Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy

IEC 60747-5-16:2023 specifies the measuring method of flat-band voltage of single GaN-based light emitting diode (LED) die or package without phosphor, based on the photocurrent (PC) spectroscopy. White LEDs for lighting applications are out of the scope of this part of IEC 60747.

General Information

Status
Published
Publication Date
27-Mar-2023
Current Stage
PPUB - Publication issued
Start Date
25-Apr-2023
Completion Date
28-Mar-2023
Ref Project

Buy Standard

Standard
IEC 60747-5-16:2023 - Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy Released:3/28/2023
English language
17 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (Sample)


IEC 60747-5-16 ®
Edition 1.0 2023-03
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-16: Optoelectronic devices – Light emitting diodes – Test method of the
flat-band voltage of GaN-based light emitting diodes based on the photocurrent
spectroscopy
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Secretariat Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform IEC Products & Services Portal - products.iec.ch
The advanced search enables to find IEC publications by a Discover our powerful search engine and read freely all the
variety of criteria (reference number, text, technical publications previews. With a subscription you will always have
committee, …). It also gives information on projects, replaced access to up to date content tailored to your needs.
and withdrawn publications.
Electropedia - www.electropedia.org
IEC Just Published - webstore.iec.ch/justpublished
The world's leading online dictionary on electrotechnology,
Stay up to date on all new IEC publications. Just Published
containing more than 22 300 terminological entries in English
details all new publications released. Available online and once
and French, with equivalent terms in 19 additional languages.
a month by email.
Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Customer Service Centre - webstore.iec.ch/csc

If you wish to give us your feedback on this publication or need
further assistance, please contact the Customer Service
Centre: sales@iec.ch.
IEC 60747-5-16 ®
Edition 1.0 2023-03
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-16: Optoelectronic devices – Light emitting diodes – Test method of the

flat-band voltage of GaN-based light emitting diodes based on the photocurrent

spectroscopy
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-6677-9

– 2 – IEC 60747-5-16:2023 © IEC 2023
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and abbreviated terms . 5
3.1 Terms and definitions . 5
3.2 Abbreviated terms . 6
4 Measuring methods . 6
4.1 Basic requirements . 6
4.1.1 Measuring conditions . 6
4.1.2 Measuring instruments and equipment . 7
4.2 Purpose . 7
4.3 Measurement . 7
4.3.1 Measurement setup . 7
4.3.2 Measurement principle. 8
4.3.3 Measurement sequence . 9
5 Test report . 11
Annex A (informative) Test example. 12
Annex B (informative) Comparison of PC and ER spectroscopies . 15
Bibliography . 17

Figure 1 – Schematic diagram of the PC spectroscopy setup . 7
Figure 2 – Schematic illustration of the InGaN/GaN quantum well and the PC signal
under different bias voltages . 8
Figure 3 – Schematic illustration of how the differential PC signal behaves as the bias
voltage is decreased . 9
Figure 4 – Schematic illustration of the peak slope as a function of bias voltage . 9
Figure 5 – Sequence of the measurement of the flat-band voltage using the PC
spectroscopy . 10
Figure A.1 – Spectral radiant flux of the Xe lamp . 12
Figure A.2 – PC signal vs. wavelength at different bias voltages . 13
Figure A.3 – Differential PC signal vs. wavelength at different bias voltages . 13
Figure A.4 – Peak slope as a function of reverse-bias voltage . 14
Figure B.1 – ER signal vs. wavelength at different bias voltages . 16
Figure B.2 – Determination of the flat-band voltage from the peak values of the ER
signals . 16

Table A.1 – Summary of test report . 14

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 5-16: Optoelectronic devices – Light emitting diodes –
Test method of the flat-band voltage of GaN-based light emitting
diodes based on the photocurrent spectroscopy

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 60747-5-16 has been prepared by subcommittee 47E: Discrete semiconductor devices, of
IEC technical committee 47: Semiconductor devices. It is an International Standard.
The text of this International Standard is based on the following documents:
Draft Report on voting
47E/788/CDV 47E/797/RVC
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.

– 4 – IEC 60747-5-16:2023 © IEC 2023
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 60747 series, published under the general title Semiconductor
devices, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates that it
contains colours which are considered to be useful for the correct understanding of its
contents. Users should therefore print this document using a colour printer.

SEMICONDUCTOR DEVICES –
Part 5-16: Optoelectronic devices – Light emitting diodes –
Test method of the flat-band voltage of GaN-based light emitting
diodes based on the photocurrent spectroscopy

1 Scope
This part of IEC 60747 specifies the measuring method of flat-band voltage of single GaN-
based light emitting diode (LED) die or package without phosphor, based on the photocurrent
(PC) spectroscopy. White LEDs for lighting applications are out of the scope of this part of
IEC 60747.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60747‑5‑6:2021, Semiconductor devices – Part 5-6: Optoelectronic devices – Light emitting
diodes
IEC 60747-5-15:2022, Semiconductor devices – Part 5-15: Optoelectronic devices – Light
emitting diodes – Test method of the flat-band voltage based on the electroreflectance
spectroscopy
3 Terms, definitions and abbreviated terms
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
3.1 Terms and definitions
3.1.1
spectral radiant flux
Φλ()
e,λ
radiant flux per unit wavelength interval at a given wavelength (λ)
Note 1 to entry: Spectral radiant flux is typically denoted by Φ , which is equivalent to dΦdλ, and is usually
λ
expressed in units of watts per nm.
[SOURCE: IEC 62607-3-1:2014 [1] , 3.20, modified – A symbol has been added.]

Numbers in square brackets refer to the Bibliography.

---------------------
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.