IEC 61747-10-1:2013

IEC 61747-10-1 ®
Edition 1.0 2013-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Liquid crystal display devices –
Part 10-1: Environmental, endurance and mechanical test methods – Mechanical

Dispositifs d'affichage à cristaux liquides –
Partie 10-1: Méthodes d’essais d’environnement, d’endurance et mécaniques –
Essais mécaniques
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IEC 61747-10-1 ®
Edition 1.0 2013-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Liquid crystal display devices –

Part 10-1: Environmental, endurance and mechanical test methods – Mechanical

Dispositifs d'affichage à cristaux liquides –

Partie 10-1: Méthodes d’essais d’environnement, d’endurance et mécaniques –

Essais mécaniques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX M
ICS 31.120 ISBN 978-2-8322-0893-9

– 2 – 61747-10-1 © IEC:2013
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and letter symbols . 6
4 Standard atmospheric conditions for measurements and tests: . 6
5 Test methods . 6
5.1 General . 6
5.2 Robustness of terminations . 6
5.2.1 Wire terminations, pins or connectors with pins . 6
5.2.2 Flexible terminations . 7
5.3 Soldering . 7
5.4 Vibration (sinusoidal) . 7
5.4.1 Test Fc . 7
5.4.2 Transverse motion . 7
5.4.3 Distortion . 7
5.4.4 Vibration amplitude tolerance . 7
5.4.5 Severities . 7
5.4.6 Vibration amplitude . 8
5.4.7 Duration of endurance . 8
5.5 Shock . 9
5.6 Acceleration, steady state . 9
5.7 Bond strength test . 10
5.7.1 General . 10
5.7.2 General description of the test . 10
5.7.3 Preconditioning . 10
5.7.4 Initial measurements . 10
5.7.5 Test method (see Figure 1) . 10
5.7.6 Information required in the relevant specification . 11
Bibliography . 12

Figure 1 – Example of bond strength . 11

Table 1 – Frequency range – Lower end . 7
Table 2 – Frequency range – Upper end . 7
Table 3 – Recommended frequency ranges . 8
Table 4 – Recommended vibration amplitudes . 8
Table 5 – Conditions for shock test . 9
Table 6 – Acceleration conditions . 10

61747-10-1 © IEC:2013 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
LIQUID CRYSTAL DISPLAY DEVICES –

Part 10-1: Environmental, endurance and
mechanical test methods – Mechanical

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
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with the International Organization for Standardization (ISO) in accordance with conditions determined by
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2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61747-10-1 has been prepared by IEC technical committee 110:
Electronic display devices.
This first edition of IEC 61747-10-1 cancels and replaces Clauses 1 and 2 of the first edition of
IEC 61747-5 published in 1998. This edition constitutes a technical revision.
NOTE It is intended that the other clauses of IEC 61747-5:1998 will be replaced by new parts in the IEC 61747
series. The details of the intended changes are given in Annex D of IEC 61747-30-1:2012.

– 4 – 61747-10-1 © IEC:2013
The text of this standard is based on the following documents:
CDV Report on voting
110/395/CDV 110/454/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61747 series, published under the general title Liquid crystal
display devices can be found on the IEC website.
Future standards in this series will carry the new general title as cited above. Titles of existing
standards in this series will be updated at the time of the next edition.
The committee has decided that the contents of this publication will remain unchanged until the
stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to
the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
61747-10-1 © IEC:2013 – 5 –
LIQUID CRYSTAL DISPLAY DEVICES –

Part 10-1: Environmental, endurance and
mechanical test methods – Mechanical

1 Scope
This part of IEC 61747 lists test methods applicable to liquid crystal display devices. It takes
into account, wherever possible, the mechanical robustness test methods as outlined in
IEC 60068.
NOTE Devices include cells and modules.
The object of this standard is to establish uniform preferred test methods with preferred values
for stress levels for judging the mechanical properties of liquid crystal display devices.
In case of contradiction between this standard and a relevant specification, it is the latter that
should govern.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
IEC 60068 (all parts), Environmental testing
IEC 60068-2-6, Environmental testing – Part 2-6: Tests – Test Fc: Vibration (sinusoidal)
IEC 60068-2-7, Basic environmental testing procedures – Part 2-7: Tests – Test Ga and
guidance: Acceleration, steady state
IEC 60068-2-20, Environmental testing – Part 2-20: Tests – Test T: Test methods for
solderability and resistance to soldering heat of devices with leads
IEC 60068-2-21, Environmental testing – Part 2-21: Tests – Test U: Robustness of terminations
and integral mounting devices
IEC 60068-2-27, Environmental testing – Part 2-27: Tests – Test Ea and guidance: Shock
IEC 60747 (all parts), Semiconductor devices
IEC 60748 (all parts), Semiconductor devices – Integrated circuits
IEC 60749-14, Semiconductor devices – Mechanical and climatic test methods – Part 14:
Robustness of terminations (lead integrity)
IEC 61747-1, Liquid crystal and solid-state display devices − Part 1: Generic specification

– 6 – 61747-10-1 © IEC:2013
3 Terms, definitions and letter symbols
For the purposes of this document, the terms, definitions and letter symbols given in IEC 60068,
IEC 60747, IEC 60748 and IEC 61747-1 apply.
4 Standard atmospheric conditions for measurements and tests:
Unless otherwise specified, all tests and measurements shall be carried out under standard
atmospheric conditions for testing:
Temperature: 15 °C to 35 °C
Relative humidity: 25 % to 85 % RH, where appropriate
Air pressure: 86 kPa to 106 kPa (860 mbar to 1 060 mbar)
The absolute humidity of the atmosphere shall not exceed 22 g/m .
5 Test methods
5.1 General
Choice of the appropriate tests depends on the type of devices. The relevant specification shall
state which tests are applicable.
5.2 Robustness of terminations
5.2.1 Wire terminations, pins or connectors with pins
5.2.1.1 Test U
Test U, specified in IEC 60068-2-21, is applicable.
5.2.1.2 Tensile
This test shall be in accordance with test Ua1 of IEC 60068-2-21, with the following specific
requirements.
After the test, examine under 3× to 10× magnification.
The device shall be rejected if there is breakage, loosening or relative motion between the lead
or termination and the device body.
5.2.1.3 Bending
This test shall be in accordance with test Ub of IEC 60068-2-21.
5.2.1.4 Torsion
See IEC 60749-14.
Applied only for cells with pin.
5.2.1.5 Torque
See IEC 60749-14.
Applied only for cells with pin.

61747-10-1 © IEC:2013 – 7 –
5.2.2 Flexible terminations
Under consideration.
5.3 Soldering
Test T, specified in IEC 60068-2-20, is applicable.
This test shall be in accordance with test Ta (methods 1, 2) (only methods 1 and 2 are
referenced, these methods are solder bath and soldering iron).
5.4 Vibration (sinusoidal)
5.4.1 Test Fc
Test Fc, specified in IEC 60068-2-6, is applicable, with the following specific requirements.
5.4.2 Transverse motion
The maximum vibration amplitude at the check points in any perpendicular to the specified axis
shall not exceed 25 %.
5.4.3 Distortion
Not exceeding 25 %.
5.4.4 Vibration amplitude tolerance
Reference point: ±15 %
Check point: ±25 %
5.4.5 Severities
The frequency range shall be given in the relevant specification by selecting a lower frequency
from Table 1 and an upper frequency from Table 2.
Table 1 – Frequency range – Lower end
Lower frequency f
Hz
Table 2 – Frequency range – Upper end
Upper frequency f
Hz
– 8 – 61747-10-1 © IEC:2013
The recommended ranges are shown in Table 3.
Table 3 – Recommended frequency ranges
Recommended frequency ranges, from f to f
1 2
Hz
1 to 55
10 to 55
10 to 300
10 to 500
55 to 500
5.4.6 Vibration amplitude
The recommended vibration amplitudes with cross-over frequency are shown in Table 4.
Table 4 – Recommended vibration amplitudes
Displacement amplitude below Acceleration amplitude above
the cross-over frequency the cross-over frequency
mm m/s g
n
0,035 4,9 0,5
0,075 9,8 1,0
0,15 19,6 2,0
0,35 49,0 5,0
0,75 98,0 10,0
NOTE The values listed apply in Table 4 for cross-over frequencies between 57 Hz and 62 Hz.

5.4.7 Duration of endurance
5.4.7.1 Endurance by sweeping
The duration of the endurance in each axis shall be given as a number of sweep cycles given
preference by the relevant specification from the list given below:
1, 2, 5, 10, 20.
5.4.7.2 Endurance at critical frequencies
The duration of the endurance in each appropriate axis at each critical frequency found during
the vibration response investigation shall be given preference in the relevant specification from
the list given below:
10 min ± 0,5 min
30 min ± 1 min
90 min ± 1 min
10 h ± 5 min
The body of the device shall be securely clamped during the test. If the device has a specified
method of installation, it shall be used to clamp the device.

61747-10-1 © IEC:2013 – 9 –
5.5 Shock
Test Ea, specified in IEC 60068-2-27, is applicable, with the following specific requirements.
The conditions shall be selected from Table 5, taking into consideration the mass of the device
and its internal construction.
Table 5 – Conditions for shock test
Peak amplitude A Corresponding duration D Corresponding
of the nominal pulse velocity change ∆V
Half-sine Final-peak
saw-tooth
ms m/s m/s
m/s (g )
n
50 (5) 30 1,0 –
150 (15) 11 1,0 0,8
150 (15) 6 0,6 0,4
300 (30) 18 3,4 2,6
300 (30) 11 2,1 1,6
300 (30) 6 1,1 0,9
500 (50) 20 6,2 4,9
500 (50) 11 3,4 2,7
500 (50) 3 0,9 0,7
700 (70) 11 4,8 3,8
1 000 (100) 11 6,9 5,4
1 000 (100) 6 3,7 2,9
2 000 (200) 6 7,5 5,9
2 000 (200) 3 3,7 2,9
NOTE The preferred values are underlined.

The relevant specification shall state the wave form utilized.
The device shall be subjected to three successive shocks, in both directions of three mutually-
perpendicular axes chosen so that faults are most likely to be revealed, i.e. a total of 18 shocks
(see IEC 60068-2-27.) The preferred combinations are underlined.
The body of the device shall be securely clamped during the test. If the device has a specified
method of installation, it shall be used to clamp the device.
5.6 Acceleration, steady state
Test Ga, specified in IEC 60068-2-7, is applicable, with the following specific requirements.
The acceleration conditions shall be selected from Table 6.

– 10 – 61747-10-1 © IEC:2013
Table 6 – Acceleration conditions
Acceleration
m/s
1 000
2 000
Procedure:
The acceleration shall be applied for at least 1 min, in both directions of the three major axes,
unless otherwise specified.
The body of the device shall be securely clamped during the test. If the device has a specified
method of installation, it shall be used to clamp the device.
5.7 Bond strength test
5.7.1 General
The purpose of this test is to measure bond strength or to determine compliance with specified
bond strength requirements. This test is intended to show the bond strength on devices of
flexible flat cables.
5.7.2 General description of the test
The flexible flat cable is pulled as shown in Figure 1, with
...