SIST EN 60440:2012

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Metoda merjenja nelinearnosti uporovVerfahren zur Messung der Nichtlinearitaet von WiderstaendenMéthode de mesure de la non-linéarité des résistancesMethod of measurement of non-linearity in resistors31.040.01Upori splošnoResistors in generalICS:Ta slovenski standard je istoveten z:EN 60440:2012SIST EN 60440:2012en01-oktober-2012SIST EN 60440:2012SLOVENSKI
STANDARD



SIST EN 60440:2012



EUROPEAN STANDARD EN 60440 NORME EUROPÉENNE
EUROPÄISCHE NORM August 2012
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2012 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60440:2012 E
ICS 31.040
English version
Method of measurement of non-linearity in resistors (IEC 60440:2012)
Méthode de mesure
de la non-linéarité des résistances (CEI 60440:2012)
Verfahren zur Messung
der Nichtlinearität von Widerständen (IEC 60440:2012)
This European Standard was approved by CENELEC on 2012-08-17. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
SIST EN 60440:2012



EN 60440:2012 - 2 - Foreword The text of document 40/2155/FDIS, future edition 1 of IEC 60440, prepared by IEC/TC 40 "Capacitors and resistors for electronic equipment" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 60440:2012. The following dates are fixed: • latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2013-05-17 • latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2015-08-17
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent rights.
Endorsement notice The text of the International Standard IEC 60440:2012 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60027 Series NOTE Harmonised as EN 60027 Series (not modified). ISO 80000-1 NOTE Harmonised as EN ISO 80000-1.
SIST EN 60440:2012



- 3 - EN 60440:2012 Annex ZA
(normative)
Normative references to international publications with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title EN/HD Year
IEC 60068-1 - Environmental testing -
Part 1: General and guidance EN 60068-1 -
SIST EN 60440:2012



SIST EN 60440:2012



IEC 60440 Edition 1.0 2012-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Method of measurement of non-linearity in resistors
Méthode de mesure de la non-linéarite des résistances
INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE Q ICS 31.040 PRICE CODE CODE PRIX ISBN 978-2-83220-228-9
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale ®
Warning! Make sure that you obtained this publication from an authorized distributor.
Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé. SIST EN 60440:2012



– 2 – 60440 © IEC:2012 CONTENTS
FOREWORD . 3 1 Scope . 5 2 Normative references . 5 3 Terms and definitions . 5 4 Method of measurement . 6 4.1 Measurement principle . 6 4.2 Measuring circuit . 8 4.3 Measurement system requirements . 9 4.3.1 Measuring frequency . 9 4.3.2 Noise level of the measuring system . 9 4.3.3 Third harmonic ratio of the measuring system . 9 4.3.4 Power amplifier . 9 4.3.5 Voltmeter . 10 4.3.6 Filter . 10 4.3.7 Test fixture . 10 4.4 Verification of the measuring system . 10 5 Measurement procedure . 10 5.1 Environmental conditions . 10 5.2 Preparation of specimen . 10 5.3 Measurement conditions . 10 5.4 Procedure . 11 5.5 Precautions . 11 6 Evaluation of measurement results . 11 6.1 Evaluation . 11 6.2 Requirements . 12 7 Information to be given in the relevant component specification. 12 Annex A (informative)
Reference to IEC/TR 60440 . 15 Bibliography . 16
Figure 1 – Equivalent circuit at the fundamental frequency . 6 Figure 2 – Equivalent circuit at the third harmonic frequency . 7 Figure 3 – Corrective term û . 8 Figure 4 – Block schematic of a suitable measuring system . 9
Table 1 – Recommended measuring conditions (1 of 2) . 13
SIST EN 60440:2012



60440 © IEC:2012 – 3 – INTERNATIONAL ELECTROTECHNICAL COMMISSION ____________
METHOD OF MEASUREMENT OF NON-LINEARITY IN RESISTORS
FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60440 has been prepared by committee 40: Capacitors and resistors for electronic equipment. This International Standard cancels and replaces the Technical Report IEC/TR 60440, published in 1973. The major changes with regard to the Technical Report are: – change of the principle parameter’s term from “third harmonic attenuation” to “third harmonic ratio”; – addition of advice on the prescription of requirements in a relevant component specification; – addition of a set of recommended measuring conditions for a specimen with a rated dissipation of less than 100 mW; – a complete editorial revision. SIST EN 60440:2012



– 4 – 60440 © IEC:2012 The text of this standard is based on the following documents: FDIS Report on voting 40/2155/FDIS 40/2167/RVD
Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to the specific publication. At this date, the publication will be • reconfirmed, • withdrawn, • replaced by a revised edition, or • amended.
SIST EN 60440:2012



60440 © IEC:2012 – 5 – METHOD OF MEASUREMENT OF NON-LINEARITY IN RESISTORS
1 Scope Non-linearity testing is a method to evaluate the integrity of a resistive element. It may be applied as an effective inline screening method suitable to detect and eliminate potential infant mortality failures in passive components. The method is fairly rapid, convenient, and the associated equipment is relatively inexpensive. Typical effects causing non-linearity on resistors are e.g. inhomogeneous spots within a resistive film, traces of film left in the spiraling grooves, or contact instability between a connecting lead or termination and the resistive element. This International Standard specifies a method of measurement and associated test conditions to assess the magnitude of non-linear distortion generated in a resistor. This method is applied if prescribed by a relevant component specification, or if agreed between a customer and a manufacturer. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60068-1, Environmental testing – Part 1: General and guidance 3 Terms and definitions For the puposes of this document the following terms and definitions apply. 3.1
electromotive force e.m.f. difference in potential that tends to give rise to an electric current 3.2
non-linearity deviation of a component’s impedance from Ohm’s law, resulting in voltage of harmonic frequencies when subjected to sinusoidal current 3.3
third harmonic ratio A3 ratio of the fundamental voltage over the e.m.f. of the third harmonic Note 1 to entry: The third harmonic ratio is expressed in dB. Note 2 to entry: The third harmonic ratio has been addressed before as third harmonic attenuation. This historic convention is misleading as it wrongly suggests harmonic frequencies originating from the test equipment being attenuated or filtered by the components under test. The misleading term should therefore be avoided. SIST EN 60440:2012



– 6 – 60440 © IEC:2012 4 Method of measurement 4.1 Measurement principle A pure sinusoidal current is passed through the component under test. If the impedance of the component is not perfectly linear, the voltage across the component will be distorted and contain harmonics. One or more of these harmonics can be measured and the magnitude of these distortions is a measure of the non-linearity in the component. It is recommended to measure the third harmonic, as it is the dominant one. The third harmonic voltage appearing across a component needs to be separated from the fundamental voltage and from any other harmonic voltage for the measurement. This is accomplished by a filter circuit letting the harmonic voltage pass through while featuring very high impedance at the fundamental frequency. Also, the generator of the fundamental frequency needs to feature very high impedance at the third harmonic frequency so as not to act as a load to the generated distortions. Hence, the equivalent circuit of the generator part operating at the fundamental frequency is quite simple, as shown in Figure 1.
U1 RT I1 IEC
1432/12
Key I1 Sinusoidal current U1 Fundamental voltage across the resistor under test RT Impedance of the resistor under test at the fundamental frequency Figure 1 – Equivalent circuit at the fundamental frequency The equivalent circuit for the third harmonic frequency is built around the test specimen represented by a linear impedance with a zero-impedance harmonic generator in series. This signal source loads the measuring system represented by its impedance as seen from the test terminals, see Figure 2. SIST EN 60440:2012



60440 © IEC:2012 – 7 –
U3 RT3 R3 E3 IEC
1433/12
Key E3 e.m.f. of the third harmonic RT3 Impedance of the resistor under test at the third harmonic frequency R3 Impedance of the measuring circuit at the third harmonic frequency, seen from t
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