EN 60444-2:1997

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980)Messung von Schwingquarz-Parametern nach dem Null-Phasenverfahren in einem Pi-Netzwerk -- Teil 2: Messung der dynamischen Kapazität von Schwingquarzen nach dem PhasenoffsetverfahrenMesure des paramètres des quartz piézoélectriques par la technique de phase nulle dans le circuit en pi -- Partie 2: Méthode de décalage de phase pour la mesure de la capacité dynamique des quartzMeasurement of quartz crystal unit parameters by zero phase technique in a pi-network -- Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units31.140Piezoelectric and dielectric devicesICS:Ta slovenski standard je istoveten z:EN 60444-2:1997SIST EN 60444-2:2002en01-september-2002SIST EN 60444-2:2002SLOVENSKI
STANDARD
IEC•NORMEINTERNATIONALEINTERNATIONALSTANDARDCEIIEC60444-2Première éditionFirst edition1980-01Mesure des paramètres des quartzpiézoélectriques par la techniquede phase nulle dans le circuit en 11Partie 2:Méthode de décalage de phase pour la mesurede la capacité dynamique des quartzMeasurement of quartz crystal unit parametersby zero phase technique in a 7t-networkPart 2:Phase offset method for measurement ofmotional capacitance of quartz crystal units© IEC 1980 Droits de reproduction réservés — Copyright - all rights reservedAucune partie de cette publication ne peut être reproduite niNo part of this publication may be reproduced or utilized inutilisée sous quelque forme que ce soit et par aucunany form or by any means, electronic or mechanical,procédé, électronique ou mécanique, y compris la photo-including photocopying and microfilm, without permission incopie et les microfilms, sans t'accord écrit de l'éditeurwriting from the publisher.International Electrotechnical Commission3, rue de Varembé Geneva, SwitzerlandTelefax: +41 22 919 0300e-mail: inmail@iec.chIEC web site http: //www.iec.chCommission Electrotechnique InternationaleInternational Electrotechnical CommissionMemavHapoaHaa 3neKTpoTexHHVectiaa HOMHCCHHCODE PRIXPRICE CODEPour prix, voir catalogue en vigueurFor price, see current catalogueJSIST EN 60444-2:2002

— 3 —CONTENTSPageFOREWORD
5PREFACE 5Clause1.Scope 72.Principle of measurement 73.Measuring circuit 74.Method of measurement 75.Measurement errors 96.Other measuring methods
11APPENDIX A 13SIST EN 60444-2:2002

5INTERNATIONAL ELECTROTECHNICAL COMMISSIONMEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERSBY ZERO PHASE TECHNIQUE IN A II-NETWORKPart 2: Phase offset method for measurement of motional capacitanceof quartz crystal unitsFOREWORD1)The formal decisions or agreements of the IEC on technical matters, prepared by Technical Committees on which all theNational Committees having a special interest therein are represented, express, as nearly as possible, an internationalconsensus of opinion on the subjects dealt with.2)They have the form of recommendations for international use and they are accepted by the National Committees in thatsense.3)In order to promote international unification, the IEC expresses the wish that all National Committees should adoptthe text of the IEC recommendation for their national rules in so far as national conditions will permit. Any divergencebetween the IEC recommendation and the corresponding national rules should, as far as possible, be clearly indicatedin the latter.PREFACEThis standard has been prepared by IEC Technical Committee No. 49: Piezoelectric Devices for Frequency Control andSelection.It forms Part 2 of the series of I EC publications on phase measuring methods.Publication 444 contains the basic method for the measurement of resonance frequency and resonance resistance of quartzcrystal units by zero phase technique in a 1r-network.Publication 444, when revised, will be issued as a second edition of IEC Publication 444-1.A draft of Part 2 was discussed at the meeting held in Baden-Baden in March 1977. As a result of this meeting, the draft,Document 49(Central Office)111, was submitted to the National Committees for approval under the Six Months' Rule inJune 1978.The National Committees of the following countries voted explicitly in favour of publication:BelgiumSouth Africa (Republic of)CanadaSpainEgyptSwedenFranceSwitzerlandGermanyTurkeyJapanUnited KingdomPolandUnited States of AmericaOther IEC publication quoted in this standard:Publication No. 302: Standard Definitions and Methods of Measurement for Piezoelectric Vibrators Operating over theFrequency Range up to 30 MHz.SIST EN 60444-2:2002

7MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERSBY ZERO PHASE TECHNIQUE IN A n-NETWORKPart 2: Phase offset method for measurement of motional capacitanceof quartz crystal units1.ScopeThis standard describes a method of measuring the motional capacitance of quartz crystal unitsin the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5010.The advantage of this method is that it uses only the measuring circuit described in I ECPublication 444 and therefore avoids the use of additional elements or instruments which could besources of error.2.Principle of measurementThis method is based on the phase measurement at the resonance frequency and in its vicinity.The value of the motional capacitance (C1 in Figure 1, page 16) is calculated from the measuredvalues of resonance frequency, two frequencies lying on both sides of the impedance curve with agiven phase difference equal in magnitude and opposite in sign, and the resonance resistance.The resonance frequency and the resonance resistance are measured as given in Clause 6 ofI EC Publication 444.3.Measuring circuitThe measuring circuit consists basically of an-network connected with coaxial cables to theassociated measuring equipment (see Figure 2, page
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