IEC 61788-7:2006

INTERNATIONAL IEC
STANDARD 61788-7
Second edition
2006-10
Superconductivity –
Part 7:
Electronic characteristic measurements –
Surface resistance of superconductors at
microwave frequencies
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INTERNATIONAL IEC
STANDARD 61788-7
Second edition
2006-10
Superconductivity –
Part 7:
Electronic characteristic measurements –
Surface resistance of superconductors at
microwave frequencies
© IEC 2006 ⎯ Copyright - all rights reserved
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– 2 – 61788-7 © IEC:2006(E)
CONTENTS
FOREWORD.4

INTRODUCTION.6

1 Scope.7

2 Normative references .7

3 Terms and definitions .7

4 Requirements .7

5 Apparatus.8
5.1 Measurement system .8
5.2 Measurement apparatus for R .9
s
5.3 Dielectric rods .11
6 Measurement procedure.12
6.1 Specimen preparation .12
6.2 Set-up .12
6.3 Measurement of reference level .12
6.4 Measurement of the frequency response of resonators.13
6.5 Determination of surface resistance of the superconductor and ε’ and tan δ
of the standard sapphire rods .15
7 Precision and accuracy of the test method.16
7.1 Surface resistance .16
7.2 Temperature.17
7.3 Specimen and holder support structure .17
7.4 Specimen protection.18
8 Test report.18
8.1 Identification of test specimen .18
8.2 Report of R values .18
s
8.3 Report of test conditions.18

Annex A (informative) Additional information relating to Clauses 1 to 8.19

Bibliography.32

Figure 1 – Schematic diagram of measurement system for temperature dependence of
R using a cryocooler .8
s
Figure 2 – Typical measurement apparatus for R .10
s
Figure 3 – Insertion attenuation IA, resonant frequency f and half power bandwidth Δf,
measured at T Kelvin .13
Figure 4 – Reflection scattering parameters (S and S ) .15
11 22
Figure 5 – Term definitions in Table 4.17
Figure A.1 – Schematic configuration of several measurement methods for the surface
resistance .20
Figure A.2 – Configuration of a cylindrical dielectric rod resonator short-circuited at
both ends by two parallel superconductor films deposited on dielectric substrates .22
Figure A.3 – Computed results of the u-v and W-v relations for TE mode.23
01p
Figure A.4 – Configuration of standard dielectric rods for measurement of R and tan δ .24
s
61788-7 © IEC:2006(E) – 3 –
Figure A.5 – Three types of dielectric resonators .24

Figure A.6 – Mode chart to design TE resonator short-circuited at both ends by

parallel superconductor films [11] .27

Figure A.7 – Mode chart to design TE resonator short-circuited at both ends by
parallel superconductor films [11] .28

Figure A.8 – Mode chart for TE closed-type resonator.29
Figure A.9 – Mode chart for TE closed-type resonator.30
Table 1 – Typical dimensions of pairs of standard sapphire rods for 12 GHz, 18 GHz

and 22 GHz .11

Table 2 – Dimensions of superconductor film for 12 GHz, 18 GHz, and 22 GHz .12
Table 3 – Specifications on vector network analyzer .16
Table 4 – Specifications on sapphire rods.16

– 4 – 61788-7 © IEC:2006(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
SUPERCONDUCTIVITY –
Part 7: Electronic characteristic measurements –

Surface resistance of superconductors

at microwave frequencies
FOREWORD
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International Standard IEC 61788-7 has been prepared by IEC technical committee 90:
Superconductivity.
This second edition cancels and replaces the first edition, published in 2002, of which it
constitutes a technical revision. Examples of technical changes made are: 1) closed type
resonators are recommended from the viewpoint of the stable measurements, 2) uniaxial-
anisotropic characteristics of sapphire rods are taken into consideration for designing the size
of the sapphire rods, and 3) recommended measurement frequency of 18 GHz and 22 GHz
are added to 12 GHz described in the first edition.
The text of this standard is based on the following documents:
FDIS Report on voting
90/193/FDIS 90/198/RVD
61788-7 © IEC:2006(E) – 5 –
Full information on the voting for the approval of this standard can be found in the report on

voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

IEC 61788 consists of the following parts, under the general title Superconductivity:

Part 1: Critical current measurement – DC critical current of Cu/Nb-Ti composite super-

conductors
Part 2: Critical current measurement – DC critical current of Nb Sn composite super-
conductors
Part 3: Critical current measurement – DC critical current of Ag- and/or Ag alloy-sheathed
Bi-2212 and Bi-2223 oxide superconductors
Part 4: Residual resistance ratio measurement – Residual resistance ratio of Nb-Ti
composite superconductors
Part 5: Matrix to superconductor volume ratio measurement – Copper to superconductor
volume ratio of Cu/Nb-Ti composite superconductors
Part 6: Mechanical properties measurement – Room temperature tensile test of Cu/Nb-Ti
composite superconductors
Part 7: Electronic characteristic measurements – Surface resistance of superconductors at
microwave frequencies
Part 8: AC loss measurements – Total AC loss measurement of
...