SIST EN 60758:2016

SLOVENSKI STANDARD
SIST EN 60758:2016
01-november-2016
1DGRPHãþD
SIST EN 60758:2009
6LQWHWLþQLNUHPHQþHYNULVWDO6SHFLILNDFLMHLQVPHUQLFH]DXSRUDER,(&

Synthetic Quartz Crystal - Specifications and guidelines for use (IEC 60758:2016)
Cristal de quartz synthétique - Spécifications et lignes directrices d'utilisation
Ta slovenski standard je istoveten z: EN 60758:2016
ICS:
31.140 3LH]RHOHNWULþQHQDSUDYH Piezoelectric devices
SIST EN 60758:2016 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------

SIST EN 60758:2016

---------------------- Page: 2 ----------------------

SIST EN 60758:2016


EUROPEAN STANDARD EN 60758

NORME EUROPÉENNE

EUROPÄISCHE NORM
September 2016
ICS 31.140 Supersedes EN 60758:2009
English Version
Synthetic quartz crystal - Specifications and guidelines for use
(IEC 60758:2016)
Cristal de quartz synthétique - Spécifications et lignes Synthetischer Quarzkristall - Festlegungen und Leitfaden
directrices d'utilisation für die Anwendung
(IEC 60758:2016) (IEC 60758:2016)
This European Standard was approved by CENELEC on 2016-06-22. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.


European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2016 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN 60758:2016 E

---------------------- Page: 3 ----------------------

SIST EN 60758:2016
EN 60758:2016
European foreword
The text of document 49/1185/FDIS, future edition 5 of IEC 60758, prepared by IEC/TC 49
“Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control,
selection and detection” was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN 60758:2016.

The following dates are fixed:
• latest date by which the document has to be (dop) 2017-04-07
implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2019-10-07
• latest date by which the national
standards conflicting with the
document have to be withdrawn

This document supersedes EN 60758:2009.

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.

Endorsement notice
The text of the International Standard IEC 60758:2016 was approved by CENELEC as a European
Standard without any modification.
2

---------------------- Page: 4 ----------------------

SIST EN 60758:2016
EN 60758:2016
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.

NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu

Publication Year Title EN/HD Year

IEC 60068-1 2013 Environmental testing - EN 60068-1 2014
Part 1: General and guidance
IEC 60122-1 2002 Quartz crystal units of assessed quality - EN 60122-1 2002
Part 1: Generic specification
IEC 60410 -  Sampling plans and procedures for - -
inspection by attributes
IEC 61994 Series Piezoelectric and dielectric devices for - -
frequency control and selection - Glossary

3

---------------------- Page: 5 ----------------------

SIST EN 60758:2016

---------------------- Page: 6 ----------------------

SIST EN 60758:2016



IEC 60758

®


Edition 5.0 2016-05




INTERNATIONAL



STANDARD




















Synthetic quartz crystal – Specifications and guidelines for use




























INTERNATIONAL

ELECTROTECHNICAL


COMMISSION





ICS 31.140 ISBN 978-2-8322-3395-5



  Warning! Make sure that you obtained this publication from an authorized distributor.


® Registered trademark of the International Electrotechnical Commission

---------------------- Page: 7 ----------------------

SIST EN 60758:2016
– 2 – IEC 60758:2016 © IEC 2016
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative references. 9
3 Terms and definitions . 9
4 Specification for synthetic quartz crystal . 13
4.1 Standard values . 13
4.1.1 Shape of synthetic quartz for optical applications . 13
4.1.2 Orientation of the seed . 13
4.1.3 Inclusion density . 13
4.1.4 Striae in synthetic quartz for optical applications . 14
4.1.5 Infrared quality indications of α and α for piezoelectric
3 500 3 585
applications . 14
4.1.6 Grade classification by α value and Schlieren method for optical
applications . 15
4.1.7 Frequency-temperature characteristics of synthetic quartz for
piezoelectric applications . 15
4.1.8 Etch channel density ρ . 15
4.1.9 Internal transmittance for optical applications . 16
4.2 Requirements and measuring methods . 17
4.2.1 Orientation . 17
4.2.2 Handedness . 18
4.2.3 Synthetic quartz crystal dimensions . 18
4.2.4 Seed dimensions . 19
4.2.5 Imperfections . 19
4.2.6 Evaluation of infrared quality by α measurement . 22
4.2.7 Frequency versus temperature characteristics for piezoelectric
applications . 24
4.2.8 Striae in synthetic quartz for optical applications . 25
4.2.9 Growth band in synthetic quartz for optical applications . 25
4.2.10 Etch channel density . 26
4.2.11 Internal transmittance for optical applications . 27
4.3 Marking . 27
4.3.1 General . 27
4.3.2 Shipping requirements . 28
5 Specification for lumbered synthetic quartz crystal . 28
5.1 Standard values . 28
5.1.1 Tolerance of dimensions . 28
5.1.2 Reference surface flatness . 29
5.1.3 Angular tolerance of reference surface . 29
5.1.4 Centrality of the seed . 30
5.2 Requirements and measuring methods . 31
5.2.1 As-grown quartz bars used for lumbered quartz bars . 31
5.2.2 Dimensions of lumbered synthetic quartz crystal . 31
5.2.3 Identification on reference surface . 31
5.2.4 Measurement of reference surface flatness . 31

---------------------- Page: 8 ----------------------

SIST EN 60758:2016
IEC 60758:2016 © IEC 2016 – 3 –
5.2.5 Measurement of reference surface angle tolerance . 31
5.2.6 Centrality of the seed . 31
5.3 Delivery conditions . 32
5.3.1 General . 32
5.3.2 Marking . 32
5.3.3 Packing . 32
5.3.4 Making batch . 32
6 Inspection rule for synthetic quartz crystal and lumbered synthetic quartz crystal . 32
6.1 Inspection rule for as-grown synthetic quartz crystal . 32
6.1.1 Inspection . 32
6.1.2 Lot-by-lot test . 32
6.2 Inspection rule for lumbered synthetic quartz crystal . 33
6.2.1 General . 33
6.2.2 Lot-by-lot test . 34
7 Guidelines for the use of synthetic quartz crystal for piezoelectric applications . 34
7.1 General . 34
7.1.1 Overview . 34
7.1.2 Synthetic quartz crystal . 34
7.2 Shape and size of synthetic quartz crystal . 35
7.2.1 Crystal axis and face designation . 35
7.2.2 Seed . 36
7.2.3 Shapes and dimensions . 36
7.2.4 Growth zones . 37
7.3 Standard method for evaluating the quality of synthetic quartz crystal . 37
7.4 Other methods for checking the quality of synthetic quartz crystal . 38
7.4.1 General . 38
7.4.2 Visual inspection . 38
7.4.3 Infrared radiation absorption method . 38
7.4.4 Miscellaneous . 39
7.5 α grade for piezoelectric quartz . 40
7.6 Optional grading (only as ordered), in inclusions, etch channels, Al content . 40
7.6.1 Inclusions . 40
7.6.2 Etch channels . 40
7.6.3 Al content . 40
7.6.4 Swept quartz . 41
7.7 Ordering . 42
Annex A (informative) Frequently used sampling procedures . 43
A.1 Complete volume counting . 43
A.2 Commodity Y-bar sampling – Method 1 . 43
A.3 Commodity Y-bar sampling – Method 2 . 43
A.4 Use of comparative standards for 100 % crystal inspection . 44
Annex B (informative) Numerical example . 45
Annex C (informative) Example of reference sample selection . 46
Annex D (informative) Explanations of point callipers . 47
Annex E (informative) Infrared absorbance α value compensation . 48
E.1 General . 48
E.2 Sample preparation, equipment set-up and measuring procedure . 48
E.2.1 General . 48

---------------------- Page: 9 ----------------------

SIST EN 60758:2016
– 4 – IEC 60758:2016 © IEC 2016
E.2.2 Sample preparation . 48
E.2.3 Equipment set-up . 48
E.2.4 Measurement procedure . 49
E.3 Procedure to establish correction terms . 49
E.4 Calculation of compensated (corrected) absorbance values . 51
Annex F (informative) Differences of the orthogonal axial system for quartz between
IEC standard and IEEE standard . 52
Annex G (informative) α value measurement consistency between dispersive infrared
spectrometer and fourier transform infrared spectrometer . 54
G.1 General . 54
G.2 Experiment . 54
G.3 Experimental result . 55
Bibliography . 58

Figure 1 – Quartz crystal axis and cut direction . 17
Figure 2 – Idealized sections of a synthetic quartz crystal grown on a Z-cut seed . 19
Figure 3 – Typical example of cutting wafers of AT-cut plate, minor rhombohedral-cut
plate, X-cut plate, Y-cut plate and Z-cut plate . 21
Figure 4 – Frequency-temperature characteristics deviation rate of the test specimen . 25
Figure 5 – Typical schlieren system setup . 25
Figure 6 – Lumbered synthetic quartz crystal outline and dimensions along X-, Y- and
Z-axes . 29
Figure 7 – Angular deviation for reference surface . 30
Figure 8 – Centrality of the seed with respect to the dimension along the Z- or Z'-axis . 31
Figure 9 – Quartz crystal axis and face designation . 36
Figure 10 – Synthetic quartz crystal grown on a Z-cut seed of small X-dimensions . 37
Figure 11 – Example of a relation between the αvalue and the Q value at wave number
-1
3 500 cm . 39
Figure D.1 – Point callipers . 47
Figure D.2 – Digital point callipers . 47
Figure E.1 – Schematic of measurement set-up . 49
Figure E.2 – Graph relationship between averaged α and measured α at two wave
numbers of α and α . 50
3 500 3 585
Figure F.1 – Left- and right-handed quartz crystals . 53
Figure G.1 – Relationship of α between measuring value and reference value . 57

Table 1 – Inclusion density grades for piezoelectric applications . 14
Table 2 – Inclusion density grades for optical applications . 14
Table 3 – Infrared absorbance coefficient grades for piezoelectric applications . 14
Table 4 – Infrared absorbance coefficient grades and Schlieren method for optical
applications . 15
Table 5 – Etch channel density grades for piezoelectric applications . 16
Table 6 – Test conditions and requirements for the lot-by-Iot test for group A . 33
Table 7 – Test conditions and requirements for the lot-by-lot test for group B . 33
Table 8 – Test conditions and requirements for the lot-by-lot test . 34
Table B.1 – Commodity bar sampling, method 1 . 45

---------------------- Page: 10 ----------------------

SIST EN 60758:2016
IEC 60758:2016 © IEC 2016 – 5 –
Table B.2 – Commodity bar sampling . 45
Table E.1 – Example of calibration data at α . 50
3 585
Table E.2 – Example of calibration data at α . 50
3 500

---------------------- Page: 11 ----------------------

SIST EN 60758:2016
– 6 – IEC 60758:2016 © IEC 2016
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

SYNTHETIC QUARTZ CRYSTAL –
SPECIFICATIONS AND GUIDELINES FOR USE

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in
addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses
arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60758 has been prepared by IEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
This fifth edition cancels and replaces the fourth edition, published in 2008. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
• order rearrangement and review of terms and definitions;
• abolition as a standard of the infrared absorbance coefficient α
3 410;
• addition of the α value measurement explanation by FT-IR equipment in annex;
• addition of the synthetic quartz crystal standards for optical applications.

---------------------- Page: 12 ----------------------

SIST EN 60758:2016
IEC 60758:2016 © IEC 2016 – 7 –
The text of this standard is based on the following documents:
FDIS Report on voting
49/1185/FDIS 49/1190/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

---------------------- Page: 13 ----------------------

SIST EN 60758:2016
– 8 – IEC 60758:2016 © IEC 2016
INTRODUCTION
The reason for adding synthetic quartz crystal for optical application to this International
Standard is as follows.
Quartz crystal produced for optical applications is produced by many of the same suppliers
manufacturing quartz for electronic applications. The equipment and methods to produce
optical quartz are similar to those used in the production of electronic quartz. Also, with a few
exceptions the characterization methods of electronic and optical material are similar.
Therefore, IEC 60758 serves as the proper basis for including addenda related to quartz crystal
for optical applications.

---------------------- Page: 14 ----------------------

SIST EN 60758:2016
IEC 60758:2016 © IEC 2016 – 9 –
SYNTHETIC QUARTZ CRYSTAL –
SPECIFICATIONS AND GUIDELINES FOR USE



1 Scope
This International Standard applies to synthetic quartz single crystals intended for
manufacturing piezoelectric elements for frequency control, selection and optical applications.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
IEC 60068-1:2013, Environmental testing – Part 1: General and guidance
IEC 60122-1:2002, Quartz crystal units of assessed quality – Part 1: Generic specification
IEC 60410, Sampling plans and procedures for inspection by attributes
IEC 61994 (all parts), Piezoelectric and dielectric devices for frequency control and selection –
Glossary
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 61994 and the
following apply.
3.1
hydrothermal crystal growth
crystal growth in the presence of water, elevated temperatures and pressures by a crystal
growth process believed to proceed geologically within the earth's crust
Note 1 to entry: The industrial synthetic quartz growth processes utilize alkaline water solutions confined within
autoclaves at supercritical temperatures (330 °C to 400 °C) and pressures (700 to 2 000 atmospheres).
Note 2 to entry: The autoclave is divided into two chambers: the dissolving chamber, containing raw quartz chips at
the higher temperature; the growing chamber, containing cut seeds at the lower temperature (see 7.1.2).
3.2
synthetic quartz crystal
single crystal of α quartz grown by the hydrothermal method
Note 1 to entry: Cultured quartz has the same meaning as synthetic quartz crystal.
3.3
as-grown synthetic quartz crystal
state of synthetic quartz crystal pri
...