Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-1: Methods of measurement of disturbances and immunity - Conducted disturbance measurements

CISPR 16-2-1:2014 is designated a basic standard, which specifies the methods of measurement of disturbance phenomena in general in the frequency range 9 kHz to 18 GHz and especially of conducted disturbance phenomena in the frequency range 9 kHz to 30 MHz. With a CDNE, the frequency range is 9 kHz to 300 Hz. This third edition cancels and replaces the second edition published in 2008, Amendment 1:2010 and Amendment 2:2013. This edition constitutes a technical revision which includes added methods of measurement using a new type of ancillary equipment: the CDNE.
This consolidated version consists of the third edition (2014) and its amendment 1 (2017). Therefore, no need to order amendment in addition to this publication.
The contents of the corrigendum 1 of August 2020 have been included in this copy.
Key Words: electromagnetic compatibility, EMC, emissions, immunity

Spécifications des méthodes et des appareils de mesure des perturbations radioélectriques et de l'immunité aux perturbations radioélectriques - Partie 2-1: Méthodes de mesure des perturbations et de l'immunité - Mesures des perturbations conduites

La CISPR 16-2-1:2014 est une norme fondamentale qui spécifie les méthodes de mesure des phénomènes perturbateurs en général, dans la gamme de fréquences de 9 kHz à 18 GHz et spécialement les perturbations conduites dans la gamme de fréquences de 9 kHz à 30 MHz. Avec un CDNE, la gamme de fréquences est comprise entre 9 kHz et 300 Hz. Cette troisième édition annule et remplace la deuxième édition parue en 2008, l'Amendement 1:2010 et l'Amendement 2:2013. Cette édition constitue une révision technique qui inclut des méthodes de mesure utilisant un nouveau type d'équipement d'appoint dont l'acronyme est: CDNE. Mots clé: compatibilité électromagnétique, CEM, EMC, émissions, immunité
Le contenu du corrigendum 1 d'août 2020 a été pris en considération dans cet exemplaire.

General Information

Status
Published
Publication Date
25-Feb-2014
Current Stage
PPUB - Publication issued
Start Date
26-Feb-2014
Completion Date
31-Mar-2014
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Standard
CISPR 16-2-1:2014 - Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-1: Methods of measurement of disturbances and immunity - Conducted disturbance measurements
English and French language
223 pages
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CISPR 16-2-1:2014+AMD1:2017 CSV - Specification for radio disturbance and immunity measuring apparatus and methods - Part 2-1: Methods of measurement of disturbances and immunity - Conducted disturbance measurements Released:6/30/2017 Isbn:9782832245590
English and French language
464 pages
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CISPR 16-2-1 ®
Edition 3.0 2014-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE

COMITÉ INTERNATIONAL SPÉCIAL DES PERTURBATIONS RADIOÉLECTRIQUES

BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Specification for radio disturbance and immunity measuring apparatus and
methods –
Part 2-1: Methods of measurement of disturbances and immunity – Conducted
disturbance measurements
Spécifications des méthodes et des appareils de mesure des perturbations
radioélectriques et de l'immunité aux perturbations radioélectriques –
Partie 2-1: Méthodes de mesure des perturbations et de l'immunité – Mesures
des perturbations conduites
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CISPR 16-2-1 ®
Edition 3.0 2014-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE

COMITÉ INTERNATIONAL SPÉCIAL DES PERTURBATIONS RADIOÉLECTRIQUES

BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Specification for radio disturbance and immunity measuring apparatus and

methods –
Part 2-1: Methods of measurement of disturbances and immunity – Conducted

disturbance measurements
Spécifications des méthodes et des appareils de mesure des perturbations

radioélectriques et de l'immunité aux perturbations radioélectriques –

Partie 2-1: Méthodes de mesure des perturbations et de l'immunité – Mesures

des perturbations conduites
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XE
ICS 33.100.10, 33.100.20 ISBN 978-2-8322-1445-9

– 2 – CISPR 16-2-1:2014 © IEC 2014
CONTENTS
FOREWORD . 8
1 Scope . 10
2 Normative references . 10
3 Terms, definitions and abbreviations . 11
3.1 Terms and definitions . 11
3.2 Abbreviations . 16
4 Types of disturbance to be measured . 17
4.1 General . 17
4.2 Types of disturbance . 17
4.3 Detector functions . 17
5 Connection of measuring equipment . 18
5.1 General . 18
5.2 Connection of ancillary equipment . 18
5.3 Connections to RF reference ground . 18
5.4 Connection between the EUT and the artificial mains network . 19
6 General measurement requirements and conditions . 20
6.1 General . 20
6.2 Disturbance not produced by the equipment under test . 20
6.2.1 General . 20
6.2.2 Compliance testing . 20
6.3 Measurement of continuous disturbance . 20
6.3.1 Narrowband continuous disturbance . 20
6.3.2 Broadband continuous disturbance . 20
6.3.3 Use of spectrum analyzers and scanning receivers . 21
6.4 EUT arrangement and measurement conditions . 21
6.4.1 EUT arrangement . 21
6.4.2 Normal load conditions . 23
6.4.3 Duration of operation . 23
6.4.4 Running-in/warm-up time . 23
6.4.5 Supply . 24
6.4.6 Mode of operation . 24
6.4.7 Operation of multifunction equipment . 24
6.4.8 Determination of EUT arrangement(s) that maximize(s)
emissions . 24
6.4.9 Recording of measurement results . 24
6.5 Interpretation of measuring results . 24
6.5.1 Continuous disturbance . 24
6.5.2 Discontinuous disturbance . 25
6.5.3 Measurement of the duration of disturbances. 25
6.6 Measurement times and scan rates for continuous disturbance . 25
6.6.1 General . 25
6.6.2 Minimum measurement times . 25
6.6.3 Scan rates for scanning receivers and spectrum analyzers . 26
6.6.4 Scan times for stepping receivers . 27
6.6.5 Strategies for obtaining a spectrum overview using the peak
detector . 28

6.6.6 Timing considerations using FFT-based instruments . 31
7 Measurement of disturbances conducted along leads, 9 kHz to 30 MHz . 33
7.1 General . 33
7.2 Measuring equipment (receivers, etc.) . 33
7.2.1 General . 33
7.2.2 Use of detectors for conducted disturbance measurements . 33
7.3 Ancillary measuring equipment . 34
7.3.1 General . 34
7.3.2 Artificial networks (ANs) . 34
7.3.3 Voltage probes . 34
7.3.4 Current probes . 35
7.4 Equipment under test configuration . 35
7.4.1 Arrangement of the EUT and its connection to the AN . 35
7.4.2 Procedure for the measurement of unsymmetric disturbance
voltages with V-networks (AMNs) . 40
7.4.3 Measurement of common mode voltages at differential mode
signal terminals . 47
7.4.4 Measurements using voltage probes . 48
7.4.5 Measurement using a capacitive voltage probe (CVP) . 51
7.4.6 Measurements using current probes . 51
7.5 System test configuration for conducted emissions measurements . 51
7.5.1 General approach to system measurements . 51
7.5.2 System configuration . 52
7.5.3 Measurements of interconnecting lines . 54
7.5.4 Decoupling of system components . 55
7.6 In situ measurements . 55
7.6.1 General . 55
7.6.2 Reference ground . 55
7.6.3 Measurement with voltage probes . 56
7.6.4 Selection of measuring points . 56
8 Automated measurement of disturbances . 56
8.1 Precautions for automating measurements. 56
8.2 Generic measurement procedure . 57
8.3 Prescan measurements . 57
8.4 Data reduction . 58
8.5 Disturbance maximization and final measurement . 58
8.6 Post processing and reporting . 59
8.7 Disturbance measurement strategies with FFT-based measuring
instruments . 59
9 Test set-up and measurement procedure using the CDNE in the frequency range
30 MHz to 300 MHz . 59
9.1 General . 59
9.2 Test set-up . 60
9.3 Measurement procedure . 62
Annex A (informative) Guidelines for connection of electrical equipment to the artificial
mains network . 63
A.1 General . 63
A.2 Classification of the possible cases . 63
A.2.1 Well-shielded but poorly filtered EUT (Figures A.1 and A.2) . 63

– 4 – CISPR 16-2-1:2014 © IEC 2014
A.2.2 Well-filtered but incompletely shielded EUT (Figures A.3 and
A.4) . 64
A.2.3 Practical general case . 64
A.3 Method of grounding . 66
A.4 Conditions of grounding . 66
A.4.1 General . 66
A.4.2 Classification of typical testing conditions . 67
A.5 Connection of the AMN as a voltage probe . 68
Annex B (informative) Use of spectrum analyzers and scanning receivers . 70
B.1 General . 70
B.2 Overload . 70
B.3 Linearity test . 70
B.4 Selectivity . 70
B.5 Normal response to pulses . 70
B.6 Peak detection . 70
B.7 Frequency scan rate . 71
B.8 Signal interception . 71
B.9 Average detection . 71
B.10 Sensitivity . 71
B.11 Amplitude accuracy . 72
Annex C (informative) Decision tree for use of detectors for conducted disturbance
measurements . 73
Annex D (informative) Scan rates and measurement times for use with the average
detector . 75
D.1 General . 75
D.2 Suppression of impulsive disturbance . 75
D.2.1 General . 75
D.2.2 Suppression of impulsive disturbance by digital averaging . 76
D.3 Suppression of amplitude modulation . 76
D.4 Measurement of slowly intermittent, unsteady or drifting narrowband
disturbances . 76
D.5 Recommended procedure for automated or semi-automated
measurements . 78
Annex E (informative) Guidelines for the improvement of the test set-up with ANs . 79
E.1 In situ verification of the AN impedance and voltage division factor . 79
E.2 PE chokes and sheath current absorbers for the suppression of ground
loops . 82
Annex F (normative) Determination of suitability of spectrum analyzers for compliance
tests . 84
Annex G (informative) Basic guidance for measurements on telecommunications ports . 85
G.1 Limits . 85
G.2 Combination of current probe and capacitive voltage probe (CVP) . 86
G.3 Basic ideas of the capacitive voltage probe . 86
G.4 Combination of current limit and voltage limit . 87
G.5 Adjusting the TCM impedance with ferrites . 89
G.6 Ferrite specifications for use with methods of Annex H . 89
Annex H (normative) Specific guidance for conducted disturbance measurements on
telecommunication ports . 92
H.1 General . 92

H.2 Characteristics of AANs . 93
H.3 Characteristics of current probe . 94
H.4 Characteristics of capacitive voltage probe . 94
H.5 Procedures for common mode measurements . 94
H.5.1 General . 94
H.5.2 Measurement procedure using AANs . 94
H.5.3 Measurement procedure using a 150 Ω load connected to the
outside surface of the cable screen . 95
H.5.4 Measurement procedure using a combination of current probe
and capacitive voltage probe . 96
H.5.5 Measurement of cable, ferrite and AE common mode
impedance . 97
Annex I (informative) Examples of AANs and ANs for screened cables . 99
Bibliography . 108

Figure 1 – Example of a recommended test set-up with PE chokes with three AMNs
and a sheath current absorber on the RF cable . 19
Figure 2 – Measurement of a combination of a CW signal (“NB”) and an impulsive
signal (“BB”) using multiple sweeps with maximum hold . 28
Figure 3 – Example of a timing analysis . 29
Figure 4 – A broadband spectrum measured with a stepped receiver . 30
Figure 5 – Intermittent narrowband disturbances measured using fast short repetitive
sweeps with maximum hold function to obtain an overview of the disturbance spectrum . 30
Figure 6 – FFT scan in segments . 32
Figure 7 – Frequency resolution enhanced by FFT-based measuring instrument . 32
Figure 8 – Illustration of current I . 35
CCM
Figure 9 – Test configuration: table-top equipment for conducted disturbance
measurements on power mains . 37
Figure 10 – Arrangement of EUT and AMN at 40 cm distance, with a) vertical RGP
and b) horizontal RGP . 38
Figure 11 – Optional example test configuration for an EUT with only a power cord
attached . 38
Figure 12 – Test configuration: floor-standing equipment (see 7.4.1 and 7.5.2.3) . 39
Figure 13 – Example test configuration: floor-standing and table-top equipment (see
7.4.1 and 7.5.2.3) . 40
Figure 14 – Schematic of disturbance voltage measurement configuration (see also
7.5.2.3) . 42
Figure 15 – Equivalent circuit for measurement of unsymmetric disturbance voltage for
safety-class I (grounded) EUT. 43
Figure 16 – Equivalent circuit for measurement of unsymmetric disturbance voltage for
safety-class II (ungrounded) EUT . 44
Figure 17 – RC element for artificial hand . 46
Figure 18 – Portable electric drill with artificial hand . 46
Figure 19 – Portable electric saw with artificial hand . 46
Figure 20 – Measuring example for voltage probes . 49
Figure 21 – Measurement arrangement for two-terminal regulating controls . 50
Figure 22 – Generic process to help reduce measurement time . 57
Figure 23 – Test set-up for measurement of an EUT with one cable . 61

– 6 – CISPR 16-2-1:2014 © IEC 2014
Figure 24 – Test set-up for measurement of an EUT with two cables connected
adjacent surfaces of the EUT . 61
Figure 25 – Test set-up for measurement of an EUT with two cables connected on the
same surface of the EUT . 62
Figure A.1 – Basic schematic of well-shielded but poorly filtered EUT . 63
Figure A.2 – Detail of well-shielded but poorly filtered EUT . 64
Figure A.3 – Well-filtered but incompletely shielded EUT . 64
Figure A.4 – Well-filtered but incompletely shielded EUT, with U reduced to zero . 64
Figure A.5 – Disturbance supply through shielded conductors . 65
Figure A.6 – Disturbance supply through unshielded but filtered conductors . 65
Figure A.7 – Disturbance supply through ordinary conductors . 66
Figure A.8 – AMN configurations . 68
Figure C.1 – Decision tree for optimizing speed of conducted disturbance
measurements with peak, quasi-peak and average detectors . 73
Figure D.1 – Weighting function of a 10 ms pulse for peak (“PK”) and average
detections with (“CISPR AV”) and without (“AV”) peak reading; meter time constant
160 ms. 77
Figure D.2 – Weighting functions of a 10 ms pulse for peak (“PK”) and average
detections with (“CISPR AV”) and without (“AV”) peak reading; meter time constant
100 ms. 77
Figure D.3 – Example of weighting functions (of a 1 Hz pulse) for peak (“PK”) and
average detections as a function of pulse width; meter time constant 160 ms . 78
Figure D.4 – Example of weighting functions (of a 1 Hz pulse) for peak (“PK”) and
average detections as a function of pulse width; meter time constant 100 ms . 78
Figure E.1 – Parallel resonance of enclosure capacitance and ground strap
inductance . 79
Figure E.2 – Connection of an AMN to RGP using a wide grounding sheet for low
inductance grounding . 80
Figure E.3 – Impedance measured with the arrangement of Figure E.2 both with
reference to the front panel ground and to the grounding sheet . 80
Figure E.4 – VDF in the configuration of Figure E.2 measured with reference to the
front panel ground and to the grounding sheet . 80
Figure E.5 – Arrangement showing the measurement grounding sheet (shown with
dotted lines) when measuring the impedance with reference to RGP . 81
Figure E.6 – Impedance measured with the arrangement of Figure E.5 with reference
to the RGP . 81
Figure E.7 – VDF measured with parallel resonances in the AMN grounding . 81
Figure E.8 – Attenuation of a sheath current absorber measured in a 150 Ω test
arrangement . 82
Figure E.9 – Arrangement for the measurement of attenuation due to PE chokes and
sheath current absorbers . 83
Figure G.1 – Basic circuit for considering the limits with a defined TCM impedance of
150 Ω. 88
Figure G.2 – Basic circuit for the measurement with unknown TCM impedance . 88
Figure G.3 – Impedance layout of the components used in Figure H.2 . 90
Figure G.4 – Basic test set-up to measure combined impedance of the 150 Ω and
ferrites . 91
Figure H.1 – Measurement set-up using an AAN . 95

Figure H.2 – Measurement set-up using a 150 Ω load to the outside surface of the
shield . 96
Figure H.3 – Measurement set-up using current and capacitive voltage probes. 97
Figure H.4 – Characterization set-up. 98
Figure I.1 – Example AAN for use with unscreened single balanced pairs . 99
Figure I.2 – Example AAN with high LCL for use with either one or two unscreened
balanced pairs . 100
Figure I.3 – Example AAN with high LCL for use with one, two, three, or four
unscreened balanced pairs . 101
Figure I.4 – Example AAN, including a 50 Ω source matching network at the voltage
measuring port, for use with two unscreened balanced pairs . 102
Figure I.5 – Example AAN for use with two unscreened balanced pairs . 103
Figure I.6 – Example AAN, including a 50 Ω source matching network at the voltage
measuring port, for use with four unscreened balanced pairs . 104
Figure I.7 – Example AAN for use with four unscreened balanced pairs . 105
Figure I.8 – Example AN for use with coaxial cables, employing an internal common
mode choke created by bifilar winding an insulated centre-conductor wire and an
insulated screen-conductor wire on a common magnetic core (for example, a ferrite
toroid) . 106
Figure I.9 – Example AN for use with coaxial cables, employing an internal common
mode choke created by miniature coaxial cable (miniature semi-rigid solid copper
screen or miniature double-braided screen coaxial cable) wound on ferrite toroids . 106
Figure I.10 – Example AN for use with multi-conductor screened cables, employing an
internal common mode choke created by bifilar winding multiple insulated signal wires
and an insulated screen-conductor wire on a common magnetic core (for example, a
ferrite toroid) . 107
Figure I.11 – Example AN for use with multi-conductor screened cables, employing an
internal common mode choke created by winding a multi-conductor screened cable on

ferrite toroids . 107

Table 1 – Minimum scan times for the three CISPR bands with peak and quasi-peak
detectors . 26
Table 2 – Minimum measurement times for the four CISPR bands . 26
Table A.2 – Testing conditions for types of EUTs – Screened cable . 69
Table B.1 – Sweep time/frequency or fastest scan rate . 71
Table D.1 – Pulse suppression factors and scan rates for a 100 Hz video bandwidth . 76
Table D.2 – Meter time constants and the corresponding video bandwidths and
maximum scan rates . 77
Table F.1 – Maximum amplitude difference between peak and quasi-peak detected
signals . 84
Table G.1 – Summary of advantages and disadvantages of the methods described in
the specific subclauses of Annex H . 86
Table H.1 – Telecommunication port disturbance measurement procedure selection . 92
Table H.2 – a values . 93
LCL
– 8 – CISPR 16-2-1:2014 © IEC 2014
INTERNATIONAL ELECTROTECHNICAL COMMISSION
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE
____________
SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY
MEASURING APPARATUS AND METHODS –

Part 2-1: Methods of measurement of disturbances and immunity –
Conducted disturbance measurements

FOREWORD
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard CISPR 16-2-1 has been prepared by CISPR subcommittee A: Radio-
interference measurements and statistical methods.
This third edition cancels and replaces the second edition published in 2008, Amendment
1:2010 and Amendment 2:2013. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition: Methods of measurement using a new type of ancillary equipment – the CDNE – are
added.
The text of this standard is based on the following documents:
FDIS Report on voting
CISPR/A/1053/FDIS CISPR/A/1062/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of CISPR 16 series under the general title Specification for radio disturbance
and immunity measuring apparatus and methods, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 10 – CISPR 16-2-1:2014 © IEC 2014
SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY
MEASURING APPARATUS AND METHODS –

Part 2-1: Methods of measurement of disturbances and immunity –
Conducted disturbance measurements

1 Scope
This part of CISPR 16 is designated a basic standard, which specifies the methods of
measurement of disturbance phenomena in general in the frequency range 9 kHz to 18 GHz
and especially of conducted disturbance phenomena in the frequency range 9 kHz to 30 MHz.
With a CDNE, the frequency range is 9 kHz to 300 Hz.
NOTE In accordance with IEC Guide 107, CISPR 16 is a basic EMC standard for use by product committees of
the IEC. As stated in Guide 107, product committees are responsible for determining the applicability of the EMC
standard. CISPR and its sub-committees are prepared to co-operate with product committees in the evaluation of
the value of particular EMC tests for specific products.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
CISPR 14-1, Electromagnetic compatibility – Requirements for household appliances, electric
tools and similar apparatus – Part 1: Emission
CISPR 16-1-1:2010, Specification for radio disturbance and immunity measuring apparatus
and methods – Part 1-1: Radio disturbance and immunity measuring apparatus – Measuring
apparatus
CISPR 16-1-2:2014, Specification for radio disturbance and immunity measuring apparatus
and methods – Part 1-2: Radio disturbance and immunity measuring apparatus – Coupling
devices for conducted disturbance measurements
CISPR 16-4-2,
...


CISPR 16-2-1 ®
Edition 3.1 2017-06
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE
COMITÉ INTERNATIONAL SPÉCIAL DES PERTURBTIONS RADIOÉLECTRIQUES

BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Specification for radio disturbance and immunity measuring apparatus and
methods –
Part 2-1: Methods of measurement of disturbances and immunity – Conducted
disturbance measurements
Spécifications des méthodes et des appareils de mesure des perturbations
radioélectriques et de l'immunité aux perturbations radioélectriques –
Partie 2-1: Méthodes de mesure des perturbations et de l'immunité – Mesures
des perturbations conduites
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CISPR 16-2-1 ®
Edition 3.1 2017-06
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE

COMITÉ INTERNATIONAL SPÉCIAL DES PERTURBATIONS RADIOÉLECTRIQUES

BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Specification for radio disturbance and immunity measuring apparatus and

methods –
Part 2-1: Methods of measurement of disturbances and immunity – Conducted

disturbance measurements
Spécifications des méthodes et des appareils de mesure des perturbations

radioélectriques et de l'immunité aux perturbations radioélectriques –

Partie 2-1: Méthodes de mesure des perturbations et de l'immunité – Mesures

des perturbations conduites
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.10; 33.100.20 ISBN 978-2-8322-4559-0

CISPR 16-2-1 ®
Edition 3.1 2017-06
CONSOLIDATED VERSION
REDLINE VERSION
VERSION REDLINE
colour
inside
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE
COMITÉ INTERNATIONAL SPÉCIAL DES PERTURBATIONS RADIOÉLECTRIQUES

BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Specification for radio disturbance and immunity measuring apparatus and
methods –
Part 2-1: Methods of measurement of disturbances and immunity – Conducted
disturbance measurements
Spécifications des méthodes et des appareils de mesure des perturbations
radioélectriques et de l'immunité aux perturbations radioélectriques –
Partie 2-1: Méthodes de mesure des perturbations et de l'immunité – Mesures
des perturbations conduites
– 2 – CISPR 16-2-1:2014+AMD1:2017 CSV
© IEC 2017
CONTENTS
FOREWORD . 8
1 Scope . 10
2 Normative references . 10
3 Terms, definitions and abbreviations . 11
3.1 Terms and definitions . 11
3.2 Abbreviations . 16
4 Types of disturbance to be measured . 17
4.1 General . 17
4.2 Types of disturbance . 17
4.3 Detector functions . 18
5 Connection of measuring equipment . 18
5.1 General . 18
5.2 Connection of ancillary equipment . 18
5.3 Connections to RF reference ground . 18
5.4 Connection between the EUT and the artificial mains network . 20
6 General measurement requirements and conditions . 21
6.1 General . 21
6.2 Disturbance not produced by the equipment under test . 21
6.2.1 General . 21
6.2.2 Compliance testing . 21
6.3 Measurement of continuous disturbance . 21
6.3.1 Narrowband continuous disturbance . 21
6.3.2 Broadband continuous disturbance . 21
6.3.3 Use of spectrum analyzers and scanning receivers . 22
6.4 EUT arrangement and measurement conditions . 22
6.4.1 EUT arrangement . 22
6.4.2 Normal load conditions . 24
6.4.3 Duration of operation . 24
6.4.4 Running-in/warm-up time . 24
6.4.5 Supply . 25
6.4.6 Mode of operation . 25
6.4.7 Operation of multifunction equipment . 25
6.4.8 Determination of EUT arrangement(s) that maximize(s)
emissions . 25
6.4.9 Recording of measurement results . 25
6.5 Interpretation of measuring results . 25
6.5.1 Continuous disturbance . 25
6.5.2 Discontinuous disturbance . 26
6.5.3 Measurement of the duration of disturbances. 26
6.6 Measurement times and scan rates for continuous disturbance . 26
6.6.1 General . 26
6.6.2 Minimum measurement times . 26
6.6.3 Scan rates for scanning receivers and spectrum analyzers . 27
6.6.4 Scan times for stepping receivers . 28
6.6.5 Strategies for obtaining a spectrum overview using the peak
detector . 29

© IEC 2017
6.6.6 Timing considerations using FFT-based instruments . 32
7 Measurement of disturbances conducted along leads, 9 kHz to 30 MHz . 34
7.1 General . 34
7.2 Measuring equipment (receivers, etc.) . 35
7.2.1 General . 35
7.2.2 Use of detectors for conducted disturbance measurements . 35
7.3 Ancillary measuring equipment . 35
7.3.1 General . 35
7.3.2 Artificial networks (ANs) . 35
7.3.3 Voltage probes . 36
7.3.4 Current probes . 36
7.4 Equipment under test Configuration of the EUT and method of
measurement . 37
7.4.1 Arrangement of the EUT and its connection to the AN . 37
7.4.2 Procedure for the measurement of unsymmetric disturbance
voltages with V-networks (AMNs) ANs . 43
7.4.3 Measurement of common mode voltages at differential mode
signal terminals . 52
7.4.4 Measurements using voltage probes . 53
7.4.5 Measurement using a capacitive voltage probe (CVP) . 56
7.4.6 Measurements using current probes . 56
7.5 System test configuration for conducted emissions measurements . 57
7.5.1 General approach to system measurements . 57
7.5.2 System configuration . 58
7.5.3 Measurements of interconnecting lines . 60
7.5.4 Decoupling of system components . 60
7.6 In situ measurements . 61
7.6.1 General . 61
7.6.2 Reference ground . 61
7.6.3 Measurement with voltage probes . 61
7.6.4 Selection of measuring points . 62
8 Automated measurement of disturbances . 62
8.1 Precautions for automating measurements. 62
8.2 Generic measurement procedure . 63
8.3 Prescan measurements . 63
8.4 Data reduction . 64
8.5 Disturbance maximization and final measurement . 64
8.6 Post processing and reporting . 64
8.7 Disturbance measurement strategies with FFT-based measuring
instruments . 65
9 Test set-up and measurement procedure using the CDNE in the frequency range
30 MHz to 300 MHz . 65
9.1 General . 65
9.2 Test set-up . 65
9.3 Measurement procedure . 67
Annex A (informative) Guidelines for connection of electrical equipment to the artificial
mains network . 69
A.1 General . 69
A.2 Classification of the possible cases . 69
A.2.1 Well-shielded but poorly filtered EUT (Figures A.1 and A.2) . 69

– 4 – CISPR 16-2-1:2014+AMD1:2017 CSV
© IEC 2017
A.2.2 Well-filtered but incompletely shielded EUT (Figures A.3 and
A.4) . 70
A.2.3 Practical general case . 70
A.3 Method of grounding . 72
A.4 Conditions of grounding . 72
A.4.1 General . 72
A.4.2 Classification of typical testing conditions . 73
A.5 Connection of the AMN as a voltage probe . 74
Annex B (informative) Use of spectrum analyzers and scanning receivers . 76
B.1 General . 76
B.2 Overload . 76
B.3 Linearity test . 76
B.4 Selectivity . 76
B.5 Normal response to pulses . 76
B.6 Peak detection . 76
B.7 Frequency scan rate . 77
B.8 Signal interception . 77
B.9 Average detection . 77
B.10 Sensitivity . 77
B.11 Amplitude accuracy . 78
Annex C (informative) Decision tree for use of detectors for conducted disturbance
measurements . 79
Annex D (informative) Scan rates and measurement times for use with the average
detector . 81
D.1 General . 81
D.2 Suppression of impulsive disturbance . 81
D.2.1 General . 81
D.2.2 Suppression of impulsive disturbance by digital averaging . 82
D.3 Suppression of amplitude modulation . 82
D.4 Measurement of slowly intermittent, unsteady or drifting narrowband
disturbances . 82
D.5 Recommended procedure for automated or semi-automated
measurements . 84
Annex E (informative) Guidelines for the improvement of the test set-up with ANs . 85
E.1 In situ verification of the AN impedance and voltage division factor . 85
E.2 PE chokes and sheath current absorbers for the suppression of ground
loops . 88
Annex F (normative) Determination of suitability of spectrum analyzers for compliance
tests . 90
Annex G (informative) Basic guidance for measurements on telecommunications ports . 91
G.1 Limits . 91
G.2 Combination of current probe and capacitive voltage probe (CVP) . 92
G.3 Basic ideas of the capacitive voltage probe . 92
G.4 Combination of current limit and voltage limit . 93
G.5 Adjusting the TCM impedance with ferrites . 95
G.6 Ferrite specifications for use with methods of Annex H . 95
Annex H (normative) Specific guidance for conducted disturbance measurements on
telecommunication ports . 98
H.1 General . 98

© IEC 2017
H.2 Characteristics of AANs . 99
H.3 Characteristics of current probe . 100
H.4 Characteristics of capacitive voltage probe . 100
H.5 Procedures for common mode measurements . 100
H.5.1 General . 100
H.5.2 Measurement procedure using AANs . 100
H.5.3 Measurement procedure using a 150 Ω load connected to the
outside surface of the cable screen . 101
H.5.4 Measurement procedure using a combination of current probe
and capacitive voltage probe . 102
H.5.5 Measurement of cable, ferrite and AE common mode
impedance . 103
Annex I (informative) Examples of AANs and ANs for screened cables . 105
Bibliography . 114

Figure 1 – Example of a recommended test set-up with PE chokes with three AMNs
and a sheath current absorber on the RF cable . 20
Figure 2 – Measurement of a combination of a CW signal (“NB”) and an impulsive
signal (“BB”) using multiple sweeps with maximum hold . 29
Figure 3 – Example of a timing analysis . 30
Figure 4 – A broadband spectrum measured with a stepped receiver . 31
Figure 5 – Intermittent narrowband disturbances measured using fast short repetitive
sweeps with maximum hold function to obtain an overview of the disturbance spectrum . 32
Figure 6 – FFT scan in segments . 33
Figure 7 – Frequency resolution enhanced by FFT-based measuring instrument . 34
Figure 8 – Illustration of current I . 37
CCM
Figure 9 – Test configuration: table-top equipment EUT for conducted disturbance
measurements on LV AC mains power mains ports and on analogue/digital data ports . 39
Figure 10 – Arrangement of EUT and AMN at 40 cm distance, with a) vertical RGP
and b) horizontal RGP . 40
Figure 11 – Optional example test configuration for an EUT with only a power cord
attached . 40
Figure 12 – Test configuration: floor-standing equipment (see 7.4.1 and 7.5.2.3) . 42
Figure 13 – Example test configuration: floor-standing and table-top equipment (see
7.4.1 and 7.5.2.3) . 43
Figure 14 – Schematic of disturbance voltage measurement configuration (see also
7.5.2.3) . 46
Figure 15 – Equivalent circuit for measurement of unsymmetric disturbance voltage for
safety-class I (grounded) EUT. 47
Figure 16 – Equivalent circuit for measurement of unsymmetric disturbance voltage for
safety-class II (ungrounded) EUT . 49
Figure 17 – RC element for artificial hand . 50
Figure 18 – Portable electric drill with artificial hand . 50
Figure 19 – Portable electric saw with artificial hand . 51
Figure 20 – Measuring example for voltage probes .
Figure 21 – Measurement arrangement for two-terminal regulating controls .
Figure 22 – Generic process to help reduce measurement time . 63
Figure 23 – Test set-up for measurement of an EUT with one cable . 66

– 6 – CISPR 16-2-1:2014+AMD1:2017 CSV
© IEC 2017
Figure 24 – Test set-up for measurement of an EUT with two cables connected
adjacent surfaces of the EUT . 67
Figure 25 – Test set-up for measurement of an EUT with two cables connected on the
same surface of the EUT . 67
Figure 26 – Test configuration: table-top EUT for conducted disturbance
measurements on the LV AC mains and LV DC power port of a GCPC . 41
Figure 27 – Typical arrangement for measurement of conducted disturbances at LV
AC mains and DC power ports of floor standing equipment with an AMN and a Δ-AN
used as voltage probes, and with a current probe . 56
Figure A.1 – Basic schematic of well-shielded but poorly filtered EUT . 69
Figure A.2 – Detail of well-shielded but poorly filtered EUT . 70
Figure A.3 – Well-filtered but incompletely shielded EUT . 70
Figure A.4 – Well-filtered but incompletely shielded EUT, with U reduced to zero . 70
Figure A.5 – Disturbance supply through shielded conductors . 71
Figure A.6 – Disturbance supply through unshielded but filtered conductors . 71
Figure A.7 – Disturbance supply through ordinary conductors . 72
Figure A.8 – AMN configurations . 74
Figure C.1 – Decision tree for optimizing speed of conducted disturbance
measurements with peak, quasi-peak and average detectors . 79
Figure D.1 – Weighting function of a 10 ms pulse for peak (“PK”) and average
detections with (“CISPR AV”) and without (“AV”) peak reading; meter time constant
160 ms. 83
Figure D.2 – Weighting functions of a 10 ms pulse for peak (“PK”) and average
detections with (“CISPR AV”) and without (“AV”) peak reading; meter time constant
100 ms. 83
Figure D.3 – Example of weighting functions (of a 1 Hz pulse) for peak (“PK”) and
average detections as a function of pulse width; meter time constant 160 ms . 84
Figure D.4 – Example of weighting functions (of a 1 Hz pulse) for peak (“PK”) and
average detections as a function of pulse width; meter time constant 100 ms . 84
Figure E.1 – Parallel resonance of enclosure capacitance and ground strap
inductance . 85
Figure E.2 – Connection of an AMN to RGP using a wide grounding sheet for low
inductance grounding . 86
Figure E.3 – Impedance measured with the arrangement of Figure E.2 both with
reference to the front panel ground and to the grounding sheet . 86
Figure E.4 – VDF in the configuration of Figure E.2 measured with reference to the
front panel ground and to the grounding sheet . 86
Figure E.5 – Arrangement showing the measurement grounding sheet (shown with
dotted lines) when measuring the impedance with reference to RGP . 87
Figure E.6 – Impedance measured with the arrangement of Figure E.5 with reference
to the RGP . 87
Figure E.7 – VDF measured with parallel resonances in the AMN grounding . 87
Figure E.8 – Attenuation of a sheath current absorber measured in a 150 Ω test
arrangement . 88
Figure E.9 – Arrangement for the measurement of attenuation due to PE chokes and
sheath current absorbers . 89
Figure G.1 – Basic circuit for considering the limits with a defined TCM impedance of
150 Ω. 94
Figure G.2 – Basic circuit for the measurement with unknown TCM impedance . 94

© IEC 2017
Figure G.3 – Impedance layout of the components used in Figure H.2 . 96
Figure G.4 – Basic test set-up to measure combined impedance of the 150 Ω and
ferrites . 97
Figure H.1 – Measurement set-up using an AAN . 101
Figure H.2 – Measurement set-up using a 150 Ω load to the outside surface of the
shield . 102
Figure H.3 – Measurement set-up using current and capacitive voltage probes. 103
Figure H.4 – Characterization set-up. 104
Figure I.1 – Example AAN for use with unscreened single balanced pairs . 105
Figure I.2 – Example AAN with high LCL for use with either one or two unscreened
balanced pairs . 106
Figure I.3 – Example AAN with high LCL for use with one, two, three, or four
unscreened balanced pairs . 107
Figure I.4 – Example AAN, including a 50 Ω source matching network at the voltage
measuring port, for use with two unscreened balanced pairs . 108
Figure I.5 – Example AAN for use with two unscreened balanced pairs . 109
Figure I.6 – Example AAN, including a 50 Ω source matching network at the voltage
measuring port, for use with four unscreened balanced pairs . 110
Figure I.7 – Example AAN for use with four unscreened balanced pairs . 111
Figure I.8 – Example AN for use with coaxial cables, employing an internal common
mode choke created by bifilar winding an insulated centre-conductor wire and an
insulated screen-conductor wire on a common magnetic core (for example, a ferrite

toroid) . 112
Figure I.9 – Example AN for use with coaxial cables, employing an internal common
mode choke created by miniature coaxial cable (miniature semi-rigid solid copper
screen or miniature double-braided screen coaxial cable) wound on ferrite toroids . 112
Figure I.10 – Example AN for use with multi-conductor screened cables, employing an
internal common mode choke created by bifilar winding multiple insulated signal wires
and an insulated screen-conductor wire on a common magnetic core (for example, a
ferrite toroid) . 113
Figure I.11 – Example AN for use with multi-conductor screened cables, employing an
internal common mode choke created by winding a multi-conductor screened cable on
ferrite toroids . 113

Table 1 – Minimum scan times for the three CISPR bands with peak and quasi-peak
detectors . 27
Table 2 – Minimum measurement times for the four CISPR bands . 27
Table A.2 – Testing conditions for types of EUTs – Screened cable . 75
Table B.1 – Sweep time/frequency or fastest scan rate . 77
Table D.1 – Pulse suppression factors and scan rates for a 100 Hz video bandwidth . 82
Table D.2 – Meter time constants and the corresponding video bandwidths and
maximum scan rates . 83
Table F.1 – Maximum amplitude difference between peak and quasi-peak detected
signals . 90
Table G.1 – Summary of advantages and disadvantages of the methods described in
the specific subclauses of Annex H . 92
Table H.1 – Telecommunication port disturbance measurement procedure selection . 98
Table H.2 – a values . 99
LCL
– 8 – CISPR 16-2-1:2014+AMD1:2017 CSV
© IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE
____________
SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY
MEASURING APPARATUS AND METHODS –
Part 2-1: Methods of measurement of disturbances and immunity –
Conducted disturbance measurements
FOREWORD
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This consolidated version of the official IEC Standard and its amendment has been prepared
for user convenience.
CISPR 16-2-1 edition 3.1 contains the third edition (2014-02) [documents CISPR/A/1053/FDIS
and CISPR/A/1062/RVD] and its amendment 1 (2017-06) [documents CISPR/A/1168/CDV and
CISPR/A/1201/RVC].
In this Redline version, a vertical line in the margin shows where the technical content is
modified by amendment 1. Additions are in green text, deletions are in strikethrough red text. A
separate Final version with all changes accepted is available in this publication.

© IEC 2017
International Standard CISPR 16-2-1 has been prepared by CISPR subcommittee A: Radio-
interference measurements and statistical methods.
This third edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition: Methods of measurement using a new type of ancillary equipment – the CDNE – are
added.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of CISPR 16 series under the general title Specification for radio disturbance
and immunity measuring apparatus and methods, can be found on the IEC website.
The committee has decided that the contents of the base publication and its amendment will
remain unchanged until the stability date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
The contents of the corrigendum of August 2020 have been included in this copy.

– 10 – CISPR 16-2-1:2014+AMD1:2017 CSV
© IEC 2017
SPECIFICATION FOR RADIO DISTURBANCE AND IMMUNITY
MEASURING APPARATUS AND METHODS –

Part 2-1: Methods of measurement of disturbances and immunity –
Conducted disturbance measurements

1 Scope
This part of CISPR 16 is designated a basic standard that specifies the methods of
measurement of disturbance phenomena in general in the frequency range 9 kHz to 18 GHz
and especially of conducted disturbance phenomena in the frequency range 9 kHz to 30 MHz.
With a The CDNE extends the frequency range is 9 kHz of conducted disturbance
measurements to 300 Hz.
NOTE In accordance with IEC Guide 107, CISPR 16 is a basic EMC standard for use
...

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