Semiconductor devices - Discrete devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation

IEC/PAS 60747-17:2011(E) gives the terminology, essential ratings, characteristics, safety test and the measuring methods of magnetic and capacitive couplers. It specifies the principles of magnetic and capacitive coupling across an isolation barrier and the related requirements for basic isolation and reinforced insulation.

General Information

Status
Replaced
Publication Date
16-Nov-2011
Current Stage
DELPUB - Deleted Publication
Completion Date
21-Sep-2020
Ref Project

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IEC PAS 60747-17:2011 - Semiconductor devices - Discrete devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation
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IEC/PAS 60747-17 ®
Edition 1.0 2011-11
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD
Semiconductor devices – Discrete devices –
Part 17: Magnetic and capacitive coupler for basic and reinforced isolation

IEC/PAS 60747-17:2011(E)
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IEC/PAS 60747-17 ®
Edition 1.0 2011-11
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD
Semiconductor devices – Discrete devices –
Part 17: Magnetic and capacitive coupler for basic and reinforced isolation

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
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ICS 31.080.99 ISBN 978-2-88912-792-4
– 2 – PAS 60747-17 © IEC:2011(E)
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Magnetic and Capacitive Coupler . 8
3.1 Semiconductor material . 8
3.2 Details of outline and encapsulation . 8
3.2.1 Outline drawing . 8
3.2.2 Method of encapsulation . 9
3.2.3 Terminal identification and indication of any connection between a
terminal and the case . 9
3.3 Type of coupler . 9
3.3.1 SIO2 Isolators . 9
3.3.2 Thin film Polymer Isolators . 9
4 Terms related to ratings and characteristics for a coupler . 9
4.1 lsolation sides . 9
4.2 lsolation capacitance: C . 9
IO
4.3 lsolation resistance: R . 9
IO
4.4 lsolation voltage . 9
4.5 Logic state match . 9
4.6 Logic state transition match . 9
4.7 Common mode transient immunity (CMTI) . 10
4.8 Magnetic field immunity (MFI) . 10
4.8.1 Static magnetic field immunity (SMFI) . 10
4.8.2 Variable magnetic field immunity (VMFI) . 10
4.9 Propagation Delay: t or t . 10
pLH pHL
4.10 Further terms and abbreviations . 10
5 Terms for couplers providing protection against electrical shock . 10
5.1 Safety ratings of couplers for reinforced insulation . 10
5.2 Electrical safety requirements of couplers for basic and reinforced insulation . 10
5.2.1 Partial discharge (pd) . 11
5.2.2 Apparent charge: q . 11
pd
5.2.3 Threshold apparent charge: q . 11
pd(TH)
5.2.4 Test voltages and time intervals for the partial-discharge test of
couplers . 11
5.2.5 Lifetime (Lifetime) . 15
5.2.6 Failure Rate over Lifetime (FROL) . 15
5.2.7 Statistical model (model) . 15
5.3 Isolation voltages and isolation test voltages for couplers providing

protection against electrical shock . 15
5.3.1 Rated isolation voltages . 15
5.4 Absolute maximum ratings . 16
5.4.1 Minimum and maximum storage temperatures: T . 16
stg
5.4.2 Minimum and maximum ambient or reference-point operating
temperatures: T or T . 16
amb ref
5.4.3 Maximum soldering temperature: T . 16
sld
5.4.4 Maximum continuous (direct) reverse input voltage (V ) over the
R
operating temperature range . 16

PAS 60747-17 © IEC:2011(E) – 3 –
5.4.5 Maximum continuous (direct) or repetitive peak isolation voltage (V
lO
or V ) over the operating temperature range . 16
IORM
5.4.6 Maximum surge isolation voltage (V ) over the operating
IOSM
temperature range . 16
5.4.7 Maximum continuous input current (I ) at an ambient or reference-
I
point temperature of 25 °C and derating curve or derating factor . 17
5.4.8 Maximum peak input current (I ) at an ambient or reference-point
lM
temperature of 25 °C and under specified pulse conditions . 17
5.4.9 Maximum power dissipation (P ) of the output stage at an ambient
trn
or reference- point temperature of 25 °C and a derating curve or
derating factor . 17
5.4.10 Maximum total power dissipation of the package (P ) at an ambient
tot
or reference- point temperature of 25 °C and derating curve or
derating factor . 17
6 Electrical characteristics . 17
6.1 Coupler logic and timing definitions . 17
7 Coupler protection against electrical shock . 18
7.1 Type . 18
7.2 Ratings (shall be listed in a special section in the manufacturer's datasheet) . 18
7.2.1 Safety Limiting Values . 18
7.2.2 Functional ratings . 18
7.2.3 Rated isolation voltages . 18
7.3 Electrical safety requirements . 19
7.4 Electrical, environmental and/or endurance test information: (supplementary
information if desired by the manufacturer) . 19
7.4.1 Routine test . 19
7.4.2 Sample test . 19
7.4.3 Type Test . 20
8 Measuring methods for couplers . 28
8.1 Input-to-output capacitance (C ) . 28
lO
8.1.1 Purpose . 28
8.1.2 Circuit diagram . 28
8.1.3 Measurement procedure . 28
8.1.4 Precautions to be observed . 29
8.1.5 Special conditions . 29
8.2 Isolation resistance between input and output, R . 29
lO
8.2.1 Purpose . 29
8.2.2 Circuit diagram . 29
8.2.3 Precautions to be observed . 29
8.2.4 Measurement procedure . 29
8.2.5 Special conditions . 29
8.3 Isolation test. 30
8.3.1 Purpose . 30
8.3.2 Circuit diagram . 30
8.3.3 Test procedure . 30
8.3.4 Requirements . 30
8.3.5 Specified conditions . 30
8.4 Partial discharges of magnetic couplers . 31
8.4.1 Purpose . 31
8.4.2 Circuit diagram . 31

– 4 – PAS 60747-17 © IEC:2011(E)
8.4.3 Description of the test circuit and requirements . 31
8.4.4 Test procedure . 32
8.4.5 Specified conditions . 33
8.5 Switching times of couplers . 34
8.5.1 Purpose . 34
8.5.2 Circuit diagram . 34
8.5.3 Circuit description and requirements . 34
8.5.4 Precautions to be observed . 34
8.5.5 Measurement procedure . 34
8.5.6 Specified conditions . 35
8.6 Measuring methods of common-mode transient immunity (CMTI) for
ma
...

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