IEC 60747-16-5:2013/AMD1:2020
(Amendment)Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
The contents of the corrigendum of September 2020 have been included in this copy.
Amendement 1 - Dispositifs à semiconducteurs - Partie 16-5: Circuits intégrés hyperfréquences - Oscillateurs
Le contenu du corrigendum d'août 2020 ne concerne que la version anglaise de ce document.
General Information
- Status
- Published
- Publication Date
- 13-Jul-2020
- Technical Committee
- SC 47E - Discrete semiconductor devices
- Drafting Committee
- WG 2 - TC 47/SC 47E/WG 2
- Current Stage
- PPUB - Publication issued
- Start Date
- 14-Jul-2020
- Completion Date
- 06-Aug-2020
Relations
- Amends
IEC 60747-16-5:2013 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators - Effective Date
- 05-Sep-2023
- Effective Date
- 05-Sep-2023
Overview
IEC 60747-16-5:2013/AMD1:2020 is an international standard amendment published by the International Electrotechnical Commission (IEC). It focuses on semiconductor devices, specifically microwave integrated circuits (MICs) that function as oscillators. This 2020 amendment updates the original 2013 publication by integrating the corrigendum issued in September 2020 to refine definitions, measurement procedures, and normative references, ensuring the document’s continued relevance and technical accuracy in the field of microwave oscillators.
This standard is part of the IEC 60747 series which covers various semiconductor devices, with Part 16-5 dedicated exclusively to microwave IC oscillators. It provides essential terminology, testing principles, and measurement considerations crucial for accurate characterization and performance evaluation of oscillator components used in high-frequency microwave applications.
Key Topics
Microwave Integrated Circuits - Oscillators
The amendment elaborates on oscillators in the microwave frequency range, emphasizing semiconductor technologies used in these circuits.Measurement Principles and Corrections
Key improvements in the amendment involve clarifications on measurement methods for oscillator characteristics such as:- Output power
- Circuit loss between measurement points
- Harmonic distortion ratios of various orders
- Spurious distortion ratios
Phase Noise Definition
Redefines phase noise L(f) as a frequency-domain measure of short-term frequency stability, described through power spectral density of phase fluctuations, critical for oscillator quality assessment.Load Mismatch Tolerance
Introduces load mismatch tolerance as the maximum load Voltage Standing Wave Ratio (VSWR) under which the device operates without unexpected spurious emissions or discontinuities in frequency tuning.Updated Normative References
The amendment revises references to related standards including:- IEC 60747-4: Microwave diodes and transistors
- IEC 60747-16-3: Microwave integrated circuits - Frequency converters
Technical Terminology Changes
Updates terminology for better precision and alignment with related IEC standards, including additions to definitions related to frequency fluctuation, VSWR, and voltage controlled oscillators (VCO).
Applications
IEC 60747-16-5:2013/AMD1:2020 applies broadly within the sectors of:
Microwave Communication Systems
Ensures standardized performance and testing for oscillators used in satellite communication, radar systems, and wireless infrastructure.Semiconductor Device Manufacturing
Provides manufacturers with clear guidelines on defining and measuring oscillator parameters to guarantee component reliability and interoperability.Electronics Testing and Certification
Assists testing laboratories in applying uniform measurement procedures for oscillator phase noise, harmonic distortion, and output power, enabling consistent certification outcomes.Research & Development
Supports R&D teams by defining clearly the measurement foundations and device tolerances essential to innovating microwave oscillators with superior performance.High-Frequency Circuit Design
Helps circuit designers understand device characteristics under various load conditions to optimize oscillator design for frequency stability and low noise.
Related Standards
IEC 60747-4:2007 & Amendments - Semiconductor devices focusing on discrete microwave diodes and transistors, supporting the broader semiconductor device framework.
IEC 60747-16-3:2002 & Amendments - Covers microwave integrated circuits focusing on frequency converters, complementing the oscillator standards.
IEC 60050-561 - International Electrotechnical Vocabulary entry related to phase noise terminology, providing context for frequency stability definitions used in the amendment.
Voltage Standing Wave Ratio (VSWR) Definitions and Testing Standards - Critical for understanding load mismatch tolerance in microwave oscillators as referenced in the standard.
Practical Value
This amendment to IEC 60747-16-5 enhances the accuracy and clarity of microwave oscillator standards, providing a robust framework for testing and characterizing semiconductor oscillators in microwave frequencies. Industry professionals benefit from:
- Improved measurement consistency for oscillator output power and noise characteristics.
- Clear definitions supporting better product design, specification, and quality control.
- Harmonized procedures aiding international trade and regulatory compliance.
- Enhanced knowledge for mitigating issues related to load mismatch and signal distortion.
By adhering to IEC 60747-16-5:2013/AMD1:2020, manufacturers and engineers can ensure their microwave oscillator devices meet rigorous and globally recognized standards, fostering innovation and reliable performance in advanced semiconductor applications.
IEC 60747-16-5:2013/AMD1:2020 - Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
IEC 60747-16-5:2013/AMD1:2020 - Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
Frequently Asked Questions
IEC 60747-16-5:2013/AMD1:2020 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators". This standard covers: The contents of the corrigendum of September 2020 have been included in this copy.
The contents of the corrigendum of September 2020 have been included in this copy.
IEC 60747-16-5:2013/AMD1:2020 is classified under the following ICS (International Classification for Standards) categories: 31.080.99 - Other semiconductor devices. The ICS classification helps identify the subject area and facilitates finding related standards.
IEC 60747-16-5:2013/AMD1:2020 has the following relationships with other standards: It is inter standard links to IEC 60747-16-5:2013, IEC 60747-16-5:2013/AMD1:2020/COR1:2020. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
IEC 60747-16-5:2013/AMD1:2020 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
IEC 60747-16-5 ®
Edition 1.0 2020-07
INTERNATIONAL
STANDARD
AMENDMENT 1
Semiconductor devices –
Part 16-5: Microwave integrated circuits – Oscillators
IEC 60747-16-5:2013-06/AMD1:2020-07(en)
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.
IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary
(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and definitions clause of
IEC publications issued between 2002 and 2015. Some
IEC Customer Service Centre - webstore.iec.ch/csc entries have been collected from earlier publications of IEC
If you wish to give us your feedback on this publication or TC 37, 77, 86 and CISPR.
need further assistance, please contact the Customer Service
Centre: sales@iec.ch.
IEC 60747-16-5 ®
Edition 1.0 2020-07
INTERNATIONAL
STANDARD
AMENDMENT 1
Semiconductor devices –
Part 16-5: Microwave integrated circuits – Oscillators
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-8617-3
– 2 – IEC 60747-16-5:2013/AMD1:2020
IEC 2020
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
The text of this amendment is based on the following documents:
CDV Report on voting
47E/673/CDV 47E/705/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
2 Normative references
Replace the existing references IEC 60747-4 and IEC 60747-16-3 by the following new
references:
IEC 60747-4:2007, Semiconductor devices – Discrete devices – Part 4: Microwave diodes and
transistors
IEC 60747-4:2007/AMD 1:2017
IEC 60747-16-3:2002, Semiconductor devices – Part 16-3: Microwave integrated circuits –
Frequency converters
IEC 60747-16-3:2002/AMD 1:2009
IEC 60747-16-3:2002/AMD 2:2017
Replace
...
IEC 60747-16-5 ®
Edition 1.0 2020-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Semiconductor devices –
Part 16-5: Microwave integrated circuits – Oscillators
Dispositifs à semiconducteurs –
Partie 16-5: Circuits intégrés hyperfréquences – Oscillateurs
IEC 60747-16-5:2013-06/AMD1:2020-07(en-fr)
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.
Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de l'IEC ou du Comité national de l'IEC du pays du demandeur. Si vous avez des
questions sur le copyright de l'IEC ou si vous désirez obtenir des droits supplémentaires sur cette publication, utilisez
les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.
IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary
(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and definitions clause of
IEC publications issued between 2002 and 2015. Some
IEC Customer Service Centre - webstore.iec.ch/csc entries have been collected from earlier publications of IEC
If you wish to give us your feedback on this publication or TC 37, 77, 86 and CISPR.
need further assistance, please contact the Customer Service
Centre: sales@iec.ch.
A propos de l'IEC
La Commission Electrotechnique Internationale (IEC) est la première organisation mondiale qui élabore et publie des
Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.
A propos des publications IEC
Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possédez l’édition la
plus récente, un corrigendum ou amendement peut avoir été publié.
Recherche de publications IEC - Electropedia - www.electropedia.org
webstore.iec.ch/advsearchform Le premier dictionnaire d'électrotechnologie en ligne au
La recherche avancée permet de trouver des publications IEC monde, avec plus de 22 000 articles terminologiques en
en utilisant différents critères (numéro de référence, texte, anglais et en français, ainsi que les termes équivalents dans
comité d’études,…). Elle donne aussi des informations sur les 16 langues additionnelles. Egalement appelé Vocabulaire
projets et les publications remplacées ou retirées. Electrotechnique International (IEV) en ligne.
IEC Just Published - webstore.iec.ch/justpublished Glossaire IEC - std.iec.ch/glossary
Restez informé sur les nouvelles publications IEC. Just 67 000 entrées terminologiques électrotechniques, en anglais
Published détaille les nouvelles publications parues. et en français, extraites des articles Termes et définitions des
Disponible en ligne et une fois par mois par email. publications IEC parues entre 2002 et 2015. Plus certaines
entrées antérieures extraites des publications des CE 37, 77,
Service Clients - webstore.iec.ch/csc 86 et CISPR de l'IEC.
Si vous désirez nous donner des commentaires sur cette
publication ou si vous avez des questions contactez-nous:
sales@iec.ch.
IEC 60747-16-5 ®
Edition 1.0 2020-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Semiconductor devices –
Part 16-5: Microwave integrated circuits – Oscillators
Dispositifs à semiconducteurs –
Partie 16-5: Circuits intégrés hyperfréquences – Oscillateurs
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.99 ISBN 978-2-8322-8746-0
– 2 – IEC 60747-16-5:2013/AMD1:2020
IEC 2020
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
The text of this amendment is based on the following documents:
CDV Report on voting
47E/673/CDV 47E/705/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
2 Normative references
Replace the existing references IEC 60747-4 and IEC 60747-16-3 by the following new
references:
IEC 60747-4:2007, Semiconductor devices – Discrete devices – Part 4: Microwave diodes and
transistors
IEC 60747-4:2007/AMD 1:2017
IEC 60747-16-3:2002, Semiconductor devices – Part 16-3: Microwave integrated circuits –
Frequency converters
IEC 60747-16-3:2002/AMD 1:2009
IEC 60747-16-3:2002/AMD 2:2017
Replace the existing terminological entry 3.3 with the following:
3.3
phase noise
L (f)
frequency-domain measure of the short-term frequency stability of an oscillator
Note 1 to entry: This phase noise is normally expressed as the power spectral density of the phase fluctuations,
S (f), where the phase fluctuation function is φ(t)=2πFt-2πF t. The spectral density of phase fluctuation can be
φ 0
directly related to the spectral density of frequency fluctuation by the following formula:
F
Sf = S f rad /Hz
( ) ( )
φ y
f
IEC 2020
where
F is the oscillator frequency;
F is the average oscillator frequency;
f is the Fourier frequency.
Note 2 to entry: L (f) is pronounced "script-ell of f".
[SOURCE: IEC 60050-561:2014, 561-03-22, modified – A symbol and Note 2 to entry have
been added.]
Replace the existing terminological entry 3.14 with the following:
3.14
load mismatch tolerance
ψ
L
maximum load VSWR in the range where the device oscillates with no unexpected spurious
intensity and/or no discontinuity of frequency tuning characteristics (in case of VCO) at all
phase angles
Note 1 to entry: “VSWR” is an abbreviation of “voltage standing wave ratio”.
Note 2 to entry: “VCO” is an abbreviation of “voltage controlled oscillator”.
5.4.2.2.2 Principle of measurement
Replace the text:
"L is the conversion gain from point A to point C."
by the following:
L is the circuit loss from point A to point C.
5.4.2.2.4 Precautions to be observed
R
...








Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.
Loading comments...