SIST EN 60512-2-1:2003
(Main)Connectors for electronic equipment - Tests and measurements -- Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method
Connectors for electronic equipment - Tests and measurements -- Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method
Defines a standard test method to measure the electrical resistance across a pair of mated contacts or a contact with a measuring gauge. Measurements may be carried out with direct current or alternating current.
Steckverbinder für elektronische Einrichtungen - Mess- und Prüfverfahren -- Teil 2-1: Prüfungen des elektrischen Durchgangs und Durchgangswiderstands - Prüfung 2a: Durchgangswiderstand - Millivoltmethode
Connecteurs pour équipements électroniques - Essais et mesures -- Partie 2-1: Essais de continuité électrique et de résistance de contact - Essai 2a: Résistance de contact - Méthode du niveau des millivolts
Définit une méthode d'essai normalisée pour mesurer la résistance électrique d'une paire de contacts accouplés ou d'un contact accouplé avec un calibre de mesure. Les mesures peuvent être effectuées en courant continu ou en courant alternatif.
Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method (IEC 60512-2-1:2002)
General Information
- Status
- Published
- Publication Date
- 30-Sep-2003
- Current Stage
- 6060 - National Implementation/Publication (Adopted Project)
- Start Date
- 01-Oct-2003
- Due Date
- 01-Oct-2003
- Completion Date
- 01-Oct-2003
Overview
EN 60512-2-1:2002 (Test 2a) specifies the millivolt level method for measuring contact resistance and electrical continuity of mated connectors and contacts. Published by CENELEC and aligned with IEC 60512-2-1:2002, this standard defines how to measure the electrical resistance across a pair of contacts (or a contact and a gauge) using low-level voltage and controlled current to avoid altering contact surfaces.
Key topics and technical requirements
- Measurement principle: Contact resistance is derived from the voltage drop measured between the connection zones of the mated contacts.
- Test methods: Measurements may be made with direct current (d.c.) or alternating current (a.c.) (a.c. frequency ≤ 2 kHz). In case of dispute, d.c. measurements govern.
- Limits to test signals: Test voltage must not exceed 20 mV (d.c. or a.c. peak) to prevent breakdown of insulating films. Test current must not exceed 100 mA (d.c. or a.c.).
- Measuring cycles:
- For d.c.: apply voltage, measure with current in one direction, measure with reverse current, then disconnect. The d.c. contact resistance is the average of forward and reverse readings.
- For a.c.: apply voltage, measure, then disconnect.
- Accuracy and errors: Measuring apparatus total error should not exceed 1%.
- Practical measurement notes:
- Do not operate the contact while the measuring voltage is applied.
- Avoid abnormal pressure or movement of test cables and contacts during measurement.
- If connection points are not directly accessible, subtract the cable/wire resistance from measured values and record the corrected value.
- Calculation: The standard provides an equation using forward and reverse voltage and currents to compute the contact resistance (variables defined in the standard). Include voltage sign when applying the formula.
- Specification details: Detail specifications must state measuring points, number of contacts, permissible contact resistance limits, and any deviations from the standard method.
Applications and who uses this standard
- Connector manufacturers and design engineers validating electrical continuity and low contact resistance.
- Test laboratories and QA/production teams performing acceptance and routine tests on connectors used in electronics, telecommunications, automotive, aerospace and medical equipment.
- Procurement and compliance teams requiring standardized test procedures for supplier verification and product certification.
Related standards
- EN 60512 / IEC 60512 series (general connector tests and measurements). EN 60512-2-1 supersedes Test 2a of earlier IEC 60512-2 editions.
Keywords: EN 60512-2-1, IEC 60512-2-1, contact resistance, millivolt level method, connectors testing, electrical continuity, low-level millivolt measurement, 20 mV, 100 mA.
Frequently Asked Questions
SIST EN 60512-2-1:2003 is a standard published by the Slovenian Institute for Standardization (SIST). Its full title is "Connectors for electronic equipment - Tests and measurements -- Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method". This standard covers: Defines a standard test method to measure the electrical resistance across a pair of mated contacts or a contact with a measuring gauge. Measurements may be carried out with direct current or alternating current.
Defines a standard test method to measure the electrical resistance across a pair of mated contacts or a contact with a measuring gauge. Measurements may be carried out with direct current or alternating current.
SIST EN 60512-2-1:2003 is classified under the following ICS (International Classification for Standards) categories: 31.220.10 - Plug-and-socket devices. Connectors. The ICS classification helps identify the subject area and facilitates finding related standards.
SIST EN 60512-2-1:2003 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.
Standards Content (Sample)
STANDARDConnectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method (IEC 60512-2-1:2002)©
Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljenoReferenčna številkaSIST EN 60512-2-1:2003(en)ICS31.220.10
EUROPEAN STANDARDEN 60512-2-1NORME EUROPÉENNEEUROPÄISCHE NORMApril 2002CENELECEuropean Committee for Electrotechnical StandardizationComité Européen de Normalisation ElectrotechniqueEuropäisches Komitee für Elektrotechnische NormungCentral Secretariat: rue de Stassart 35, B - 1050 Brussels© 2002 CENELEC -All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.Ref. No. EN 60512-2-1:2002 EICS 31.220.10English versionConnectors for electronic equipment –Tests and measurementsPart 2-1: Electrical continuity and contact resistance tests –Test 2a: Contact resistance –Millivolt level method(IEC 60512-2-1:2002)Connecteurs pour équipementsélectroniques –Essais et mesuresPartie 2-1: Essais de continuité électriqueet de résistance de contact –Essai 2a: Résistance de contact -Méthode du niveau des millivolts(CEI 60512-2-1:2002)Steckverbinder für elektronischeEinrichtungen –Mess- und PrüfverfahrenTeil 2-1: Prüfungen des elektrischenDurchgangs und Durchgangswiderstands -Prüfung 2a: Durchgangswiderstand -Millivoltmethode(IEC 60512-2-1:2002)This European Standard was approved by CENELEC on 2002-04-01. CENELEC members are bound tocomply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this EuropeanStandard the status of a national standard without any alteration.Up-to-date lists and bibliographical references concerning such national standards may be obtained onapplication to the Central Secretariat or to any CENELEC member.This European Standard exists in three official versions (English, French, German). A version in any otherlanguage made by translation under the responsibility of a CENELEC member into its own language andnotified to the Central Secretariat has the same status as the official versions.CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands,Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.
NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD60512-2-1Première éditionFirst edition2002-02Connecteurs pour équipements électroniques –Essais et mesures –Partie 2-1:Essais de continuité électrique etde résistance de contact –Essai 2a: Résistance de contact –Méthode du niveau des millivoltsConnectors for electronic equipment –Tests and measurements –Part 2-1:Electrical continuity and contactresistance tests –Test 2a: Contact resistance –Millivolt level methodPour prix, voir catalogue en vigueurFor price, see current catalogue IEC 2002
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Copyright - all rights reservedAucune partie de cette publication ne peut être reproduite niutilisée sous quelque forme que ce soit et par aucun procédé,électronique ou mécanique, y compris la photocopie et lesmicrofilms, sans l'accord écrit de l'éditeur.No part of this publication may be reproduced or utilized in anyform or by any means, electronic or mechanical, includingphotocopying and microfilm, without permission in writing fromthe publisher.International Electrotechnical Commission,
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E-mail: inmail@iec.ch
Web: www.iec.chCODE PRIXPRICE CODEECommission Electrotechnique InternationaleInternational Electrotechnical Commission
60512-2-1 IEC:2002– 3 –INTERNATIONAL ELECTROTECHNICAL COMMISSION–––––––––CONNECTORS FOR ELECTRONIC EQUIPMENT –TESTS AND MEASUREMENTS –Part 2-1: Electrical continuity and contact resistance tests –Test 2a: Contact resistance – Millivolt level methodFOREWORD1)The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprisingall national electrotechnical committees (IEC National Committees). The object of the IEC is to promoteinternational co-operation on all questions concerning standardization in the electrical and electronic fields. Tothis end and in addition to other activities, the IEC publishes International Standards. Their preparation isentrusted to technical committees; any IEC National Committee interested in the subject dealt with mayparticipate in this preparatory work. International, governmental and non-governmental organizations liaisingwith the IEC also participate in this preparation. The IEC collaborates closely with the InternationalOrganization for Standardization (ISO) in accordance with
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