIDATED VERSION
REDLINE VERSION
VERSION REDLINE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE
Electromagnetic compatibility (EMC) –
Part 4-11: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests

Compatibilité électromagnétique (CEM) –
Partie 4-11: Techniques d'essai et de mesure – Essais d'immunité aux creux de
tension, coupures brèves et variations de tension

– 1 –
SC 77A/Publication 61000-4-11 (2004), Second edition/I-SH 01
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-11: Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations immunity tests

INTERPRETATION SHEET 1
This interpretation sheet has been prepared by subcommittee 77A: Low frequency
phenomena, of IEC technical committee 77: Electromagnetic compatibility.
The text of this interpretation sheet is based on the following documents:
ISH Report on voting
77A/726/ISH 77A/731/RVD
Full information on the voting for the approval of this interpretation sheet can be found in the
report on voting indicated in the above table.
___________
Interpretation of the rise-time and fall-time requirements during EUT testing in IEC
61000-4-11:2004: Electromagnetic compatibility (EMC) – Part 4-11: Testing and
measurement techniques – Voltage dips, short interruptions and voltage variations
immunity tests.
1) In IEC 61000-4-11:2004, Table 4 does not apply to EUT (equipment under test) testing.
Table 4 is for generator calibration and design only.
2) With reference to Table 1 and Table 2, there is no requirement in 61000-4-11:2004 for
rise-time and fall-time when testing EUT; therefore, it is not necessary to measure these
parameters during tests.
3) With reference to Table 4, all of the requirements apply to design and calibration of the
generator. The requirements of Table 4 only apply when the load is a non-inductive 100 Ω
resistor. The requirements of Table 4 do not apply during EUT testing.

August 2010 ICS 33.100.20 French text overleaf

– 22 – IEC 61000-4-11:2004+AMD1:2017 CSV
 IEC 2017
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 General . 8
5 Test levels . 8
6 Test instrumentation . 12
7 Test set-up . 14
8 Test procedures . 15
9 Evaluation of test results . 17
10 Test report . 18
Annex A (normative) Test circuit details . 19
Annex B (informative) Electromagnetic environment classes . 22
Annex C (informative) Test instrumentation . 23
Annex D (informative) Rationale for generator specification regarding voltage, rise-time
and fall-time, and inrush current capability . 26
Bibliography . 29

Figure 1 – Voltage dip - Examples . 11
Figure 2 – Short interruption . 11
Figure 3 – Voltage variation . 12
Figure 4 – Phase-to-neutral and phase-to-phase testing on three-phase systems . 17
Figure A.1 – Circuit for determining the inrush current drive capability of the short
interruptions generator . 20
Figure A.2 – Circuit for determining the peak inrush current requirement of an EUT . 21
Figure C.1 – Schematics of test instrumentation for voltage dips, short interruptions

and voltage variations . 24
Figure C.2 – Schematic of test instrumentation for three-phase voltage dips, short
interruptions and voltage variations using power amplifier . 25

Table 1 – Preferred test level and durations for voltage dips . 9
Table 2 – Preferred test level and durations for short interruptions . 9
Table 3 – Timing of short-term supply voltage variations . 10
Table 4 – Generator specifications . 13

 IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-11: Testing and measurement techniques –
Voltage dips, short interruptions and
voltage variations immunity tests
FOREWORD
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This consolidated version of the official IEC Standard and its amendment has been prepared
for user convenience.
IEC 61000-4-11 edition 2.1 contains the second edition (2004-03) [documents 77A/452/FDIS and
77A/455/RVD] and its interpretation sheet 1 (2010-08), and its amendment 1 (2017-05)
[documents 77A/951/FDIS and 77A/961/RVD].
In this Redline version, a vertical line in the margin shows where the technical content is
modified by amendment 1. Additions are in green text, deletions are in strikethrough red text. A
separate Final version with all changes accepted is available in this publication.

– 44 – IEC 61000-4-11:2004+AMD1:2017 CSV
 IEC 2017
International Standard IEC 61000-4-11 has been prepared by subcommittee 77A: Low
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
This second edition constitutes a technical revision in which
1) preferred test values and durations have been added for the different environment classes;
2) the tests for the three-phase systems have been specified.
It forms part 4-11 of IEC 61000. It has the status of a Basic EMC Publication in accordance
with IEC Guide 107.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of the base publication and its amendment will
remain unchanged until the stability date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.

 IEC 2017
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as International Standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: 61000-6-1).

– 66 – IEC 61000-4-11:2004+AMD1:2017 CSV
 IEC 2017
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-11: Testing and measurement techniques –
Voltage dips, short interruptions and
voltage variations immunity tests

1 Scope
This part of IEC 61000 defines the immunity test methods and range of preferred test levels
for electrical and electronic equipment connected to low-voltage power supply networks for
voltage dips, short interruptions, and voltage variations.
This standard applies to electrical and electronic equipment having a rated input current not
exceeding 16 A per phase, for connection to 50 Hz or 60 Hz a.c. networks.
It does not apply to electrical and electronic equipment for connection to 400 Hz a.c. networks.
Tests for these networks will be covered by future IEC standards.
The object of this standard is to establish a common reference for evaluating the immunity of
electrical and electronic equipment when subjected to voltage dips, short interruptions and
voltage variations.
NOTE Voltage fluctuation immunity tests are covered by IEC 61000-4-14.
The test method documented in this part of IEC 61000 describes a consistent method to
assess the immunity of equipment or a system against a defined phenomenon. As described in
IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As
also stated in Guide 107, the IEC product committees are responsible for determining whether
this immunity test standard should be applied or not, and, if applied, they are responsible for
defining the appropriate test levels. Technical committee 77 and its sub-committees are
prepared to co-operate with product committees in the evaluation of the value of particular
immunity tests for their products.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 61000-2-8, Electromagnetic compatibility (EMC) − Part 2-8: Environment − Voltage dips
and short interruptions on public electric power supply systems with statistical measurement
results
3 Terms and definitions
For the purpose of this document, the following terms and definitions apply:

 IEC 2017
3.1
basic EMC standard
standard giving general and fundamental conditions or rules for the achievement of EMC,
which are related or applicable to all products and systems and serve as reference documents
for product committees
NOTE As determined by the Advisory Committee on Electromagnetic Compatibility (ACEC) – see IEC Guide 107.
3.2
immunity (to a disturbance)
the ability of a device, equipment or system to perform without degradation in the presence of
an electromagnetic disturbance
[IEV 161-01-20]
3.3
voltage dip
a sudden reduction of the voltage at a particular point of an electricity supply system below a
specified dip threshold followed by its recovery after a brief interval
NOTE 1 Typically, a dip is associated with the occurrence and termination of a short circuit or other extreme
current increase on the system or installations connected to it.
NOTE 2 A voltage dip is a two-dimensional electromagnetic disturbance, the level of which is determined by both
voltage and time (duration).
3.4
short interruption
a sudden reduction of the voltage on all phases at a particular point of an electric supply
system below a specified interruption threshold followed by its restoration after a brief interval
NOTE Short interruptions are typically associated with switchgear operations related to the occurrence and
termination of short circuits on the system or on installations connected to it.
3.5
residual voltage (of voltage dip)
the minimum value of r.m.s. voltage recorded during a voltage dip or short interruption
NOTE The residual voltage may be expressed as a value in volts or as a percentage or per unit value relative to
the reference voltage.
3.6
malfunction
the termination of the ability of equipment to carry out intended functions or the execution of
unintended functions by the equipment
3.7
calibration
method to prove that the measurement equipment is in compliance with its specifications
NOTE For the purposes of this standard, calibration is applied to the test generator.
3.8
verification
set of operations which is used to check the test equipment system (e.g. the test generator
and the interconnecting cables) to demonstrate that the test system is functioning within the
specifications given in Clause 6
NOTE 1 The methods used for verification may be different from those used for calibration.
NOTE 2 The verification procedure of 6.1.2 is meant as a guide to insure the correct operation of the test
generator, and other items making up the test set-up that the intended waveform is delivered to the EUT.

– 88 – IEC 61000-4-11:2004+AMD1:2017 CSV
 IEC 2017
4 General
Electrical and electronic equipment may be affected by voltage dips, short interruptions or
voltage variations of power supply.
Voltage dips and short interruptions are caused by faults in the network, primarily short circuits
(see also IEC 61000-2-8), in installations or by sudden large changes of load. In certain cases,
two or more consecutive dips or interruptions may occur. Voltage variations are caused by
continuously varying loads connected to the network.
These phenomena are random in nature and can be minimally characterized for the purpose of
laboratory simulation in terms of the deviation from the rated voltage and duration.
Consequently, different types of tests are specified in this standard to simulate the effects of
abrupt voltage change. These tests are to be used only for particular and justified cases,
under the responsibility of product specification or product committees.
It is the responsibility of the product committees to establish which phenomena among the
ones considered in this standard are relevant and to decide on the applicability of the test.
5 Test levels
The voltages in this standard use the rated voltage for the equipment (U ) as a basis for
T
voltage test level specification.
Where the equipment has a rated voltage range the following shall apply:
− if the voltage range does not exceed 20 % of the lower voltage specified for the rated
voltage range, a single voltage within that range may be specified as a basis for test level
specification (U );
T
− in all other cases, the test procedure shall be applied for both the lowest and highest
voltages declared in the voltage range;
− guidance for the selection of test levels and durations is given in IEC 61000-2-8.
5.1 Voltage dips and short interruptions
The change between U and the changed voltage is abrupt. The step can start and stop at any
T
phase angle on the mains voltage. The following test voltage levels (in % U ) are used: 0 %,
T
40 %, 70 % and 80 %, corresponding to dips with residual voltages of 0 %, 40 %, 70 % and
80 %.
For voltage dips, the preferred test levels and durations are given in Table 1, and an example
is shown in Figure 1a) and Figure 1b).
For short interruptions, the preferred test levels and durations are given in Table 2, and an
example is shown in Figure 2.
The preferred test levels and durations given in Tables 1 and 2 take into account the
information given in IEC 61000-2-8.
The preferred test levels in Table 1 are reasonably severe, and are representative of many real
world dips, but are not intended to guarantee immunity to all voltage dips. More severe dips, for
example 0 % for 1 s and balanced three-phase dips, may be considered by product
committees.
 IEC 2017
The voltage rise time, t , and voltage fall time, t , during abrupt changes are indicated in
r f
Table 4.
The levels and durations shall be given in the product specification. A test level of 0 %
corresponds to a total supply voltage interruption. In practice, a test voltage level from 0 % to
20 % of the rated voltage may be considered as a total interruption.
Shorter durations in the table, in particular the half-cycle, should be tested to be sure that the
equipment under test (EUT) operates within the performance limits specified for it.
When setting performance criteria for disturbances of 0,5 period duration for products with a
mains transformer, product committees should pay particular attention to effects which may
result from inrush currents. For such products, these may reach 10 to 40 times the rated
current because of magnetic flux saturation of the transformer core after the voltage dip.
Table 1 – Preferred test level and durations for voltage dips
a
Class Test level and durations for voltage dips (t ) (50 Hz/60 Hz)
s
Class 1 Case-by-case according to the equipment requirements
c
Class 2 0 % during 0 % during 70 % during 25/30 cycles
½ cycle 1 cycle
Class 3 0 % during 0 % during 40 % during 70 % during 80 % during
c c c
½ cycle 1 cycle 10/12 cycles 25/30 cycles 250/300 cycles
b
Class X X X X X X
a
Classes as per IEC 61000-2-4; see Annex B.
b
To be defined by product committee. For equipment connected directly or indirectly to the public network, the
levels must not be less severe than Class 2.
c
"25/30 cycles" means "25 cycles for 50 Hz test" and "30 cycles for 60 Hz test".

Table 2 – Preferred test level and durations for short interruptions
a
Class Test level and durations for short interruptions (t ) (50 Hz/60 Hz)
s
Class 1 Case-by-case according to the equipment requirements
c
Class 2 0 % during 250/300 cycles
c
Class 3 0 % during 250/300 cycles
b
Class X X
a
Classes as per IEC 61000-2-4; see Annex B.
b
To be defined by product committee. For equipment connected directly or indirectly to the public network, the
levels must not be less severe than Class 2.
c
"250/300 cycles" means "250 cycles for 50 Hz test" and "300 cycles for 60 Hz test".

– 1010 – IEC 61000-4-11:2004+AMD1:2017 CSV
 IEC 2017
5.2 Voltage variations (optional)
This test considers a defined transition between rated voltage U and the changed voltage.
T
NOTE The voltage change takes place over a short period, and may occur due to change of load.
The preferred duration of the voltage changes and the time for which the reduced voltages are
to be maintained are given in Table 3. The rate of change should be constant; however, the
voltage may be stepped. The steps should be positioned at zero crossings, and should be no
larger than 10 % of U . Steps under 1 % of U are considered as constant rates of change of
T T
voltage.
Table 3 – Timing of short-term supply voltage variations
Voltage test level Time for decreasing Time at reduced Time for increasing
voltage (t ) voltage(t ) voltage (t ) (50 Hz/60 Hz)
d s i
b
70 % Abrupt 1 cycle 25/30 cycles
a a a a
X X X X
a
To be defined by product committee.
b
"25/30 cycles" means "25 cycles for 50 Hz test" and "30 cycles for 60 Hz test".

This shape is the typical shape of a motor starting.
Figure 3 shows the r.m.s. voltage as a function of time. Other values may be taken in justified
cases and shall be specified by the product committee.
U
t  (periods)
0 5 25
IEC  270/04
NOTE The voltage decreases to 70 % for 25 periods. Step at zero crossing.
Figure 1a) – Voltage dip – 70 % voltage dip sine wave graph

 IEC 2017
U (r.m.s.)
T
100 %
40 %
0 %
t
f t t
s r
IEC  271/04
Key
t Voltage rising time
r
t Voltage fall time
f
t Time at reduced voltage
s
Figure 1b) – Voltage dip – 40 % voltage dip r.m.s. graph

Figure 1 – Voltage dip - Examples
U
T (r.m.s.)
100 %
0 %
t
f t t
s
r
IEC  272/04
Key
t Voltage rising time
r
t Voltage fall time
f
t Time at reduced voltage
s
Figure 2 – Short interruption
– 1212 – IEC 61000-4-11:2004+AMD1:2017 CSV
 IEC 2017
U (r.m.s.)
T
100 %
70 %
0 %
t
d t
s t
i
IEC  273/04
Key
t Time for decreasing voltage
d
t Time for increasing voltage
i
t Time at reduced voltage
s
Figure 3 – Voltage variation
6 Test instrumentation
6.1 Test generator
The following features are common to the generator for voltage dips, short interruptions and
voltage variations, except as indicated.
Examples of generators are given in Annex C.
The generator shall have provision to prevent the emission of heavy disturbances, which, if
injected in the power supply network, may influence the test results.
Any generator creating a voltage dip of equal or more severe characteristics (amplitude and
duration) than that prescribed by the present standard is permitted.

 IEC 2017
6.1.1 Characteristics and performance of the generator
Table 4 – Generator specifications
Output voltage at no load As required in Table 1, ± 5 % of residual voltage value
Voltage change with load at the output of the generator
100 % output, 0 A to 16 A
less than 5 % of U
T
80 % output 0 A to 20 A less than 5 % of U
T
70 % output, 0 A to 23 A less than 5 % of U
T
40 % output, 0 A to 40 A
less than 5 % of U
T
Output current capability 16 A r.m.s. per phase at rated voltage. The generator
shall be capable of carrying 20 A at 80 % of rated value
for a duration of 5 s. It shall be capable of carrying 23 A
at 70 % of rated voltage and 40 A at 40 % of rated
voltage for a duration of 3 s. (This requirement may be
reduced according to the EUT rated steady-state supply
current, see Clause A.3).
Peak inrush current capability (no requirement for Not to be limited by the generator. However, the
voltage variation tests) maximum peak capability of the generator need not
exceed 1 000 A for 250 V to 600 V mains, 500 A for
200 V to 240 V mains, or 250 A for 100 V to 120 V
mains.
Instantaneous peak overshoot/undershoot of the Less than 5 % of U
T
actual voltage, generator loaded with 100 Ω resistive
load
Voltage rise (and fall) time t (and t ), see Figures 1b) Between 1 µs and 5 µs
r f
and 2, during abrupt change, generator loaded with
100 Ω resistive load
Phase shifting (if necessary) 0° to 360°
Phase relationship of voltage dips and interruptions Less than +10 °
with the power frequency
Zero crossing control of the generators ±10°

Output impedance shall be predominantly resistive.
The output impedance of the test voltage generator shall be low even during transitions (for
example, less than 0,4 + j0,25 Ω).
NOTE 1 The 100 Ω resistive load used to test the generator should not have additional inductivity.
NOTE 2 To test equipment which regenerates energy, an external resistor connected in parallel to the load can be
added. The test result must not be influenced by this load.
6.1.2 Verification of the characteristics of the voltage dips, short interruptions
generators
In order to compare the test results obtained from different test generators, the generator
characteristics shall be verified according to the following:
– the 100 %, 80 %, 70 % and 40 % r.m.s. output voltages of the generator shall conform to
those percentages of the selected operating voltage: 230 V, 120 V, etc.;
– the 100 %, 80 %, 70 % and 40 % r.m.s. output voltages of the generator shall be measured
at no load, and shall be maintained within a specified percentage of the U ;
T
– load regulation shall be verified at nominal load current at each of the output voltages and
the variation shall not exceed 5 % of the nominal power supply voltage at 100 %, 80 %,
70 % and 40 % of the nominal power supply voltage.

– 1414 – IEC 61000-4-11:2004+AMD1:2017 CSV
 IEC 2017
For output voltage of 80 % of the nominal value, the above requirements need only be verified
for a maximum of 5 s duration.
For output voltages of 70 % and 40 % of the nominal value, the above requirements need only
be verified for a maximum of 3 s duration.
If it is necessary to verify the peak inrush drive current capability, the generator shall be
switched from 0 % to 100 % of full output, when driving a load consisting of a suitable rectifier
with an uncharged capacitor whose value is 1 700 µF on the d.c. side. The test shall be carried
out at phase angles of both 90° and 270°. The circuit required to measure generator inrush
current drive capability is given in Figure A.1.
When it is believed that a generator with less than the specified standard generator peak
inrush current may be used because the EUT may draw less than the specified standard
generator peak inrush current (e.g., 500 A for 220 V-240 V mains), this shall first be confirmed
by measuring the EUT peak inrush current. When power is applied from the test generator,
measured EUT peak inrush current shall be less than 70 % of the peak current drive capability
of the generator, as already verified according to Annex A. The actual EUT inrush current shall
be measured both from a cold start and after a 5 s turn-off, using the procedure of Clause A.3.
Generator switching characteristics shall be measured with a 100 Ω load of suitable power-
dissipation rating.
NOTE The 100 Ω resistive load used to test the generator should not have additional inductivity.
Rise and fall time, as well as overshoot and undershoot, shall be verified for switching at both
90° and 270°, from 0 % to 100 %, 100 % to 80 %, 100 % to 70 %, 100 % to 40 %, and 100 % to
0 %.
Phase angle accuracy shall be verified for switching from 0 % to 100 % and 100 % to 0 %, at
nine phase angles from 0° to 360° in 45° increments. It shall also be verified for switching
from 100 % to 80 % and 80 % to 100 %, 100 % to 70 % and 70 % to 100 %, as well as from
100 % to 40 % and 40 % to 100 %, at 90° and 180°.
The voltage generators shall, preferably, be recalibrated at defined time periods in accordance
with a recognized quality assurance system.
6.2 Power source
The frequency of the test voltage shall be within ± 2% of rated frequency.
7 Test set-up
The test shall be performed with the EUT connected to the test generator with the shortest
power supply cable as specified by the EUT manufacturer. If no cable length is specified, it
shall be the shortest possible length suitable to the application of the EUT.
The test set-ups for the three types of phenomena described in this standard are:
– voltage dips;
– short interruptions;
– voltage variations with gradual transition between the rated voltage and the changed
voltage (option).
Examples of test set-ups are given in Annex C.

 IEC 2017
Figure C.1a) shows a schematic for the generation of voltage dips, short interruptions and
voltage variations with gradual transition between rated and changed voltage using a
generator with internal switching, and Figure C.1b) using a generator and a power amplifier.
Figure C.2 shows a schematic for the generation of voltage dips, short interruptions and
voltage variations using a generator and a power amplifier for three-phase equipment.
8 Test procedures
Before starting the test of a given EUT, a test plan shall be prepared.
The test plan should be representative of the way the system is actually used.
Systems may require a precise pre-analysis to define which system configurations must be
tested to reproduce field situations.
Test cases must be explained and indicated in the Test report.
It is recommended that the test plan include the following items:
– the type designation of the EUT;
– information on possible connections (plugs, terminals, etc.) and corresponding cables, and
peripherals;
– input power port of equipment to be tested;
– representative operational modes of the EUT for the test;
– performance criteria used and defined in the technical specifications;
– operational mode(s) of equipment;
– description of the test set-up.
If the actual operating signal sources are not available to the EUT, they may be simulated.
For each test, any degradation of performance shall be recorded. The monitoring equipment
should be capable of displaying the status of the operational mode of the EUT during and after
the tests. After each group of tests, a full functional check shall be performed.
8.1 Laboratory reference conditions
8.1.1 Climatic conditions
Unless otherwise specified by the committee responsible for the generic or product standard,
the climatic conditions in the laboratory shall be within any limits specified for the operation of
the EUT and the test equipment by their respective manufacturers.
Tests shall not be performed if the relative humidity is so high as to cause condensation on the
EUT or the test equipment.
NOTE Where it is considered that there is sufficient evidence to demonstrate that the effects of the phenomenon
covered by this standard are influenced by climatic conditions, this should be brought to the attention of the
committee responsible for this standard.
8.1.2 Electromagnetic conditions
The electromagnetic conditions of the laboratory shall be such as to guarantee the correct
operation of the EUT in order not to influence the test results.

– 1616 – IEC 61000-4-11:2004+AMD1:2017 CSV
 IEC 2017
8.2 Execution of the test
During the tests, the mains voltage for testing shall be monitored within an accuracy of 2 %.
8.2.1 Voltage dips and short interruptions
The EUT shall be tested for each selected combination of test level and duration with a
sequence of three dips/interruptions with intervals of 10 s minimum (between each test event).
Each representative mode of operation shall be tested.
For voltage dips, changes in supply voltage shall occur at zero crossings of the voltage, and at
additional angles considered critical by product committees or individual product specifications
preferably selected from 45°, 90°, 135°, 180°, 225°, 270° and 315° on each phase.
For short interruptions, the angle shall be defined by the product committee as the worst case.
In the absence of definition, it is recommended to use 0° for one of the phases.
For the short interruption test of three-phase systems, all the three phases shall be
simultaneously tested as per 5.1.
For the voltage dips test of single-phase systems, the voltage shall be tested as per 5.1. This
implies one series of tests.
For the voltage dips test of three-phase systems with neutral, each individual voltage (phase-
to-neutral and phase-to-phase) shall be tested, one at a time, as per 5.1. This implies six
different series of tests. See Figure 4b).
For the voltage dips test of three-phase systems without neutral, each phase-to-phase voltage
shall be tested, one at a time, as per 5.1. This implies three different series of tests. See
Figure 4b).
NOTE For three-phase systems, during a dip on a phase-to-phase voltage a change will occur on one or two of the
other voltages as well.
For EUTs with more than one power cord, each power cord should be tested individually.

 IEC 2017
70 %
70 %
70 %
IEC  274/04
NOTE Phase-to-neutral testing on three-phase systems is performed one phase at a time.
Figure 4a) – Phase-to-neutral testing on three-phase systems
70 %
70 %
(A) (B)
IEC  275/04
NOTE Phase-to-phase testing on three-phase phase systems is also performed one phase at a time. Both (A) and
(B) show a 70 % dip. (A) is preferred, but (B) is also acceptable.
Figure 4b) – Phase-to-phase testing on three-phase systems
Figure 4 – Phase-to-neutral and phase-to-phase testing on three-phase systems
8.2.2 Voltage variations (optional)
The EUT is tested to each of the specified voltage variations, three times at 10 s interval for
the most representative modes of operations.
9 Evaluation of test results
The test results shall be classified in terms of the loss of function or degradation of
performance of the equipme
...