kSIST FprEN IEC 62506:2023
(Main)Methods for product accelerated testing
Methods for product accelerated testing
IEC 62506:2023 provides guidance on the application of various accelerated test techniques for measurement or improvement of item reliability. Identification of potential failure modes that can be experienced in the use of an item and their mitigation is instrumental to ensure dependability of an item. The object of the methods is to either identify potential design weakness or provide information on item reliability, or to achieve necessary reliability and availability improvement, all within a compressed or accelerated period of time. This document addresses accelerated testing of non-repairable and repairable systems. It can be used for probability ratio sequential tests, fixed duration tests and reliability improvement/growth tests, where the measure of reliability can differ from the standard probability of failure occurrence. This document also extends to present accelerated testing or production screening methods that would identify weakness introduced into the item by manufacturing error, which can compromise item reliability. Services and people are however not covered by this document.
Verfahren für beschleunigte Produktprüfungen
Méthodes d'essais accélérés de produits
L'IEC 62506:2023 fournit des recommandations pour l’application de diverses techniques d’essais accélérés permettant de mesurer ou d’améliorer la fiabilité de l’entité. L’identification des modes de défaillance potentiels qui peuvent être rencontrés lors de l’utilisation d’une entité donnée et la manière d’y remédier contribuent à assurer la sûreté de fonctionnement d’une entité. L’objectif de ces méthodes est soit d’identifier les faiblesses potentielles de la conception et fournir des informations sur la fiabilité de l’entité, soit d’atteindre l’amélioration nécessaire de la fiabilité et de la disponibilité, dans les deux cas en comprimant ou en accélérant la durée. Le présent document couvre les essais accélérés de systèmes non réparables et de systèmes réparables. Elle peut être utilisée pour des essais de rapport de probabilité progressifs, des essais à durée fixe et des essais d’amélioration/croissance de la fiabilité, lorsque la mesure de la fiabilité peut être différente de la probabilité normale d’occurrence de défaillance. Le présent document décrit également des méthodes d’essais accélérés ou de déverminage de la production qui permettraient d’identifier les faiblesses induites par une éventuelle erreur de fabrication de l’entité et qui peuvent de ce fait d’en compromettre la fiabilité. Les services et les personnes ne sont cependant pas couverts par le présent document.
Metode za pospešeno preskušanje proizvodov
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
oSIST prEN IEC 62506:2023
01-januar-2023
Metode za pospešeno preskušanje proizvodov
Methods for product accelerated testing
Verfahren für beschleunigte Produktprüfungen
Méthodes d'essais accélérés de produits
Ta slovenski standard je istoveten z: prEN IEC 62506:2022
ICS:
03.120.01 Kakovost na splošno Quality in general
19.020 Preskuševalni pogoji in Test conditions and
postopki na splošno procedures in general
21.020 Značilnosti in načrtovanje Characteristics and design of
strojev, aparatov, opreme machines, apparatus,
equipment
oSIST prEN IEC 62506:2023 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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oSIST prEN IEC 62506:2023
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oSIST prEN IEC 62506:2023
56/1966/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62506 ED2
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2022-11-11 2023-02-03
SUPERSEDES DOCUMENTS:
56/1889/CD, 56/1897B/CC
IEC TC 56 : DEPENDABILITY
SECRETARIAT: SECRETARY:
United Kingdom Ms Stephanie Lavy
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
Other TC/SCs are requested to indicate their interest, if
any, in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of
which they are aware and to provide supporting documentation.
TITLE:
Methods for product accelerated testing
PROPOSED STABILITY DATE: 2025
NOTE FROM TC/SC OFFICERS:
Copyright © 2022 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.
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oSIST prEN IEC 62506:2023
– 2 – IEC CDV 62506 © IEC 2022
1 CONTENTS
2 FOREWORD . 5
3 INTRODUCTION . 7
4 1 Scope . 8
5 2 Normative references . 8
6 3 Terms, definitions, symbols and abbreviations . 9
7 3.1 Terms and definitions . 9
8 3.2 Symbols and abbreviated terms . 11
9 4 General description of the accelerated test methods . 12
10 4.1 Cumulative damage model . 12
11 4.2 Classification, methods and types of test acceleration . 14
12 4.2.1 General . 14
13 4.2.2 Type A: qualitative accelerated tests . 15
14 4.2.3 Type B: quantitative accelerated tests . 15
15 4.2.4 Type C: quantitative time and event compressed tests . 16
16 5 Accelerated test models . 17
17 5.1 Type A, qualitative accelerated tests . 17
18 5.1.1 Highly accelerated limit tests (HALT) . 17
19 5.1.2 Highly accelerated stress test (HAST) . 21
20 5.1.3 Highly accelerated stress screening/audit (HASS/HASA) . 21
21 5.1.4 Engineering aspects of HALT and HASS . 22
22 5.2 Type B and C – Qua
...
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