IEC 60352-3:2020

IEC 60352-3 ®
Edition 2.0 2020-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Solderless connections –
Part 3: Accessible insulation displacement (ID) connections – General
requirements, test methods and practical guidance

Connexions sans soudure –
Partie 3: Connexions autodénudantes accessibles – Règles générales, méthodes
d’essai et guide pratique
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IEC 60352-3 ®
Edition 2.0 2020-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Solderless connections –
Part 3: Accessible insulation displacement (ID) connections – General

requirements, test methods and practical guidance

Connexions sans soudure –
Partie 3: Connexions autodénudantes accessibles – Règles générales, méthodes

d’essai et guide pratique
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.120.20 ISBN 978-2-8322-8086-7

– 2 – IEC 60352-3:2020 © IEC 2020
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 10
4 Workmanship . 13
5 Prerequisites for basic test schedule . 13
5.1 General . 13
5.2 Prerequisites for accessible ID terminations . 14
5.2.1 Accessible ID termination materials . 14
5.2.2 Accessible ID termination dimensions . 14
5.2.3 Accessible ID termination surface finishes . 14
5.2.4 Accessible ID termination design features . 14
5.3 Prerequisites for wires and conductors. 14
5.3.1 Wires and conductors . 14
5.3.2 Wire insulation . 15
5.4 Accessible insulation displacement connections (accessible ID connections) . 15
6 Testing . 15
6.1 Introduction . 15
6.2 General . 15
6.3 Standard conditions for testing . 16
6.4 Preconditioning . 16
6.5 Recovery . 16
6.6 Mounting of specimen . 16
7 Tests . 16
7.1 General examination . 16
7.2 Mechanical tests . 17
7.2.1 Transverse extraction force . 17
7.2.2 Bending of the wire . 18
7.2.3 Vibration . 19
7.2.4 Repeated connection and disconnection, reusable accessible ID
terminations . 20
7.3 Electrical tests . 20
7.3.1 General . 20
7.3.2 Contact resistance . 21
7.3.3 Electrical load and temperature . 22
7.4 Climatic tests . 22
7.4.1 General . 22
7.4.2 Rapid change of temperature . 22
7.4.3 Climatic sequence . 22
7.4.4 Flowing mixed gas corrosion test . 22
7.4.5 Damp heat, cyclic . 23
8 Test schedules . 23
8.1 General . 23
8.1.1 Overview . 23

8.1.2 ID connections with terminations suitable for a range of wire diameters . 23
8.1.3 Multipole connectors . 23
8.2 Basic test schedule . 24
8.2.1 Généralités . 24
8.2.2 Initial examination . 24
8.2.3 Testing of accessible ID connections . 24
8.3 Full test schedule . 26
8.3.1 General . 26
8.3.2 Initial examination . 26
8.3.3 Testing of accessible ID connections . 26
8.4 Flow charts . 29
Annex A (informative) Practical guidance . 32
A.1 General information on accessible ID connections . 32
A.1.1 General . 32
A.1.2 Advantages of accessible ID connections . 32
A.2 Current-carrying capacity . 33
A.3 Tool information . 33
A.3.1 Wire insertion tool . 33
A.3.2 Wire extraction tool . 33
A.3.3 Combination tool. 33
A.4 Termination information . 33
A.4.1 General . 33
A.4.2 Design features . 34
A.4.3 Materials . 34
A.4.4 Surface finishes . 34
A.5 Wire information. 34
A.5.1 Type . 34
A.5.2 Dimensions . 34
A.5.3 Surface finishes . 34
A.5.4 Insulation . 34
A.6 Connection information . 35
Annex B (informative) Application examples . 37
B.1 Examples for good IDCs or negative results (see Figure B.1 to Figure B.7) . 37
B.2 Examples for good transversal micro section or negative results . 39
Bibliography . 40

Figure 1 – Example of accessible and non-accessible insulation displacement
connection . 7
Figure 2 – Insulation displacement connection . 11
Figure 3 – Slot . 12
Figure 4 – Beam . 13
Figure 5 – Test arrangement, transverse extraction force. 17
Figure 6 – Test arrangement, bending of the wire . 18
Figure 7 – Test arrangement, vibration . 19
Figure 8 – Test arrangement, contact resistance . 21
Figure 9 – Basic test schedule (see 8.2) . 30
Figure 10 – Full test schedule (see 8.3) . 31

– 4 – IEC 60352-3:2020 © IEC 2020
Figure A.1 – Example of a single-type accessible ID termination with a solid round
conductor . 36
Figure B.1 – Example of correct and acceptable ID connections . 37
Figure B.2 – Examples for good IDCs or negative results . 37
Figure B.3 – Faulty IDC: damaged contacts . 38
Figure B.4 – Requirements for open-ended IDCs . 38
Figure B.5 – Faulty IDC: damaged wire . 38
Figure B.6 – IDC: Wire position . 39
Figure B.7 – IDC: transversal micro section . 39

Table 1 – Minimum transverse extraction force . 18
Table 2 – Vibration, preferred test severities . 19
Table 3 – Contact resistance of accessible ID connections, maximum permitted values . 21
Table 4 – Number of specimens required . 24
Table 5 – Qualification test schedule – Test group 1 . 25
Table 6 – Qualification test schedule – Test group 2 . 25
Table 7 – Qualification test schedule – Test group 3 . 26
Table 8 – Qualification test schedule – Test group A . 27
Table 9 – Qualification test schedule – Test group B . 27
Table 10 – Qualification test schedule – Test group C . 28
Table 11 – Qualification test schedule – Test group D . 29
Table 12 – Qualification test schedule – Test group E . 29

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SOLDERLESS CONNECTIONS –
Part 3: Accessible insulation displacement (ID) connections –
General requirements, test methods and practical guidance

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote interna-
tional co-operation on all questions concerning standardization in the electrical and electronic fields. To this
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nical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as "IEC Publica-
tion(s)"). Their preparation is entrusted to technical committees; any IEC National Committee interested in the
subject dealt with may participate in this preparatory work. International, governmental and non-governmental
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tional Organization for Standardization (ISO) in accordance with conditions determined by agreement between
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2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all inter-
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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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6) All users should ensure that they have the latest edition of this publication.
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other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and ex-
penses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publica-
tions.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60352-3 has been prepared by subcommittee 48B: Electrical
connectors, of IEC technical committee 48: Electrical connectors and mechanical structures
for electrical and electronic equipment.
This second edition cancels and replaces the first edition published in 1993. This edition con-
stitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) Subclause 7.2.2: reduce the limit of duration of contact disturbance to 1 µs.
b) Subclause 7.2.3: reduce the limit of duration of contact disturbance to 1 µs.
c) Transferred Clauses 9 to 13 to Annex A (informative).
d) The figures were revised for clarity.

– 6 – IEC 60352-3:2020 © IEC 2020
The text of this International Standard is based on the following documents:
FDIS Report on voting
48B/2789/FDIS 48B/2802/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60352 series, published under the general title Solderless connec-
tions, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
INTRODUCTION
The two following parts of IEC 60352 are available on solderless insulation displacement con-
nections:
– Part 3: Accessible insulation displacement connections – General requirements, test
methods and practical guidance;
– Part 4: Solderless non-accessible insulation displacement connections – General require-
ments, test methods and practical guidance.
NOTE In this document the term "insulation displacement" is abbreviated to "ID", for example "ID connection", "ID
termination".
Figure 1 illustrates examples of accessible and non-accessible insulation displacement con-
nections that clarify the difference among them.
Part 3 includes requirements and relevant tests (normative) as well as a practical guidance in
Annex A (informative) for accessible ID connections.
Two test schedules are provided:
– the basic test schedule which applies to insulation displacement connections which con-
form to all prerequisites of Clause 5. It is derived from experience with successful applica-
tions of such connections;
– the full test schedule which applies to insulation displacement connections which do not
fully conform to all prerequisites of Clause 5, for example which are manufactured using
materials or finishes not included in Clause 5.
This philosophy permits cost and time effective performance verification using a limited basic
test schedule for established insulation displacement connections and an expanded full test
schedule for connections requiring more extensive performance validation.
The suitability of the accessible ID connection implies that the specified requirements and
tests apply to all factors involved in producing a suitable ID connection, namely:
– the accessible ID termination, which may be part of a single-pole or multipole connector;
– the wire (or range of wires) for which the termination is suitable;
– the tools (if any) required to produce that type of solderless connection.
The practical guidance (informative Annex A) serves as a guideline for the required workman-
ship. Attention is drawn to the fact that some industries (e.g. automotive, aerospace, nuclear,
military) may have specific workmanship standards and/or quality requirements, which are
outside the scope of this standard.

Figure 1 – Example of accessible and non-accessible
insulation displacement connection

– 8 – IEC 60352-3:2020 © IEC 2020
IEC Guide 109 advocates the need to minimise the impact of a product on the natural
environment throughout the product life cycle.
It is understood that some of the materials permitted in this document may have a negative
environmental impact.
As technological advances lead to acceptable alternatives for these materials, they will be
eliminated from the document.
SOLDERLESS CONNECTIONS –
Part 3: Accessible insulation displacement (ID) connections –
General requirements, test methods and practical guidance

1 Scope
This part of IEC 60352 is applicable to ID connections which are accessible for tests and
measurements according to Clauses 6 through 8 and which are made with:
– appropriately designed accessible ID terminations,
– wires having solid round conductors of 0,25 mm to 3,6 mm nominal diameter,
2 2
– wires having stranded conductors of 0,05 mm to 10 mm cross-sectional area,
for use in electrical and electronic equipment and components.
Information on materials and data from industrial experience is included in addition to the test
procedures to provide electrically stable connections under prescribed environmental condi-
tions.
There are different designs and materials for accessible ID terminations in use. For this rea-
son only fundamental parameters of the termination are specified, while the performance re-
quirements of the wire and the complete connection are specified in full detail.
The purpose of this document is:
– to determine the suitability of accessible ID connections under specified mechanical, elec-
trical and atmospheric conditions;
– to provide a means of comparing test results when the tools used to make the connec-
tions, if any, are of different designs or manufacture.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their con-
tent constitutes requirements of this document. For dated references, only the edition cited
applies. For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60068-1, Environmental testing – Part 1: General and guidance
IEC 60228, Conductors of insulated cables
IEC 60512-1, Connectors for electrical and electronic equipment – Tests and measurements –
Part 1: Generic specification
IEC 60512-1-1, Connectors for electronic equipment – Tests and measurements – Part 1-1:
General examination – Test 1a: Visual examination
IEC 60512-1-2, Connectors for electronic equipment – Tests and measurements – Part 1-2:
General examination – Test 1b: Examination of dimension and mass
IEC 60512-2-1, Connectors for electronic equipment – Part 2: Electrical continuity and contact
resistance tests – Test 2a: Contact resistance – Millivolt level method

– 10 – IEC 60352-3:2020 © IEC 2020
IEC 60512-2-2, Connectors for electronic equipment – Tests and measurements – Part 2-2:
Electrical continuity and contact resistance tests – Test 2b: Contact resistance – Specified
test current method
IEC 60512-2-5, Connectors for electronic equipment – Tests and measurements – Part 2-5:
Electrical continuity and contact resistance tests – Test 2e: Contact disturbance
IEC 60512-6-4, Connectors for electronic equipment – Tests and measurements – Part 6-4:
Dynamic stress tests – Test 6d: Vibration (sinusoidal)
IEC 60512-9-2, Connectors for electronic equipment – Tests and measurements – Part 9-2:
Endurance tests – Test 9b: Electrical load and temperature
IEC 60512-11-1, Connectors for electrical and electronic equipment – Tests and measure-
ments – Part 11-1: Climatic tests – Test 11a – Climatic sequence
IEC 60512-11-4, Connectors for electronic equipment – Tests and measurements – Part 11-4:
Climatic tests – Test 11d: Rapid change of temperature
IEC 60512-11-7, Connectors for electronic equipment – Tests and measurements – Part 11-7:
Climatic tests – Test 11g: Flowing mixed gas corrosion test
IEC 60512-11-9, Connectors for electronic equipment – Tests and measurements – Part 11-9:
Climatic tests – Test 11i: Dry heat
IEC 60512-11-10, Connectors for electronic equipment – Tests and measurements –
Part 11-10: Climatic tests – Test 11j: Cold
IEC 60512-11-12, Connectors for electronic equipment – Tests and measurements –
Part 11-12: Climatic tests – Test 11m: Damp heat, cyclic
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1
conductor
part of the cable or wire intended to carry electric current
Note 1 to entry: The conductor may be
a) solid – made of a single strand of circular cross-section;
b) stranded – made of several strands of circular cross-section assembled either by laying up concentrically or by
bunching, and without insulation between them.
Note 2 to entry: The properties of the copper are in accordance with IEC 60228
[SOURCE: IEC 60189-1:2018, 3.1, modified – Note 2 to entry has been added]

3.2
wire
insulated conductor or assembly of several insulated conductors, laid up together and which
may be provided with a screen
Note 1 to entry: The wire may be
a) single – consists of a single insulated conductor;
b) multiple – consists of several insulated conductors
[SOURCE: IEC 60189-1:2018, 3.2 modified –"low frequency" has been deleted in the term
defined and Note 2 to entry has been deleted]
3.3
insulation displacement connection
ID connection
solderless electrical connection made by inserting a single wire into a precisely controlled slot
in a termination such that the sides of the slot displace the insulation and deform the conduc-
tor of a solid wire or the strands of a stranded wire to produce a gas-tight connection
Note 1 to entry: See Figure 2.

Figure 2 – Insulation displacement connection
3.3.1
accessible insulation displacement connection
accessible ID connection
ID connection in which it is possible to access test points for carrying out mechanical tests
(for example, transverse extraction force) and electrical measurements (for example, contact
resistance) without deactivation of any design feature intended to establish and/or maintain
the ID connection
3.3.2
non-accessible insulation displacement connection
non-accessible ID connection
ID connection in which it is not possible to access test points for carrying out mechanical tests
such as transverse extraction force and some electrical measurements (for example, contact
resistance) without deactivation of any design feature intended to establish and/or maintain
the ID connection, mainly where the ID connection is enclosed in a component
(see IEC 60352-4)
3.4
insulation displacement termination
ID termination
termination designed to accept a wire for the purpose of establishing an ID connection

– 12 – IEC 60352-3:2020 © IEC 2020
3.4.1
reusable insulation displacement termination
reusable ID termination
ID termination that can be used more than once
3.4.2
non-reusable insulation displacement termination
non-reusable ID termination
ID termination that can be used only once
3.5
slot
specially shaped opening in an ID termination suitable to provide either connection or strain
relief
Note 1 to entry: See Figure 3.

Figure 3 – Slot
3.5.1
connection slot
specially shaped opening in an ID termination suitable to displace the insulation of a wire and
to ensure a gas-tight connection between the termination and the conductor(s) of the wire
Note 1 to entry: In certain cases, a second connection slot is used to provide for a double connection.
3.5.2
strain relief slot
specially shaped opening in an ID termination suitable to provide for strain relief
3.6
beam
specially shaped metallic part of an ID termination on each side of the slot
Note 1 to entry: See Figure 4.

Figure 4 – Beam
3.7
apparent diameter
diameter of the circumscribing circle of the bundle of strands
3.8
wire insertion tool
hand or power-operated tool for producing an ID connection by inserting the wire(s) in a con-
trolled manner to a predetermined position into the slot(s)
[SOURCE: IEC 60050-581: 2008, 581-24-27]
3.9
wire extraction tool
device for extracting the wire(s) from the ID termination
[SOURCE: IEC 60050-581: 2008, 581-24-28]
4 Workmanship
The manufacturer of accessible ID terminations or of a component (e.g. multipole connectors)
using such terminations shall provide an instruction for the assembly of accessible
ID connections.
Accessible ID connections shall be processed in a careful and workmanlike manner, in ac-
cordance with good current practice.
Annex A (informative) provides practical guidance and may constitute a benchmark for the
assessment of workmanship.
NOTE Some industry sectors (e.g. automotive, aerospace, marine, nuclear, military) use workmanship standards
which can be considered upon agreement between manufacturer and user.
5 Prerequisites for basic test schedule
5.1 General
Accessible ID connections which fulfil the following prerequisites, which are based on the ex-
perience by the industry, shall be assessed in accordance with the basic test schedule.

– 14 – IEC 60352-3:2020 © IEC 2020
All prerequisites are essential at the same level of importance. Accessible ID connections,
which do not comply with all these prerequisites but are covered by the scope of this stand-
ard, shall be assessed in accordance with the full test schedule.
5.2 Prerequisites for accessible ID terminations
5.2.1 Accessible ID termination materials
Suitable grades of copper alloy, such as copper-tin (bronze), copper-zinc (brass), etc. shall be
used.
If copper-zinc alloys are used, there should be consideration for corrosion effects caused by
mechanical stresses in some environments.
5.2.2 Accessible ID termination dimensions
The quality of an ID connection depends on the dimensions of the accessible ID termination,
particularly of its slot and beams, together with the characteristics of the materials used. The
dimensions shall be chosen so as to be suitable for the wire or range of wires for which the
accessible ID termination is designed. The suitability is verified by applying the test schedule
given in Clauses 6 to 8.
5.2.3 Accessible ID termination surface finishes
The contact area of the accessible ID termination shall be plated with tin or with silver, gold,
palladium or their alloys. The surface of the contact area shall be free of detrimental contami-
nation or corrosion.
5.2.4 Accessible ID termination design features
Accessible ID terminations may be distinguished according to reusability conditions and ac-
cording to a range of wire sizes that can be accommodated. This results in the following
types:
– reusable ID terminations, designed to be connected more than once and designed for one
specified nominal conductor diameter or cross-section;
– reusable ID terminations, designed to be connected more than once and designed for a
specified range of conductor diameters or cross-sections;
– non-reusable ID terminations, designed to be connected once and designed for one speci-
fied nominal conductor diameter or cross-section;
– non-reusable ID terminations, designed to be connected once and designed for a specified
range of conductor diameters or cross-sections.
The edges of the beams shall be smooth and free of burrs to avoid unintentional damage to
the conductor(s) or insulation.
5.3 Prerequisites for wires and conductors
5.3.1 Wires and conductors
5.3.1.1 General
Wires with solid round conductors or stranded conductors with seven single strands according
to IEC 60228 class 2 shall be used.
5.3.1.2 Conductor materials
The conductor material shall be annealed copper. It shall have an elongation at break of not
less than 10 %.
5.3.1.3 Wire and conductor dimensions
Different ranges of wires shall be used:
– single solid round conductors of 0,25 mm to 1,4 mm diameter (converted 0,049 mm to
);or
1,5 mm
2 2
– stranded conductors of seven strands only and 0,075 mm to 1,5 mm cross-sectional
area.
5.3.1.4 Conductor surface finishes
Solid round conductors shall be unplated or plated with tin or silver. Stranded conductors
shall have strands unplated or plated with tin or silver.
5.3.2 Wire insulation
The manufacturer of the accessible ID termination shall specify the outside diameter of the
wire that can be accommodated.
The insulation material shall be compatible with the insulation displacement process, i.e. the
insulation material shall be capable of being readily displaced by the inner edges of the
beams without cutting the conductor or conductor strands. In the case of stranded conductors,
the insulation shall, in addition, be capable of keeping the strands in place so that they are
not unduly displaced when making the ID connection.
5.4 Accessible insulation displacement connections (accessible ID connections)
a) The combination of wire, accessible ID termination and, if applicable, connection tool shall
be compatible.
b) When inserting the wire into the connection slot of the accessible ID termination, the inner
sides of the beams shall displace the wire insulation and deform
– the diameter of a solid round conductor, or
– the apparent diameter of a stranded conductor and, in addition, the diameter of those
strands which are in contact with the beams
to produce a gas-tight connection.
c) The wire shall be correctly located in the connection slot of the accessible ID termination
as specified by the manufacturer (either of the accessible ID termination or of the con-
nector using such termination). There shall be a sufficient distance between the termina-
tion and the wire end. The minimum value of that distance depends on the wire used and
shall be as specified by the manufacturer.
d) Only one wire in one connection slot shall be used.
6 Testing
6.1 Introduction
All tests shall be carried out with accessible ID terminations and accessible ID connections
being in their normal operating position, for example in their housings (e.g.: the connector
insulating body).
Where an accessible ID termination is designed to accommodate more than one accessible
ID connection, each connection shall be tested individually.
6.2 General
As explained in the introduction to this document, there are two test schedules which shall be
applied according to the following conditions:

– 16 – IEC 60352-3:2020 © IEC 2020
– accessible ID connections which conform to all the prerequisites of Clause 5 shall be test-
ed in accordance with and meet the requirements of 8.2.
– accessible ID connections which do not fully conform to all the prerequisites of Clause 5,
for example, which are made with different wire and/or termination sizes and/or materials,
shall be tested according to and meet the requirements of 8.3.
6.3 Standard conditions for testing
Unless otherwise specified, all tests shall be carried out under standard conditions for testing
as specified in IEC 60512-1.
The ambient temperature and the relative humidity at which the measurements are made shall
be stated in the test report.
In the case of dispute about test results, the test shall be repeated at one of the referee con-
ditions of IEC 60068-1.
6.4 Preconditioning
Where specified, the connections shall be preconditioned under standard conditions for test-
ing for a period of 24 h, in accordance with IEC 60512-1.
6.5 Recovery
Where specified, the specimen shall be allowed to recover under standard conditions for test-
ing for a period of 1 h to 2 h after conditioning.
6.6 Mounting of specimen
A test specimen shall consist of the component having one or a specified number of accessi-
ble ID terminations with wires mounted according to manufacturer´s instruction to the connec-
tion slots of each accessible ID termination. The wires connected with a multipole connector
may be a multi-core cable or a number of single wires.
When mounting is required in a test, the specimens shall be mounted using the normal mount-
ing method, unless otherwise specified.
7 Tests
7.1 General examination
The tests shall be carried out in accordance with Test 1a: Visual examination of
IEC 60512-1-1, and Test 1b: Examination of dimension and mass, of IEC 60512-1-2. The vis-
ual examination test may be carried out with magnification of up to approximately five times.
All parts shall be examined
...