EN 60444-8:2003

SLOVENSKI SIST EN 60444-8:2004

STANDARD
julij 2004
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface
mounted quartz crystal units (IEC 60444-8:2003)
ICS 31.140 Referenčna številka
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

EUROPEAN STANDARD EN 60444-8
NORME EUROPÉENNE
EUROPÄISCHE NORM October 2003

ICS 31.140
English version
Measurement of quartz crystal unit parameters
Part 8: Test fixture for surface mounted quartz crystal units
(IEC 60444-8:2003)
Mesure des paramètres  Messung von Schwingquarz-Parametern
des résonateurs à quartz Teil 8: Prüfaufbau für oberflächen-
Partie 8: Dispositif d'essai montierbare Schwingquarze
pour les résonateurs à quartz (IEC 60444-8:2003)
montés en surface
(CEI 60444-8:2003)
This European Standard was approved by CENELEC on 2003-10-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Lithuania, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels

© 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 60444-8:2003 E
Foreword
The text of document 49/599/FDIS, future edition 1 of IEC 60444-8, prepared by IEC TC 49,
Piezoelectric and dielectric devices for frequency control and selection, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as EN 60444-8 on 2003-10-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2004-07-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2006-10-01

Annexes designated "normative" are part of the body of the standard.
In this standard, annex ZA is normative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60444-8:2003 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
IEC 60444-4 NOTE Harmonized as EN 60444-4:1997 (not modified).
__________
- 3 - EN 60444-8:2003
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
IEC 60444-1 1986 Measurement of quartz crystal unit EN 60444-1 1997
parameters by zero phase technique in
a pi-network
Part 1: Basic method for the
measurement of resonance frequency
and resonance resistance of quartz
crystal units by zero phase technique in
a pi-network
IEC 60444-2 1980 Part 2: Phase offset method for EN 60444-2 1997
measurement of motional capacitance
of quartz crystal units
IEC 60444-5 1995 Part 5: Methods for the determination of EN 60444-5 1997
equivalent electrical parameters using
automatic network analyzer techniques
and error correction
IEC 61240 1994 Piezoelectric devices - Preparation of EN 61240 1997
outline drawings of surface-mounted
devices (SMD) for frequency control and
selection - General rules
NORME CEI
INTERNATIONALE IEC
60444-8
INTERNATIONAL
Première édition
STANDARD
First edition
2003-07
Mesure des paramètres des résonateurs
à quartz –
Partie 8:
Dispositif d'essai pour les résonateurs
à quartz montés en surface
Measurement of quartz crystal unit
parameters –
Part 8:
Test fixture for surface mounted
quartz crystal units
© IEC 2003 Droits de reproduction réservés ⎯ Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
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Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch  Web: www.iec.ch
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Commission Electrotechnique Internationale PRICE CODE
International Electrotechnical Commission
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Pour prix, voir catalogue en vigueur
For price, see current catalogue

60444-8 © IEC:2003 – 3 –
CONTENTS
FOREWORD . 5
INTRODUCTION .9
1 Scope .11
2 Normative references.11
3 General issue.13
4 Leadless surface mounted quartz crystal units.13
4.1 Enclosure .13
4.2 Overtone and frequency range .13
5 Specifications of measurement method, test fixture .13
5.1 Specifications of measurement method .13
5.2 Specifications of test fixture .13
6 Calibration of measurement system and C adapter board.19
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6.1 Calibration of measurement system.19
6.2 Calibration of C adapter board .19
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Bibliography .21
Figure 1 – Equivalent circuit of the test fixture.15
Figure 2 – Equivalent circuit of the test fixture with load capacitance.15
Figure 3 – Three-dimensional projection for the test fixture .15
Figure 4 – Design of the test fixture .17
Figure 5 – Structure of the test fixture.19

60444-8 © IEC:2003 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –
Part 8: Test fixture for surface mounted quartz crystal units
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
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Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60444-8 has been prepared by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
This International Standard cancels and replaces IEC/PAS 62277 published in 2001, of which it
constitutes a technical revision.
This bilingual version (2003-10) replaces the English version.
The text of this standard is based on the following documents:
FDIS Report on voting
49/599/FDIS 49/611/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

60444-8 © IEC:2003 – 7 –
The French version of this standard has not been voted upon.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
This standard forms Part 8 of a series of publications dealing with measurements of quartz
crystal unit parameters.
IEC 60444 consists of the following parts under the general title Measurement of quartz crystal
unit parameters:
Part 1: Basic method for the measurement of resonance frequency and resonance resistance
of quartz crystal units by zero phase technique in a π-network
Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Part 4: Method for the measurement of the load resonance frequency f , load resonance
L
resistance, R and the calculation of other derived values of quartz crystal units, up to
L
30 MHz
Part 5: Methods for the determination of equivalent electrical parameters using automatic
network analyzer techniques and error correction
Part 6: Measurement of drive level dependence (DLD)
Part 7: Measurement of activity and frequency dips of quartz crystal units
The committee has decided that the contents of this publication will remain unchanged until
2007. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
___________
Under consideration.
60444-8 © IEC:2003 – 9 –
INTRODUCTION
This document is only for the test fixture applied to leadless surface mounted quartz crystal
units. The document is the specification for the test fixture [1] that allows the accurate
measurement of resonance frequency, resonance resistance, and equivalent electrical circuit
parameters of leadless surface mounted quartz crystal units. The measurement method using
an automatic network analyzer is based on IEC 60444-5.
The measuring frequency range is from 1 MHz to 150 MHz when the load capacitance is not
used, and is from 1
...