SIST EN IEC 61000-4-20:2022

SLOVENSKI STANDARD
SIST EN IEC 61000-4-20:2022
01-julij-2022
Nadomešča:
SIST EN 61000-4-20:2011
Elektromagnetna združljivost (EMC) - 4-20. del: Preskusne in merilne tehnike -
Preskušanje oddajanja in odpornosti v prečnih elektromagnetnih (TEM) valovodih
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques -
Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Elektromagnetische Verträglichkeit (EMV) - Teil 4-20: Prüf- und Messverfahren -
Messung der Störaussendung und Prüfung der Störfestigkeit in transversal-
elektromagnetischen (TEM-)Wellenleitern
Compatibilité électromagnétique (CEM) - Partie 4-20: Techniques d'essai et de mesure -
Essais d'émission et d'immunité dans les guides d'onde TEM
Ta slovenski standard je istoveten z: EN IEC 61000-4-20:2022
ICS:
33.100.10 Emisija Emission
33.100.20 Imunost Immunity
SIST EN IEC 61000-4-20:2022 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN IEC 61000-4-20:2022

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SIST EN IEC 61000-4-20:2022


EUROPEAN STANDARD EN IEC 61000-4-20

NORME EUROPÉENNE

EUROPÄISCHE NORM April 2022
ICS 33.100.10; 33.100.20 Supersedes EN 61000-4-20:2010 and all of its
amendments and corrigenda (if any)
English Version
Electromagnetic compatibility (EMC) - Part 4-20: Testing and
measurement techniques - Emission and immunity testing in
transverse electromagnetic (TEM) waveguides
(IEC 61000-4-20:2022)
Compatibilité électromagnétique (CEM) - Partie 4-20: Elektromagnetische Verträglichkeit (EMV) - Teil 4-20: Prüf-
Techniques d'essai et de mesure - Essais d'émission et und Messverfahren - Messung der Störaussendung und
d'immunité dans les guides d'onde TEM Prüfung der Störfestigkeit in transversal-
(IEC 61000-4-20:2022) elektromagnetischen (TEM-)Wellenleitern
(IEC 61000-4-20:2022)
This European Standard was approved by CENELEC on 2022-03-25. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.


European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2022 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN IEC 61000-4-20:2022 E

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SIST EN IEC 61000-4-20:2022
EN IEC 61000-4-20:2022 (E)
European foreword
The text of document 77B/853/FDIS, future edition 3 of IEC 61000-4-20, prepared by SC 77B "High
frequency phenomena" of IEC/TC 77 "Electromagnetic compatibility" was submitted to the IEC-
CENELEC parallel vote and approved by CENELEC as EN IEC 61000-4-20:2022.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2022-12-25
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2025-03-25
document have to be withdrawn
This document supersedes EN 61000-4-20:2010 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
This document has been prepared under a Standardization Request given to CENELEC by the
European Commission and the European Free Trade Association.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 61000-4-20:2022 was approved by CENELEC as a
European Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards
indicated:
IEC 60068-1 NOTE Harmonized as EN 60068-1
IEC 60118-13 NOTE Harmonized as EN IEC 60118-13
IEC 61967-2 NOTE Harmonized as EN 61967-2
IEC 62132-2 NOTE Harmonized as EN 62132-2
CISPR 25 NOTE Harmonized as EN IEC 55025
CISPR 14 (series) NOTE Harmonized as EN IEC 55014-2 (series)
CISPR 16-4-2 NOTE Harmonized as EN 55016-4-2
IEC 61000-2-9 NOTE Harmonized as EN 61000-2-9
IEC 61000-4-3 NOTE Harmonized as EN IEC 61000-4-3
CISPR 16-2-3:2016 NOTE Harmonized as EN 55016-2-3:2017 (not modified)
CISPR 32 NOTE Harmonized as EN 55032
CISPR 20:2006 NOTE Harmonized as EN 55020:2007 (not modified) +A11:2011
2

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SIST EN IEC 61000-4-20:2022
EN IEC 61000-4-20:2022 (E)
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the
relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60050-161 - International Electrotechnical Vocabulary - -
(IEV) - Part 161: Electromagnetic
compatibility
CISPR 16-1-1 - Specification for radio disturbance and EN IEC 55016-1-1 -
immunity measuring apparatus and
methods - Part 1-1: Radio disturbance and
immunity measuring apparatus -
Measuring apparatus
CISPR 16-1-4 - Specification for radio disturbance and EN IEC 55016-1-4 -
immunity measuring apparatus and
methods - Part 1-4: Radio disturbance and
immunity measuring apparatus - Antennas
and test sites for radiated disturbance
measurements


3

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SIST EN IEC 61000-4-20:2022




IEC 61000-4-20

®


Edition 3.0 2022-02




INTERNATIONAL



STANDARD




NORME


INTERNATIONALE
colour

inside



BASIC EMC PUBLICATION

PUBLICATION FONDAMENTALE EN CEM






Electromagnetic compatibility (EMC) –

Part 4-20: Testing and measurement techniques – Emission and immunity

testing in transverse electromagnetic (TEM) waveguides



Compatibilité électromagnétique (CEM) –

Partie 4-20: Techniques d’essai et de mesure – Essais d’émission et d’immunité


dans les guides d’onde TEM













INTERNATIONAL

ELECTROTECHNICAL

COMMISSION


COMMISSION

ELECTROTECHNIQUE


INTERNATIONALE




ICS 33.100.10; 33.100.20 ISBN 978-2-8322-1083-0




Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN IEC 61000-4-20:2022
– 2 – IEC 61000-4-20:2022 © IEC 2022
CONTENTS
FOREWORD . 7
INTRODUCTION . 9
1 Scope . 10
2 Normative references . 11
3 Terms, definitions and abbreviated terms . 11
3.1 Terms and definitions . 11
3.2 Abbreviated terms . 14
4 General . 15
5 TEM waveguide requirements . 15
5.1 General . 15
5.2 General requirements for the use of TEM waveguides . 16
5.2.1 Test volume and maximum EUT size . 16
5.2.2 Validation of usable test volume . 16
5.3 Special requirements and recommendations for certain types of TEM
waveguides . 23
5.3.1 Set-up of open TEM waveguides . 23
5.3.2 Alternative TEM mode verification for a two-port TEM waveguide . 23
5.3.3 TEM mode generation for a four-port TEM waveguide . 23
5.4 Figures for Clause 5 . 24
6 Overview of EUT types . 26
6.1 General . 26
6.2 Small EUT . 26
6.3 Large EUT . 26
7 Laboratory test conditions. 26
7.1 General . 26
7.2 Climatic conditions . 26
7.3 Electromagnetic conditions . 26
8 Evaluation and reporting of test results . 27
Annex A (normative) Emission measurements in TEM waveguides . 28
A.1 Overview. 28
A.2 Test equipment . 28
A.3 Correlating TEM waveguide voltages to electric field strength data . 28
A.3.1 General . 28
A.3.2 Correlation algorithms . 29
A.4 Emission measurement correction factors . 33
A.4.1 Reference emission sources . 33
A.4.2 Arrangement of small EUTs . 34
A.4.3 Calculation of the small EUT correction factor . 34
A.5 Emission measurement procedures in TEM waveguides . 37
A.5.1 EUT types. 37
A.5.2 EUT arrangement . 37
A.6 Test report . 38
A.7 Figures for Annex A . 39
Annex B (normative) Immunity testing in TEM waveguides . 44
B.1 Overview. 44
B.2 Test equipment . 44

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B.2.1 General . 44
B.2.2 Description of the test facility . 44
B.3 Field uniformity area calibration . 45
B.4 Test levels . 45
B.5 Test set-up . 45
B.5.1 Arrangement of table-top equipment . 45
B.5.2 Arrangement of floor-standing equipment . 46
B.5.3 Arrangement of wiring . 46
B.6 Test procedures . 46
B.7 Test results and test report . 46
B.8 Figures for Annex B . 47
Annex C (normative) HEMP transient testing in TEM waveguides . 49
C.1 Overview. 49
C.2 Immunity tests . 49
C.2.1 General . 49
C.2.2 Radiated test facilities . 50
C.2.3 Frequency domain spectrum requirements . 51
C.3 Test equipment . 51
C.4 Test set-up . 52
C.5 Test procedure . 52
C.5.1 General . 52
C.5.2 Severity level and test exposures . 53
C.5.3 Test procedure . 53
C.5.4 Test execution . 54
C.5.5 Execution of the radiated immunity test . 54
C.6 Figure for Annex C . 55
Annex D (informative) TEM waveguide characterization . 56
D.1 Overview. 56
D.2 Distinction between wave impedance and characteristic impedance. 56
D.3 TEM wave . 57
D.3.1 General . 57
D.3.2 Free-space TEM mode . 57
D.3.3 Waveguides . 57
D.4 Wave propagation . 58
D.4.1 General . 58
D.4.2 Spherical propagation . 58
D.4.3 Plane wave propagation in free space . 58
D.4.4 Velocity of propagation . 58
D.5 Polarization . 58
D.6 Types of TEM waveguides . 59
D.6.1 General . 59
D.6.2 Open TEM waveguides (striplines, etc.) . 60
D.6.3 Closed TEM waveguides (TEM cells) . 60
D.7 Frequency limitations . 60
D.8 Figures for Annex D . 61
Annex E (informative) Calibration method for E-field probes in TEM waveguides . 69
E.1 Overview. 69
E.2 Probe calibration requirements . 69
E.2.1 General . 69

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E.2.2 Calibration frequency range . 69
E.2.3 Calibration volume . 70
E.2.4 Probe dimensions . 70
E.2.5 Perturbations of TEM waveguide fields due to the probe . 70
E.2.6 Frequency steps . 71
E.2.7 Field strength . 71
E.3 Requirements for calibration instrumentation . 71
E.3.1 Specifications of TEM waveguide . 71
E.3.2 Harmonics and spurious signals . 72
E.3.3 Probe fixture . 72
E.3.4 Measuring net power to a transmitting device using directional couplers . 72
E.4 E-field probe calibration . 73
E.4.1 Calibration methods . 73
E.4.2 Calibration procedure using a two-port TEM waveguide . 73
E.4.3 Calibration procedure using one-port TEM waveguide . 74
E.5 Figures for Annex E . 77
Annex F (informative) Instrumentation uncertainty of emission measurement results . 79
F.1 Radiated disturbance measurements using a TEM waveguide . 79
F.1.1 Measurand for radiated disturbance measurements using a TEM
waveguide . 79
F.1.2 Symbols of input quantities common to all disturbance measurements . 79
F.1.3 Symbols of input quantities specific to TEM waveguide measurements . 79
F.2 Input quantities to be considered for radiated disturbance measurements
using a TEM waveguide . 79
F.3 Uncertainty budget and rationale for the input quantities for radiated
disturbance measurements using a TEM waveguide . 80
F.3.1 Uncertainty budget for radiated disturbance measurements using a TEM

waveguide . 80
F.3.2 Rationale for the estimates of input quantities for radiated disturbance
measurements using a TEM waveguide . 81
F.4 Figures for Annex F . 87
Annex G (informative) Measurement uncertainty of immunity testing due to test
instrumentation . 89
G.1 General symbols . 89
G.2 Symbol and definition of the measurand . 89
G.3 Symbols for input quantities . 89
G.4 Example: Uncertainty budget for immunity test . 89
G.5 Rationale for the estimates of input quantities . 90
Annex H (informative) Correlation of emission and immunity limits between EMC test
facilities . 93
H.1 Overview. 93
H.2 Dipole in free space (representing FAR set-up) . 93
H.3 Dipole in half space (representing OATS or SAC set-up). 95
H.4 Dipole in a TEM-mode transmission line . 96
H.5 Dipole in a reverberation chamber . 97
H.6 Correlation . 98
H.7 Example of emission limits . 99
H.8 Figures for Annex H . 100
Annex I (informative) TEM waveguide transient characterization . 103
I.1 Overview. 103

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I.2 Test equipment . 103
I.3 Test set-up . 103
I.4 TEM waveguide characterization by correlation . 104
I.5 Quantification of the Pcc . 105
I.6 Performable transient test signals . 105
I.7 Figures for Annex I . 106
Bibliography . 108

Figure 1 – Flowchart of TEM mode and field uniformity verification procedure with the
“constant forward power” method (see 5.2.2.4.1) . 24
Figure 2 – Flowchart of TEM mode and field uniformity verification procedure with the

“constant field strength” method (see 5.2.2.4.2) . 25
Figure A.1 – Routing the exit cable to the corner at the ortho-angle and the lower edge
of the test volume in a TEM waveguide (see A.5.2) . 39
Figure A.2 – Basic ortho-axis EUT positioner or manipulator (see 3.1.13, A.4.2,
A.5.1.2, A.5.2) . 40
Figure A.3 – Die pattern and axis alignment for an EUT [26] (see A.3.2.3.2) . 41
Figure A.4 – Non-redundant twelve-face and axis orientations for a typical EUT [26]
(see A.3.2.3.2) . 42
Figure A.5 – Open-area test site (OATS) emission measurements geometry (see
A.3.2.4) . 43
Figure B.1 – Example of test set-up for single-polarization TEM waveguide
(see Clause B.5) . 47
Figure B.2 – Uniform area calibration points in a TEM waveguide (see Clause B.3) . 48
Figure C.1 – Pulse waveform frequency domain spectral magnitude between 100 kHz

and 300 MHz (see C.2.1) . 55
Figure D.1 – Simple waveguide (no TEM mode) (see D.3.3) . 61
Figure D.2 – Example of waveguides supporting TEM-mode propagation (see D.3.3) . 61
Figure D.3 – E-field polarization vector (see Clause D.5) . 61
Figure D.4 – Simple transmission line model for TEM mode propagation (see D.6.1) . 62
Figure D.5 – One- and two-port TEM waveguide concepts (see D.6.1) . 62
Figure D.6 – Operation of four-port TEM waveguides (see D.6.1) . 62
Figure D.7 – Two-port TEM cell (symmetric septum) (see D.6.1 and D.6.3) . 63
Figure D.8 – One-port TEM cell (asymmetric septum) (see D.6.1 and D.6.3) . 64
Figure D.9 – Stripline (two plates) (see D.6.1 and D.6.2) . 66
Figure D.10 – Stripline (four plates, balanced feed) (see D.6.1) . 67
Figure D.11 – Four-port TEM waveguide (symmetric parallel septa) (see D.6.1 and
D.6.3) . 68
Figure E.1 – Example of test points for calibration volume validation (see E.2.3) . 77
Figure E.2 – Set-up for validation of probe perturbation (see E.2.5) . 77
Figure E.3 – Set-up for measuring net power to a transmitting device (not to scale)
(see E.3.4
...