EN 60862-1:2003

SLOVENSKI SIST EN 60862-1:2004

STANDARD
julij 2004
Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic
specification (IEC 60862-1:2003)
ICS 31.160 Referenčna številka
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

EUROPEAN STANDARD EN 60862-1
NORME EUROPÉENNE
EUROPÄISCHE NORM August 2003
ICS 31.140 Supersedes EN 166000:1995

English version
Surface acoustic wave (SAW) filters of assessed quality
Part 1: Generic specification
(IEC 60862-1:2003)
Filtres à ondes acoustiques  Oberflächenwellenfilter (OFW-Filter)
de surface (OAS) mit bewerteter Qualität
sous assurance de la qualité Teil 1: Fachgrundspezifikation
Partie 1: Spécification générique (IEC 60862-1:2003)
(CEI 60862-1:2003)
This European Standard was approved by CENELEC on 2003-07-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Lithuania, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 60862-1:2003 E
Foreword
The text of document 49/587/FDIS, future edition 2 of IEC 60862-1, prepared by IEC TC 49,
Piezoelectric and dielectric devices for frequency control and selection, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as EN 60862-1 on 2003-07-01.
This European Standard supersedes EN 166000:1995.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2004-04-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2006-07-01

Annexes designated "normative" are part of the body of the standard.
In this standard, annex ZA is normative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60862-1:2003 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60068-2-10 NOTE Harmonized as HD 323.2.10 S3:1988 (not modified).
IEC 60862-2 NOTE Harmonized as EN 60862-2:2002 (not modified).
__________
- 3 - EN 60862-1:2003
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
IEC 60027 series Letter symbols to be used in electrical HD 245 series
technology HD 60027 series
IEC 60050-561 1991 International Electrotechnical - -
Vocabulary (IEV)
Chapter 561: Piezoelectric devices for
frequency control and selection

1)
IEC 60068-1 1988 Environmental testing EN 60068-1 1994
Part 1: General and guidance
IEC 60068-2-1 1990 Part 2: Tests - Tests A: Cold EN 60068-2-1 1993

2)
IEC 60068-2-2 1974 Part 2: Tests - Test B: Dry heat EN 60068-2-2 1993

IEC 60068-2-6 1995 Part 2: Tests - Test Fc: Vibration EN 60068-2-6 1995
+ corr. March 1995 (sinusoidal)

3)
IEC 60068-2-7 1983 Part 2: Tests - Test Ga and guidance: EN 60068-2-7 1993
Acceleration, steady state
IEC 60068-2-13 1983 Part 2: Tests - Test M: Low air pressure EN 60068-2-13 1999

4)
IEC 60068-2-14 1984 Part 2: Tests - Test N: Change of EN 60068-2-14 1999
temperature
IEC 60068-2-17 1994 Part 2: Tests - Test Q: Sealing EN 60068-2-17 1994

5)
IEC 60068-2-20 1979 Part 2: Tests - Test T: Soldering HD 323.2.20 S3 1988

1)
EN 60068-1 includes corrigendum October 1988 + A1:1992.
2)
EN 60068-2-2 includes supplement A:1996 to IEC 60068-2-2.
3)
EN 60068-2-7 includes A1:1986 to IEC 60068-2-7.
4)
EN 60068-2-14 includes A1:1986 to IEC 60068-2-14.
5)
HD 323.2.20 S3 includes A2:1987 to IEC 60068-2-20.

Publication Year Title EN/HD Year
IEC 60068-2-21 1999 Part 2-21: Tests - Test U: Robustness of EN 60068-2-21 1999
terminations and integral mounting
devices
IEC 60068-2-27 1987 Part 2: Tests - Test Ea and guidance: EN 60068-2-27 1993
Shock
IEC 60068-2-29 1987 Part 2: Tests - Test Eb and guidance: EN 60068-2-29 1993
+ Corr. Bump
6)
IEC 60068-2-30 1980 Part 2: Tests - Test Db and guidance: EN 60068-2-30 1999
Damp heat, cyclic (12 + 12 hour cycle)

7)
IEC 60068-2-32 1975 Part 2: Tests - Test Ed: Free fall EN 60068-2-32 1993
(Procedure 1)
IEC 60068-2-45 1980 Part 2: Tests - Test Xa and guidance: EN 60068-2-45 1992
Immersion in cleaning solvents

IEC 60068-2-52 1996 Part 2: Tests - Test Kb: Salt mist, cyclic EN 60068-2-52 1996
(sodium chloride solution)
IEC 60068-2-58 1999 Part 2-58: Tests - Test Td: Test EN 60068-2-58 1999
methods for solderability, resistance to
dissolution of metallization and to
soldering heat of surface mounting
devices (SMD)
IEC 60068-2-64 1993 Part 2: Test methods - Test Fh: EN 60068-2-64 1994
+ corr. October 1993 Vibration, broad-band random (digital
control) and guidance
IEC 60068-2-78 2001 Part 2-78: Tests - Test Cab: Damp heat, EN 60068-2-78 2001
steady state
IEC 60122-1 2002 Quartz crystal units of assessed quality EN 60122-1 2002
Part 1: Generic specification
database
IEC 60617 Graphical symbols for diagrams - -

IEC 60642 1979 Piezoelectric ceramic resonators and - -
resonator units for frequency control
and selection –
Chapter I: Standard values and
conditions - Chapter II: Measuring and
test conditions
IEC 60695-2-2 1991 Fire hazard testing EN 60695-2-2 1994
Part 2: Test methods –
Section 2: Needle-flame test
6)
EN 60068-2-30 includes A1:1985 to IEC 60068-2-30.
7)
EN 60068-2-32 includes A2:1990 to IEC 60068-2-32.

- 5 - EN 60862-1:2003
Publication Year Title EN/HD Year
IEC 61000-4-2 1995 Electromagnetic compatibility (EMC) EN 61000-4-2 1995
Part 4-2: Testing and measurement
techniques - Electrostatic discharge
immunity test
A1 1998 A1 1998
A2 2000 A2 2001
IEC QC 001001 2000 IEC Quality Assessment System for - -
Electronic Components (IECQ)- Basic
rules
IEC QC 001002-2
1998 IEC Quality Assessment System for - -
Electronic Components (IECQ) - Rules
of Procedure
Part 2: Documentation
IEC QC 001002-3
1998 Part 3: Approval procedures - -

IEC QC 001005 2000 Register of firms, products and services - -
approved under the IECQ system,
including ISO 9000
ISO 1000 1992 SI units and recommendations for the - -
use of their multiples and of certain
other units
NORME CEI
INTERNATIONALE IEC
60862-1
INTERNATIONAL
QC 166000
STANDARD
Deuxième édition
Second edition
2003-05
Filtres à ondes acoustiques de surface (OAS)
sous assurance de la qualité –
Partie 1:
Spécification générique
Surface acoustic wave (SAW) filters
of assessed quality –
Part 1:
Generic specification
© IEC 2003 Droits de reproduction réservés ⎯ Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
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Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch  Web: www.iec.ch
CODE PRIX
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Commission Electrotechnique Internationale PRICE CODE
International Electrotechnical Commission
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Pour prix, voir catalogue en vigueur
For price, see current catalogue

60862-1 © IEC:2003 – 3 –
CONTENTS
FOREWORD . 5
1 General . 9
1.1 Scope . 9
1.2 Normative references . 9
1.3 Order of precedence of documents .13
2 Terms, definitions, units and symbols .13
2.1 General .13
2.2 Definitions .13
2.3 Preferred values for ratings and characteristics .31
3 Marking .35
3.1 Filter marking .35
3.2 Package marking .35
4 Quality assessment procedures .37
4.1 Primary stage of manufacture .37
4.2 Structurally similar components .37
4.3 Subcontracting .37
4.4 Incorporated components .37
4.5 Manufacturer’s approval .37
4.6 Approval procedures.37
4.7 Procedures for capability approval.39
4.8 Procedures for qualification approval.41
4.9 Test procedures.41
4.10 Screening requirements.41
4.11 Rework and repair work .41
4.12 Certified records of released lots .41
4.13 Validity of release .43
4.14 Release for delivery.43
4.15 Unchecked parameters .43
5 Test and measurement procedures .43
5.1 General .43
5.2 Test and measurement conditions .43
5.3 Visual inspection .45
5.4 Dimensions and gauging procedures .45
5.5 Electrical test procedures .47
5.6 Mechanical and environmental test procedures.65
5.7 Endurance test procedure.75
Bibliography.77
Figure 1 – Frequency response of a SAW filter .29
Figure 2 – Insertion attenuation, phase, and group delay measurement .49
Figure 3 – Return attenuation measurement.55
Figure 4 – Unwanted signal measurement.59
Figure 5 – Unwanted signals on time domain measuring .59
Figure 6 – Intermodulation distortion measurement .61

60862-1 © IEC:2003 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
SURFACE ACOUSTIC WAVE (SAW) FILTERS
OF ASSESSED QUALITY –
Part 1: Generic specification
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International
Organization for Standardization (ISO) in accordance with conditions determined by agreement between the
two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60862-1 has been prepared by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
This second edition of IEC 60862-1 cancels and replaces the first edition published in 1989
and constitutes a technical revision.
International Standard IEC 60862-1 is the first part of a new edition of the IEC standard series
for SAW filters, updated to include the quality assessment procedures and test requirements
of the IECQ System.
The text of this standard is based on the following documents:
FDIS Report on voting
49/587/FDIS 49/603/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

60862-1 © IEC:2003 – 7 –
IEC 60862 consists of the following parts under the general title Surface acoustic wave (SAW)
filters of assessed quality:
Part 1: Generic specification
Part 2: Guide to the use of surface acoustic wave (SAW) filters
Part 3: Standard outlines
The QC number which appears on the front cover of this publication is the specification
number in the IEC Quality Assessment System for Electronic Components (IECQ).
The committee has decided that this publication remains valid until 2007. At this date, in
accordance with the committee’s decision, the publication will be
– reconfirmed;
– withdrawn;
– replaced by a revised edition; or
– amended.
60862-1 © IEC:2003 – 9 –
SURFACE ACOUSTIC WAVE (SAW) FILTERS
OF ASSESSED QUALITY –
Part 1: Generic specification
1 General
1.1 Scope
This part of IEC 60862 specifies the methods of test and general requirements for SAW filters
of assessed quality using either capability approval or qualification approval procedures.
1.2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology
IEC 60050(561):1991, International Electrotechnical Vocabulary (IEV) – Chapter 561:
Piezoelectric devices for frequency control and selection
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 60068-2-1:1990, Environmental testing – Part 2: Tests – Tests A: Cold
IEC 60068-2-2:1974, Environmental testing – Part 2: Tests – Tests B: Dry heat
IEC 60068-2-6:1995, Environmental testing – Part 2: Tests – Test Fc: Vibration (sinusoidal)
IEC 60068-2-7:1983, Environmental testing – Part 2: Tests – Test Ga: Acceleration, steady
state
IEC 60068-2-13:1983, Environmental testing – Part 2: Tests – Test M: Low air pressure
IEC 60068-2-14:1984, Environmental testing – Part 2: Tests – Test N: Change of temperature
IEC 60068-2-17:1994, Environmental testing – Part 2: Tests – Test Q: Sealing
IEC 60068-2-20:1979, Environmental testing – Part 2: Tests – Test T: Soldering
IEC 60068-2-21:1999, Environmental testing – Part 2-21: Tests – Test U: Robustness of
terminations and integral mounting devices
IEC 60068-2-27:1987, Environmental testing – Part 2: Tests – Test Ea and guidance: Shock

60862-1 © IEC:2003 – 11 –
IEC 60068-2-29:1987, Environmental testing – Part 2: Tests – Test Eb and guidance: Bump
IEC 60068-2-30:1980, Environmental testing – Part 2: Tests – Test Db and guidance: Damp
heat, cyclic (12 + 12-hour cycle)
IEC 60068-2-32:1975, Environmental testing – Part 2: Tests – Test Ed: Free fall (Procedure 1)
IEC 60068-2-45:1980, Environmental testing – Part 2: Tests – Test XA and guidance:
Immersion in cleaning solvents
IEC 60068-2-52:1996, Environmental testing – Part 2: Tests – Test Kb: Salt mist, cyclic
(sodium chloride solution)
IEC 60068-2-58:1999, Environmental testing – Part 2-58: Tests – Test Td: Test methods for
solderabilitly, resistance to dissolution of metallization and to soldering heat of surface
mounting devices (SMD)
IEC 60068-2-64:1993, Environmental testing – Part 2: Tests – Test Fh: Vibration, broad-band
random (digital control) and guidance
IEC 60068-2-78:2001, Environmental testing – Part 2-78: Tests – Test Cab: Damp heat,
steady state
IEC 60122-1:2002, Quartz crystal units of assessed quality – Part 1: Generic specification
IEC 60617, Graphical symbols for diagrams
IEC 60642:1979, Piezoelectric ceramic resonators and resonator units for frequency control
and selection – Chapter I: Standard values and conditions – Chapter II: Measuring and test
conditions
IEC 60695-2-2:1991, Fire hazard testing – Part 2: Test methods – Section 2: Needle-flame
test
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 2: Electrostatic discharge immunity test. Basic EMC Publication
Amendment 1 (1998)
Amendment 2 (2000)
IEC QC 001001:2000, IEC Quality Assessment System for Electronic Components (IECQ) -
Basic Rules
IEC QC 001002-2:1998, IEC Quality Assessment System for Electronic Components (IECQ) –
Rules of Procedure – Part 2: Documentation
IEC QC 001002-3:1998, IEC Quality Assessment system for Electronic Components (IECQ) –
Rules of Procedure – Part 3: Approval Procedures
———————
There is a consolidated edition 1.2 (2001) that includes IEC 61000-4-2 (1995) and its amendments 1 (1998) and
2 (2000).
60862-1 © IEC:2003 – 13 –
IEC QC 001005:2000, Register of Firms, Products and Services approved under the IECQ
System, including ISO 9000
ISO 1000:1992, SI units and recommendations for use of their multiples and of certain other
units
1.3 Order of precedence of documents
Where any discrepancies occur for any reason, documents shall rank in the following order of
precedence:
– the detail specification;
– the sectional specification;
– the generic specification;
– any other international documents (for example, of the IEC) to which reference is made.
The same order of precedence shall apply to equivalent national documents.
2 Terms, definitions, units and symbols
2.1 General
Units, graphical symbols, letter symbols and terminology shall, wherever possible, be taken
from the following standards:
IEC 60027
IEC 60050(561)
IEC 60617
IEC 60642
IEC 60122-1
ISO 1000
2.2 Definitions
For the purposes of this document, the following definitions apply.
2.2.1 General terms
2.2.1.1
surface acoustic wave (SAW)
acoustic wave, propagating along a surface of an elastic substrate, whose amplitude decays
exponentially with substrate depth
2.2.1.2
surface acoustic wave filter (SAW filter)
filter characterized by a surface acoustic wave which is usually generated by an interdigital
transducer and propagates along a substrate surface to a receiving transducer
2.2.1.3
power flow vector
vector, analogous to a Poynting vector, characterizing energy propagation caused by a
surface acoustic wave
60862-1 © IEC:2003 – 15 –
2.2.1.4
propagation vector
vector characterizing the phase progression of a wave
2.2.1.5
power flow angle
the angle between the direction of the power flow vector and the direction of the propagation
vector
2.2.1.6
SAW beam steering
SAW propagation phenomenon in anisotropic materials described by an angle of power flow
which is not zero
2.2.1.7
SAW diffraction
phenomenon (analogous to diffraction of light from a source of finite aperture) which causes
SAW beam spreading and wave-front distortion
2.2.1.8
SAW coupling coefficient (k )
s
SAW electromechanical coupling coefficient is defined as follows:
∆ν
s
k = 2
s
ν
s
where
v is the SAW propagation velocity on free surface;
s
ǻv is the change of SAW velocity due to short-circuiting the surface potential;
s
ǻv /v is the relative velocity change produced by short-circuiting the surface potential from
s s
the open-circuit condition
2.2.1.9
interdigital transducer (IDT)
SAW transducer made of two comb-like conductive structures deposited on a piezoelectric
substrate transforming electrical energy into acoustic energy or vice versa
2.2.1.10
unidirectional interdigital transducer (UDT)
transducer capable of radiating and receiving surface acoustic waves in or from a single
direction
2.2.1.11
multiphase transducer
interdigital transducer having more than two inputs which are driven in different phases.
Usually used as a unidirectional transducer
2.2.1.12
finger
element of the IDT comb electrode
2.2.1.13
dummy finger
passive finger which may be included in order to suppress wave-front distortion

60862-1 © IEC:2003 – 17 –
2.2.1.14
split finger
finger formed of more than one element, so as to produce antireflection properties in a
surface acoustic wave filter
2.2.1.15
bus bar
common electrode which connects individual fingers together and also connects the filter to
an external circuit
2.2.1.16
weighted-response transducer
transducer intended to produce a specified impulse response by design of the structure. See
2.2.1.17 to 2.2.1.22
2.2.1.17
finger overlap or source strength
length of a finger pair between which only electromechanical interaction is generated
2.2.1.18
apodization
weighting produced by the change of finger overlap over the length of the IDT
2.2.1.19
withdrawal weighting
weighting by removal of fingers or sources
2.2.1.20
capacitive weighting
weighting by change of capacitance between electrodes
2.2.1.21
series weighting
weighting by separation of a finger into individual elements having capacitive coupling
between them. The elements may be separated from the bus bar
2.2.1.22
phase weighting
weighting by change in period of finger arrangement inside the IDT
2.2.1.23
aperture
normalized beamwidth of the SAW generated at the centre frequency and normalized to the
corresponding wavelength
2.2.1.24
multistrip coupler (MSC)
an array of additional metal strips deposited on a piezoelectric substrate, in a direction
transverse to the propagation direction, which transfers acoustic power from one acoustic
track to an adjacent track
2.2.1.25
reflector
SAW reflecting component which normally makes use of the periodic discontinuity provided by
a metal strip array or a grooved array

60862-1 © IEC:2003 – 19 –
2.2.1.26
spurious reflections
unwanted signals caused by reflection of SAW or bulk waves from substrate edges or
electrodes
2.2.1.27
triple transit echo (TTE)
unwanted signals in a SAW filter which have traversed three times the propagation path
between input and output IDTs caused by reflections from output and input transducers
2.2.1.28
bulk wave signals
unwanted signals caused by bulk wave excitation and detected at the filter output
2.2.1.29
feedthrough signals (signals of electromagnetic interference)
unwanted signals from the input appearing at the filter output due to stray capacitances and
other electromagnetic couplings
2.2.1.30
suppression corrugation
grooves in the non-active side of a substrate for suppressing bulk wave signals
2.2.1.31
acoustic absorber
material with high acoustic loss placed on any part of the substrate for acoustic absorption
purposes
2.2.1.32
shielding electrode
electrode intended for the reduction of electromagnetic interference signals
2.2.1.33
interdigitated interdigital transducer (IIDT)
SAW transducer made of a combination of three or more interdigital transducers.
Same as a multi-IDT. In this standard, IIDT (or multi-IDT) resonator filter is used to refer to
SAW resonator filters composed of a number of IDTs for input and output in a line alternately
with grating reflectors at both ends.
2.2.2 Response characteristics
(See Figure 1)
2.2.2.1
nominal frequency
frequency given by the manufacturer or the specification to identify the filter
2.2.2.2
centre frequency
arithmetic mean of the cut-off frequencies

60862-1 © IEC:2003 – 21 –
2.2.2.3
reference frequency
frequency defined by the specification to which other frequencies may be referred
2.2.2.4
cut-off frequency
frequency of the pass band at which the relative attenuation reaches a specified value
2.2.2.5
total power loss
the logarithmic ratio of the available power at the given source to the power that the SAW
filter delivers to a load impedance under specified operating conditions
2.2.2.6
insertion attenuation
the logarithmic ratio of the power delivered directly to the load impedance before insertion of
the filter to the power delivered to the load impedance after insertion of the filter
2.2.2.7
nominal insertion attenuation
the insertion attenuation at a specified reference frequency
2.2.2.8
relative attenuation
the difference between the attenuation at a given frequency and the attenuation at the
reference frequency
2.2.2.9
pass band
band of frequencies in which the relative attenuation is equal to or less than a specified value
2.2.2.10
pass bandwidth
the separation of frequencies between which the relative attenuation is equal to or less than a
specified value
2.2.2.11
pass band ripple
the maximum variation in attenuation characteristics within a specified pass band
2.2.2.12
TTE ripple
maximum variation in attenuation characteristics caused by TTE within a specified pass band
2.2.2.13
minimum insertion attenuation
the minimum value of insertion attenuation in the pass band
2.2.2.14
maximum insertion attenuation
the maximum value of insertion attenuation in the pass band

60862-1 © IEC:2003 – 23 –
2.2.2.15
stop band
band of frequencies in which the relative attenuation is equal to or greater than a specified
value
2.2.2.16
stop bandwidth
separation of frequencies between which the relative attenuation is equal to or greater than
a specified value
2.2.2.17
shape factor
ratio of the two bandwidths at specified values of relative attenuation
2.2.2.18
group delay
time equal to the first derivative of the phase shift, in radians, with respect to the angular
frequency
2.2.2.19
nominal group delay
group delay at a specified reference frequency
2.2.2.20
group delay distortion
difference between the lowest and highest value of group delay in a specified frequency band
2.2.2.21
trap frequency
specified frequency at which the relative attenuation is equal to or greater than a specified
value
2.2.2.22
trap attenuation
relative attenuation at a specified trap frequency
2.2.2.23
transition band
band of frequencies between the cut-off frequency and the nearest point of the adjacent stop-
band
2.2.2.24
reflection coefficient
dimensionless measure of the degree of mismatch between two impedances Z and Z given by
a b
the expression:
Z – Z
a b
Z +Z
a b
where
Z and Z represent respectively the input and source impedance or the output and load
a b
impedance
60862-1 © IEC:2003 – 25 –
2.2.2.25
return attenuation
absolute value of the reciprocal of the reflection coefficient given by the expression in
decibels:
Z +Z
a b
20 log
dB
Z – Z
a b
2.2.2.26
reflected wave signal suppression
relative attenuation of unwanted signals caused by reflection of SAW or bulk waves from
substrate edges or electrodes within a specified time window
2.2.2.27
feedthrough signal suppression
relative attenuation which implies the suppression of directly coupled signals by the
electromagnetic and electrostatic coupling between the input and output electrodes
2.2.2.28
unwanted response
response other than that associated with the mode of vibration intended for the application
2.2.2.29
input level
power, voltage or current value applied to the input terminal pair of a filter
2.2.2.30
output level
power, voltage or current value delivered to the load
2.2.2.31
nominal level
power, voltage or current value at which the performance measurement is specified
2.2.2.32
input impedance
impedance presented by the filter to the signal source when the output is terminated by
a specified load impedance
2.2.2.33
output impedance
impedance presented by the filter to the load when the input is terminated by a specified
source impedance
2.2.2.34
terminating impedance
either of the impedances presented to the filter by the source or by the load
2.2.2.35
available power
maximum power obtainable from a given source by suitable adjustment of the load impedance

60862-1 © IEC:2003 – 27 –
2.2.2.36
reference temperature
the temperature at which certain filter performance parameters are measured, normally
(25 ± 2) °C
2.2.2.37
operating temperature range
range of temperatures, over which the SAW filter will function while maintaining its specified
characteristics within specified tolerances
2.2.2.38
operable temperature range
range of temperatures, over which the SAW filter shall continue to provide its specified
response characteristics, though not necessarily within the specified tolerances
2.2.2.39
storage temperature range
the minimum and maximum temperatures as measured on the enclosure, at which the SAW
filter may be stored without deterioration or damage to its performance
2.2.2.40
roll-off rate
index describing the rise-up characteristics for digital communication SAW roll-off filters. It is
a ratio of the transition band to the ideal cut-off frequency, which is equal to a half of the
sampling frequency, in the case of cosine roll-off frequency characteristics
2.2.2.41
intermodulation distortion
non-linear distortion of a SAW transducer or filter response characterized by the appearance
of frequencies at the output equal to the differences (or sums) of integral multiples of the two
or more component frequencies present at the input
2.2.3 SAW filter related terms
2.2.3.1
transversal filter
filter consisting of input and output interdigital transducers on a piezoelectric substrate.
The frequency response of the filter is fundamentally given by the impulse response
of the transducer
2.2.3.2
frequency symmetrical filter
filter having a symmetrical frequency characteristic in relation to the reference frequency
2.2.3.3
frequency asymmetrical filter
filter having a specified asymmetrical pass-band or stop-band characteristic in relation to
the reference frequency
2.2.3.4
dispersive filter
filter designed so as to have group delay which is a function of frequency, usually by varying
the finger periodicity
60862-1 © IEC:2003 – 29 –
2.2.3.5
comb filter
filter having two or more pass bands between three or more stop bands
2.2.3.6
resonator filter
filter in which two or more SAW resonators are incorporated
2.2.3.7
ladder filter
filter having a cascade or tandem connection of alternating series and shunt SAW resonators
2.2.3.8
lattice filter
filter having at least four SAW resonators connected in series to form a mesh, two non-
adjacent junction points are used as input terminals, while the remaining two junction points
are used as output terminals (bridge circuit). Preferably, it can be used for balanced circuits
Specified pass-band
Attenuation
Specified
stop band
Reference
frequency
Cut-off Centre Cut-off
Frequency  MHz
frequency frequency frequency
IEC  1462/03
Figure 1 – Frequency response of a SAW filter
Attenuation  dB
Minimum
insertion
Relative attenuation
attenuation
TTE ripple
Group delay
distorsion
Nominal
insertion
attenuation
Pass-band
ripple
Maximum
insertion
attenuation
Nominal group delay
Group delay  µs
60862-1 © IEC:2003 – 31 –
2.3 Preferred values for ratings and characteristics
Values should be chosen from the following paragraphs unless otherwise stated in the detail
specification:
2.3.1 Nominal frequencies
2.3.1.1 Nominal frequency bands for use in RF application
150 MHz
280 MHz
300 MHz
800 MHz
900 MHz
1 500 MHz
1 900 MHz
2 400 MHz
2.3.1.2 Nominal frequency bands for use in IF applications
70 MHz
130 MHz
250 MHz
400 MHz
2.3.1.3 Nominal frequency values for use in broadcasting IF applications
32,7 MHz
36,875 MHz
37,0 MHz
38,0 MHz
38,9 MHz
39,5 MHz
45,75 MHz
58,75 MHz
402,78 MHz
479,5 MHz
2.3.2 Relative attenuation values specifying pass bandwidth for IF applications
1 dB
3 dB
5 dB
6 dB
60862-1 © IEC:2003 – 33 –
2.3.3 TTE signal suppression
30 dB
35 dB
40 dB
45 dB
2.3.4 Operating temperature ranges, in degrees Celsius (°°°°C)
–40 to +85
–30 to +85
–20 to +75
–20 to +70
–10 to +60
0 to +60
NOTE Other temperature ranges may be used but the lowest temperature should be not lower than –60 °C and
the highest temperature should not exceed 125 °C.
2.3.5 Climatic category
40/085/56 (climatic categories are given in conformity with Annex A to IEC 60068-1): for
metal, glass and ceramic enclosures.
For requirements where the operating temperature range of the SAW filter is greater than
–40 °C to +85 °C, a climatic category consistent with the operating temperature range shall
be specified.
20/085/21 (climatic categories are given in conformity with Annex A to IEC 60068-1): for
plastic packages.
2.3.6 Bump severity
(4 000 ± 10) bumps at 400 m/s peak acceleration in each direction along three mutually
perpendicular axes (see 5.6.6).
Pulse duration 6 ms.
2.3.7 Vibration severity
Sinusoidal
10 Hz to 55 Hz
0,75 mm displacement amplitude
(peak value)
30 min in each of three
mutually perpendicular axes
55 Hz to 500 Hz or 55 Hz to 2 000 Hz at 1 octave/min (see 5.6.7)
100 m/s acceleration amplitude
(peak value)
or
10 Hz to 55 Hz
1,5 mm displacement amplitude
(peak value) 30 min in each of three
mutually perpendicular axes
55 Hz to 2 000 Hz at 1 octave/min (see 5.6.7)
200 m/s acceleration amplitude
(peak value)
60862-1 © IEC:2003 – 35 –
Random
2 2
30 min in each of three
(19,2 m/s ) /Hz between
mutually perpendicular axes
20 Hz and 2 000 Hz
2 at 1 octave/min (see 5.6.7)
196 m/s acceleration
or
2 2
30 min in each of three
(48 m/s ) /Hz between
20 Hz and 2 000 Hz mutually perpendicular axes
at 1 octave/min (see 5.6.7)
314 m/s acceleration
or
2 2
30 min in each of three
(19,2 m/s ) /Hz between
20 Hz and 2 000 Hz mutually perpendicular axes
at 1 octave/min (see 5.6.7)
62 m/s acceleration
2.3.8 Shock severity
1 000 m/s peak acceleration for 6 ms duration; three shocks in each direction along three
mutually perpendicular axes (see 5.6.8) half sine pulse, unless otherwise stated in the detail
specification.
2.3.9 Fine leak rate
–1 3 –6 3
10 Pa cm /s (10 bar cm /s);
–3 3 –8 3
10 Pa cm /s (10 bar cm /s).
3 Marking
3.1 Filter marking
Surface acoustic wave filters shall be clearly and durably marked (see 5.6.18) along with
items 1) to 3) in the order given below and, if possible, with as many of the remaining items
as considered necessary:
1) type designation as defined in the detail specification;
2) year and week (or month) of manufacture;
3) manufacturer’s name or trade mark;
4) terminal identification (if applicable);
5) mark of conformity (unless a certificate of conformity is used);
6) designation of electrical connections (if applicable);
7) serial number (if applicable);
8) surface mounted device classification (if applicable);
9) nominal frequency in kilohertz (kHz) or megahertz (MHz) (if applicable);
10) factory identification code (if applicable).
Where the available surface area of miniature SAW filters imposes practical limits on the
amount of marking, instructions on the marking to be applied shall be given in the detail
specification.
3.2 Package marking
The primary packaging containing the SAW filters(s) shall be clearly marked with the
information listed in 3.1, except item 4) and Electrostatic Sensitive Device (ESD) identification
where necessary.
60862-1 © IEC:2003 – 37 –
4 Quality assessment procedures
Two methods are available for the approval of SAW filters of assessed quality: capability
approval and qualification approval.
4.1 Primary stage of manufacture
The primary stage of manufacture for a SAW filter, in accordance with 4.2.1.2 of
IEC QC 001002-3 is the final surface cleaning of substrates.
4.2 Structurally similar components
The grouping of structurally similar SAW filters for the purpose of qualification approval,
capability approval and quality conformance inspection shall be prescribed in the relevant
sectional specification.
4.3 Subcontracting
These procedures shall be in accordance with 3.1.2 of IEC QC 001002-3.
However, the final surface cleaning of the crystal substrate and all subsequent processes
shall be carried out by the manufacturer to whom approval has been granted.
4.4 Incorporated components
Where the final component contains components of a type covered by a generic specification
in the IEC series, these shall be produced using the normal IEC release procedures.
4.5 Manufacturer’s approval
To obtain the manufacturer’s approval, the manufacturer shall meet the requirements of
Clause 2 of IEC QC 001002-3.
4.6 Approval procedures
4.6.1 General
To qualify a SAW filter either capability approval or qualification approval procedures may be
used. These procedures conform to those stated in IEC QC 001001 and QC 001002-3.
4.6.2 Capability approval
Capability approval is appropriate when structurally similar SAW filters based on common
design rules are fabricated by a group of common processes.
Under capability approval detail specifications fall into the following three categories:
a) Capability qualifying components (CQCs)
A detail specification shall be prepared for each CQC as agreed with the National
Supervising Inspectorate (NSI). It shall identify the purpose of the CQC and include all
relevant stress levels and test limits.

60862-1 © IEC:2003 – 39 –
b) Standard catalogue items
When a component covered by the capability approval procedure is intended to be offered
as a standard catalogue item, a detail specification complying with the blank detail
specification shall be written. Such specifications shall be registered by the IECQ and the
component may be listed in IEC QC 001005.
c) Custom built SAW filters
The content of the detail specification shall be by agreement between the manufacturer
and the customer in accordance with 4.3.3 of IEC QC 001002-3.
Further information on detail specifications is contained in the sectional specification.
The product and capability qualifying components (CQCs) are tested in combination and
approval given to a manufacturing facility on the basis of validated design rules, processes
and quality control procedures. Further information is given in 4.7 and in the sectional
specification.
4.6.3 Qualification approval
Qualification approval is appropriate for components manufactured to a standard design and
established production process and conforming to a published detail specification.
The programme of tests defined in the detail specification for the appropriate assessment and
severity level appli
...