EN 60747-5-3:2001

SLOVENSKI STANDARD
01-september-2002
Discrete semiconductor devices and integrated circuits - Optoelectronic devices -
Measuring methods (IEC 60747-5-3:1997)
Discrete semiconductor devices and integrated circuits -- Part 5-3: Optoelectronic
devices - Measuring methods
Einzel-Halbleiterbauelemente und integrierte Schaltungen -- Teil 5-3: Optoelektrische
Bauelemente - Messverfahren
Dispositifs discrets à semiconducteurs et circuits intégrés -- Partie 5-3: Dispositifs
optoélectroniques - Méthodes de mesure
Ta slovenski standard je istoveten z: EN 60747-5-3:2001
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 60747-5-3
NORME EUROPÉENNE
EUROPÄISCHE NORM July 2001
ICS 31.260
English version
Discrete semiconductor devices and integrated circuits
Part 5-3: Optoelectronic devices -
Measuring methods
(IEC 60747-5-3:1997)
Dispositifs discrets à semiconducteurs et Einzel-Halbleiterbauelemente und
circuits intégrés integrierte Schaltungen
Partie 5-3: Dispositifs optoélectroniques - Teil 5-3: Optoelektronische Bauelemente -
Méthodes de mesure Meßverfahren
(CEI 60747-5-3:1997) (IEC 60747-5-3:1997)
This European Standard was approved by CENELEC on 2000-12-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway,
Portugal, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2001 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60747-5-3:2001 E
Foreword
The text of the International Standard IEC 60747-5-3:1997, prepared by SC 47C, Flat panel display
devices, of IEC TC 47, Semiconductor devices, was submitted to the Unique Acceptance Procedure
and was approved by CENELEC as EN 60747-5-3 on 2000-12-01 without any modification.
This standard should be read jointly with IEC 60747-1, EN 62007-1 and EN 62007-2.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2002-01-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2004-01-01
Annexes designated "normative" are part of the body of the standard.
Annexes designated "informative" are given for information only.
In this standard, annex ZA is normative and annex A is informative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60747-5-3:1997 was approved by CENELEC as a
European Standard without any modification.
__________
- 3 - EN 60747-5-3:2001
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
1)
IEC 60068-1 1988 Environmental testing EN 60068-1 1994
Part 1: General and guidance
IEC 60270 1981 Partial discharge measurements - -

1)
EN 60068-1 includes Corrigendum October 1988 + A1:1992 to IEC 60068-1:1988.

NORME
CEI
INTERNATIONALE
IEC
60747-5-3
INTERNATIONAL
Première édition
STANDARD
First edition
1997-08
Dispositifs discrets à semiconducteurs
et circuits intégrés –
Partie 5-3:
Dispositifs optoélectroniques –
Méthodes de mesure
Discrete semiconductor devices
and integrated circuits –
Part 5-3:
Optoelectronic devices –
Measuring methods
© IEC 1997 Droits de reproduction réservés ⎯ Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun any form or by any means, electronic or mechanical,
procédé, électronique ou mécanique, y compris la photo- including photocopying and microfilm, without permission in
copie et les microfilms, sans l'accord écrit de l'éditeur. writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http: //www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
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PRICE CODE
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Pour prix, voir catalogue en vigueur
For price, see current catalogue

60747-5-3 © IEC:1997 – 3 –
CONTENTS
Page
FOREWORD . 5
Clause
1 Scope. 7
2 Normative references. 7
3 Measuring methods for photoemitters . 7
3.1 Luminous intensity of light-emitting diodes (I ). 7
v
3.2 Radiant intensity of infrared-emitting diodes (I ) . 9
e
3.3 Peak-emission wavelength (λ ), spectral radiation bandwidth (∆λ), and number of
p
longitudinal modes (n ) . 11
m
3.4 Emission source length and width and astigmatism of a laser diode without pigtail 17
3.5 Half-intensity angle and misalignment angle of a photoemitter . 19
4 Measuring methods for photosensitive devices. 25
4.1 Reverse current under optical radiation of photodiodes including devices with or
without pigtails (I or I ) and collector current under optical radiation of
R(H) R(e)
phototransistors (I or I ) . 25
C(H) C(e)
4.2 Dark current for photodiodes I and dark currents for phototransistors
R
I , I , I . 29
CEO ECO EBO
4.3 Collector-emitter saturation voltage V of phototransistors. 31
CE(sat)
5 Measuring methods for photocouplers. 33
5.1 Current transfer ratio (h ) . 33
F(ctr)
5.2 Input-to-output capacitance (C ). 35
io
5.3 Isolation resistance between input and output (r ). 37
IO
5.4 Isolation test. 39
5.5 Partial discharges of photocouplers. 41
5.6 Collector-emitter saturation voltage V of a photocoupler . 49
CE(sat)
5.7 Switching times t t of a photocoupler. 53
on, off
Annex A (informative) – Cross references index. 59

60747-5-3 © IEC:1997 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
__________
DISCRETE SEMICONDUCTOR DEVICES
AND INTEGRATED CIRCUITS –
Part 5-3: Optoelectronic devices –
Measuring methods
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60747-5-3 has been prepared by subcommittee 47C:
Optoelectronic, display and imaging devices, of IEC technical committee 47: Semiconductor
devices.
This first edition replaces partially the second edition of IEC 60747-5 (1992) and constitutes a
technical revision (see also annex A: Cross references index).
It should be read jointly with IEC 60747-1, IEC 62007-1 and IEC 62007-2.
The text of this standard is based partially on IEC 60747-5 (1992) and partially on the following
documents:
FDIS Report on voting
47C/173/FDIS 47C/186/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
Annex A is for information only.

60747-5-3 © IEC:1997 – 7 –
DISCRETE SEMICONDUCTOR DEVICES
AND INTEGRATED CIRCUITS –
Part 5-3: Optoelectronic devices –
Measuring methods
1 Scope
This part of IEC 60747 describes the measuring methods applicable to the optoelectronic
devices which are not intended to be used in the fibre optic systems or subsystems.
2 Normative references
The following normative documents contain provisions which, through reference in this text,
constitute provisions of this part of IEC 60747. At the time of publication, the editions indicated
were valid. All normative documents are subject to revision, and parties to agreements based
on this part of IEC 60747 are encouraged to investigate the possibility of applying the most
recent editions of the normative documents indicated below. Members of IEC and ISO maintain
registers of currently valid International Standards.
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 60270:1981, Partial discharge measurements
3 Measuring methods for photoemitters
3.1 Luminous intensity of light-emitting diodes (I )
v
a) Purpose
To measure the luminous intensity of semiconductor light-emitting diodes.
The method can be applied to three possible measurement variants:
Variant 1
Rotation of the diode around its mechanical axis for an accurate location of the minimum
and/or maximum value.
Variant 2
Alignment of the diode optical axis with that of the optical bench.
Variant 3
Positioning according to a reference corresponding to the type of the diode envelope and
allowing a reproducible mechanical orientation.

60747-5-3 © IEC:1997 – 9 –
b) Circuit diagram
Figure 1
c) Circuit description and requirements
G = current source
D = light-emitting diode being measured
PD = photodetector including the diaphragm D of area A
D , D = Diaphragms intended to suppress parasitic radiations. D and D shall not limit
2 3 2 3
the solid angle
d = distance between the diode being measured and D .
The spectral sensitivity of the photometer shall be adjusted to the CIE (International
Commission on Illumination) standard observers curve in the wavelength region of the light
emitted by the diode. The photometer shall be calibrated in candelas at the distance d, with
diaphragm D in place.
The distance d shall be such that the solid angle viewed by the light source at the
diaphragm D (= A/d²) is less than 0,01 sr.
For pulse measurements, the current generator should provide current pulses of the
require
...