EN 62680-2-3:2015

SLOVENSKI STANDARD
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ICS:
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oprema equipment
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 62680-2-3

NORME EUROPÉENNE
EUROPÄISCHE NORM
December 2015
ICS 29.220; 33.120; 35.200
English Version
Universal Serial Bus interfaces for data and power - Part 2-3:
Universal Serial Bus Cables and Connectors Class Document,
Revision 2.0 (TA 14)
(IEC 62680-2-3:2015)
Interfaces de bus universel en série pour les données et Schnittstellen des Universellen Seriellen Busses für Daten
l'alimentation électrique - Partie 2-3 : câbles et connecteurs und Energie - Teil 2-3: Klasse für Kabel und
USB, document de classe, révision 2.0 (TA 14) Steckverbinder des Universellen Seriellen Busses,
(IEC 62680-2-3:2015) Überarbeitung 2.0
(IEC 62680-2-3:2015)
This European Standard was approved by CENELEC on 2015-10-14. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2015 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62680-2-3:2015 E
European foreword
The text of document 100/2333/CDV, future edition 1 of IEC 62680-2-3, prepared by Technical Area
14 "Interfaces and methods of measurement for personal computing equipment" of IEC/TC 100
"Audio, video and multimedia systems and equipment" was submitted to the IEC-CENELEC parallel
vote and approved by CENELEC as EN 62680-2-3:2015.

The following dates are fixed:
• latest date by which the document has to be (dop) 2016-07-14
implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2018-10-14
• latest date by which the national
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 62680-2-3:2015 was approved by CENELEC as a
European Standard without any modification.
IEC 62680-2-3 ®
Edition 1.0 2015-09
INTERNATIONAL
STANDARD
colour
inside
Universal serial bus interfaces for data and power –

Part 2-3: Universal Serial Bus Cables and Connectors Class Document

Revision 2.0
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 29.220; 33.120; 35.200 ISBN 978-2-8322-2847-0

– 2 – IEC 62680-2-3:2015 © IEC 2015
© USB-IF 2014
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
UNIVERSAL SERIAL BUS INTERFACES
FOR DATA AND POWER –
Part 2-3: Universal Serial Bus Cables and
Connectors Class Document Revision 2.0

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62680-2-3 has been prepared by technical area 14: Interfaces and
methods of measurement for personal computing equipment, of IEC technical committee 100:
Audio, video and multimedia systems and equipment.
The text of this standard is based on documents prepared by the USB Implementers Forum
(USB-IF). The structure and editorial rules used in this publication reflect the practice of the
organization which submitted it.

IEC 62680-2-3:2015 © IEC 2015 – 3 –
© USB-IF 2014
The text of this standard is based on the following documents:
CDV Report on voting
100/2333/CDV 100/2436/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
A list of all the parts in the IEC 62680 series, published under the general title Universal serial
bus interfaces for data and power can be found on the IEC website.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 4 – IEC 62680-2-3:2015 © IEC 2015
© USB-IF 2014
INTRODUCTION
The IEC 62680 series is based on a series of specifications that were originally developed by
the USB Implementers Forum (USB-IF). These specifications were to submitted to the IEC
under the auspices of a special agreement between the IEC and the USB IF.
The USB Implementers Forum, Inc.(USB-IF) is a non-profit corporation founded by the group
of companies that developed the Universal Serial Bus specification. The USB-IF was formed
to provide a support organization and forum for the advancement and adoption of Universal
Serial Bus technology. The Forum facilitates the development of high-quality compatible USB
peripherals (devices), and promotes the benefits of USB and the quality of products that have
passed compliance testing.
ANY USB SPECIFICATIONS ARE PROVIDED TO YOU "AS IS, "WITH NO WARRANTIES
WHATSOEVER, INCLUDING ANY WARRANTY OF MERCHANTABILITY, NON-
INFRINGEMENT, OR FITNESS FOR ANY PARTICULAR PURPOSE. THE USB
IMPLEMENTERS FORUM AND THE AUTHORS OF ANY USB SPECIFICATIONS DISCLAIM
ALL LIABILITY, INCLUDING LIABILITY FOR INFRINGEMENT OF ANY PROPRIETARY
RIGHTS, RELATING TO USE OR IMPLEMENTATION OR INFORMATION IN THIS
SPECIFICAITON.
THE PROVISION OF ANY USB SPECIFICATIONS TO YOU DOES NOT PROVIDE YOU
WITH ANY LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE, TO ANY
INTELLECTUAL PROPERTY RIGHTS.
Entering into USB Adopters Agreements may, however, allow a signing company to
participate in a reciprocal, royalty-free licensing arrangement for compliant products. For more
information, please see:
http://www.usb.org/developers/docs/
http://www.usb.org/developers/devclass_docs#approved
IEC DOES NOT TAKE ANY POSITION AS TO WHETHER IT IS ADVISABLE FOR YOU TO
ENTER INTO ANY USB ADOPTERS AGREEMENTS OR TO PARTICIPATE IN THE USB
IMPLEMENTERS FORUM.”
This series covers the Universal Series Bus interfaces for data and power and consists of the
following parts:
IEC 62680-1-1, Universal Serial Bus interfaces for data and power – Part 1-1: Common
components – USB Battery Charging Specification, Revision 1.2
IEC 62680-2-1, Universal Serial Bus interfaces for data and power – Part 2-1: Universal
Serial Bus Specification, Revision 2.0
IEC 62680-2-2, Universal Serial Bus interfaces for data and power – Part 2-2: USB Micro-
USB Cables and Connectors Specification, Revision 1.01
IEC 62680-2-3, Universal Serial Bus interfaces for data and power – Part 2-3: Universal
Serial Bus Cables and Connectors Class Document Rev. 2.0
This part of the IEC 62680 series consists of several distinct parts:
• the main body of the text, which consists of the original specification developed by the
USB-IF.
IEC 62680-2-3:2015 © IEC 2015 – 5 –
© USB-IF 2014
CONTENTS
FOREWORD . 2
INTRODUCTION . 4
1 Introduction . 11
1.1 Purpose . 11
1.2 Scope . 11
1.3 Related Documents . 11
1.4 Terms and Abbreviations . 12
2 Management Overview . 13
3 USB Electrical, Mechanical and Environmental Compliance Standards . 13
4 Acceptance Criteria, Test Methods and Test Procedures . 17
4.1 Integrators List (IL) . 17
4.2 USB Logo Usage . 17
4.3 Compliance Test Report. 17
4.4 Connector and Cable Assembly Physical Certification . 17
4.5 General Information . 18
4.5.1 Mated Pairs . 18
4.5.2 Before Testing . 18
4.5.3 Test Sequences . 18
4.6 Sample Selection . 18
4.7 USB Compliance Testing Interval . 18
4.8 Primary Qualification Approval Testing. 19
4.9 Sustaining Qualification Approval Testing . 19
4.10 Compliance Test Sequences . 19
4.10.1 Inspection EIA 364-18 . 19
4.10.2 Test Group ‘1’ . 21
4.10.3 Test Group ‘2’ . 22
4.10.4 Test Group ‘3’ . 23
4.10.5 Test Group ‘4’ . 24
4.10.6 Test Group ‘5’ . 25
4.10.7 Test Group ‘6’ . 25
4.10.8 Test Group ‘7’ . 26
4.10.9 Test Group ‘8’ . 27
5 Certification Acceptance and Submission . 27
5.1 Compliance Test Report. 28
5.2 Listing, Authorization and Notification . 28
5.2.1 Listing . 28
5.2.2 Authorization to use Certified USB Logo . 28
5.2.3 Notification . 28
Appendices . 29

Figure 4-1 – Typical Contact Resistance Measurement . 22

Table 3-1 – Electrical, Mechanical and Environmental Compliance Standards . 14
Table 4-1 – Test Conditions . 18
Table 4-2 – Performance Levels . 18

– 6 – IEC 62680-2-3:2015 © IEC 2015
© USB-IF 2014
Table 4-3 – Primary Qualification Approval Testing . 19
Table 4-4 – Test Group '1' Durability, Vibration, Shock, Cable Retention and
Mating/Un-mating Force . 21
Table 4-5 – Group '2' Temperature Life . 22
Table 4-6 – Test Group '3' Mixed Flowing Gas . 23
Table 4-7 – Test Group '4' Insulation Resistance, Dielectric Withstanding Voltage,
Thermal Shock & Humidity Temperature Cycling . 24
Table 4-8 – Test Group '5' Solderability . 25
Table 4-9 – Test Group '6' High Frequency Testing . 25
Table 4-10 – Test Group '7' Critical Dimensions . 26
Table 4-11 – Test Group '8' Cable. 27

IEC 62680-2-3:2015 © IEC 2015 – 7 –
© USB-IF 2014
Universal Serial Bus
Cables and Connectors
Specification
Revision 2.0
August, 2007
Revision History
Revision Date Filename Comment
2.0 RC 6 August 10, CabConnRC6_Aug10.doc Added Go/No-go & latch measurement for Micro
2007 series
Added Drain wire inspection process
Added pin contact visual inspection
Added clarifying text to 4-axis test description
2.0 RC5 June 5, 2007 CabConn20RC5_June5 Removed Shielding Effectiveness Replace
Rotational Continuity with 4-Axis continuity Other
miscellaneous minor changes
2.0 RC4 May, 2007 CabConn20RC4_May07 Cable Construction inspection added
2.0 April 4, 2007 CabConn20 Removed Shielding Effectiveness, Added power
line resistance test Added cable rotation test
2.0 February 14, CabConn Rev 2.0 Edits from Tsuyoshi YAMANE of Matsushita
2.0 February 13, CabConn Rev 2.0 Edited by Jim Koser new chart from Hirose
2.0 February 7, CabConn Rev 2.0 Edited draft
2.02RC2 February 6, CabConnRC2_02-06-07 Work group editorials
2.01RC2 December 6, CabConnRC2_12-06-06 Work group editorials
2.0RC2 July 11, 2006 CabConnRC2_7-11-06 Added durability requirements for Ruggedized
Standard “A” receptacle and durability
requirements for Micro series
2.0RC2 June 7, 2006 CabConnRC2_6-7-06 Added new critical dimensions drawings for
standard “A” and “B” plugs and receptacles and
changed the criteria for “mini” products to the use
of go – no go gages in Appendix B
2.0RC2 March 24, CabConnRC2_3-23- Added new IP agreement
2006 06.doc
2.0RC2 December CabConnRC2.doc Final edit during USB DWG meeting in Austin
03,2003 prior to posting the document to Web site
2.0RC1 October 29, CabConnRC1.doc Adjust formatting in technical edit pass
2.0RC August 13, Rewrite of test program to reflect current practice
2002 and general updates to reflect changes in the
USB Specification.
1.1 September 1, Editorial Update for improved use. Add
1999 Appendices ‘A’ and ‘B.’
1.0 May 22, 1999  Accepted unanimously by USB-IF DWG after 30-
day posting without negative comment.
1.0RC March 27, Release for industry comment
– 8 – IEC 62680-2-3:2015 © IEC 2015
© USB-IF 2014
Revision Date Filename Comment
0.9a January 19, Moved to Revision 0.9 by consensus of the Cable
1999 & Connector Work Group. Pending final editorial
cleanup RRs to be voted on at a special Cable &
Connector Work Group meeting February 21,
1999.
0.9RC December 18, Moves Document to 0.9RC by consensus of the
1998 Cable & Connector Group to Version 0.9 without
Appendices Drawings and Lab Listings. Special
dispensation by the DWG to move to Revision
1.0 for use at the January 1999 Plug Fest.
0.8 October 20, Release for industry comment
INTELLECTUAL PROPERTY DISCLAIMER
THIS SPECIFICATION IS PROVIDED TO YOU “AS IS” WITH NO WARRANTIES
WHATSOEVER, INCLUDING ANY WARRANTY OF MERCHANTABILITY, NON-
INFRINGEMENT, OR FITNESS FOR ANY PARTICULAR PURPOSE. THE AUTHORS OF
THIS SPECIFICATION DISCLAIM ALL LIABILITY, INCLUDING LIABILITY FOR
INFRINGEMENT OF ANY PROPRIETARY RIGHTS, RELATING TO USE OR
IMPLEMENTATION OF INFORMATION IN THIS SPECIFICATION. THE PROVISION OF THIS
SPECIFICATION TO YOU DOES NOT PROVIDE YOU WITH ANY LICENSE, EXPRESS OR
IMPLIED, BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS.
All product names are trademarks, registered trademarks, or service marks of their respective
owners.
USB Cables and Connectors Class Document
© Copyright 2007 USB Implementers Forum
All rights reserved.
IEC 62680-2-3:2015 © IEC 2015 – 9 –
© USB-IF 2014
Contributors
Name Company E-mail Address
James R. Koser Foxconn Electronics – CCWG Chair jim.koser@foxconn.com
Tsuneki Watanabe Foxconn Electronics t.watanabe@foxconn.com
Jim Zhao Foxconn Electronics Jim.zhao@foxconn.com
George G. Olear II Contech Research – Co-Editor ggo@contechresearch.com
Jaremy Flake ATL Technology – CCWG Scribe jaremyf@atlconnect.com
Glen Chandler Acon glenc@acon.com
George Yee Acon George.Yee@acon.com
Roy Ting ELKA International Ltd. roy@elka.com.tw
Sophia Liu ETC (Electronic Test Center, Taiwan) scl@etc.org.tw
Bill Northey FCI William.northey@fciconnect.com
Jack Lu Foxlink International, Inc. Jack_lu@foxlink.com
Wen Yang Foxlink International, Inc. wen@foxlink.com
Yasuhiro Ishii Fujikura Ltd Yishii@fujikura.co.jp
Shigreu Ashida Fujikura Ltd Ashidas@fujikura.co.jp
Marksuk Piyavit Fujikura Ltd MPiyavit @fujikura.com
Hiromichi Kato Fujikura Ltd pakl@fujikura.com
Sathid Inthon Fujikura Ltd isathid @fujikura.com
Makoto Kikuchi Fujikura Ltd mkikuchi@fujikura.co.jp
Hiroshi Nakazawa Hirose Electric Co. Ltd Hiroshi Nakazawa@hirose.co.jp
Yousuke Takeuchi Hirose Electric Co. Ltd Yousuke_Takeuchi@hirose.co.jp
Shinya Tono Hirose Electric Co. Ltd Shinya_tohno@hirose.co.jp
Karl Kwiat Hirose Electric Co. Ltd kkwiat@hirose.com
Kazunori Ichikawa Hirose Electric Co. Ltd Kazunori_Ichikawa@hirose.co.jp
Toshi Sasaki Honda Connectors t.sasaki@honda-connectors.co.jp
Jim Eilers Hosiden eilersjm@hoaco.com
Tsuyoshi Kitagawa Hosiden kitagawat@hoaco.com
David Suryoutomo Japan Aviation Electronics, Inc suryoutomod@jae.com
Ron Muir Japan Aviation Electronics, Inc muirr@jae.com
Kazuhiro Saito Japan Aviation Electronics, Inc saitouk@jae.co.jp
Takahiro Deguchi JST Mfg. Co. Ltd tdeguchi@jst-mfg.com
Yasuhira Miya JST Mfg. Co. Ltd ymiya@jst-mfg.com
Yoichi Nakazawa JST Mfg. Co. Ltd ynakazawa@jst-mfg.com
Hironori Handa JST Mfg. Co. Ltd hhanda@jst-mfg.com
Vincent Chen Longwell vince@longwell.com
Ron Ward Matsushita Electronics rward@us.pewg.panasonic.com
Hitoshi Kawamura Mitsumi h_kawamura@sales.mitsumi.co.jp
Atsushi Nishio Mitsumi a_nishio@eeb.mitsumi.co.jp
Yasuhiko Shinohara Mitsumi y_shinohara@eeb.mitsumi.co.jp
Scott Sommers Molex Scott.sommers@molex.com
E. Mark Rodda Motorola PCS markrodda@motorola.com
Sheldon Singleton National Technical Systems sheldons@ntscorp.com
Sam Liu Newnex saml@newnex.com
Jan Fahllund Nokia Corporation Jan.h.fahllund@nokia.com

– 10 – IEC 62680-2-3:2015 © IEC 2015
© USB-IF 2014
Name Company E-mail Address
Kai Silvennoine Nokia Corporation Kai.silvennoine@nokia.com
Richard Petrie Nokia Corporation Richard.petrie@nokia.com
Jussi Takaneva Nokia Corporation Jussi.Takaneva@nokia.com
Panu Ylihaavisto Nokia Corporation Panu.Ylihaavisto@nokia.com
Arthur Zarnowitz Palm arthur.zarnowitz@palm.com
Dave Peters Palm dave.peters@palm.com
Tetsuji Kawaguchi Panasonic (Matsushita) t Kawaguchi@us.pewg.panasonic.com
Satoshi Yamamoto Panasonic (Matsushita) koteyamd@sei.mew.co.jp
Tsuyoshi Yamane Panasonic (Matsushita) Yamane.tsuyoshi@mail.mew.co.jp
Naoyuki Ono SMK Naoyuki@smk.co.jp
Eric Yagi SMK s-yagi@smkusa.com
Scott Shuey Tyco Electronics. scott.shuey@tycoelectronics.com
Masaru Ueno Tyco Electronics Ueno.masaru@ tycoelectronics.com
Mark Paxson USB-IF. mpaxson@vtm-inc.com
Ed Beeman 2010 Tech for USB-IF ed.beeman@2010tech.com

IEC 62680-2-3:2015 © IEC 2015 – 11 –
© USB-IF 2014
UNIVERSAL SERIAL BUS INTERFACES
FOR DATA AND POWER –
Part 2-3: Universal Serial Bus Cables and
Connectors Class Document Revision 2.0

1 Introduction
1.1 Purpose
This document describes the mechanical, electrical, environmental, design and performance
criteria and voluntary supplier compliance requirements for USB connectors, cable and
fabricated cable assemblies. In addition, this document provides detailed requirements for the
design, approval and implementation of application specific USB connectors and fabricated
cable assemblies.
1.2 Scope
The information provided in this document serves as a guideline for design, development and
voluntary compliance testing of USB connectors and fabricated cables assemblies, as well as
defining mechanical, electrical, environmental and performance characteristics. As such, it
defines how USB connectors, cable and fabricated cables assemblies are to be implemented
and how manufacturers and/or fabricators will interact with the voluntary compliance
requirements.
1.3 Related Documents
American Society for Testing and Materials
ASTM-D-4565 Standard Test Methods for Physical and Environmental Performance
Properties of Insulations and Jackets for Telecommunications Wire and
Cable. This specification is available through the World Wide Web site
http://www.astm.org/
ASTM-D-4566 Standard Test Methods for Electrical Performance Properties of Insulations
and Jackets for Telecommunications Wire and Cable. This specification is
available through the World Wide Web site http://www.astm.org/
ANSI/EIA 364-C Electrical Connector/Socket Test Procedures Including Environmental
Classifications, approved 1994. Available in hard copy – reference search
site http://www.nssn.org/information.html
Underwriters Laboratories
UL STD-94 Test procedures used to classify polymeric materials 94HB, 94V-1, 94V-2,
94-5VA, 94-5VB, 94VTM-0, 94VTM-1, 94VTM-2, 94HBF, 94HF-1, and
94HF-2. This specification is available through the World Wide Web site
http://www.comm-2000.com/
UL Subject-444 Type CMP (plenum cable), Type CMR (riser cable), Type CM (commercial
cable), and Type CMX (cable for restricted use. This specification is
available through the World Wide Web site http://www.comm-2000.com/
[USB2.0] Universal Serial Bus Specification, revision 2.0 (also referred to as the USB
Specification). This specification is available on the World Wide Web site
http://www.usb.org.
USB On-The-Go On-The-Go Supplement to the USB 2.0 Specification (also referred to as
the USB On-The-Go Specification). This specification is available on the
World Wide Web site http://www.usb.org.

– 12 – IEC 62680-2-3:2015 © IEC 2015
© USB-IF 2014
1.4 Terms and Abbreviations
Term Description
A2LA The American Association for Laboratory Accreditation (A2LA) is a non-
profit, professional membership society. A2LA coordinates and manages a
broad-spectrum, nationwide laboratory accreditation system and offers
training and continuing education in laboratory practices and management.
A2LA offers accreditation to private, independent (for hirer), in-house and
government testing laboratories in the following fields: acoustics and
vibration; biological; chemical; construction materials; electrical;
environmental; geotechnical; mechanical; calibration; and, nondestructive
and thermal.
ANSI American National Standards Institute
Approved Integrators List (AIL) A listing available to USB-IF member companies at http://www.usb.org
listing cable and connector products that have successfully completed a
Voluntary Compliance Testing program conducted in accordance with the
most current version of the USB Specification’s Electrical, Mechanical and
Environmental Performance Standards as shown in Chapter 6, Chapter 7
and this document.
ASTM American Society for Testing and Materials.
ASUPS The acronym for Application Specific USB Product Specification. An ASUPS
describes the unique characteristics of a special purpose nonstandard USB
connector or cable assembly specification.
C of C Certificate of Compliance.
Characteristic A physical, chemical, visual or any other measurable property of a product
or material.
Contact Point One electrical contact of a multi-contact connector.
CTR Conformance Test Report
Defect Any nonconformance of the unit of product with specified requirements.
Defective Unit A unit of product that contains one or more defects.
DWG USB-IF Device Working Group
EIA Electronic Industries Association.
EMI/RFI Electro-magnetic Interference/Radio Frequency Interference.
Full-speed The USB ‘Full-speed’ data signaling rate is 12 Mb/s.
High-speed The USB ‘High-speed’ data signaling rate is 480 Mb/s.
Low-speed The USB ‘Low-speed’ data signaling rate is 1.5 Mb/s.
NIST National Institute of Standards and Technology.
Power Pair The non-twisted pair of electrical conductors in a USB cable used to carry
power from the ‘host controller’ and/or a ‘selfpowered hub’ to the device.
Where the ‘Red’ conductor is Vbus and the ‘Black’ conductor is Ground.
Signal Pair The twisted pair of electrical conductors in a USB cable used to carry data
from the ‘host controller’ and/or a ‘self-powered hub’ to the device. Where
the ‘Green’ conductor is Dplus (D+) and the ‘White’ conductor is Dminus (D-
).
TID Test Identification Number
Universal Serial Bus Universal Serial Bus is a serial interconnect bus that supports transfer rates
up to 480 M/bs for a maximum of 127 USB devices. (Please see USB 2.0)
USB Devices USB devices can be: ‘Hubs’ that provide attachment points for USB; or,
‘Functions’ that provide capabilities to the system, such as an ISDN
connection, a digital joystick, a printer, speakers, et cetera.
CNLA Chinese National Laboratory Accreditation
USB Host The USB interface to the host computer system is referred to as the Host
Controller. The Host Controller may be implemented in a combination of
hardware, firmware or software. A ‘root hub’ is integrated within the host
system to provide one or more attachment points. Additional information
concerning the ‘USB host’ may be found in Section 4.9 and Chapter 10 of
the USB Specification USB 2.0.

IEC 62680-2-3:2015 © IEC 2015 – 13 –
© USB-IF 2014
Term Description
USB Topology The USB connects USB devices with the USB host. The USB physical
interconnection is a tiered star topology. A ‘hub’ is at the center of each
star. Each wire segment is a point-to-point connection between the ‘host’
and a ‘hub’ or ‘function,’ or a ‘hub’ connected to another ‘hub’ or ‘function.’
USB The acronym for Universal Serial Bus. (Please see Universal Serial Bus)
USB-IF USB Implementers Forum is a nonprofit industry organization made up of
original equipment manufacturers (OEMs), component manufacturers and
firmware/software developers who are actively involved in the advancement
of USB technology. (Please see http://www.usb.org)
2 Management Overview
This section is an overview of the contents of this document and provides a brief summary of
each of the subsequent sections. It does not establish any requirements or guidelines.
Section 3 describes USB Electrical, Mechanical and Environmental Compliance Standards.
Section 4 describes the acceptance testing criteria and test procedures for USB connectors
and fabricated cable assemblies.
Section 5 Certification, Acceptance and Submission
Appendices:
3 USB Electrical, Mechanical and Environmental Compliance Standards
USB cable, connectors and fabricated cable assemblies must meet or exceed the
requirements specified by the most current version of Chapter 6 of the USB Specification and
applicable Supplements (please see Table 3-1, USB Electrical, Mechanical and Environmental
Compliance Standards).
– 14 – IEC 62680-2-3:2015 © IEC 2015
© USB-IF 2014
Table 3-1 – Electrical, Mechanical and Environmental Compliance Standards
Test Description Test Procedure Performance Requirement
Durability EIA 364-09 1500 cycles
The object of this test procedure is 5 000 cycles for Mini “B”
to detail a uniform test method for
10 000 cycles for Micro series
determining the effects caused by
subjecting a USB connector to the
10 000 cycles for ruggedized
conditioning action of insertion and
Standard “A”
extraction, simulating the expected
life of the connectors. Durability Cycle rate of 500 cycles per hour if
cycling with a gauge is intended done automatically and 200 if
only to produce mechanical stress. manual cycle
Durability performed with mating
components is intended to produce
both mechanical and wear stress.
Mating Force EIA 364-13 35 Newtons maximum at a
maximum rate of 12.5 mm (0,492”)
The object of this test is to detail a
per minute.
standard method for determining
the mechanical forces that are
required for inserting a USB
connector.
Un-mating Force EIA 364-13 10 Newtons minimum at a
maximum rate of 12,5 mm (0,492”)
The object of this test is to detail a
per minute. Standard A & B series.
standard method for determining
the mechanical forces that are 3 Newtons minimum Mini Series.
required for extracting a USB
8 N minimum at a maximum rate of
connector
12,5 mm (0,492″) per minute for
MicroUSB
Temperature Life EIA 364-17 Must meet the minimum
requirements specified by the most
Test Condition 4 – Method A.
current version of Chapter 6 of the
USB Specification and must be free
The object of this test procedure is
of cosmetic and/or mechanical
to detail a standard method to
imperfections that will prevent
assess the ability of a USB
normal use.
connector to withstand +85 °C ±
2 temperatures without applied
voltage for 500 hours
Visual & Dimensional Inspection EIA 364-18 Must meet the minimum
requirements specified by the most
Visual, dimensional and functional
current version of Chapter 6 of the
inspection in accordance with the
USB Specification.
USB quality inspection plans
Plating thickness of contacts
Dielectric EIA 364-20 The dielectric must withstand 500 V
Withstanding Voltage AC for one minute at sea level.
The object of this test procedure is
to detail a test method to prove that 100 V AC for Mini/Micro Series.
a USB connector can operate
safely at its rated voltage and
withstand momentary over
potentials due to switching, surges
and/or other similar phenomena.
Insulation Resistance EIA 364-21 Pre test
The object of this test procedure is
Standard – 1,000 MΩ minimum.
to detail a standard method to
MIcroUSB – 1,000 MΩ minimum
assess the insulation resistance of
USB connectors. This test
Mini Series – 100 MΩ minimum.
procedure is used to determine the
resistance offered by the insulation
Post test
materials and the various seals of a
100 MΩ minimum final.
connector to a DC potential tending
to produce a leakage of current
through or on the surface of these
members.
IEC 62680-2-3:2015 © IEC 2015 – 15 –
© USB-IF 2014
Test Description Test Procedure Performance Requirement
Low Level Contact Resistance EIA 364-23
30 mΩ maximum for Standard &
MicroUSB (50 mΩ maximum for
The object of this test is to detail a
Mini Series) when measured at
standard method to measure the
20 mV maximum open circuit at
electrical resistance across a pair
100 mA. Mated test contacts must
of mated contacts such that the
be in a connector housing.
insulating films, if present, will not
be broken or asperity melting will
Measurements to include Power,
not occur.
Ground, D+ and D- contacts of
connector.
Measurement to use Kelvin 4-wire
method. Measurements shall be
10 mΩ maximum change for post
taken form receptacle terminal to
test
plug terminal.
LLCR
Mechanical Shock EIA 364-27
No discontinuities of 1 µS or longer
duration when mated USB
Test Condition H
connectors are subjected to 11 ms
duration 30 Gs halfsine shock
The object of this test procedure is
pulses. Three shocks in each
to detail a standard method to
direction applied along three
assess the ability of a USB
mutually perpendicular planes for
connector to withstand specified
18 shocks.
severity of mechanical shock
Random Vibration EIA 364-28
No discontinuities of 1 µS or longer
duration when mated USB
Test Condition V Test Letter A This
connectors are subjected to
test procedure tests the ability of
5.35 GRMS. 15 minutes in each of
USB connectors to withstand
three mutually perpendicular
conditions involving vibration.
planes.
Contact Capacitance EIA 364-30 2 pF maximum unmated per
contact
The object of this test is to detail a
standard method to determine the
capacitance between conductive
elements of a USB connector.
Humidity Life EIA 364-31 168 Hours minimum (seven
complete cycles). The USB
Test Condition A Method III The
connectors under test shall be
object of this test procedure is to
tested in accordance with EIA 364-
detail a standard test method for
31.
the evaluation of the properties of
materials used in USB connectors
as the effects of high humidity and
heat influences them.
Cable Pull-Out EIA 364-38 After the application of a steady
state axial load of 40 Newtons for
Test Condition A The object of this
one minute.
test procedure is to detail a
standard method for determining
the holding effect of a USB plug
cable clamp without causing any
detrimental effects upon the cable
or connector components when the
cable is subjected to inadvertent
axial tensile loads.
Solderability EIA 364-52 USB contact solder tails shall pass
95 % coverage after 8-hour steam
The object of this test procedure is
age. Note: If lead free solder is
to detail a uniform test method for
required, solder temperature is
determining USB connector
256 ºC.
solderability. The test procedure
contained herein utilizes the solder
dip technique. It is not intended to
test or evaluate solder cup, solder
eyelet, other hand-soldered type or
SMT type terminations.
– 16 – IEC 62680-2-3:2015 © IEC 2015
© USB-IF 2014
Test Description Test Procedure Performance Requirement
Thermal Shock EIA 364-32
10 Cycles –55 ºC and +85 ºC. The
USB connectors under test must be
Test Condition I The object of this
mated. There shall be no evidence
test is to determine the resistance
of damage.
of a USB connector to exposure at
extremes of high and low
temperatures and to the shock of
alternate exposures to these
extremes, simulating the worst
case conditions for storage,
transportation and application.
Mixed Flowing Gas EIA 364-65 Class II A 30 mΩ maximum (50 mΩ maximum
for Mini Series) when measured at
The object of this 10-day (5 days
20 mV maximum open circuit at
unmated and 5 days mated) test
100 mA. Mated test contacts must
procedure is to produce
be in a connector housing. 10 mΩ
environmentally related corrosive
maximum change for post test
atmospheres to determine the
LLCR after 1 durability cycle.
reaction to plated or unplated
surfaces when exposed to different
concentrations of flowing industrial
gas mixtures. USB connector
evaluation samples should be
mated and placed in an
environmentally controlled ‘test
chamber’ that is monitored by a
gas analyzing system for controlled
concentrations of the specified gas
mixture. Test coupons shall also be
used and the weight gain reported.
Propagation Delay EIA 364-103 26 ns Maximum 200 ps rise time
see TP for details. 10 ns for Micro-
The purpose of the test is to verify
USB due to a maximum cable
the end-to-end propagation of the
length of 2 meters.
cable assembly.
Propagation Delay Skew EIA 364-103 100 ps Maximum
This test ensures that the signal on 200 ps rise time
both the D+ and D- lines of cable
assembly arrive at the receiver at
the same time.
Attenuation EIA 364-101 –190 dB Max @ 100.0 MHz
This test ensures a cable assembly –3.20 dB Max @ 200.0 MHz
can provide adequate signal
–5.80 dB Max @ 400.0 MHz
strength to the receiver in order to
maintain a low error rate.
Impedance (Differential) EIA 364-108 76.5 Ω minimum
This test ensures that the signal 103.5 Ω maximum.
conductors of a cable assembly
200 ps rise time
have the proper impedance.
Measured 2ns out from the
launching connector.
Contact Plating thickness Use of x-ray to measure each layer Must meet minimum requirement as
of contact plating defined in the USB 2.0
Specification and Micro-USB
specification in the mating zone
Cable Assembly Voltage Drop 5 V nominal at 500 mA. 125 mV max drop across power
pair from pin to pin
Note 1: Impedance, Propagation Delay and Skew Test Fixture. This fixture will be used with
the TDR for measuring the time domain performance of the cable under test. The fixture
impedance should be matched to the equipment, typically 50 Ω. Coaxial connectors should be
provided on the fixture for connection from the TDR.
Note 2: Attenuation Text Fixture.
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