IEC 61000-4-11:2004/ISH1:2010
(Main)Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
Feuille d'interprétation 1 - Compatibilité électromagnétique (CEM) - Partie 4-11: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et variations de tension
General Information
- Status
- Published
- Publication Date
- 26-Aug-2010
- Technical Committee
- SC 77A - EMC - Low frequency phenomena
- Current Stage
- DELPUB - Deleted Publication
- Start Date
- 28-Jan-2020
- Completion Date
- 13-Feb-2026
Relations
- Effective Date
- 05-Sep-2023
- Effective Date
- 05-Sep-2023
IEC 61000-4-11:2004/ISH1:2010 - Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests Released:8/27/2010
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Frequently Asked Questions
IEC 61000-4-11:2004/ISH1:2010 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests". This standard covers: Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
IEC 61000-4-11:2004/ISH1:2010 is classified under the following ICS (International Classification for Standards) categories: 33.100.20 - Immunity. The ICS classification helps identify the subject area and facilitates finding related standards.
IEC 61000-4-11:2004/ISH1:2010 has the following relationships with other standards: It is inter standard links to IEC 61000-4-11:2004, IEC 61000-4-11:2020. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
IEC 61000-4-11:2004/ISH1:2010 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
– 1 –
SC 77A/Publication 61000-4-11 (2004), Second edition/I-SH 01
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-11: Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations immunity tests
INTERPRETATION SHEET 1
This interpretation sheet has been prepared by subcommittee 77A: Low frequency
phenomena, of IEC technical committee 77: Electromagnetic compatibility.
The text of this interpretation sheet is based on the following documents:
ISH Report on voting
77A/726/ISH 77A/731/RVD
Full information on the voting for the approval of this interpretation sheet can be found in the
report on voting indicated in the above table.
___________
Interpretation of the rise-time and fall-time requirements during EUT testing in IEC
61000-4-11:2004: Electromagnetic compatibility (EMC) – Part 4-11: Testing and
measurement techniques – Voltage dips, short interruptions and voltage variations
immunity tests.
1) In IEC 61000-4-11:2004, Table 4 does not apply to EUT (equipment under test) testing.
Table 4 is for generator calibration and design only.
2) With reference to Table 1 and Table 2, there is no requirement in 61000-4-11:2004 for
rise-time and fall-time when testing EUT; therefore, it is not necessary to measure these
parameters during tests.
3) With reference to Table 4, all of the requirements apply to design and calibration of the
generator. The requirements of Table 4 only apply when the load is a non-inductive 100 Ω
resistor. The requirements of Table 4 do not apply during EUT testing.
August 2010 ICS 33.100.20 French text overleaf
– 2 –
SC 77A/Publication 61000-4-11 (2004), Deuxième édition/I-SH 01
COMPATIBILITE ELECTROMAGNETIQUE (CEM) –
...




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