SIST EN 60368-1:2002

Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljenoReferenčna številkaSIST EN 60368-1:2002(en)ICS31.140; 31.160

EUROPEAN STANDARD
EN 60368-1
NORME EUROPÉENNE
EUROPÄISCHE NORM
April 2000
ICS 31.140;31.160
English version
Piezoelectric filters of assessed quality Part 1: Generic specification (IEC 60368-1:2000)
Filtres piézoélectriques sous assurance de la qualité Partie 1: Spécification générique (CEI 60368-1:2000) Piezoelektrische Filter mit bewerteter Qualität Teil 1: Fachgrundspezifikation (IEC 60368-1:2000)
This European Standard was approved by CENELEC on 2000-04-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.
CENELEC European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2000 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60368-1:2000 E
Page 2 EN 60368-1:2000
Foreword
The text of document 49/448/FDIS, future edition 1 of IEC 60368-1, prepared by IEC TC 49, Piezoelectric and dielectric devices for frequency control and selection, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60368-1 on 2000-04-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2001-01-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2003-04-01
Annexes designated "normative" are part of the body of the standard.
In this standard, annex ZA is normative. Annex ZA has been added by CENELEC. __________
Endorsement notice
The text of the International Standard IEC 60368-1:2000 was approved by CENELEC as a European Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
IEC 60617 NOTE: Harmonized in the series EN 60617 (not modified).
__________
Page 3
Annex ZA (normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other publications. These normative references are cited at the appropriate places in the text and the publications are listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated in it by amendment or revision. For undated references the latest edition of the publication referred to applies (including amendments).
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title
EN/HD Year
IEC 60027 Series Letter symbols to be used in electrical technology
- -
IEC 60050-561 1991 International electrotechnical vocabulary - Chapter 561: Piezoelectric devices for frequency control and selection
- -
IEC 60068-1 1988 Environmental testing Part 1: General and guidance
EN 60068-11) 1994
IEC 60068-2-1 1990 Part 2: Tests - Tests A: Cold
EN 60068-2-1 1993
IEC 60068-2-2 1974 Part 2: Tests - Test B: Dry heat
EN 60068-2-22) 1993
IEC 60068-2-3 1969 Part 2: Tests - Test Ca: Damp heat, steady state
HD 323.2.3 S23) 1987
IEC 60068-2-6
+ corr. March 1995 1995 Part 2: Tests - Test Fc: Vibration (sinusoidal)
EN 60068-2-6 1995
IEC 60068-2-7 1983 Part 2: Tests - Test Ga and guidance: Acceleration, steady state
EN 60068-2-74) 1993
IEC 60068-2-10 1988 Part 2: Tests - Test J and guidance: Mould growth
HD 323.2.10 S3 1988
IEC 60068-2-13 1983 Part 2: Tests - Test M: Low air pressure
EN 60068-2-13 1999
1) EN 60068-1 includes the corrigendum October 1988 + A1:1992 to IEC 60068-1. 2) EN 60068-2-2 includes supplement A:1976 to IEC 60068-2-2. 3) HD 323.2.3 S2 includes A1:1984 to IEC 60068-2-3. 4) EN 60068-2-7 includes A1:1986 to IEC 60068-2-7.

Page 4 EN 60368-1:2000
Publication Year Title
EN/HD Year
IEC 60068-2-14 1984 Part 2: Tests - Test N: Change of temperature
EN 60068-2-145) 1999
IEC 60068-2-17 1994 Part 2: Tests - Test Q: Sealing
EN 60068-2-17 1994
IEC 60068-2-20 1979 Part 2: Tests - Test T: Soldering
HD 323.2.20 S36) 1988
IEC 60068-2-21 1999 Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
EN 60068-2-21 1999
IEC 60068-2-27 1987 Part 2: Tests - Test Ea and guidance: Shock
EN 60068-2-27 1993
IEC 60068-2-29 +
corrigendum 1987 Part 2: Tests - Test Eb and guidance: Bump
EN 60068-2-29 1993
IEC 60068-2-30 1980 Part 2: Tests - Test Db and guidance: Damp heat, cyclic (12 + 12 hour cycle)
EN 60068-2-307) 1999
IEC 60068-2-32 1975 Part 2: Tests - Test Ed: Free fall
EN 60068-2-328) 1993
IEC 60068-2-45 1980 Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents
EN 60068-2-45 1992
IEC 60068-2-52 1996 Part 2: Tests -Test Kb: Salt mist, cyclic (sodium chloride solution)
EN 60068-2-52 1996
IEC 60068-2-58 1999 Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
EN 60068-2-58 1999
IEC 60068-2-64 +
corr. October 1993 1993 Part 2: Test methods - Test Fh: Vibration, broad-band random (digital control) and guidance
EN 60068-2-64 1994
IEC 60368-4 9) Piezoelectric filters of assessed quality Part 4: Sectional specification - Capability approval
- -
IEC 60642 1979 Piezoelectric ceramic resonators and resonator units for frequency control and selection. Chapter I: Standard values and conditions. Chapter II: Measuring and test conditions
- -
5) EN 60068-2-14 includes A1:1986 to IEC 60068-2-14.
6) HD 323.2.20 S3 includes A2:1987 to IEC 60068-2-20. 7) EN 60068-2-30 includes A1:1985 to IEC 60068-2-30. 8) EN 60068-2-32 includes A2:1990 to IEC 60068-2-32. 9) To be published.

Page 5 EN 60368-1:2000
Publication Year Title
EN/HD Year
IEC 61000-4-2 1995 Electromagnetic compatibility (EMC) Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test
EN 61000-4-2 1995 A1 1998
A1 1998
IEC 61178-1 1993 Quartz crystal units - A specification in the IEC Quality Assessment System for electronic Components (IECQ) Part 1: Generic specification
- -
IEC QC 001002-2 1998 IEC Quality Assessment System for Electronic Components (IECQ) - Basic rules Part 2: Documents
- -
IEC QC 001002-3 1998 Part 3: Approval procedures
- -
ISO 1000 1992 SI units and recommendations for the use of their multiples and of certain other units
- -
NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD60368-1QC 640000Quatrième éditionFourth edition2000-03Filtres piézoélectriques sous assurancede la qualité –Partie 1:Spécification génériquePiezoelectric filters of assessed quality –Part 1:Generic specification Commission Electrotechnique Internationale International Electrotechnical CommissionPour prix, voir catalogue en vigueurFor price, see current catalogue© IEC 2000
Droits de reproduction réservés
⎯
Copyright - all rights reservedAucune partie de cette publication ne peut être reproduite niutilisée sous quelque forme que ce soit et par aucun procédé,électronique ou mécanique, y compris la photo-copie et lesmicrofilms, sans l'accord écrit de l'éditeur.No part of this publication may be reproduced or utilized inany form or by any means, electronic or mechanical,including photocopying and microfilm, without permission inwriting from the publisher.International Electrotechnical Commission3, rue de Varembé
Geneva, SwitzerlandTelefax: +41 22 919 0300e-mail: inmail@iec.ch IEC web site
http://www.iec.chCODE PRIXPRICE CODEV

60368-1 © IEC:2000– 3 –CONTENTSPageFOREWORD.7Clause1General.111.1Scope.111.2Normative references.111.3Order of precedence.152Terminology and general requirements.152.1General.152.2Definitions.152.3Preferred values for ratings and characteristics.312.4Marking.333Quality assessment procedures.353.1Primary stage of manufacture.353.2Structurally similar components.353.3Subcontracting.353.4Incorporated components.353.5Manufacturer's approval.373.6Approval procedures.373.7Procedures for capability approval.373.8Procedures for qualification approval.393.9Test procedures.393.10Screening requirements.413.11Rework and repair work.413.12Certified records of released lots.413.13Validity of release.413.14Release for delivery.413.15Unchecked parameters.414Test and measurement procedures.434.1General.434.2Test and measurement conditions.434.3Visual inspection.454.4Dimensions and gauging procedures.454.5Electrical test procedures.454.6Mechanical and environmental test procedures.554.7Endurance test procedure.65Figure 1 – Symbol of monolithic filter.17Figure 2 – Symbol of tandem monolithic filter.17Figure 3 – Symbol of monolithic multiple pole resonator.17Figure 4 – Transducer attenuation characteristics of a filter.23

60368-1 © IEC:2000– 5 –Figure 5 – Shape factor of a band-pass filter.27Figure 6 – Pass-band ripple of a filter.27Figure 7 – Pass-band attenuation deviation of a filter.29Figure 8 – Test circuit for insertion attenuation, phase and group delay measurement.47Figure 9 – Test circuit for return attenuation measurement.51Figure 10 – Test circuit for the intermodulation distortion measurement.53Bibliography.67

60368-1 © IEC:2000– 7 –INTERNATIONAL ELECTROTECHNICAL COMMISSION____________PIEZOELECTRIC FILTERS OF ASSESSED QUALITY –Part 1: Generic specificationFOREWORD1)The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprisingall national electrotechnical committees (IEC National Committees). The object of the IEC is to promoteinternational co-operation on all questions concerning standardization in the electrical and electronic fields. Tothis end and in addition to other activities, the IEC publishes International Standards. Their preparation isentrusted to technical committees; any IEC National Committee interested in the subject dealt with mayparticipate in this preparatory work. International, governmental and non-governmental organizations liaisingwith the IEC also participate in this preparation. The IEC collaborates closely with the International Organizationfor Standardization (ISO) in accordance with conditions determined by agreement between the twoorganizations.2)The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, aninternational consensus of opinion on the relevant subjects since each technical committee has representationfrom all interested National Committees.3)The documents produced have the form of recommendations for international use and are published in the formof standards, technical specifications, technical reports or guides and they are accepted by the NationalCommittees in that sense.4)
In order to promote international unification, IEC National Committees undertake to apply IEC InternationalStandards transparently to the maximum extent possible in their national and regional standards. Anydivergence between the IEC Standard and the corresponding national or regional standard shall be clearlyindicated in the latter.5)
The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for anyequipment declared to be in conformity with one of its standards.6)Attention is drawn to the possibility that some of the elements of this International Standard may be the subjectof patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.International Standard IEC 60368-1 has been prepared by IEC technical committee 49:Piezoelectric and dielectric devices for frequency control and selection.This fourth edition of IEC 60368-1 cancels and replaces the third edition published in 1992 andconstitutes a technical revision.International Standard IEC 60368-1 is the first part of a new edition of the IEC standard seriesfor piezoelectric filters, updated to include the test requirements of the IECQ System.The text of this standard is based on the following documents:FDISReport on voting49/448/FDIS49/450/RVDFull information on the voting for the approval of this standard can be found in the report onvoting indicated in the above table.This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.

60368-1 © IEC:2000– 9 –IEC 60368 consists of the following parts under the general title: Piezoelectric filters ofassessed quality:–Part 1: Generic specification (IEC 60368-1)–Part 2: Guide to the use of piezoelectric filters –Part 2-1: Quartz crystal filters (IEC 60368-2-1)Part 2-2: Piezoelectric ceramic filters (IEC 60368-2-2)–Part 3: Standard outlines (IEC 60368-3, under consideration)–Part 4: Sectional specification – Capability approval (IEC 60368-4, to be published)–Part 4-1: Blank detail specification – Capability approval (IEC 60368-4-1, to be published)–Part 5: Sectional specification – Qualification approval (IEC 60368-5, under consideration)–Part 5-1: Blank detail specification – Qualification approval (IEC 60368-5-1, under con-sideration)The QC number which appears on the front cover of this publication is the specification numberin the IEC Quality Assessment System for Electronic Components (IECQ).The committee has decided that the contents of this publication will remain unchanged until2003. At this date, the publication will be•reconfirmed;•withdrawn;•replaced by a revised edition, or•amended.

60368-1 © IEC:2000– 11 –PIEZOELECTRIC FILTERS OF ASSESSED QUALITY –Part 1: Generic specification1 General1.1 ScopeThis part of IEC 60368 specifies the methods of test and general requirements for piezoelectricfilters of assessed quality using either capability approval or qualification approval procedures.1.2 Normative referencesThe following normative documents contain provisions which, through reference in this text,constitute provisions of this part of IEC 60368. For dated references, subsequent amendmentsto, or revisions of, any of these publications do not apply. However, parties to agreementsbased on this part of IEC 60368 are encouraged to investigate the possibility of applying themost recent editions of the normative documents indicated below. For undated references, thelatest edition of the normative document referred to applies. Members of ISO and IEC maintainregisters of currently valid International Standards.IEC 60027 (all parts), Letter symbols to be used in electrical technologyIEC 60050(561):1991, International Electrotechnical Vocabulary (IEV) – Chapter 561: Piezo-electric devices for frequency control and selectionIEC 60068-1:1988, Environmental testing – Part 1: General and guidanceIEC 60068-2-1:1990, Environmental testing – Part 2: Tests – Tests A: ColdIEC 60068-2-2:1974, Environmental testing – Part 2: Tests - Tests B: Dry heatIEC 60068-2-3:1969, Environmental testing – Part 2: Tests – Test Ca: Damp heat, steady stateIEC 60068-2-6:1995, Environmental testing – Part 2: Tests – Test Fc: Vibration (sinusoidal)IEC 60068-2-7:1983, Environmental testing – Part 2: Tests – Test Ga and guidance:Acceleration, steady stateIEC 60068-2-10:1988, Environmental testing – Part 2: Tests – Test J and guidance: MouldgrowthIEC 60068-2-13:1983, Environmental testing – Part 2: Tests – Test M: Low air pressureIEC 60068-2-14:1984, Environmental testing – Part 2: Tests – Test N: Change of temperatureIEC 60068-2-17:1994, Environmental testing – Part 2: Tests – Test Q: Sealing

60368-1 © IEC:2000– 13 –IEC 60068-2-20:1979, Environmental testing – Part 2: Tests – Test T: SolderingIEC 60068-2-21:1999, Environmental testing – Part 2-21: Tests – Test U: Robustness ofterminations and integral mounting devicesIEC 60068-2-27:1987, Environmental testing – Part 2: Tests – Test Ea and guidance: ShockIEC 60068-2-29:1987, Environmental testing – Part 2: Tests – Test Eb and guidance: BumpIEC 60068-2-30:1980, Environmental testing – Part 2: Tests – Test Db and guidance:Dampheat, cyclic (12 + 12-hour cycle)IEC 60068-2-32:1975, Environmental testing – Part 2: Tests – Test Ed: Free fall (Procedure 1)IEC 60068-2-45:1980, Environmental testing – Part 2: Tests – Test XA and guidance:Immersion in cleaning solventsIEC 60068-2-52:1996, Environmental testing – Part 2: Tests – Test Kb: Salt mist, cyclic(sodium chloride solution)IEC 60068-2-58:1999, Environmental testing – Part 2-58: Tests – Test Td: Test methods forsolderability,resistance to dissolution of metallization and to soldering heat of surfacemounting devices (SMD)IEC 60068-2-64:1993, Environmental testing – Part 2: Test methods – Test Fh: Vibration,broad-band random (digital control) and guidanceIEC 60368-4, Piezoelectric filters of assessed quality – Part 4: Sectional specification –Capability Approval 1)IEC 60642:1979, Piezoelectric ceramic resonators and resonator units for frequency controland selection – Chapter I: Standard values and conditions – Chapter II: Measuring and testconditionsIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4: Testing and measurementtechniques – Section 2: Electrostatic discharge immunity test. Basic EMC PublicationAmendment 1 (1998) 2)IEC 61178-1:1993, Quartz crystal units – A specification in the IEC Quality Assessment Systemfor Electronic Components (IECQ) – Part 1: Generic specificationIEC QC 001001:1998, IEC Quality Assessment System for Electronic Components (IECQ) –Basic RulesIEC QC 001002-2:1998, IEC Quality Assessment System for Electronic Components (IECQ) –Rules of Procedure – Part 2: DocumentationIEC QC 001002-3:1998, IEC Quality Assessment System for Electronic Components (IECQ) –Rules of Procedure – Part 3: Approval ProceduresISO 1000:1992, SI units and recommendations for use of their multiples and of certain otherunits–––––––––1)To be published.2) There is a consolidated edition 1.1 (1999) that includes IEC 61000-4-2 (1995) and its amendment 1 (1998).

60368-1 © IEC:2000– 15 –1.3 Order of precedenceWhere any discrepancies occur for any reason, documents shall rank in the following order ofprecedence:–the detail specification;–the sectional specification;–the generic specification;–any other international document (for example, of the IEC) to which reference is made.The same order of precedence shall apply to equivalent national documents.2 Terminology and general requirements2.1 GeneralUnits, graphical symbols, letter symbols and terminology shall, wherever possible, be takenfrom the following standards:–IEC 60027–IEC 60050(561)–IEC 60642–IEC 61178-1–ISO 10002.2 DefinitionsFor the purpose of this part of IEC 60368, the following definitions apply.2.2.1piezoelectric filteran electrical filter in which one or more piezoelectric resonators made from quartz crystals orother piezoelectric materials are incorporated2.2.2band-pass filtera filter having a single pass-band between two specified stop-bands[IEV 561-03-33]2.2.3band-stop filtera filter having a single stop-band between two specified pass-bands [IEV 561-03-34]2.2.4high-pass filtera filter having a single pass-band above a cut-off frequency and a stop-band for lowerfrequencies [IEV 561-03-32]2.2.5low-pass filtera filter having a single pass-band below a cut-off frequency and a stop-band for higherfrequencies [IEV 561-03-31]

60368-1 © IEC:2000– 17 –2.2.6comb filtera two terminal pair filter in which there are five or more bands of which two or more are pass-bands and two or more are stop-bands [IEV 561-03-35]2.2.7monolithic filtera filter with at least one monolithic multiple pole resonator [IEV 561-03-36 modified]IEC
050/2000Figure 1 – Symbol of monolithic filter2.2.8tandem monolithic filtera filter made by electrically connecting at least two monolithic multiple pole resonatorsIEC
051/2000Figure 2 – Symbol of tandem monolithic filter2.2.9monolithic multiple pole resonatora piezoelectric resonator with at least two mechanically coupled vibrating regions on a singlecrystal elementIEC
052/2000Figure 3 – Symbol of monolithic multiple pole resonator2.2.10input levelthe power, voltage or current value presented to the input terminal pair of a piezoelectric filter[IEV 561-03-02]

60368-1 © IEC:2000– 19 –2.2.11output levelthe power, voltage or current value delivered to the load circuit of a piezoelectric filter[IEV 561-03-03]2.2.12rated levelthe power, voltage or current value at which the characteristics of a piezoelectric filter arespecified[IEV 561-03-04]2.2.13maximum levelthe power, voltage or current value above which unacceptable distortion of the signal orirreversible changes may occur in a piezoelectric filter[IEV 561-03-05]2.2.14available powerthe maximum power which may be obtained from a given source by suitable adjustment of theload impedance[IEV 561-03-06]2.2.15input impedancethe impedance presented by a piezoelectric filter to the signal source when terminated in thespecified load impedance[IEV 561-03-07]2.2.16output impedancethe impedance presented by a piezoelectric filter to the load when its input is connected to thespecified source impedance[IEV 561-03-08]2.2.17terminating impedancethe impedance presented to a piezoelectric filter by its load or by its source[IEV 561-03-09]2.2.18cut-off frequencya frequency of the pass-band at which the relative attenuation of a piezoelectric filter reaches aspecified value[IEV 561-03-10]2.2.19mid-band frequency (of a band-pass or band-stop filter)the geometric mean of the cut-off frequencies limiting a single pass-band or single stop-bandNOTE
In practice, the arithmetic mean is often used as a good approximation to the geometric mean forpiezoelectric filters with relatively narrow pass-bands or stop-bands.[IEV 561-03-11]

60368-1 © IEC:2000– 21 –2.2.20nominal frequency (of a piezoelectric filter)the frequency used to identify the piezoelectric filter [IEV 561-03-12]2.2.21pass-banda band of frequencies in which the relative attenuation of a piezoelectric filter is equal to or lessthan a specified value [IEV 561-03-13]2.2.22pass bandwidththe separation of frequencies between which the attenuation of a piezoelectric filter shall beequal to or less than a specified value [IEV 561-03-14]2.2.23stop banda band of frequencies in which the relative attenuation of a piezoelectric filter is equal to orgreater than specified values [IEV 561-03-15]2.2.24stop bandwidththe separation of frequencies between which the relative attenuation of a piezoelectric filtershall be equal to or greater than a specified value[IEV 561-03-16]2.2.25transition banda band of frequencies between a cut-off frequency and the nearest point of the adjacent stop-band[IEV 561-03-17]2.2.26envelope delay timethe time of propagation of a certain characteristic of a signal envelope between two points, fora certain frequency [IEV 561-03-18]2.2.27phase delay timethe time of propagation of a sinusoidal oscillation of a certain frequency between two points[IEV 561-03-19]2.2.28transducer attenuation (of a filter)the ratio, generally expressed in decibels, of the available power of a given source to the powerthat the filter connected to this source delivers to a load impedance under specified conditions[IEV 561-03-20]

60368-1 © IEC:2000– 23 –W
stated portion of the pass-band for whichattenuation deviation is specified.Tranducer
attenuation
dBPass-band rippleFrequency
fIEC
053/2000BA0fff×=or2BA0fff+=wherefA,fBare the cut-off frequencies of the pass-band;f0 is the mid-band frequency.Figure 4 – Transducer attenuation characteristics of a filter2.2.29insertion attenuation (of a filter)the ratio, generally expressed in decibels, of the power delivered to the load impedance beforeinsertion of the filter to the power delivered to the load impedance after insertion of the filter[IEV 561-03-21]2.2.30insertion phase shiftchange in phase caused by the insertion of a filter into a transmission system2.2.31transducer phasethe phase difference between the output of a given filter with a specified load impedance andthe source connected to its input [IEV 561-03-22]

60368-1 © IEC:2000– 25 –2.2.32modulus of the reflection coefficienta dimensionless measure of the degree of mismatch between two impedances Za and Zbgivenby the expression:babaZZZZ+−whereZa is the source or output impedanceZb is the load or input impedance[IEV 561-03-23]2.2.33return attenuationthe reciprocal, generally expressed in decibels, of the modulus of the reflection coefficient[IEV 561-03-24]2.2.34relative attenuationthe difference between the attenuation at a given frequency and the minimum attenuation in thepass-band [IEV 561-03-25]2.2.35shape factor (of a band-pass or band-stop filter)the ratio of the two bandwidths of a band-pass or a band-stop filter limited by two specifiedattenuation values[IEV 561-03-26]

60368-1 © IEC:2000– 27 –Frequency symmetrical band-pass filterFrequency asymmetrical band-pass filterFigure 5a – Shape factorFigure 5b – Shape factorfor frequency symmetricalfor frequency asymmetricalband-pass filterband-pass filterFigure 5 – Shape factor of a band-pass filter2.2.36pass-band ripplethe difference between the peak value and the minimum value of attenuation within the pass-band of a filterA2A1P1P2B1aminfAf0fBFrequency
fTransducerattenuation
dBIEC
054/2000KeyA1specified value of the pass-band rippleA2relative attenuation valuewhich defines the pass-bandrippleB1actual value of the pass-band rippleP1,P2peak value of the relativeattenuation within the pass-bandP2≥P1B1 = P2(dB)Figure 6 – Pass-band ripple of a filter

60368-1 © IEC:2000– 29 –2.2.37pass-band attenuation deviationthe maximum variation of the attenuation within a defined portion of the pass-band of a filterTransducerattenuation
dBA2A1L1L2P1P2B1B2aminfAf0fBWFrequency
fIEC
055/2000KeyWstated portion of the pass-bandwithin which the attenuationdeviation is specifiedA1specified value of the pass-bandripple or the pass-bandattenuation deviationA2 relative attenuation value whichdefines the pass-bandwidthB1 actual value of the pass-bandrippleB2 actual valueof the pass-bandattenuation deviationL1relative attenuation in the lowerside of WL2relative attenuation in the upperside of WL2≥L1P1,P2peak value of the relativeattenuation within the pass-bandP2≥P1B1 = P2(dB)B2 = L2(dB)Figure 7 – Pass-band attenuation deviation of a filter2.2.38distortion of envelope delay time (in an electrical network)an unwanted variation of the envelope delay time of a signal in an electrical network as afunction of frequency[IEV 561-03-28]2.2.39phase distortion (in an electrical network)an unwanted variation of phase difference in an electrical network as a function of frequency[IEV 561-03-29]2.2.40intermodulation distortionthe distortion resulting from the combination within the filter of two independent input signals[IEV 561-03-30]2.2.41reference temperaturethe temperature at which certain filter performance parameters are measured, normally(25 ± 2) °C2.2.42operating temperature rangethe range of temperatures, over which the piezoelectric filter will function maintaining itsspecified characteristics within specified tolerances

60368-1 © IEC:2000– 31 –2.2.43operable temperature rangethe range of temperatures, over which the piezoelectric filter shall continue to provide itsspecified response characteristics, though not necessarily within the specified tolerances2.2.44storage temperature rangethe minimum and maximum temperatures as measured on the enclosure at which thepiezoelectric filter may be stored without deterioration or damage to its performance2.2.45symmetric and antisymmetric frequencies of a bipole resonatorthe lower and higher of the first two resonance frequencies, respectively, of a bipole resonatorwhose output terminals are short-circuited2.3 Preferred values for ratings and characteristicsValues should preferably be chosen from the following paragraphs, unless otherwise statedinthe detail specification.2.3.1 Temperature ranges in degrees Celsius (°C) suitable for ambient operation–55to+105–10to+60–40to+850 to+50–20to+70+10to+402.3.2 Climatic category40/085/56 (see appendix A of IEC 60068-1)For requirements where the operating temperature range of the piezoelectric filter is greaterthan –40 °C to +85 °C, a climatic category consistent with the operating temperature rangeshall be specified.2.3.3 Bump severity(4 000 ± 10) bumps at 40 gn (400 m/s2)peak acceleration in each direction along threemutually perpendicular axes (see IEC 60068-2-29, table 1 and 4.6.6 of this standard). Pulseduration: 6 ms.

60368-1 © IEC:2000– 33 –2.3.4 Vibration severitySinusoidal10 Hz to 55 Hz0,75 mm displacement amplitude (peak value)55 Hz to 500 Hzor 55 Hz to 2 000 Hz100 m/s2 acceleration amplitude (peak value)30 min in each of three mutually perpendicularaxes at 1 octave/min (see 4.6.7)10 Hz to 55 Hz1,5 mm displacement amplitude (peak value)55 Hz to 2 000 Hz200 m/s2 acceleration amplitude (peak value)30 min in each of three mutually perpendicularaxes at 1 octave/min (see 4.6.7)Random(19,2 m/s2)2/Hz between 20 Hz and 2 000 Hz196 m/s2accelerationor(48 m/s2)2 /Hz between 20 Hz and 2 000 Hz314 m/s2acceleration30 min in each of three mutually perpendicularaxes at 1 octave/min (see 4.6.7)2.3.5 Shock severity100gn (1 000 m/s2) peak acceleration for 6 ms duration; three shocks in each direction alongthree mutually perpendicular axes (see IEC 60068-2-27, table I and 4.6.8 of this specification)half-sine pulse, unless otherwise stated in the detail specification.2.3.6 Leak rate10–1Pa cm3/s (10–6 bar cm3/s);10–3 Pa cm3/s (10–8 bar cm3/s).2.4 Marking2.4.1The piezoelectric filter shall be clearly and durably marked (see 4.6.19) according to a)to g) below, and if possible with as many of the remaining items as considered necessary:a)type designation as defined in the detail specification;b)nominal frequency in kilohertz (kHz) or megahertz (MHz);c)year and week of manufacture;d)mark of conformity (unless a certificate of conformity is used);e)factory identification code;f)manufacturer's name or trade mark;g)terminal identification (if applicable);

60368-1 © IEC:2000– 35 –h)designation of electrical connections (if applicable);i)serial number (if applicable);j)surface mounted device classification (if applicable).Where the available surface area of miniature piezoelectric filters imposes practical limits inthe amount of marking, instructions on the marking to be applied shall be given in the detailspecification.2.4.2
The primary packaging containing the piezoelectric filter(s) shall be clearly marked withthe information listed in 2.4.1, except item g) and where necessary marked with electrostaticsensitive device (ESD) identification.3 Quality assessment proceduresTwo methods are available for the approval of piezoelectric filters of assessed quality. They arequalification approval and capability approval.3.1 Primary stage of manufactureThe primary stage of manufacture for a piezoelectric filter in accordance with 3.1.1.2 and4.2.1.2 of IEC QC 001002-3 shall be as follows:a)for filters incorporating a sealed crystal unit:– the assembly of the piezoelectric filter;b)for filters incorporating unencapsulated crystal units or monolithic multiple pole resonators:– the final surface finishing of the crystal element in addition to the assembly of the filter.NOTE
The final surface finishing of the crystal element could be any of the following operations: lapping;polishing; etching; cleaning, in the case of polished plates.3.2 Structurally similar componentsThe grouping of structurally similar piezoelectric filters for the purpose of qualification approval,capability approval and quality conformance inspection shall be prescribed in the relevantsectional specification.3.3 SubcontractingThese procedures shall be in accordance with 3.1.2 of IEC QC 001002-3.There shall be no subcontracting after the assembly of the crystal to the electronic circuit,except in the case of sealed crystal units, where the sealing of the final enclosure of the filtermay be permitted.3.4 Incorporated componentsWhere the final component contains components of a type covered by a generic specificationin the IEC series, these shall be produced using the normal IEC release procedures.

60368-1 © IEC:2000– 37 –3.5 Manufacturer's approvalTo obtain manufacturer's approval the manufacturer shall meet the requirements of clause 2 ofIEC QC 001002-3.3.6 Approval procedures3.6.1 GeneralTo qualify a piezoelectric filter, either capability approval or qualification approval proceduresmay be used. These procedures conform to those stated in IEC QC 001001 and QC 001002-3.3.6.2 Capability approvalCapability approval is appropriate when structurally similar piezoelectric filters based oncommon design rules, are fabricated, by a group of common processes.Under capability approval, detail specifications fall into the following three categories.a)Capability qualifying components (CQCs)A detail specification shall be prepared for each CQC as agreed with the NationalSupervising Inspectorate (NSI). It shall identify the purpose of the CQC and include allrelevant stress levels and test limits.b)Standard catalogue itemsWhen a component covered by the capability approval procedure is intended to be offeredas a standard catalogue item, a detail specification complying with the blank detailspecification shall be written. Such specifications shall be registered by the IECQ and thecomponent may be listed in IEC QC 001005.c) Custom built piezoelectric filtersThe content of the detail specification shall be by agreement between the manufacturer andthe customer in accordance with 4.4.3 of IEC QC 001002-3.Further information on detail specifications is contained in the sectional specificationIEC 60368-4.The product and capability qualifying components (CQCs) are tested in combination andapproval given to a manufacturing facility on the basis of validated design rules, processesand quality control procedures.Further information is given in 3.7 and in the sectional specification IEC 60368-4.3.6.3 Qualification approvalQualification approval is appropriate for components manufactured to a standard design andestablished production process and conforming to a published detail specification.The programme of tests defined in the detail specification for the appropriate assessment andseverity level applies directly to the piezoelectric filter to be qualified, as prescribed in 3.8 andthe sectional specification IEC 60368-5.3.7 Procedures for capability approval3.7.1 GeneralThe procedures for capability approval shall be in accordance with IEC QC 001002-3.

60368-1 © IEC:2000– 39 –3.7.2 Eligibility for capability approvalThe manufacturer shall comply with the requirements of 4.2.1 of IEC QC 001002-3 and theprimary stage of manufacture as defined in 3.1 of this generic specification.3.7.3 Application for capability approvalIn order to obtain capability approval, the manufacturer shall apply the rules of procedure givenin clause 4 of IEC QC 001002-3.3.7.4 Granting of capability approvalCapability approval shall be granted when the procedures in accordance with clause 4 ofIEC QC 001002-3 have been successfully completed.3.7.5 Capability manualThe contents of the capability manual shall be in accordance with the requirements of thesectional specification.The NSI shall treat the capability manual as a confidential document. The manufacturer may, ifhe so wishes, disclose part or all of it to a third party.3.8 Procedures for qualification approval3.8.1 GeneralThe procedures for qualification approval shall be in accordance with clause 3 ofIEC QC 001002-3.3.8.2 Eligibility for qualification approvalThe manufacturer shall comply with the requirements of 3.1.1 of IEC QC 001002-3 and theprimary stage of manufacture as defined in 3.1 of this generic specification.3.8.3 Application for qualification approvalIn order to obtain qualification approval the manufacturer shall apply the procedures given in3.1.3 of IEC QC 001002-3.3.8.4 Granting of qualification approvalQualification approval shall be granted when the procedures in accordance with 3.1.5 ofIEC QC 001002-3 have been successfully completed.3.8.5 Quality conformance inspectionThe blank detail specification associated with the sectional specification shall prescribe the testschedule for quality conformance inspection.3.9 Test proceduresThe test procedures to be used shall be selected from this generic specification. If any requiredtest is not included, then it shall be defined in the detail specification.

60368-1 © IEC:2000– 41 –3.10 Screening requirementsWhere screening is required by the customer for piezoelectric filters, this shall be specified inthe detail specification.3.11 Rework and repair work3.11.1 ReworkRework is the rectification of processing errors and shall not be carried out if prohibited by thesectional specification. The sectional specification shall state if there is a restriction on thenumber of occasions that rework may take place on a specific component.All rework shall be carried out prior to the formation of the inspection lot offered for inspectionto the requirements of the detail specification.Such rework procedures shall be fully described in the relevant documentation produced by themanufacturer and shall be carried out under the direct control of the chief inspector. Sub-contracting of rework is not permitted.3.11.2 Repair workRepair work is the correction of defects in a component after release to the customer.Components that have been repaired can no longer be considered as representative of themanufacturer's production and may not be released under the IECQ System.3.12 Certified records of released lotsWhen certified records of released lots (CRRL) are prescribed in the sectional specification forqualification approval and are requested by the customer, the results of the specified testsshall be summarized (see 1.5 of IEC QC 001002-2).3.13 Validity of releasePiezoelectric filters held for a period exceeding two years following acceptance inspection shallbe reinspected for the electrical tests detailed in 4.5.1, with a sample tested as described in4.6.3.1, prior to release.3.14 Release for deliveryPiezoelectric filters shall be released in accordance with 3.2.6 and 4.3.2 of IEC QC 001002-3.3.15 Unchecked parametersOnly those parameters of a component which have been specified in the detail specificationand which were subject to testing, can be assumed to be within the specified limits. It shouldnot be assumed that any parameter not specified will remain unchanged from one componentto another. Should it be necessary for further parameters to be controlled, then a new, moreextensive, detail specification should be used. The additional test method(s) shall be fullydescribed and appropriate limits, AQLs and inspection levels specified.

60368-1 © IEC:2000– 43 –4 Test and measurement procedures4.1 GeneralThe test and measurement procedures shall be carried out in accordance with the relevantdetail specification.4.2 Test and measurement conditions4.2.1 Standard conditions for testingUnless otherwise specified, all tests shall be carried out under the standard atmosphericconditions for testing as specified in 5.3 of IEC 60068-1.Temperature15 °C to 35 °C;Relative humidity25 % to 75 %Air pressure86 kPa to 106 kPa (860 mbar to 1 060 mbar)In case of dispute, the reference conditions are the following:Temperature(25 ± 1) °CRelative humidity48 % to 52 %Air pressure86 kPa to 106 kPa (860 mbar to 1 060 mbar)Before measurements are made, the piezoelectric filter shall be stored at the measuringtemperature for a time sufficient to allow the piezoelectric filter to reach thermal equilibrium.Controlled recovery conditions and standard conditions for assisted drying are given in 5.4 ofIEC 60068-1.The ambient temperature during the measurements shall be recorded and stated in the testreport.4.2.2 Uncertainty of measurementThe limits given in detail specifications are true values. Measurement inaccuracies shall betaken into account when evaluating the results. Precautions should be taken to reducemeasurement errors to a minimum.4.2.3 Precautions4.2.3.1 MeasurementsThe measurement circuits shown for specified electrical tests are the prefer
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