IEC 60384-1:2016

IEC 60384-1 ®
Edition 5.0 2016-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 1: Generic specification
Condensateurs fixes utilisés dans les équipements électroniques –
Partie 1: Spécification générique

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IEC 60384-1 ®
Edition 5.0 2016-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –

Part 1: Generic specification
Condensateurs fixes utilisés dans les équipements électroniques –

Partie 1: Spécification générique

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.060 ISBN 978-2-8322-3153-1

– 2 – IEC 60384-1:2016  IEC 2016
CONTENTS
FOREWORD . 9
INTRODUCTION . 11
1 General . 13
1.1 Scope . 13
1.2 Normative references . 13
2 Technical data . 15
2.1 Symbols, units and abbreviated terms . 15
2.1.1 General . 15
2.1.2 Letter symbols . 15
2.1.3 Abbreviations . 16
2.2 Terms and definitions . 16
2.3 Preferred values and additional technical requirements . 21
2.3.1 General . 21
2.3.2 Preferred values of nominal capacitance . 21
2.3.3 Preferred values of rated voltage . 21
2.3.4 Rated a.c. load . 21
2.3.5 Rated pulse load . 22
2.3.6 Temperature derated voltage . 22
2.4 Marking . 23
2.4.1 General . 23
2.4.2 Coding . 23
3 Quality assessment procedures . 23
4 Tests and measurement procedures . 24
4.1 General . 25
4.2 Standard atmospheric conditions . 25
4.2.1 Standard atmospheric conditions for testing . 25
4.2.2 Recovery conditions . 25
4.2.3 Referee conditions . 26
4.2.4 Reference conditions . 26
4.3 Drying . 26
4.4 Visual examination and check of dimensions . 26
4.4.1 Visual examination . 26
4.4.2 Dimensions (gauging) . 26
4.4.3 Dimensions (detail) . 26
4.5 Insulation resistance . 27
4.5.1 Preconditioning . 27
4.5.2 Measuring conditions . 27
4.5.3 Test points . 27
4.5.4 Test methods . 27
4.5.5 Temperature compensation . 28
4.5.6 Conditions to be prescribed in the relevant specification . 28
4.6 Voltage proof . 29
4.6.1 General . 29
4.6.2 Test circuit (for the test between terminations) . 29
4.6.3 Test . 30
4.6.4 Requirements . 32

4.6.5 Conditions to be prescribed in the relevant specification . 32
4.7 Capacitance . 32
4.7.1 Measuring frequency and measuring voltage . 32
4.7.2 Measuring equipment . 33
4.7.3 Conditions to be prescribed in the relevant specification . 33
4.8 Tangent of loss angle and equivalent series resistance (ESR) . 33
4.8.1 Tangent of loss angle . 33
4.8.2 Equivalent series resistance (ESR) . 33
4.9 Leakage current . 34
4.9.1 Preconditioning . 34
4.9.2 Test method . 34
4.9.3 Power source . 34
4.9.4 Measuring accuracy . 34
4.9.5 Test circuit . 34
4.9.6 Conditions to be prescribed in the relevant specification . 34
4.10 Impedance . 34
4.11 Self-resonant frequency and inductance . 35
4.11.1 Self-resonant frequency (f ) . 35
r
4.11.2 Inductance . 38
4.11.3 Conditions to be prescribed in the relevant specification . 38
4.12 Outer foil termination . 38
4.13 Robustness of terminations . 39
4.13.1 General . 39
4.13.2 Test Ua – Tensile . 39
4.13.3 Test Ub – Bending (half of the sample) . 40
4.13.4 Test Uc – Torsion (remaining sample) . 40
4.13.5 Test Ud – Torque . 40
4.13.6 Visual examination . 40
4.14 Resistance to soldering heat . 41
4.14.1 Preconditioning and initial measurement . 41
4.14.2 Test procedure . 41
4.14.3 Recovery . 41
4.14.4 Final inspection, measurement and requirements . 41
4.15 Solderability . 41
4.15.1 General . 41
4.15.2 Preconditioning . 41
4.15.3 Test procedure . 42
4.15.4 Final inspection, measurements and requirements . 42
4.16 Rapid change of temperature . 42
4.16.1 Initial measurement . 42
4.16.2 Test procedure . 42
4.16.3 Final inspection, measurements and requirements . 42
4.17 Vibration . 42
4.17.1 Initial measurement . 42
4.17.2 Test procedure . 43
4.17.3 Electrical test (intermediate measurement) . 43
4.17.4 Final inspection, measurements and requirements . 43
4.18 Bump (repetitive shock) . 43
4.18.1 Initial measurement . 43

– 4 – IEC 60384-1:2016  IEC 2016
4.18.2 Test procedure . 43
4.18.3 Final inspection, measurements and requirements . 43
4.19 Shock . 43
4.19.1 Initial measurement . 43
4.19.2 Test procedure . 43
4.19.3 Final inspection, measurements and requirements . 44
4.20 Container sealing . 44
4.21 Climatic sequence . 44
4.21.1 General . 44
4.21.2 Initial measurements . 44
4.21.3 Dry heat . 44
4.21.4 Damp heat, cyclic, Test Db, first cycle . 44
4.21.5 Cold . 44
4.21.6 Low air pressure . 45
4.21.7 Damp heat, cyclic, Test Db, remaining cycles . 45
4.21.8 Final measurements . 45
4.22 Damp heat, steady state . 45
4.22.1 Initial measurement . 45
4.22.2 Test procedure . 45
4.22.3 Final inspection, measurements and requirements . 46
4.23 Endurance . 46
4.23.1 Initial measurements . 46
4.23.2 Test procedure . 46
4.23.3 Conditions to be prescribed in the relevant specification . 46
4.23.4 Test voltage . 46
4.23.5 Placement in the test chamber . 47
4.23.6 Recovery . 47
4.23.7 Final inspection, measurements and requirements . 47
4.24 Variation of capacitance with temperature . 48
4.24.1 Static method . 48
4.24.2 Dynamic method . 48
4.24.3 Methods of calculation . 49
4.25 Storage . 50
4.25.1 Storage at high temperature . 50
4.25.2 Storage at low temperature . 50
4.26 Surge . 51
4.26.1 Initial measurement . 51
4.26.2 Test procedure . 51
4.26.3 Final inspection, measurements and requirements . 52
4.26.4 Information to be given in the relevant detail specification . 52
4.27 Charge and discharge tests and inrush current test . 52
4.27.1 Initial measurement . 52
4.27.2 Test procedure . 52
4.27.3 Charge and discharge . 53
4.27.4 Inrush current . 54
4.27.5 Final inspection, measurements and requirements . 54
4.28 Pressure relief (for aluminium electrolytic capacitors) . 54
4.28.1 General . 54
4.28.2 AC test . 54

4.28.3 DC test . 54
4.28.4 Pneumatic test . 54
4.28.5 Final inspection, measurements and requirements . 54
4.29 Characteristics at high and low temperature . 54
4.29.1 Test procedure . 54
4.29.2 Requirements . 55
4.30 Thermal stability test . 55
4.31 Component solvent resistance . 55
4.31.1 Initial measurements . 55
4.31.2 Test procedure . 55
4.31.3 Final inspection, measurements and requirements . 55
4.32 Solvent resistance of marking . 55
4.32.1 Test procedure . 55
4.32.2 Final inspection, measurements and requirements . 56
4.33 Mounting (for surface mount capacitors only) . 56
4.33.1 Substrate . 56
4.33.2 Wave soldering . 56
4.33.3 Reflow soldering . 56
4.34 Shear test . 59
4.34.1 Test procedure . 59
4.34.2 Final inspection, measurements and requirements . 59
4.35 Substrate bending test . 59
4.35.1 Test procedure . 59
4.35.2 Recovery . 60
4.35.3 Final inspection and requirements . 60
4.36 Dielectric absorption . 60
4.36.1 Test procedure . 60
4.36.2 Requirement . 61
4.37 Damp heat, steady state, accelerated . 61
4.37.1 Initial measurements . 61
4.37.2 Test methods . 61
4.37.3 Test procedures . 61
4.37.4 Final inspection, measurements and requirements . 61
4.38 Passive flammability . 61
4.38.1 Test procedure . 61
4.38.2 Final inspection, measurements and requirements . 62
4.39 High surge current test . 62
4.39.1 Initial measurements . 62
4.39.2 Test procedure . 62
4.39.3 Requirements for the charging circuit . 63
4.39.4 Nonconforming items . 63
4.40 Voltage transient overload (for aluminium electrolytic capacitors with non-
solid electrolyte) . 63
4.40.1 Initial measurement . 63
4.40.2 Test procedure . 63
4.40.3 Final inspection, measurements and requirements . 65
4.40.4 Conditions to be prescribed in the relevant specification . 65
4.41 Whisker growth test . 65
4.41.1 General . 65

– 6 – IEC 60384-1:2016  IEC 2016
4.41.2 Preparation of specimen. 66
4.41.3 Initial measurement . 66
4.41.4 Test procedures . 66
4.41.5 Test severities . 66
4.41.6 Final inspection, measurements and requirements . 66
Annex A (informative) Interpretation of sampling plans and procedures as described in
IEC 60410 for use within quality assessment systems . 67
Annex B (informative) Rules for the preparation of detail specifications for capacitors
and resistors for electronic equipment for use within quality assessment systems . 68
B.1 Drafting . 68
B.2 Reference standard . 68
B.3 Circulation . 68
Annex C (informative) Layout of the first page of a PCP/CQC specification . 69
Annex D (informative) Requirements for capability approval test report . 70
D.1 General . 70
D.2 Requirements . 70
D.3 Summary of test information (for each CQC) . 70
D.4 Measurement record . 70
Annex E (informative) Guide for pulse testing of capacitors . 71
E.1 Overview. 71
E.2 Typical capacitor pulse conditions . 71
E.3 Effect of inductance on pulse testing . 72
Annex F (informative) Guidance for the extension of endurance tests on fixed
capacitors . 74
F.1 Overview. 74
F.2 Guidelines. 74
Annex G (normative) Damp heat, steady state with voltage applied, for metallized film
capacitors only . 75
G.1 Overview. 75
G.2 Test procedure . 75
Annex H (normative) Accelerated damp heat, steady state, for multilayer ceramic
capacitors only . 76
H.1 Mounting of capacitors . 76
H.2 Initial measurement . 76
H.3 Test procedure . 76
H.4 Recovery . 76
H.5 Final inspection, measurements and requirements . 76
Annex Q (informative) Quality assessment procedures . 77
Q.1 General . 77
Q.1.1 Scope of this annex . 77
Q.1.2 Quality assessment definitions . 78
Q.1.3 Rework . 78
Q.1.4 Alternative test methods . 79
Q.1.5 Certified test records of released lots . 79
Q.1.6 Unchecked parameters . 79
Q.1.7 Delayed delivery . 79
Q.1.8 Repair . 79
Q.1.9 Registration of approvals . 80
Q.1.10 Manufacture outside the geographical limits . 80

Q.2 Qualification approval (QA) procedures . 80
Q.2.1 Eligibility for qualification approval. 80
Q.2.2 Application for qualification approval . 80
Q.2.3 Subcontracting . 80
Q.2.4 Test procedure for the initial product qualification approval . 80
Q.2.5 Granting of qualification approval . 80
Q.2.6 Maintenance of qualification approval . 81
Q.2.7 Quality conformance inspection . 81
Q.3 Capability approval (CA) procedures . 81
Q.3.1 General . 81
Q.3.2 Eligibility for capability approval . 81
Q.3.3 Application for capability approval . 82
Q.3.4 Subcontracting . 82
Q.3.5 Description of the capability . 82
Q.3.6 Demonstration and verification of capability . 82
Q.3.7 Granting of capability approval . 82
Q.3.8 Maintenance of capability approval . 82
Q.3.9 Quality conformance inspection . 82
Q.4 Technology approval (TA) procedure . 83
Q.4.1 General . 83
Q.4.2 Eligibility for technology approval . 83
Q.4.3 Application of technology approval . 83
Q.4.4 Subcontracting . 83
Q.4.5 Description of technology . 83
Q.4.6 Demonstration and verification of the technology . 83
Q.4.7 Granting of technology approval . 84
Q.4.8 Maintenance of technology approval . 84
Q.4.9 Quality conformance inspection . 84
Bibliography . 85

Figure 1 – Reactive power against frequency . 22
Figure 2 – Relation between category temperature range and applied voltage . 23
Figure 3 – Voltage-proof test circuit . 30
Figure 4 – Schematic diagram of the impedance measuring circuit . 35
Figure 5 – Capacitor mounting arrangement . 36
Figure 6 – Capacitor mounting arrangement . 37
Figure 7 – Typical diagram of an absorption oscillator-wavemeter . 37
Figure 8 – Schematic diagram of the measuring circuit . 38
Figure 9 – Test circuit . 39
Figure 10 – Test circuit for electrolytic capacitors . 47
Figure 11 – Relay circuit . 51
Figure 12 – Thyristor circuit . 51
Figure 13 – Voltage waveform across capacitor . 52
Figure 14 – Voltage and current waveform . 53
Figure 15 – Suitable substrate for mechanical tests . 58
Figure 16 – Suitable substrate for electrical tests . 59

– 8 – IEC 60384-1:2016  IEC 2016
Figure 17 – High surge current test . 63
Figure 18 – Voltage transient overload test circuit . 64
Figure 19 – Voltage waveform . 65

Table 1 – Referee conditions. 26
Table 2 – Measurement of insulation resistance . 27
Table 3 – Measuring points . 29
Table 4 – Tensile force . 40
Table 5 – Torque . 40
Table 6 – Number of cycles . 45
Table 7 – Severities and requirements . 62

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 1: Generic specification
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