IEC 60424-3:1999
(Main)Ferrite cores - Guide on the limits of surface irregularities - Part 3: ETD-cores and E-cores
Ferrite cores - Guide on the limits of surface irregularities - Part 3: ETD-cores and E-cores
Gives guidance on allowable limits of surface irregularities applicable to ETD-cores, E-cores and other similar shapes in accordance with the relevant general specification.
Noyaux ferrites - Guide relatif aux limites des irrégularités de surface - Partie 3: Noyaux ETD et E
Constitue un guide sur les limites admissibles d'irrégularités de surface applicables aux noyaux ETD et E ainsi que d'autres géométries de noyaux similaires, conformément à la spécification générale associée.
General Information
- Status
- Published
- Publication Date
- 08-Jun-1999
- Technical Committee
- TC 51 - Magnetic components, ferrite and magnetic powder materials
- Drafting Committee
- WG 1 - TC 51/WG 1
- Current Stage
- DELPUB - Deleted Publication
- Start Date
- 22-Oct-2015
- Completion Date
- 26-Oct-2025
Relations
- Effective Date
- 05-Sep-2023
Overview
IEC 60424-3:1999 is an international standard published by the International Electrotechnical Commission (IEC) that provides guidance on allowable limits of surface irregularities for ferrite cores, focusing specifically on ETD-cores and E-cores. Ferrite cores are essential components used in electrical and electronic devices for electromagnetic applications, such as transformers and inductors.
This part 3 of IEC 60424 builds upon general specifications, offering detailed limits on surface defects like chips, cracks, flash, and pull-outs. It plays a crucial role in facilitating clear communication and agreement between ferrite core manufacturers and their customers by standardizing the acceptable quality levels of core surfaces, ensuring reliable performance and consistency across the industry.
Key Topics
1. Scope and Purpose
- Establishes allowable limits of surface irregularities applicable to ETD and E-type ferrite cores.
- Aids negotiations between manufacturers and purchasers by providing clear defect criteria.
- Covers typical surface defects including chips, ragged edges, cracks, flash, and pull-outs.
2. Surface Irregularities Defined
- Chips and ragged edges on mating surfaces and other surfaces with quantitative limits.
- Cracks and other defects that could compromise magnetic performance or mechanical integrity.
- Guidelines ensure that surface deviations do not exceed limits that could impair function.
3. Limits on Chips and Ragged Edges
- On mating surfaces (e.g., center leg contact surfaces), chips area must be less than specific percentages of the surface area, e.g., cumulative chips area <6%, ragged edge length <25% perimeter.
- On other core surfaces, allowable chip areas are doubled compared to mating surfaces.
- Detailed tables list permissible chip areas in square millimeters based on core size and type (ETD or E-core). For example:
- ETD19 core allows chips <2.5 mm² on mating surfaces, <5 mm² on other surfaces.
- E10/3 core allows chips <1 mm² on mating surfaces, <1.5 mm² on other surfaces.
4. Reference to Related Standards
- IEC 60424-1: General Specification on Surface Irregularities for Ferrite Cores.
- IEC 61185: Dimensions for ETD magnetic oxide cores for power supplies.
- IEC 61246: Dimensions for E-cores of rectangular cross-section.
- These references provide a comprehensive framework, combining dimensional standards with surface quality limits.
Applications
- Manufacturing Quality Control: Assists ferrite core manufacturers to maintain product quality by defining clear, measurable limits for surface defects.
- Contractual Agreements: Provides a standardized reference for buyer-supplier negotiations regarding product acceptance criteria, reducing disputes related to irregularities.
- Performance Assurance: Helps ensure that ferrite cores meet functional requirements in electromagnetic applications by minimizing defects that could degrade magnetic properties or assembly fit.
- Component Inspection Procedures: Guides inspection and testing protocols during production and incoming material assessments in electronics manufacturing.
Related Standards
- IEC 60424-1:1999 – Provides the general specification for surface irregularities across all ferrite core types, forming the foundational framework for part 3.
- IEC 61185:1992 – Specifies the dimensional requirements for ETD-cores, informing size classifications and referencing in chip area limits.
- IEC 61246:1994 – Details dimensions for E-cores, serving as a dimensional baseline connected to surface defect limits.
- IEC 60050 – International Electrotechnical Vocabulary (IEV) for terminology related to electrical components.
- IEC 60027, IEC 60417, IEC 60617 – Standards covering graphical and letter symbols relevant to electrical technology, useful for documentation referencing ferrite core standards.
By adhering to IEC 60424-3:1999, manufacturers and buyers of ETD-cores and E-cores align on clear surface quality expectations, enhancing the consistency, reliability, and performance of ferrite cores used in electrical and electronic systems worldwide. This standard is pivotal for ensuring that surface imperfections remain within limits that do not impede the electromagnetic efficiency or assembly compatibility of ferrite components.
Frequently Asked Questions
IEC 60424-3:1999 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Ferrite cores - Guide on the limits of surface irregularities - Part 3: ETD-cores and E-cores". This standard covers: Gives guidance on allowable limits of surface irregularities applicable to ETD-cores, E-cores and other similar shapes in accordance with the relevant general specification.
Gives guidance on allowable limits of surface irregularities applicable to ETD-cores, E-cores and other similar shapes in accordance with the relevant general specification.
IEC 60424-3:1999 is classified under the following ICS (International Classification for Standards) categories: 29.100.10 - Magnetic components. The ICS classification helps identify the subject area and facilitates finding related standards.
IEC 60424-3:1999 has the following relationships with other standards: It is inter standard links to IEC 60424-3:2015. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
IEC 60424-3:1999 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
NORME CEI
INTERNATIONALE IEC
60424-3
INTERNATIONAL
Première édition
STANDARD
First edition
1999-06
Noyaux ferrites –
Guide relatif aux limites des irrégularités
de surface –
Partie 3:
Noyaux ETD et E
Ferrite cores –
Guide on the limits of surface irregularities –
Part 3:
ETD-cores and E-cores
Numéro de référence
Reference number
CEI/IEC 60424-3:1999
Numéros des publications Numbering
Depuis le 1er janvier 1997, les publications de la CEI As from 1 January 1997 all IEC publications are
sont numérotées à partir de 60000. issued with a designation in the 60000 series.
Publications consolidées Consolidated publications
Les versions consolidées de certaines publications de Consolidated versions of some IEC publications
la CEI incorporant les amendements sont disponibles. including amendments are available. For example,
Par exemple, les numéros d’édition 1.0, 1.1 et 1.2 edition numbers 1.0, 1.1 and 1.2 refer, respectively, to
indiquent respectivement la publication de base, la the base publication, the base publication incor-
publication de base incorporant l’amendement 1, et la porating amendment 1 and the base publication
publication de base incorporant les amendements 1 incorporating amendments 1 and 2.
et 2.
Validité de la présente publication Validity of this publication
Le contenu technique des publications de la CEI est The technical content of IEC publications is kept
constamment revu par la CEI afin qu'il reflète l'état under constant review by the IEC, thus ensuring that
actuel de la technique. the content reflects current technology.
Des renseignements relatifs à la date de reconfir- Information relating to the date of the reconfirmation
mation de la publication sont disponibles dans le of the publication is available in the IEC catalogue.
Catalogue de la CEI.
Les renseignements relatifs à des questions à l’étude et Information on the subjects under consideration and
des travaux en cours entrepris par le comité technique work in progress undertaken by the technical
qui a établi cette publication, ainsi que la liste des committee which has prepared this publication, as well
publications établies, se trouvent dans les documents ci- as the list of publications issued, is to be found at the
dessous: following IEC sources:
• «Site web» de la CEI* • IEC web site*
• Catalogue des publications de la CEI • Catalogue of IEC publications
Publié annuellement et mis à jour Published yearly with regular updates
régulièrement (On-line catalogue)*
(Catalogue en ligne)*
• IEC Bulletin
• Bulletin de la CEI Available both at the IEC web site* and
Disponible à la fois au «site web» de la CEI* as a printed periodical
et comme périodique imprimé
Terminology, graphical and letter
Terminologie, symboles graphiques
symbols
et littéraux
For general terminology, readers are referred to
En ce qui concerne la terminologie générale, le lecteur IEC 60050: International Electrotechnical Vocabulary
se reportera à la CEI 60050: Vocabulaire Electro- (IEV).
technique International (VEI).
For graphical symbols, and letter symbols and signs
Pour les symboles graphiques, les symboles littéraux approved by the IEC for general use, readers are
et les signes d'usage général approuvés par la CEI, le referred to publications IEC 60027: Letter symbols to
lecteur consultera la CEI 60027: Symboles littéraux à be used in electrical technology, IEC 60417: Graphical
utiliser en électrotechnique, la CEI 60417: Symboles symbols for use on equipment. Index, survey and
graphiques utilisables sur le matériel. Index, relevé et compilation of the single sheets and IEC 60617:
compilation des feuilles individuelles, et la CEI 60617: Graphical symbols for diagrams.
Symboles graphiques pour schémas.
* See web site address on title page.
* Voir adresse «site web» sur la page de titre.
NORME CEI
INTERNATIONALE IEC
60424-3
INTERNATIONAL
Première édition
STANDARD
First edition
1999-06
Noyaux ferrites –
Guide relatif aux limites des irrégularités
de surface –
Partie 3:
Noyaux ETD et E
Ferrite cores –
Guide on the limits of surface irregularities –
Part 3:
ETD-cores and E-cores
IEC 1999 Droits de reproduction réservés Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun procédé, any form or by any means, electronic or mechanical,
électronique ou mécanique, y compris la photo-copie et les including photocopying and microfilm, without permission in
microfilms, sans l'accord écrit de l'éditeur. writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http://www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
K
PRICE CODE
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue
– 2 – 60424-3 © CEI:1999
SOMMAIRE
Pages
AVANT-PROPOS . 4
Articles
1 Domaine d'application.6
2 Références normatives.6
3 Limites des irrégularités de surface . 6
3.1 Eclats et angles ébréchés . 6
3.2 Fissures.14
3.3 Bavure.14
3.4 Collages.14
60424-3 © IEC:1999 – 3 –
CONTENTS
Page
FOREWORD . 5
Clause
1 Scope.7
2 Normative references.7
3 Limits of surface irregularities. 7
3.1 Chips and ragged edges. 7
3.2 Cracks.15
3.3 Flash.15
3.4 Pull-outs.15
– 4 – 60424-3 © CEI:1999
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
___________
NOYAUX FERRITES –
GUIDE RELATIF AUX LIMITES
DES IRRÉGULARITÉS DE SURFACE –
Partie 3: Noyaux ETD et E
AVANT-PROPOS
1) La CEI (Commission Electrotechnique Internationale) est une organisation mondiale de normalisation composée
de l'ensemble des comités électrotechniques nationaux (Comités nationaux de la CEI). La CEI a pour objet de
favoriser la coopération internationale pour toutes les questions de normalisation dans les domaines de
l'électricité et de l'électronique. A cet effet, la CEI, entre autres activités, publie des Normes internationales.
Leur élaboration est confiée à des comités d'études, aux travaux desquels tout Comité national intéressé par le
sujet traité peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en
liaison avec la CEI, participent également aux travaux. La CEI collabore étroitement avec l'Organisation
Internationale de Normalisation (ISO), selon des conditions fixées par accord entre les deux organisations.
2) Les décisions ou accords officiels de la CEI concernant les questions techniques représentent, dans la mesure
du possible un accord international sur les sujets étudiés, étant donné que les Comités nationaux intéressés
sont représentés dans chaque comité d’études.
3) Les documents produits se présentent sous la forme de recommandations internationales. Ils sont publiés
comme normes, rapports techniques ou guides et agréés comme tels par les Comités nationaux.
4) Dans le but d'encourager l'unification internationale, les Comités nationaux de la CEI s'engagent à appliquer de
façon transparente, dans toute la mesure possible, les Normes internationales de la CEI dans leurs normes
nationales et régionales. Toute divergence entre la norme de la CEI et la norme nationale ou régionale
correspondante doit être indiquée en termes clairs dans cette dernière.
5) La CEI n’a fixé aucune procédure concernant le marquage comme indication d’approbation et sa responsabilité
n’est pas engagée quand un matériel est déclaré conforme à l’une de ses normes.
6) L’attention est attirée sur le fait que certains des éléments de la présente Norme internationale peuvent faire
l’objet de droits de propriété intellectuelle ou de droits analogues. La CEI ne saurait être tenue pour
responsable de ne pas avoir identifié de tels droits de propriété et de ne pas avoir signalé leur existence.
La Norme internationale CEI 60424-3 a été établie par le comité d'études 51 de la CEI:
Composants magnétiques et ferrites.
Le texte de cette norme est issu des documents suivants:
FDIS Rapport de vote
51/530/FDIS 51/544/RVD
Le rapport de vote indiqué dans le tableau ci-dessus donne toute information sur le vote ayant
abouti à l'approbation de cette norme.
Les normes futures de cette série porteront dorénavant le nouveau titre général cité ci-dessus.
Le titre des normes existant déjà dans cette série sera mis à jour lors d'une prochaine édition.
60424-3 © IEC:1999 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
FERRITE CORES –
GUIDE ON THE LIMITS OF SURFACE IRREGULARITIES –
Part 3: ETD-cores and E-cores
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
Internationa
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