IEC TS 61000-5-9:2009

IEC/TS 61000-5-9 ®
Edition 1.0 2009-07
TECHNICAL
SPECIFICATION
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 5-9: Installation and mitigation guidelines – System-level susceptibility
assessments for HEMP and HPEM
IEC/TS 61000-5-9:2009(E)
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IEC/TS 61000-5-9 ®
Edition 1.0 2009-07
TECHNICAL
SPECIFICATION
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 5-9: Installation and mitigation guidelines – System-level susceptibility
assessments for HEMP and HPEM
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XB
ICS 33.100.20 ISBN 978-2-88910-396-6
– 2 – TS 61000-5-9 © IEC:2009(E)
CONTENTS
FOREWORD.5
INTRODUCTION.7
1 Scope.8
2 Normative references .8
3 Terms and definitions .9
4 General .11
4.1 Introduction .11
4.2 Systems and subsystems .12
5 Interaction mechanisms and protection methods .13
5.1 General .13
5.2 Front-door coupling .13
5.3 Back-door coupling.13
5.4 Protection methods .14
6 Description of overall assessment methodology .14
6.1 Methodology.14
6.2 Subsystems and equipment characterization phase.16
6.3 System analysis phase.17
6.4 System test phase.17
6.4.1 General .17
6.4.2 Low-level tests .18
6.4.3 High-level testing.18
6.5 Susceptibility assessment phase .20
6.6 The use of reverberation chambers to characterise immunity .20
Annex A (informative) Classification of effect .24
Annex B (informative) Good measurement practice.27
Annex C (informative) Computational electromagnetics .30
Annex D (informative) System level assessment – HEMP .33
Annex E (informative) System level assessment – HPEM .35
Annex F (informative) Limitations.39
Annex G (informative) Detailed description of low-level techniques.42
Annex H (informative) Detailed description of high-level test techniques .54
Annex I (informative) Data processing and analysis .61
Bibliography.66

Figure 1 – Example system architecture .
Figure 2 – Example of radiated HPEM at high frequencies [3].14
Figure 3 – Methodology flowchart .15
Figure 4 – Reverberation chamber results: all effects.21
Figure 5 – Reverberation chamber results: susceptibilities.22
Figure 6 – Frequency spectrum of several HPEM sources .23
Figure A.1 – Classification of effect.24
Figure B.1 – Effect of adding ferrites to connecting cable: swept frequency example .27

TS 61000-5-9 © IEC:2009(E) – 3 –
Figure B.2 – Effect of adding ferrite to connecting cable: reverberation chamber
example.28
Figure B.3 – Effect of adding ferrite to connecting cable: transient example (time
domain) .28
Figure B.4 – Effect of adding ferrite to connecting cable: transient example (frequency
domain) .29
Figure E.1 – Steps taken in the system assessment .36
Figure E.2 – Maximum free-space separation distances.38
Figure E.3 – Critical regions for permanent damage.38
Figure G.1 – Electromagnetic interaction sequence diagram for a facility illuminated by
an external antenna .43
Figure G.2 – Illustration of the difference of a directed, narrow-beam antenna exciting
the facility with a spot beam, along with a plane wave providing illumination to the
entire facility .45
Figure G.3 – Measurement equipment and configuration for measuring transient
responses in a buried facility, as reported by [G-6] .47
Figure G.4 – Example of a measured transient cable current (a) and the resulting
spectral magnitude, as computed by a Fourier transform (b) .48
Figure G.5 – Plots of the analytical pulser output open circuit voltage waveform (a)
and spectral magnitude (b), which are used as reference for computing the transfer
function T .48
sc
Figure G.6 – The radiated E-field from the IRA at a distance of 6 meters for the
analytical pulser excitation (a) and the resulting spectral magnitude (b).49
Figure G.7 – The spectral magnitude of the computed transfer function T (a) and the
sc
corresponding transient transfer function (b).49
Figure G.8 – The spectral magnitude of the computed transfer function T (a) and the
ec
corresponding transient transfer function (b).50
Figure G.9 – LLCW reference field measurement.51
Figure G.10 – LLCW induced current measurement .51
Figure G.11 – Typical magnitude-only transfer function.52
Figure H.1 – Microwave injection testing of a low noise amplifier, LNA [H-2]. LNA at
the tip of the arrow.54
Figure H.2 – Aircraft testing at the Swedish Microwave Test Facility, MTF [H-3] .55
Figure H.3 – Measured shielding effectiveness of an equipment compared to the MTF
test frequencies (dashed bars) [3].56
Figure H.4 – Reverberation chamber .58
Figure I.1 – Prediction of induced current using magnitude-only transfer functions [I-1] .61
Figure I.2 – IEC 61000-2-9 HEMP Waveform .62
Figure I.3 – Convolution process.62
Figure I.4 – Predicted induced current .63
Figure I.5 – Comparison of transfer function predictions with simulator measurements .64
Figure I.6 – Extrapolation of measured transients .65

– 4 – TS 61000-5-9 © IEC:2009(E)
Table A.1 – Categorisation of effect by criticality.25
Table A.2 – Categorisation of effect duration .26
Table A.3 – Combination of criticality level and duration category.26
Table I.1 – Comparison of transfer function predictions and simulator measured
currents .63

TS 61000-5-9 © IEC:2009(E) – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 5-9: Installation and mitigation guidelines –
System-level susceptibility assessments for HEMP and HPEM

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