Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts

SCOPE
1.1 This practice sets forth requirements to ensure consistency in neutron-induced displacement damage testing of silicon and gallium arsenide electronic piece parts. This requires controls on facility, dosimetry, tester, and communications processes that affect the accuracy and reproducibility of these tests. It provides background information on the technical basis for the requirements and additional recommendations on neutron testing. In addition to neutrons, reactors are used to provide gamma-ray pulses of intensities and durations that are not achievable elsewhere. This practice also provides background information and recommendations on gamma-ray testing of electronics using nuclear reactors.
1.2 Methods are presented for ensuring and validating consistency in neutron displacement damage testing of electronic parts such as integrated circuits, transistors, and diodes. The issues identified and the controls set forth in this practice address the characterization and suitability of the radiation environments. They generally apply to reactor and 14-MeV neutron sources when used for displacement damage testing, and apply to  252Cf testing when this source is used for this application. Facility and environment characteristics that introduce complications or problems are identified, and recommendations are offered as to how problems can be recognized and minimized or solved. This practice may be used by facility users, test personnel, facility operators, and independent process validators to determine the suitability of a specific environment within a facility and of the testing process as a whole, with the exception of the electrical measurements, which are addressed in other standards. Additional information on conducting irradiations can be found in Practices E 798 and F 1190. This practice also may be of use to test sponsors (that is, organizations that establish test specifications or otherwise have a vested interest in the performance of electronics in neutron environments).
1.3 Methods for evaluation and control of undesired contributors to damage are discussed in this practice, and references to relevant ASTM standards and technical reports are provided. Processes and methods used to arrive at the appropriate test environments and specification levels for electronics systems are beyond the scope of this practice; however, the process for determining the 1-MeV equivalent displacement specifications from operational environment neutron spectra should employ the methods and parameters described herein. Some important considerations are addressed in through (Nonmandatory information)..
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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Status
Historical
Publication Date
31-May-2005
Current Stage
Ref Project

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ASTM E1854-05 - Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
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NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation:E1854–05
Standard Practice for
Ensuring Test Consistency in Neutron-Induced
1
Displacement Damage of Electronic Parts
This standard is issued under the fixed designation E1854; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope ences to relevant ASTM standards and technical reports are
provided. Processes and methods used to arrive at the appro-
1.1 This practice sets forth requirements to ensure consis-
priatetestenvironmentsandspecificationlevelsforelectronics
tency in neutron-induced displacement damage testing of
systems are beyond the scope of this practice; however, the
silicon and gallium arsenide electronic piece parts. This re-
process for determining the 1-MeV equivalent displacement
quires controls on facility, dosimetry, tester, and communica-
specifications from operational environment neutron spectra
tions processes that affect the accuracy and reproducibility of
should employ the methods and parameters described herein.
thesetests.Itprovidesbackgroundinformationonthetechnical
Some important considerations are addressed inAppendix X1
basis for the requirements and additional recommendations on
through X1.3.1 (Nonmandatory information).
neutron testing. In addition to neutrons, reactors are used to
1.4 This standard does not purport to address all of the
provide gamma-ray pulses of intensities and durations that are
safety concerns, if any, associated with its use. It is the
not achievable elsewhere. This practice also provides back-
responsibility of the user of this standard to establish appro-
ground information and recommendations on gamma-ray test-
priate safety and health practices and determine the applica-
ing of electronics using nuclear reactors.
bility of regulatory limitations prior to use.
1.2 Methods are presented for ensuring and validating
consistency in neutron displacement damage testing of elec-
2. Referenced Documents
tronic parts such as integrated circuits, transistors, and diodes.
2.1 The ASTM standards listed below present methods for
The issues identified and the controls set forth in this practice
ensuring proper determination of neutron spectra and fluences,
address the characterization and suitability of the radiation
gamma-ray doses, and damage in silicon and gallium arsenide
environments. They generally apply to reactor and 14-MeV
devices.The proper use of these standards is the responsibility
neutron sources when used for displacement damage testing,
252
of the radiation metrology or dosimetry organization that is
and apply to Cf testing when this source is used for this
often closely affiliated with facility operations. The references
application.Facilityandenvironmentcharacteristicsthatintro-
listed in each standard are also relevant to all participants as
duce complications or problems are identified, and recommen-
background material for testing consistency.
dations are offered as to how problems can be recognized and
2
2.2 ASTM Standards:
minimized or solved. This practice may be used by facility
E170 Terminology Relating to Radiation Measurements
users, test personnel, facility operators, and independent pro-
and Dosimetry
cess validators to determine the suitability of a specific
E181 Test Methods for Detector Calibration and Analysis
environment within a facility and of the testing process as a
of Radionuclides
whole, with the exception of the electrical measurements,
E261 Practice for Determining Neutron Fluence Rate, Flu-
whichareaddressedinotherstandards.Additionalinformation
ence, and Spectra by Radioactivation Techniques
onconductingirradiationscanbefoundinPracticesE798and
E262 Test Method for Determining Thermal Neutron Re-
F1190. This practice also may be of use to test sponsors (that
action and Fluence Rates by Radioactivation Techniques
is, organizations that establish test specifications or otherwise
E263 Test Method for Measuring Fast-Neutron Reaction
have a vested interest in the performance of electronics in
Rates by Radioactivation of Iron
neutron environments).
E264 Test Method for Measuring Fast-Neutron Reaction
1.3 Methods for evaluation and control of undesired con-
Rates by Radioactivation of Nickel
tributors to damage are discussed in this practice, and refer-
E265 Test Method for Measuring Reaction Rates and
1
This practice is under the jurisdiction of ASTM Committee E10 on Nuclear
2
Technology and Applications and is the direct responsibility of Subcommittee For referenced ASTM standards, visit the ASTM website, www.astm.org, or
E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices. contact AST
...

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