EN 62271-101:2013

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Hochspannungs-Schaltgeräte und -Schaltanlagen - Teil 101: Synthetische Prüfung (IEC 62271-101:2012)Appareillage à haute tension - Partie 101: Essais synthétiques (CEI 62271-101:2012)High-voltage switchgear and controlgear - Part 101: Synthetic testing (IEC 62271-101:2012)29.130.10Visokonapetostne stikalne in krmilne napraveHigh voltage switchgear and controlgearICS:Ta slovenski standard je istoveten z:EN 62271-101:2013SIST EN 62271-101:2013en01-marec-2013SIST EN 62271-101:2013SLOVENSKI
STANDARDSIST EN 62271-101:2006/A1:2010SIST EN 62271-101:20061DGRPHãþD

EUROPEAN STANDARD EN 62271-101 NORME EUROPÉENNE
EUROPÄISCHE NORM January 2013
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2013 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62271-101:2013 E
ICS 29.130.10 Supersedes EN 62271-101:2006 + A1:2010
English version
High-voltage switchgear and controlgear -
Part 101: Synthetic testing (IEC 62271-101:2012)
Appareillage à haute tension -
Partie 101: Essais synthétiques (CEI 62271-101:2012)
Hochspannungs-Schaltgeräte und -Schaltanlagen -
Teil 101: Synthetische Prüfung (IEC 62271-101:2012)
This European Standard was approved by CENELEC on 2012-11-16. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
Foreword The text of document 17A/1015/FDIS, future edition 2 of IEC 62271-101, prepared by SC 17A, "High-voltage switchgear and controlgear", of IEC TC 17, "Switchgear and controlgear" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62271-101:2013.
The following dates are fixed: • latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2013-08-16 • latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2015-11-16
This document supersedes EN 62271-101:2006 + A1:2010. EN 62271-101:2013 includes the following significant technical changes with respect to EN 62271-101:2006: – addition of the new rated voltages of 1 100 kV and 1 200 kV; – revision of Annex F regarding circuit-breakers with opening resistors; – alignment with the EN 62271-100:2009 + A1: 2012.
This publication shall be read in conjunction with EN 62271-100:2009, to which it refers. The numbering of the subclauses of Clause 6 is the same as in EN 62271-100. However, not all subclauses of EN 62271-100 are addressed; merely those where synthetic testing has introduced changes. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent rights.
Endorsement notice The text of the International Standard IEC 62271-101:2012 was approved by CENELEC as a European Standard without any modification. SIST EN 62271-101:2013

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Annex ZA
(normative)
Normative references to international publications with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title EN/HD Year
IEC 62271-100 + A1 2008 2012 High-voltage switchgear and controlgear - Part 100: Alternating current circuit-breakers EN 62271-100 + A1 2009 2012
IEC 62271-101 Edition 2.0 2012-10 INTERNATIONAL STANDARD NORME INTERNATIONALE High-voltage switchgear and controlgear –
Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques
INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XH ICS 29.130.10 PRICE CODE CODE PRIX ISBN 978-2-83220-421-4
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CONTENTS FOREWORD . 7 1 Scope . 9 2 Normative references . 9 3 Terms and definitions . 9 4 Synthetic testing techniques and methods for short-circuit breaking tests . 11
Basic principles and general requirements for synthetic breaking test 4.1methods . 11
General . 11 4.1.1 High-current interval . 12 4.1.2 Interaction interval . 12 4.1.3 High-voltage interval . 13 4.1.4 Synthetic test circuits and related specific requirements for breaking tests . 14 4.2 Current injection methods . 14 4.2.1 Voltage injection method . 15 4.2.2 Duplicate circuit method (transformer or Skeats circuit) . 15 4.2.3 Other synthetic test methods . 16 4.2.4 Three-phase synthetic test methods . 16 4.35 Synthetic testing techniques and methods for short-circuit making tests . 19
Basic principles and general requirements for synthetic making test methods . 19 5.1 General . 19 5.1.1 High-voltage interval . 19 5.1.2 Pre-arcing interval . 19 5.1.3 Latching interval and fully closed position . 20 5.1.4 Synthetic test circuit and related specific requirements for making tests . 20 5.2 General . 20 5.2.1 Test circuit . 20 5.2.2 Specific requirements . 20 5.2.36 Specific requirements for synthetic tests for making and breaking performance related to the requirements of 6.102 through 6.111 of
IEC 62271-100:2008 . 21 Annex A (informative)
Current distortion . 42 Annex B (informative)
Current injection methods. 58 Annex C (informative)
Voltage injection methods . 62 Annex D (informative)
Skeats or duplicate transformer circuit . 65 Annex E (normative)
Information to be given and results to be recorded for synthetic tests . 68 Annex F (normative)
Synthetic test methods for circuit-breakers with opening resistors . 69 Annex G (informative)
Synthetic methods for capacitive-current switching . 76 Annex H
(informative)
Re-ignition methods to prolong arcing . 88 Annex I (normative)
Reduction in di/dt and TRV for test duty T100a . 91 Annex J (informative)
Three-phase synthetic test circuits . 100 Annex K (normative)
Test procedure using a three-phase current circuit and one voltage circuit . 107 Annex L (normative)
Splitting of test duties in test series taking into account
the associated TRV for each pole-to-clear . 127 Annex M (normative)
Tolerances on test quantities for type tests . 147 SIST EN 62271-101:2013

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Annex N (informative)
Typical test circuits for metal-enclosed and dead tank circuit-breakers . 150 Annex O (informative)
Combination of current injection and voltage injection methods . 160 Bibliography . 163
Figure 1 – Interrupting process – Basic time intervals . 33 Figure 2 – Examples of evaluation of recovery voltage . 34 Figure 3 – Equivalent surge impedance of the voltage circuit
for the current injection method . 35 Figure 4 – Making process – Basic time intervals . 36 Figure 5 – Typical synthetic making circuit for single-phase tests. 37 Figure 6 – Typical synthetic making circuit for out-of-phase . 38 Figure 7 – Typical synthetic make circuit for three-phase tests (kpp = 1,5) . 39 Figure 8 – Comparison of arcing time settings during three-phase direct tests (left)
and three-phase synthetic (right) for T100s with kpp = 1,5 . 40 Figure 9 – Comparison of arcing time settings during three-phase direct tests (left)
and three-phase synthetic (right) for T100a with kpp = 1,5 . 41 Figure A.1 – Direct circuit, simplified diagram . 49 Figure A.2 – Prospective short-circuit current . 49 Figure A.3 – Distortion current . 49 Figure A.4 – Distortion current . 50 Figure A.5 – Simplified circuit diagram . 51 Figure A.6 – Current and arc voltage characteristics for symmetrical current . 52 Figure A.7 – Current and arc voltage characteristics for asymmetrical current . 53 Figure A.8 – Reduction of amplitude and duration of final current loop of arcing . 54 Figure A.9 – Reduction of amplitude and duration of final current loop of arcing . 55 Figure A.10 – Reduction of amplitude and duration of final current loop of arcing . 56 Figure A.11 – Reduction of amplitude and duration of final current loop of arcing . 57 Figure B.1 – Typical current injection circuit with voltage circuit
in parallel with the test circuit-breaker . 59 Figure B.2 – Injection timing for current injection scheme with circuit B.1 . 60 Figure B.3 – Examples of the determination of the interval of significant change of arc voltage from the oscillograms . 61 Figure C.1 – Typical voltage injection circuit diagram with voltage circuit
in parallel with the auxiliary circuit-breaker (simplified diagram) . 63 Figure C.2 – TRV waveshapes in a voltage injection circuit with the voltage circuit in parallel with the auxiliary circuit-breaker . 64 Figure D.1 – Transformer or Skeats circuit . 66 Figure D.2 – Triggered transformer or Skeats circuit . 67 Figure F.1 – Test circuit to verify thermal re-ignition behaviour of the main interrupter . 73 Figure F.2 – Test circuit to verify dielectric re-ignition behaviour of the main interrupter . 73 Figure F.3 – Test circuit on the resistor interrupter . 74 Figure F.4 – Example of test circuit for capacitive current
switching tests on the main interrupter . 75 SIST EN 62271-101:2013

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Figure F.5 – Example of test circuit for capacitive current switching tests on the resistor interrupter . 75 Figure G.1 – Capacitive current circuits (parallel mode) . 79 Figure G.2 – Current injection circuit . 80 Figure G.3 – LC oscillating circuit . 81 Figure G.4 – Inductive current circuit in parallel with LC oscillating circuit . 82 Figure G.5 – Current injection circuit, normal recovery voltage
applied to both terminals of the circuit-breaker . 83 Figure G.6 – Synthetic test circuit (series circuit), normal recovery voltage applied to both sides of the test circuit breaker . 84 Figure G.7 – Current injection circuit, recovery voltage
applied to both sides of the circuit-breaker . 85 Figure G.8 – Making test circuit . 86 Figure G.9 – Inrush making current test circuit . 87 Figure H.1 – Typical re-ignition circuit diagram for prolonging arc-duration . 89 Figure H.2 – Combined Skeats and current injection circuits . 89 Figure H.3 – Typical waveforms obtained during an asymmetrical test
using the circuit in Figure H.2 . 90 Figure J.1 – Three-phase synthetic combined circuit . 102 Figure J.2 – Waveshapes of currents, phase-to-ground and phase-to phase voltages during a three-phase synthetic test (T100s; kpp = 1,5 ) performed
according to the three-phase synthetic combined circuit . 103 Figure J.3 – Three-phase synthetic circuit with injection in all phases for kpp = 1,5. 104 Figure J.4 – Waveshapes of currents and phase-to-ground voltages
during a three-phase synthetic test (T100s; kpp =1,5) performed
according to the three-phase synthetic circuit with injection in all phases . 104 Figure J.5 – Three-phase synthetic circuit for terminal fault tests with kpp = 1,3 (current injection method) . 105 Figure J.6 – Waveshapes of currents, phase-to-ground and phase-to-phase voltages during a three-phase synthetic test (T100s; kpp =1,3 ) performed
according to the three-phase synthetic circuit shown in Figure J.5 . 105 Figure J.7 – TRV voltages waveshapes of the test circuit described in Figure J.5 . 106 Figure K.1 – Example of a three-phase current circuit
with single-phase synthetic injection . 118 Figure K.2 – Representation of the testing conditions of Table K.1 . 119 Figure K.3 – Representation of the testing conditions of Table K.2 . 120 Figure K.4 – Representation of the testing conditions of Table K.3 . 121 Figure K.5 – Representation of the testing conditions of Table K.4 . 122 Figure K.6 – Representation of the testing conditions of Table K.5 . 123 Figure K.7 – Representation of the testing conditions of Table K.6 . 124 Figure K.8 – Representation of the testing conditions of Table K.7 . 125 Figure K.9 – Representation of the testing conditions of Table K.8 . 126 Figure L.1 – Graphical representation of the test shown in Table L.6 . 137 Figure L.2 – Graphical representation of the test shown in Table L.7 . 138 Figure N.1 – Test circuit for unit testing (circuit-breaker with interaction due to gas circulation) . 151 SIST EN 62271-101:2013

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Figure N.2 – Half-pole testing of a circuit-breaker in test circuit given by Figure N.1 – Example of the required TRVs to be applied between the terminals of the unit(s) under test and between the live parts and the insulated enclosure . 152 Figure N.3 – Synthetic test circuit for unit testing (if unit testing is allowed as per 6.102.4.2 of IEC 62271-100:2008) . 153 Figure N.4 – Half-pole testing of a circuit-breaker in the test circuit of Figure N.3 – Example of the required TRVs to be applied between the terminals of the unit(s) under test and between the live parts and the insulated enclosure . 154 Figure N.5 – Capacitive current injection circuit with enclosure of the circuit-breaker energized . 155 Figure N.6 – Capacitive synthetic circuit using two power-frequency sources and with the enclosure of the circuit-breaker energized . 156 Figure N.7 – Capacitive synthetic current injection circuit – Example of unit testing on half a pole of a circuit-breaker with two units per pole – Enclosure energized with d.c. voltage source . 157 Figure N.8 – Symmetrical synthetic test circuit for out-of-phase switching tests on a complete pole of a circuit-breaker . 158 Figure N.9 – Full pole test with voltage applied to both terminals and the metal enclosure . 159 Figure O.1 – Example of combined current and voltage injection circuit with application of full test voltage to earth . 161 Figure O.2 – Example of combined current and voltage injection circuit with separated application of test voltage . 162
Table 1 – Test circuits for test duties T100s and T100a . 17 Table 2 – Test parameters during three-phase interruption for test-duties T10, T30, T60 and T100s, kpp = 1,5 . 17 Table 3 – Test parameters during three-phase interruption for test-duties T10, T30, T60 and T100s, kpp = 1,3 . 18 Table 4 – Test parameters during three phase interruption for test-duties T10, T30, T60 and T100s, kpp = 1,2 . 18 Table 5 – Synthetic test methods for test duties T10, T30, T60,
T100s, T100a, SP, DEF, OP and SLF . 31 Table I.1 – Last loop di/dt reduction for 50 Hz for kpp = 1,3 and 1,5 . 91 Table I.2 – Last loop di/dt reduction for 50 Hz for kpp = 1,2 . 92 Table I.3 – Last loop di/dt reduction for 60 Hz for kpp = 1,3 and 1,5 . 93 Table I.4 – Last loop di/dt reduction for 60 Hz for kpp = 1,2 . 94 Table I.5 – Corrected TRV values for the first pole-to-clear for kpp = 1,3 and fr = 50 Hz . 95 Table I.6 – Corrected TRV values for the first pole-to-clear for kpp = 1,3 and fr = 60 Hz . 96 Table I.7 – Corrected TRV values for the first pole-to-clear for kpp = 1,5 and fr = 50 Hz . 97 Table I.8 – Corrected TRV values for the first pole-to-clear for kpp = 1,5 and fr = 60 Hz . 98 Table I.9 – Corrected TRV values for the first pole-to-clear for kpp = 1,2 and fr = 50 Hz . 98 Table I.10 – Corrected TRV values for the first pole-to-clear for kpp = 1,2 and fr = 60 Hz . 99 Table K.1 – Demonstration of arcing times for kpp = 1,5 . 108 Table K.2 – Alternative demonstration of arcing times for kpp = 1,5 . 109 Table K.3 – Demonstration of arcing times for kpp = 1,3 . 110 Table K.4 – Alternative demonstration of arcing times for kpp = 1,3 . 111 SIST EN 62271-101:2013

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Table K.5 – Demonstration of arcing times for kpp = 1,5 . 112 Table K.6 – Alternative demonstration of arcing times for kpp = 1,5 . 113 Table K.7 – Demonstration of arcing times for kpp = 1,3 . 114 Table K.8 – Alternative demonstration of arcing times for kpp = 1,3 . 115 Table K.9 – Procedure for combining kpp = 1,5 and 1,3 during test-duties T10, T30, T60 and T100s(b) . 116 Table K.10 – Procedure for combining kpp = 1,5 and 1,3 during test-duty T100a . 117 Table L.1 – Test procedure for kpp = 1,5. 129 Table L.2 – Test procedure for kpp = 1,3. 130 Table L.3 – Simplified test procedure for kpp = 1,3 . 131 Table L.4 – Test procedure for kpp = 1,2. 132 Table L.5 – Simplified test procedure for kpp = 1,2 . 133 Table L.6 – Test procedure for asymmetrical currents in the case of kpp = 1,5 . 134 Table L.7 – Test procedure for asymmetrical currents in the case of kpp = 1,3 . 135 Table L.8 – Test procedure for asymmetrical currents in the case of kpp = 1,2 . 136 Table L.9 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,5 , fr = 50 Hz . 139 Table L.10 – Required test parameters for different asymmetrical conditions in the case of a kpp = 1,3 , fr = 50 Hz . 140 Table L.11 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,2 , fr = 50 Hz . 141 Table L.12 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,5 , fr = 60 Hz . 142 Table L.13 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,3 , fr = 60 Hz . 143 Table L.14 – Required test parameters for different asymmetrical conditions in the case of kpp = 1,2, fr = 60 Hz . 144 Table L.15 – Procedure for combining kpp = 1,5 and 1,3 during test-duties T10, T30, T60 and T100s(b) . 145 Table L.16 – Procedure for combining kpp = 1,5 and 1,3 during test-duty T100a . 146 Table M.1 – Tolerances on test quantities for type tests (1of 2) . 148
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INTERNATIONAL ELECTROTECHNICAL COMMISSION ___________
HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR –
Part 101: Synthetic testing
FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62271-101 has been prepared by subcommittee 17A: High-voltage switchgear and controlgear, of IEC technical committee 17: Switchgear and controlgear. This second edition cancels and replaces the first edition published in 2006 and its Amendment 1 published in 2010. It constitutes a technical revision. This edition includes the following significant technical changes with respect to the first edition: – addition of the new rated voltages of 1 100 kV and 1 200 kV; – revision of Annex F regarding circuit-breakers with opening resistors; – alignment with the second edition of IEC 62271-100:2008 and its Amendment 1 (2012). SIST EN 62271-101:2013

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The text of this standard is based on the first edition of IEC 62271-101 and the following documents: FDIS Report on voting 17A/1015/FDIS 17A/1024/RVD
Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. This publication shall be read in conjunction with IEC 62271-100, published in 2008, to which it refers. The numbering of the subclauses of Clause 6 is the same as in IEC 62271-100. However, not all subclauses of IEC 62271-100 are addressed; merely those where synthetic testing has introduced changes. A list of all the parts in the IEC 62271 series, under the general title High-voltage switchgear and controlgear, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to the specific publication. At this date, the publication will be • reconfirmed; • withdrawn; • replaced by a revised edition, or • amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer.
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HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR –
Part 101: Synthetic testing
1 Scope This part of IEC 62271 mainly applies to a.c. circuit-breakers within the scope of IEC 62271-100. It provides the general rules for testing a.c. circuit-breakers, for making and breaking capacities over the range of test duties described in 6.102 to 6.111 of IEC 62271-100:2008, by synthetic methods. It has been proven that synthetic testing is an economical and technically correct way to test high-voltage a.c. circuit-breakers according to the requirements of IEC 62271-100 and that it is equivalent to direct testing. The methods and techniques described are those in general use. The purpose of this standard is to establish criteria for synthetic testing and for the proper evaluation of results. Such criteria will establish the validity of the test method without imposing restraints on innovation of test circuitry. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 62271-100:2008, High-voltage switchgear and controlgear – Part 100: Alternating current circuit-breakers Amendment 1:2012 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 62271-100, as well as the following, apply.
3.1direct test test in which the applied voltage, the current and the transient and power-frequency recovery voltages are all obtained from a circuit having a single-power source, which may be a power system or special alternators as used in short-circuit testing stations or a combination of both
3.2synthetic test test in which all of the current, or a major portion of it, is obtained from one source (current circuit), and in which the applied voltage and/or the recovery voltages (transient and power frequency) are obtained wholly or in part from one or more separate sources (voltage circuits)
3.3test circuit-breaker circuit-breaker under test
SEE: 6.102.3 of IEC 62271-100:2008. SIST EN 62271-101:2013

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3.4auxiliary circuit-breaker circuit-breaker forming part of a synthetic test circuit used to put the test circuit-breaker into the required relation with various circuits
3.5current circuit that part of the synthetic test circuit from which all or the major part of the power-frequency current is obtained
3.6voltage circuit that part of the synthetic test circuit from which all or the major part of the applied voltage and/or recovery voltage is obtained
3.7prospective current (of a circuit and with respect to a circuit-breaker) current that would flow in the circuit if each pole of the test and auxiliary circuit-breakers were replaced by a conductor of negligible impedance [SOURCE: IEC 60050-441:1984, 441-17-01, modified]
3.8actual current current through the test circuit-breaker (prospective current modified by the arc voltage of the test and auxiliary circuit-breakers)
3.9distortion current calculated current equal to the difference between the prospective current and the actual current
3.10post-arc current current which flows through the arc gap of a circuit-breaker when the current and arc voltage have fallen to zero and the transient recovery voltage has begun to rise
3.11current-injection method synthetic test method in which the voltage circuit is applied to the test circuit-breaker before power-frequency current zero
3.12initial transient making current ITMC transient current which flows through the circuit-breaker at the moment of voltage breakdown prior to the initiation of current from the current circuit during making
3.13injected current current supplied by the voltage circuit of a current injection circuit when it is connected to the circuit-breaker under test
3.14voltage-injection method synthetic test method in which the voltage circuit is applied to the test circuit-breaker after power frequency current zero SIST EN 62271-101:2013

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3.15reference system conditions conditions of an electrical system having the parameters from which the rated and test values of IEC 62271-100 are derived
3.16time delay of making device tm time interval, during synthetic making test, between the instant of breakdown of the applied voltage and the initiation of current from the current circuit
3.17minimum clearing time sum of the minimum opening time, minimum relay time (0,5 cycle), and the minimum arcing time at current interruption after the minor loop of the first-pole-to-clear, during test duty T100a only, as declared by the manufacturer NOTE This definition should be used only for the determination of the test parameters during short-circuit breaking tests according to test duty T100a. [SOURCE: 3.7.159 of IEC 62271-100:2008]
3.18pre-strike voltage breakdown between the contacts during a making operation which initiates current flow 4 Synthetic testing techniques and methods for short-circuit breaking tests
Basic principles and general requirements for synthetic breaking test methods 4.1 General 4.1.1Any particular synthetic method chosen for testing shall adequately stress the test circuit-breaker. Generally, the adequacy is established when the test method meets the requirements set forth in the following subclauses. A circuit-breaker has two basic positions: closed and open. In the closed position a circuit-breaker conducts full current with negligible voltage drop across its contacts. In the open position it conducts negligible current but with full voltage across the contacts. This defines the two main stresses, the current stress and the voltage stress, which are separated in time. If closer attention is paid to the voltage and current stresses during the interrupting process (Figure 1), three main intervals can be recognized: – High-current interval
The high-current interval is the time from contact separation to the start of the significant change in arc voltage. The high-current interval precedes the interaction and high-voltage intervals. – Interaction interval
The interaction interval is the time from the start of the significant change in arc voltage prior to current zero to the time when the current including the post-arc current, if any, ceases to flow through the test circuit-breaker (see also Clause B.2). – High-voltage interval
The high-voltage interval is the time from the moment when the current including the post-arc current, if any, ceases to flow through the test circuit-breaker to the end of the test. SIST EN 62271-101:2013

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High-current interval 4.1.2During the high-current interval the test circuit-breaker shall be stressed by the test circuit in such a way that the starting conditions for the interaction interval, within tolerances to be specified, are the same as under reference system conditions. In synthetic test circuits the ratio of the power-frequency voltage of the current circuit to the arc voltage is low in comparison with tests at reference system conditions due to: – the voltage of the current circuit being a fraction of the system voltage; – the fact that the arc voltages of the test circuit-breaker and of the auxiliary circuit-breaker are added. As a result the duration of the current loop and the peak value of the current will be reduced. This distortion of the current is outlined in Annex A. Considerations with respect to the arc energy released in the test circuit-breaker lead to a maximum permissible influence in terms of tolerances on two characteristic values of the shape of the current, i.e. current-peak value and current-loop duration (see Annex A). The tolerance on the amplitude and the power frequency of the prospective breaking current is given in 6.103.2 and 6.104.3 of IEC 62271-100:2008. Therefore, the following conditions concerning the actual current through the test circuit-breaker shall be met: – for symmetrical testing the current amplitude and final loop duration shall not be less than 90 % of the required values based on rated current; – for asymmetrical testing, the current amplitude and final loop duration shall be between 90 % and 110 % of the required values, based on rated current and time constant (see Tables 15 to 22 of IEC 62271-100:2008). Adjustment measures: The amplitude and duration of the last current loop may be adjusted by several means, such as – increasing or decreasing of the r.m.s. value of the short-circuit test current, – changing of the frequency of the test current, – using pre-tripping or delayed tripping, – changing the instant of current initiation (initial d.c. component).
Interaction interval 4.1.3During the interaction interval, the short-circuit current stress changes into high-voltage stress and the circuit-breaker performance can significantly influence the current and voltages in the circuit. As the current decreases to zero, the arc voltage may rise to charge parallel capacitance and distort current passing through the arc. After the current zero the post-arc conductivity may result in additional damping of the transient recovery voltage and thus influence the voltage across the circuit-breaker and the energy supplied to the ionized contact gap. The interaction between the circuit and the circuit-breaker immediately before and after current zero (i.e. during the interaction interval) is of extreme importance to the interrupting process. During the interaction interval, the current and voltage waveforms shall be the same for a synthetic test as under reference system conditions (see 3.15), taking into account the possible deviations of the current and voltage from the prospective values due to the interaction between the circuit-breaker and the circuit. SIST EN 62271-101:2013

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The interaction interval presents the critical time for the thermal failure mode of the circuit-breaker. Therefore, it is of extreme importance that the shape and magnitude of the prospective transient recovery voltage (TRV) corresponds to that associated with the prospective current of the relevant test duty. The above implies strict requirements for the test circuit. The requirements are given for the current injection method in 4.2.1 and
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