Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests

Feuille d'interprétation 1 - Compatibilité électromagnétique (CEM) - Partie 4-11: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et variations de tension

General Information

Status
Published
Publication Date
26-Aug-2010
Current Stage
DELPUB - Deleted Publication
Start Date
28-Jan-2020
Completion Date
13-Feb-2026

Relations

Effective Date
05-Sep-2023
Effective Date
05-Sep-2023
Standard

IEC 61000-4-11:2004/ISH1:2010 - Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests Released:8/27/2010

English and French language
10 pages
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Frequently Asked Questions

IEC 61000-4-11:2004/ISH1:2010 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests". This standard covers: Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests

Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests

IEC 61000-4-11:2004/ISH1:2010 is classified under the following ICS (International Classification for Standards) categories: 33.100.20 - Immunity. The ICS classification helps identify the subject area and facilitates finding related standards.

IEC 61000-4-11:2004/ISH1:2010 has the following relationships with other standards: It is inter standard links to IEC 61000-4-11:2004, IEC 61000-4-11:2020. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.

IEC 61000-4-11:2004/ISH1:2010 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.

Standards Content (Sample)


– 1 –
SC 77A/Publication 61000-4-11 (2004), Second edition/I-SH 01

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-11: Testing and measurement techniques –

Voltage dips, short interruptions and voltage variations immunity tests

INTERPRETATION SHEET 1
This interpretation sheet has been prepared by subcommittee 77A: Low frequency

phenomena, of IEC technical committee 77: Electromagnetic compatibility.
The text of this interpretation sheet is based on the following documents:
ISH Report on voting
77A/726/ISH 77A/731/RVD
Full information on the voting for the approval of this interpretation sheet can be found in the
report on voting indicated in the above table.
___________
Interpretation of the rise-time and fall-time requirements during EUT testing in IEC
61000-4-11:2004: Electromagnetic compatibility (EMC) – Part 4-11: Testing and
measurement techniques – Voltage dips, short interruptions and voltage variations
immunity tests.
1) In IEC 61000-4-11:2004, Table 4 does not apply to EUT (equipment under test) testing.
Table 4 is for generator calibration and design only.
2) With reference to Table 1 and Table 2, there is no requirement in 61000-4-11:2004 for
rise-time and fall-time when testing EUT; therefore, it is not necessary to measure these
parameters during tests.
3) With reference to Table 4, all of the requirements apply to design and calibration of the
generator. The requirements of Table 4 only apply when the load is a non-inductive 100 Ω
resistor. The requirements of Table 4 do not apply during EUT testing.

August 2010 ICS 33.100.20 French text overleaf

– 2 –
SC 77A/Publication 61000-4-11 (2004), Deuxième édition/I-SH 01

COMPATIBILITE ELECTROMAGNETIQUE (CEM) –
...

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