oSIST prEN IEC 63185:2024

SLOVENSKI STANDARD
01-julij-2024
Merjenje kompleksne permisivnosti za dielektrične podlage z nizkimi izgubami,
uravnotežene z metodo krožnega diskastega resonatorja
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type
circular disk resonator method
Messung der komplexen Dielektrizitätskonstante für verlustarme dielektrische Substrate
nach dem symmetrischen Kreisscheibenresonatorverfahren
Méthode au résonateur à disque circulaire de type symétrique pour mesurer la
permittivité complexe des substrats diélectriques à faible perte
Ta slovenski standard je istoveten z: prEN IEC 63185:2024
ICS:
33.120.30 Radiofrekvenčni konektorji RF connectors
(RF)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

46F/672/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 63185 ED2
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2024-05-24 2024-08-16
SUPERSEDES DOCUMENTS:
46F/656/CD, 46F/669/CC
IEC SC 46F : RF AND MICROWAVE PASSIVE COMPONENTS
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United States of America Mr John Morelli
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TITLE:
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk
resonator method
PROPOSED STABILITY DATE: 2027
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IEC CDV 63185 © IEC 2024 2 46F/672/CDV

NOTE FROM TC/SC OFFICERS:
46F/672/CDV 3 IEC CDV 63185 © IEC 2024

1 CONTENTS
3 FOREWORD . 4
4 1 Scope . 6
5 2 Normative references . 6
6 3 Terms and definitions . 6
7 4 Measurement parameters . 6
8 5 Theory and calculation equations . 7
9 6 Measurement system . 9
10 7 Measurement procedure . 10
11 7.1 Preparation of measurement apparatus. 10
12 7.2 Adjustment of measurement conditions . 10
13 7.3 Calibration of a vector network analyzer . 10
14 7.4 Measurement of complex permittivity of test sample . 10
15 7.5 Periodic checkup of metal in resonator. 11
16 Annex A (informative) . 12
17 Example of measurement results and associated uncertainties for complex
18 permittivity . 12
19 Bibliography . 14
21 Figure 1 – Structure of a circular disk resonator . 8
22 Figure 2 – Relations between resonant frequency and relative permittivity . 9
23 Figure 3 – Schematic diagram of a vector network analyzer measurement system . 10
| |
24 Figure 4 – Frequency response of S21 of balanced-type circular disk resonator . 11
26 Table A.1 – Parameters of the cavity and the sheet sample . 12
27 Table A.2 – The resonant frequencies and unloaded Q-factors . 12
28 Table A.3 – Measurement results of complex permittivity . 13
IEC CDV 63185 © IEC 2024 4 46F/672/CDV

31 INTERNATIONAL ELECTROTECHNICAL COMMISSION
32 ____________
34 MEASUREMENT OF THE COMPLEX PERMITTIVITY
35 FOR LOW-LOSS DIELECTRIC SUBSTRATES
36 BALANCED-TYPE CIRCULAR DISK RESONATOR METHOD
38 FOREWORD
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70 International Standard IEC 63185 has been prepared by subcommittee 46F: RF and microwave
71 passive components, of IEC technical committee 46: Cables, wires, waveguides, RF connectors,
72 RF and microwave passive components and accessories.
73 The text of this standard is based on the following documents:
FDIS Report on voting
46F/XX/FDIS 46F/XX/RVD
75 Full information on the voting for the approval of this standard can be found in the report on
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IEC CDV 63185 © IEC 2024 6 46F/672/CDV

88 MEASUREMENT OF THE COMPLEX PERMITTIVITY
89 FOR LOW-LOSS DIELECTRIC SUBSTRATES
90 BALANCED-TYPE CIRCULAR DISK RESONATOR METHOD
94 1 Scope
95 This document relates to a measurement method for complex permittivity of a dielectric
96 substrates at microwave and millimeter-wave frequencies. This method has been developed to
97 evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave
98 circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and
99 provides broadband measurements of dielectric substrates by using one resonator, where the
100 effect of excitation holes and that of fringing fields are taken into account accurately on the
101 basis of the mode-matching analysis.
102 In comparison with the conventional method described in IEC 62810 and IEC 61338-1-3, this
103 method has the following characteristics:
′
104 • the values of the relative permittivity 𝜖𝜖 and loss tangent tan𝛿𝛿 normal to dielectric plate
r
105 samples can be measured accurately and non-destructively;
106 • this method presents broadband measurements by using higher-order modes by one
107 resonator;
108 • this method is applicable for the measurements on the following condition:
109 – frequency: 10 GHz ≤𝑓𝑓≤ 170 GHz;
′
110 – relative permittivity: 1 ≤𝜖𝜖 ≤ 10;
–4 -2
111 – loss tangent: 10 ≤ tan𝛿𝛿≤ 10 .
112 2 Normative references
113 The following documents are referred to in the text in such a way that some or all of their content
114 constitutes requirements of this document. For dated references, only the edition cited applies.
115 For undated references, the latest edition of the referenced document (including any
116 amendments) applies.
117 IEC 61338-1-3:1999, Waveguide type dielectric resonators – Part 1-3: General information and
118 test conditions – Measurement method of complex relative permittivity for dielectric resonator
119 materials at microwave frequency
120 IEC 62810:2015, Cylindrical cavity method to measure the complex permittivity of low-loss
121 dielectric rods
122 3 Terms and definitions
123 No terms and definitions are listed in this document.
124 ISO and IEC maintain terminological databases for use in standardization at the following
125 addresses:
126 • IEC Electropedia: available at http://www.electropedia.org/
127 • ISO Online browsing platform: available at http://www.iso.org/obp
129 4 Measurement parameters
130 The measurement parameters are defined as follows:

46F/672/CDV 7 IEC CDV 63185 © IEC 2024

′ ′′
131 𝜖𝜖 =𝜖𝜖 −𝑗𝑗𝜖𝜖 (1)
r r r
′′ ′
⁄
132 tan𝛿𝛿 =𝜖𝜖 𝜖𝜖 (2)
r r
′ ′′
133 where 𝜖𝜖 and 𝜖𝜖 are the real and imaginary parts of the complex relative permittivity 𝜖𝜖 .
r r r
134 5 Theory and calculation equations
135 A resonator structure used in this method is shown in Figure 1. A thin circular conductor disk
136 with radius 𝑅𝑅 and thickness 𝑡𝑡 is sandwiched between a pair of dielectric plate samples to be
c
′
137 measured having the same thickness 𝑡𝑡 and dielectric properties 𝜖𝜖 and tan𝛿𝛿. Dielectric samples
r
138 are sandwiched by two parallel conductor plates.
139 The resonator is excited and detected by coaxial lines through excitation holes having radius 𝑎𝑎
140 and length 𝑀𝑀. Because only the TM0m0 modes have the electric field in the center of the
141 resonator, only those modes are selectively excited in the resonator, where the electric field
142 component
...