SIST EN 62197-1:2006
(Main)Connectors for electronic equipment - Quality assessment requirements -- Part 1: Generic specification
Connectors for electronic equipment - Quality assessment requirements -- Part 1: Generic specification
Establishes uniform testing requirements to support quality assessment procedures for connectors. Is applicable to a family of connectors for use in electronic and electrical equipment; does not cover connectors designed for use at radio frequencies.
Steckverbinder für elektronische Einrichtungen - Qualitätsbewertungsanforderungen -- Teil 1: Fachgrundspezifikation
Connecteurs pour équipements électroniques - Exigences d'assurance de la qualité -- Partie 1: Spécification générique
Etablit des exigences d'essai uniformes pour les procédures d'assurance de la qualité des connecteurs. Est applicable à une famille de connecteurs destinés à être utilisés dans des équipements électriques et électroniques; ne couvre pas les connecteurs conçus pour être utilisés aux fréquences radioélectriques.
Konektorji za elektronsko opremo – Zahteve za ocenjevanje kakovosti – 1. del: Rodovna specifikacija (IEC 62197-1:2006)
General Information
Standards Content (Sample)
SLOVENSKI SIST EN 62197-1:2006
STANDARD
oct 2006
Konektorji za elektronsko opremo – Zahteve za ocenjevanje kakovosti – 1.
del: Rodovna specifikacija (IEC 62197-1:2006)
Connectors for electronic equipment – Quality assessment requirements – Part 1:
Generic specification (IEC 62197-1:2006)
ICS 31.220.10 Referenčna številka
© Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno
EUROPEAN STANDARD
EN 62197-1
NORME EUROPÉENNE
June 2006
EUROPÄISCHE NORM
ICS 31.220.10
English version
Connectors for electronic equipment -
Quality assessment requirements
Part 1: Generic specification
(IEC 62197-1:2006)
Connecteurs pour équipements Steckverbinder für elektronische
électroniques - Einrichtungen -
Exigences d'assurance de la qualité Qualitätsbewertungsanforderungen
Partie 1: Spécification générique Teil 1: Fachgrundspezifikation
(CEI 62197-1:2006) (IEC 62197-1:2006)
This European Standard was approved by CENELEC on 2006-05-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62197-1:2006 E
Foreword
The text of document 48B/1622/FDIS, future edition 1 of IEC 62197-1, prepared by SC 48B, Connectors,
of IEC TC 48, Electromechanical components and mechanical structures for electronic equipment, was
submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62197-1 on
2006-05-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2007-02-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2009-05-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 62197-1:2006 was approved by CENELEC as a European
Standard without any modification.
__________
- 3 - EN 62197-1:2006
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
IEC 60050-581 1978 International Electrotechnical Vocabulary - -
(IEV) -
Chapter 581: Electromechanical components
for electronic equipment
1)
IEC 60068-1 1988 Environmental testing - EN 60068-1 1994
+ corr. October 1988 Part 1: General and guidance
IEC 60410 1973 Sampling plans and procedures for inspection - -
by attributes
IEC 60512 Series Connectors for electronic equipment - Tests EN 60512 Series
and measurements
IEC 61076-1 2006 Connectors for electronic equipment - EN 61076-1 2006
Product requirements -
Part 1: Generic specification
IEC/TR 62225 2001 Guidance on terms for connectors and - -
mechanical structures in electronic equipment
IEC Guide 102 1996 Electronic components - Specification - -
structures for quality assessment
(Qualification approval and capability
approval)
2)
IEC QC 001002-2 - IEC Quality Assessment System for - -
Electronic Components (IECQ) - Rules of
Procedure -
Part 2: Documentation
2)
IEC QC 001002-3 - IEC Quality Assessment System for - -
Electronic Components (IECQ) - Rules of
Procedure -
Part 3: Approval procedures
2)
IEC QC 210000 - Technology Approval Schedules - - -
Requirements under the IECQ Quality
Assessment System for Electronic
Components (IECQ)
1)
EN 60068-1 includes A1 to IEC 60068-1.
2)
Undated reference.
Publication Year Title EN/HD Year
2)
ISO 2859-1 - Sampling procedures for inspection by - -
attributes -
Part 1: Sampling schemes indexed by
acceptance quality limit (AQL) for lot-by-lot
inspection
NORME CEI
INTERNATIONALE
IEC
62197-1
INTERNATIONAL
Première édition
STANDARD
First edition
2006-04
Connecteurs pour équipements électroniques –
Exigences d'assurance de la qualité –
Partie 1:
Spécification générique
Connectors for electronic equipment –
Quality assessment requirements –
Part 1:
Generic specification
IEC 2006 Droits de reproduction réservés Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
CODE PRIX
U
PRICE CODE
Commission Electrotechnique Internationale
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
Pour prix, voir catalogue en vigueur
For price, see current catalogue
62197-1 IEC:2006 – 3 –
CONTENTS
FOREWORD.5
INTRODUCTION.9
1 General .19
1.1 Scope.19
1.2 General considerations relating to specifications .19
1.3 Normative references .21
1.4 Performance characteristics .21
2 Technical information .23
2.1 Terms and definitions .23
2.2 System of levels .25
2.3 Statistical process control.25
2.4 Assessment of outgoing non conforming values in ppm .25
2.5 Process capability .27
2.6 Definition of C and C .29
P PK
2.7 Relation between C and number of non conforming (defective) parts .31
PK
2.8 Typical minimum values for C and C .31
P PK
2.9 Implementation of statistical process control .33
3 Quality assessment procedures.33
3.1 Quality assessment definitions .33
3.2 Qualification Approval (QA) .35
3.3 Capability Approval (CA) .35
3.4 Technology Approval (TA) .37
4 Test and test schedules.37
4.1 General aspects .37
4.2 Test schedules .39
Annex A (informative) Further information and practical figures concerning process
measures indices.41
Annex B (normative) Quality assessment procedures .45
Figure 1 – Actual detail specification structure .11
Figure 2 – New documentation structure for specifications drafted in SC 48B –
Separation of product and quality assessment requirement.13
Table 1 – Typical values for non-conformance levels .27
Table 2 – Process capability cases .29
Table 3 – C -values as function of good/defective parts.31
PK
Table 4 – Typical minimum values .31
62197-1 IEC:2006 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CONNECTORS FOR ELECTRONIC EQUIPMENT–
QUALITY ASSESSMENT REQUIREMENTS –
Part 1: Generic specification
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62197-1 has been prepared by subcommittee 48B: Connectors, of
IEC technical committee 48: Electromechanical components and mechanical structures for
electronic equipment.
This standard shall be used in conjunction with IEC 61076-1:2006.
The text of this standard is based on the following documents:
FDIS Report on voting
48B/1622/FDIS 48B/1672/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
62197-1 IEC:2006 – 7 –
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
62197-1 IEC:2006 – 9 –
INTRODUCTION
The objective of this work is to update the quality assessment procedures of the connector
specifications to the current state of the art industrial procedures.
At the time of publication, all the connector detail specifications dealt with by subcommittee
48B of the IEC were built as described in Figure 1 with 5 major chapters.
The most significant out of date procedures relate to the lot-by-lot tests with different
inspection levels and acceptance quality level and to the periodic tests with permitted number
of defectives.
It was felt necessary to introduce the capability and the technology approval together with the
basic design parameters of statistical process control as a feed back system to have a
continuous control of the quality during the various steps of manufacture.
It was also felt appropriate to split the current documentation structure into two separate
structures of documents which, in the day to day use of specifications, satisfy most users, see
Figure 2.
The documentation system will be split into two parts:
• Product requirements
• Quality assessment requirements
The structure for the Product Specification contains characteristics, dimensions, performance
requirements and test schedules.
The structure for the quality assessment specification contains the requirements to obtain
Qualification Approval (QA) for a given performance level (per environment category),
Capability Approval (CA) per family of connectors or Technology Approval (TA) comprising all
relevant technologies for connector production.
Capability Approval or Technology Approval combined with statistical process control
parameters are intending to replace lot-by-lot and periodic tests.
To fully certify a product, a combination of the two structures will have to be selected by the
user, keeping in mind that in the statistical process control, key characteristics shall be
agreed between manufacturer and user.
A generic product specification with a 4 level structure consists of a generic, a sectional, a
blank detail and a detail specification.
From this, it can be concluded that two generic specifications are being circulated, one
document for the product aspects and a second one for the quality aspects.
The sectional specifications will be presented at the product level per family of connectors, for
example printed board connectors, circular connectors, rectangular connectors, etc.
62197-1 IEC:2006 – 11 –
At the quality assessment level, Annex B deals with qualification approval in B.2, capability
approval in B.3 and technology approval in B.4.
Interface
dimensions
Test schedule
(= performance
requirements) with
different performance
levels (PL)
Qualification approval
test schedule
with different
performance levels
Lot-by-lot tests
with different
assessment levels
Periodic tests
with different
assessment level
with permitted no.
of defectives
IEC 481/06
Figure 1 – Actual detail specification structure
62197-1 IEC:2006 – 13 –
Detail product Detail product Detail product
specification specification specification
IEC 61076-2-1xx IEC 61076-3-1xx IEC 61076-4-1xx
IEC 61076-2-1xy IEC 61076-3-1x y IEC 61076-4-1xy
Blank detail Blank detail Blank detail
specification specification specification
IEC 61076-2-001 IEC 61076-3-001 IEC 61076-4-001
Sectional product Sectional product Sectional product
specification specification specification
circular connectors rectangular connectors printed board connectors
IEC 61076-2 IEC 61076-3 IEC 61076-4
Connectors for electronic equipment –
Generic product specification – IEC 61076-1
Definitions and requirements for:
• characteristics
• dimensions
Product
• performance requirements
requirements
• test schedules
Quality Connectors for electronic equipment –
assessment
Quality assessment requirements –
requirements
Generic quality specification – IEC 62197-1
Definitions and requirements for:
• qualification approval
• capability approval with Statistical Process Control (SPC)
• technology approval with Statistical Process Control (SPC)
Annex B : Quality assessment procedures
Clause B.2 : Qualification approval
Clause B.3 : Capability approval
Clause B.4 : Technology approval
Blank detail Blank det ail Blank detail
specification specification specification
Circular connectors Rectangular connectors Printer bord connectors
IEC 62197-2-001 IEC 62197-3-001 IEC 62197-4-001
Detail quality Detail quality Detail quality
specification specification specification
IEC 62197-2-1xx IEC 62197-3-1xx IEC 62197-4-1xx
IEC 62197-2-1xy IEC 62197-3-1xy IEC 62197-4-1xy
IEC 482/06
NOTE Detail and blank detail specifications for the same connector will have publication numbers with identical
terminations in the 61076 and 62197 series; for instance IEC 61076-4-100 and IEC 62197-4-100 are associated
with the same connector.
Figure 2 – New documentation structure for specifications drafted in SC 48B –
Separation of product and quality assessment requirement
62197-1 IEC:2006 – 15 –
nd
The objective of this 2 Edition is to review and update the actual connector specifications
containing product and quality assessment requirements.
Today, all the connector detail specifications dealt with by Subcommittee 48B of the
International Electrotechnical Commission are prepared as described in figure 1 with 5 major
chapters.
The most significant out of date procedures relate to the lot-by-lot tests with different
inspection levels and acceptance quality level and to the periodic tests with permitted number
of defectives.
To update the document to reflect modern practices it was necessary to introduce the
capability and the technology approval together with the basic design parameters of statistical
process control as a feed back system to have a continuous quality control during various
steps of manufacture.
It was also felt appropriate to split the current documentation into two separate structures of
documents which, in the day-to-day use of specifications, satisfy most users, see illustration
in Figure 2.
This offers the user the option to acquire products with and without certification. It is obvious
that the industry needs to get separate information on dimensions, performance requirements
and basic design parameters.
The two separate documents are:
– Product requirements
– Quality assessment requirements
The Product Specification contains characteristics, dimensions, performance requirements
and test schedules. The relevant document is:
IEC 61076-1 (Ed. 2)
Connectors for electronic equipment – Product requirements –
Part 1: Generic Specification
The Quality Assessment Specification contains the requirements to obtain Qualification
Approval (QA) for a given performance level (per environment category), Capability Approval
(CA) per family of connectors or Technology Approval (TA) comprising all relevant
technologies for connector production.
Capability Approval or Technology Approval combined with statistical process control
parameters are intending to replace lot-by-lot and periodic tests. The relevant document is:
IEC 62197-1
Connectors for electronic equipment – Quality assessment requirements –
Part 1: Generic Specification
To specify a fully certified product, a combination of specifications from both structures shall
be required.
The 4 level document structure adopted by SC48B consists of a Generic, a Sectional, a Blank
Detail and Detail Specifications.
62197-1 IEC:2006 – 17 –
To maintain this 4 level structure, two Generic Specifications are being circulated, one
document for the product aspects and a second one for the quality aspects.
The Sectional Specifications will be presented at the product level per family of connectors
e.g. printed board connectors, circular connectors, rectangular connectors, etc.
At the quality assessment level Annex B of IEC 62197-1 is dealing with Qualification Approval
B.2, Capability Approval B.3 and Technology Approval B.4.
62197-1 IEC:2006 – 19 –
CONNECTORS FOR ELECTRONIC EQUIPMENT–
QUALITY ASSESSMENT REQUIREMENTS –
Part 1: Generic specification
1 General
1.1 Scope
This part of IEC 62197 establishes uniform testing requirements to support quality
assessment procedures for connectors.
This part of IEC 62197 is applicable to a family of connectors for use in electronic and
electrical equipment; connectors designed for use at radio frequencies are not covered.
1.2 General considerations relating to specifications
This generic quality specification contains, or gives reference to, the terms, definitions,
symbols, test methods and information relating to the inspection particular to connectors.
It shall be used in conjunction with relevant levels of specifications, with reference to IEC
Guide 102, if applicable.
In the event of conflict, the requirements of the Detail Quality Specification prevail.
1.2.1 Detail Quality Specifications
Quality sectional specifications are not existent and appropriate for this document structure.
In place of sectional specifications, the Quality assessment procedures as described in
Clauses B.2, B.3 and B.4 are applied.
If applicable, it shall contain a list of all test methods and sequences, severities and preferred
values for characteristics, which could be applicable to that subfamily.
The contents shall be derived from IEC 62197-1 and the detail product specification, if
appropriate.
In the event of conflict, the requirements of the detail quality specification prevail.
1.2.2 Blank detail quality specification (if applicable)
Guidance to prepare the appropriate detail quality specifications shall be given in a blank
detail quality specification, prescribing the layout to be adopted and the information to be
given, thus ensuring a uniform presentation.
Its content shall be derived from IEC 62197-1 and shall list parameters of the subject
connector subfamily and a selection of the technical criteria necessary and sufficient to
assess quality of the connector type and considered to be complete and sufficient for control
purposes
62197-1 IEC:2006 – 21 –
1.2.3 Detail Quality Specification (if applicable)
Detail Quality Specifications shall give directly, or by making reference to other normative
documents, all information necessary to describe the qualification approval parameters for a
given connector or range of connectors completely.
Their contents shall be derived from IEC 62197-1 and shall list parameters of the subject
connector subfamily and a selection of the technical criteria necessary and sufficient to
assess quality of the connector type and be considered to be complete and sufficient for
control purposes
1.3 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050(581):1978, International Electrotechnical Vocabulary (IEV) – Chapter 581: Electro-
mechanical components for electronic equipment
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 60410:1973, Sampling plans and procedures for inspection by attributes
IEC 60512 (all parts), Connectors for electronic equipment – Tests and measurements
IEC 61076-1:2006, Connectors – Product requirements – Part 1: Generic specification
IEC 62225:2001, Guidance on terms for connectors and mechanical structures in electronic
equipment
IEC Guide 102:1996, Electronic components – Specification structures for quality assessment
(Qualification approval and capability approval)
QC 001002-2: IEC Quality Assessment System for Electronic Components (IECQ) – Rules of
procedure – Part 2: Documentation
QC 001002-3: IEC Quality Assessment System for Electronic Components (IECQ) – Rules of
procedure – Part 3: Approval procedures
QC 210000: Technology Approval Schedules – Requirements under the IECQ
ISO 2859-1: Sampling procedures for inspection by attributes – Part 1: Sampling schemes
indexed by acceptance quality limit (AQL) for lot-by-lot inspection
1.4 Performance characteristics
For details about performance characteristics such as operating environment, see 1.4 of
IEC 61076-1:2006.
Characteristics
For details of electrical and mechanical characteristics, see 1.4.2 and 1.4.3 of IEC 61076-1:
2006.
Compatibility
See for details of compatibility, 1.4.5 of IEC 61076-1:2006.
62197-1 IEC:2006 – 23 –
2 Technical information
2.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050(581) and
IEC 62225, as well as the following, apply
2.1.1
process
combination of people, equipment, materials, methods and environment that work together to
produce output – a given product or a service
NOTE A key tool for managing processes is statistical process control.
2.1.2
characteristic
distinguishing feature of a process or its output on which variables or attributes data can be
collected
NOTE 1 Process characteristics are for example temperatures, cycle times.
NOTE 2 Action on the process needs to be taken to prevent the important characteristics from varying too far
from their target values.
2.1.3
target values
target values for the characteristics are the values, which result in the most productive
operation of the process and are monitored
2.1.4
control chart
graphic representation of a characteristic of a process showing plotted values of statistics
gathered from that characteristic, a central line and one or two control limits
NOTE It has two basic uses: as a judgement to determine if a process has been operating in statistical control
and to aid in maintaining statistical control.
2.1.5
range
difference between the maximum and the minimum value of a characteristic: it is a measure of
dispersion within a population of measurements
2.1.6
process capability indices
measures of the relationship between the specification limits and the process capability: initial
, C ), pre-production (P , P ) and full production stage (C , C )
(C
M MK P PK P PK
NOTE In this document only C and C capability indices are considered.
P PK
2.1.7
common causes
refers to the many sources of variation within a process that has stable and repeatable
distribution over time (for example: wear of a punching die)
NOTE If only common causes of variation are present and do not change, the output of a process is said
predictable. Process capability is determined by the variations coming from common causes.
62197-1 IEC:2006 – 25 –
2.1.8
special causes
refer to any factors causing variation that do not always act on the process. Sources of
variation are intermittent, often not predictable and unstable. When they occur, they make the
overall process distribution change (for example: change in raw material).
NOTE If special causes of variation are present, the process output is not stable over time. If detrimental, they
need to be identified and removed. If beneficial they also need to be identified and made part of the process.
2.1.9
process spread
extent to which the distribution of individual values of the process characteristic vary.
NOTE It is often shown as the process average plus or minus a number of specification deviations (denoted by
the Greek letter sigma).
2.2 System of levels
2.2.1 Performance levels
Reflects the grouping of the environmental and mechanical stresses at which a component is
tested, and also such features as long-term stability of electrical characteristics. These levels
are numbered, where the lowest number (1) usually indicates the highest performance.
2.2.2 Compatibility levels
As a function of the standardization degree, 4 levels characterize the compatibility of
connectors from different sources; reference is made to IEC 61076-1:2006, 2.2.3.2 to 2.2.3.5.
If connectors of different compatibility levels are applied, the lower level shall prevail.
2.3 Statistical process control
Continuous quality improvement and the achievement of operational and manufacturing
excellence are the essence of the total quality philosophy that all manufacturers are targeting.
One of the major vehicles for achieving the excellence objective is the application of
Statistical Process Control (SPC) techniques.
Periodic revision should be provided and the status of the SPC system should be recorded.
Statistical techniques permit to determine the critical process characteristics and their
variability and by taking action to reduce the variability (strategy of prevention instead of
defect detection).
SPC embraces a management philosophy of continuous process improvement that has a
primary focus on prevention of defects. The management shall empower personnel with
responsibility and authority, and provide sufficient resources to implement and maintain an
SPC system. It should be reviewed periodically and the status of the SPC system should be
recorded.
This subclause is only giving general outlines of the SPC techniques to be used.
2.4 Assessment of outgoing non conforming values in ppm
Improvements in manufacturing technology have resulted in a corresponding quality
improvement for components such as connectors. Consequently, average quality level in per
cent of non-conformance products needs to be replaced by the term part per million or ppm.
62197-1 IEC:2006 – 27 –
The ppm philosophy applies to estimating the average quality level of products, not to lot
acceptance plans.
Estimation of the non-conformance level in ppm for components is calculated as follows
(examples, see Table 1)
(0,7 + total number of non − conformance products)
–6
ppm = × 10
total number of products inspected
Table 1 – Typical values for non-conformance levels
PPM Number of products inspected = sample size
Number of non- 4
4 4 4
1,5 × 10 2 × 10 2,5 × 10
conformances
0 70 47 35 28
1 170 113 85 68
2 270 180 135 108
3 370 247 185 148
4 470 313 235 188
5 570 380 285 228
Example of non-conformance level:
Number of non-conformance products = 0
Total number of products inspected = 10 000
0,7 + 0
ppm = × 10 = 70 ppm
10 000
Non-conformance for ppm covers functional defects, electrical non-conformances, visual and
mechanical defects.
For example:
Electrical non-conformance: contact missing or moving into the housing
Mechanical defect: connector fitting function not possible
NOTE All equations of this Subclause contain a factor 0,7 which considers practical experience in the industry in
context with calculations of non-conformance levels in the area of electro-mechanical components; these figures
take sufficient safety aspects into account.
2.5 Process capability
Process capability is determined by the variation that comes from the common causes.
It generally represents the best performance (i.e. minimum spread) of the process itself.
Customers (users) are more typically concerned with the overall output of the process and
how it relates to their requirements (defined as specifications) irrespective of the process
variation.
Every process is subject to classification based on capability and control. A process can be
classified into 1 of 4 cases:
– The ideal situation is to have a case 1 where the process is under control and the ability to
meet requirements is acceptable.
62197-1 IEC:2006 – 29 –
– A case 2 where the process is in control but has excessive common cause variation, which
shall be reduced.
– A case 3 where ability to meet requirements is acceptable but is not under control; special
causes of variation shall be identified and acted upon.
– A case 4, the process is neither under control nor is acceptable; both common and cause
variation shall be reduced.
Table 2 – Process capability cases
Under control Not under control
P
LSL USL N
N
Acceptable
P
LSL USL
σ σ
Case 1 Case 3
P
LSL USL
E = USL – LSL
Not acceptable
N
P
LSL USL
N
σ σ
Case 2 Case 4
IEC 483/06
Definitions: σ = distribution of measuring values
USL: Upper Specification Limit
LSL: Lower Specification Limit
E: Engineering tolerance
P: Process average
N: Nominal value
2.6 Definition of C and C
P PK
Definitions of process measures indices are as follows:
C : This is the capability index, which is defined as the tolerance width divided by the
P
process spread, irrespective of process centering. Typically, this is expressed as:
C = (USL – LSL) / 6 sigma
P
C : This is the upper capability index and is defined as the upper tolerance spread divided
PU
by the actual upper process spread. Typically, this is expressed as:
C = (USL – ) / 3 sigma
X
PU
62197-1 IEC:2006 – 31 –
C : This is the lower capability index and is defined as the lower tolerance spread divided
PL
by the actual lower process spread. Typically, this is expressed as:
C = ( X – LSL) / 3 sigma
PL
C : This is the capability index which accounts for process centering and is defined as the
PK
minimum of C or C . It relates the scaled distance between the process mean and
PU PL
the closest specification limit to half the total process spread. Typically:
C = (USL – X )/ 3 sigma or ( X – LSL ) / 3 sigma (for More details. see Annex A).
PK
Definitions:
X
: mean value
further definitions see Table 2.
C shall be used only on critical characteristics.
PK
Critical characteristics shall be well identified and accepted by both customer and
manufacturer (examples, see Tables 3, 4 and Figures A.1a), A.1b), A.1c), A.1d) and A.1e).
2.7 Relation between C and number of non conforming (defective) parts
PK
Table 3 – C -values as function of good/defective parts
PK
Specification limit C Percentage of good Number of defectives:
PK
products ppm
X
±1 sigma 0 34,13 658 700
±2 sigma 0,17 69,13 308 700
±3 sigma 0,5 93,32 66 810
±4 sigma 0,83 99,379 0 6 210
±5 sigma 1,17 99,976 70 233
±6 sigma 1,5 99,999 660 3,4
NOTE Sigma is the specification deviation of the distribution of individual values of a process characteristic.
2.8 Typical minimum values for C and C
P PK
Table 4 – Typical minimum values
C < 1,00 1,00 ≤C ≤1,33 C >1,33
PK PK PK
C < 1,00 Process spread too large. X X
P
Capability not adequate.
1,00 < C < 1,33 Process spread is critical. Process spread is critical. X
P
Process shall be centered. Capability is critical.
C > 1,33 Process spread is good. Process spread is good. Process spread is good.
P
Process shall be centered. Capability can be Capability is good.
improved by centering.
NOTE For more details, see Annex A.
62197-1 IEC:2006 – 33 –
2.9 Implementation of statistical process control
Demonstrated evidence of statistical process control may be used as compliance of product
conformance in lieu of lot-by-lot inspection and periodic testing if the following conditions are
met:
• When statistical techniques are applied to in-process product and/or process
characteristics to ensure final quality, the relationship between final product requirements
(engineering specification) and in process characteristics shall be clearly defined and
documented.
• The manufacturing process has been shown to be clearly capable of producing a product
that meets specification requirements (C values meeting or exceeding 1,33). A minimum
PK
of 100 data points with the process in control should be used to demonstrate capability.
• The process exhibits a reasonable degree of statistical control i.e. at least 20 consecutive
subgroups on the control chart fail to indicate evidence of lack of control. Each subgroup
consists of 3 to 5 observations.
• Immediate action is taken to investigate and correct special causes indicated by the
control chart and this action is documented.
3 Quality assessment procedures
Essentially, the IEC Quality Assessment System for Electronic Components (IECQ–CECC) is
based on the following concept:
• A connector shall be qualified, to demonstrate that it has successfully passed a
qualification approval testing and its qualification is approved.
• The assessed quality of connectors is carried out in accordance with the relevant
specification on an inspection lot before it is released for delivery.
respectively
• The manufacturer has obtained approval, that he has the relevant manufacturing
processes for connector families or the complete technological process covering the
approval process of the connectors at his disposal.
Details are given in IEC QC 001002-2 and IEC QC 001002-3.
3.1 Quality assessment definitions
3.1.1 Primary stage of manufacture
Is the first process subsequent to the manufacture of finished piece parts and the permanent
assembly of two or more piece parts
3.1.2 Structurally similar connectors
Connectors produced by the same manufacturer with essentially the same design, material,
processes and methods. They are such that the result of a given test, carried out on one of
the connectors can be recognized as being valid for the others of the group. They are
separately identifiable.
3.1.3 Performance level
Reflects a grouping of the environmental and mechanical stresses at which a connector is
tested, and also such features as long-term stability of electrical characteristic. It is based on
four factors:
62197-1 IEC:2006 – 35 –
– climatic category;
– the test schedule;
– the severities of the test conditions (magnitude and combination of stresses);
– the end-of-test requirements.
It also permits the following differences between levels to be stated:
– further characteristics to be specified in addition to those that are mandatory;
– different (closer) tolerances on characteristics;
– different severities for environmental testing.
A variation in one or more of these factors will result in a different performance level.
3.1.4 Assessment level
Relates to the degree of assurance of the quality of the connector. It indicates the balance
between the lot-by-lot tests, and the periodic tests and also depends upon the severity of the
sampling plans.
The sample size used for the sampling plans may be fixed and, in that case, the number of
specimens to be tested, and the number of defects permitted, are defined in the relevant
quality detail specification and do not take into account the size of the lot being inspected.
Inspection levels and Acceptable Quality Levels (AQL) as well as the appropriate quantities
are prescribed in the relevant quality detail specification if applicable and/or in IEC 60410.
In principle, any combination of performance and assessment level is possible, but in
practice, only few combinations are applied.
3.2 Qualification Approval (QA)
The QA procedure is applicable to a single connector type or a connector range differing only
in minor features (for example: connectors with regular first-make-last-break contact elements
or partially loaded contact pattern).
It shall be demonstrated that each product type meets the qualification tests schedule as
defined in the relevant product detail specification. Quality is checked after manufacturing.
For details, see Clause B.2.
3.3 Capability Approval (CA)
The CA procedure is applicable to a family of connectors (for example: connector families of
one, two or more rows of contact elements, of different contact numbers, of different current
rating, but structurally identical features).
It shall be demonstrated that the manufacturer has the structure, organization and capability
of manufacturing process and control methods covering the requested connector technology
to fulfil the requirements of the relevant detail product specification.
62197-1 IEC:2006 – 37 –
Quality is checked by using capability-qualifying connectors as test vehicles. It will also
incorporate the principles and techniques of in-process control methods and the continuous
quality improvement strategy.
For details see Clause B.3.
3.4 Technology
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