EN IEC 62228-1:2018

SLOVENSKI STANDARD
01-september-2018
Integrirana vezja - Vrednotenje elektromagnetne združljivosti (EMC) oddajnikov-
sprejemnikov - 1. del: Splošni pogoji in definicije (IEC 62228-1:2018)
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and
definitions (IEC 62228-1:2018)
Ta slovenski standard je istoveten z: EN IEC 62228-1:2018
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.01 Elektromagnetna združljivost Electromagnetic compatibility
na splošno in general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 62228-1

NORME EUROPÉENNE
EUROPÄISCHE NORM
June 2018
ICS 31.200
English Version
Integrated circuits - EMC evaluation of transceivers - Part 1:
General conditions and definitions
(IEC 62228-1:2018)
Circuits intégrés - Évaluation CEM des émetteurs- Integrierte Schaltungen - Bewertung der
récepteurs - Partie 1 : Conditions générales et définitions elektromagnetischen Verträglichkeit von Sende-
(IEC 62228-1:2018) Empfangsgeräten - Teil 1: Allgemeine Bedingungen und
Festlegungen
(IEC 62228-1:2018)
This European Standard was approved by CENELEC on 2018-02-13. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2018 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 62228-1:2018 E

European foreword
The text of document 47A/1018/CDV, future edition 1 of IEC 62228-1, prepared by IEC/SC 47A
"Integrated circuits" of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC
parallel vote and approved by CENELEC as EN IEC 62228-1:2018.

The following dates are fixed:
• latest date by which the document has to be (dop) 2018-12-01
implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2021-06-01
• latest date by which the national
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 62228-1:2018 was approved by CENELEC as a European
Standard without any modification.
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 61967-1 -  Integrated circuits - Measurement of EN 61967-1 -
electromagnetic emissions, 150 kHz to 1
GHz -- Part 1: General conditions and
definitions
IEC 61967-4 2002 Integrated circuits - Measurement of EN 61967-4 2002
electromagnetic emissions, 150 kHz to 1
GHz -- Part 4: Measurement of conducted
emissions - 1 ohm/150 ohm direct coupling
method
+ A1 2006  + A1 2006
- -  + corrigendum Dec. 2006
IEC 62132-1 -  Integrated circuits - Measurement of EN 62132-1 -
electromagnetic immunity - Part 1: General
conditions and definitions
IEC 62132-4 -  Integrated circuits - Measurement of EN 62132-4 -
electromagnetic immunity, 150 kHz to 1
GHz -- Part 4: Direct RF power injection
method
IEC 62215-3 -  Integrated circuits - Measurement of EN 62215-3 -
impulse immunity -- Part 3: Non-
synchronous transient injection method
ISO 10605 -  Road vehicles - Test methods for electrical - -
disturbances from electrostatic discharge

IEC 62228-1 ®
Edition 1.0 2018-01
INTERNATIONAL
STANDARD
Integrated circuits – EMC evaluation of transceivers –

Part 1: General conditions and definitions

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.200 ISBN 978-2-8322-5191-1

– 2 – IEC 62228-1:2018 © IEC 2018
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and abbreviated terms . 5
3.1 Terms and definitions . 6
3.2 Abbreviated terms . 6
4 Philosophy . 6
5 General test conditions and test board specification . 8
5.1 Test conditions . 8
5.2 Test board specification . 8
6 Test report . 8

Figure 1 – General test configuration for tests in functional operation modes . 7
Figure 2 – General test configuration for unpowered ESD test . 7

Table 1 – Overview of test and measurement methods . 6

IEC 62228-1:2018 © IEC 2018 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INTEGRATED CIRCUITS –
EMC evaluation of transceivers –

Part 1: General conditions and definitions

FOREWORD
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