ISO 18118:2024

FINAL
INTERNATIONAL ISO/FDIS
DRAFT
STANDARD 18118
ISO/TC 201/SC 7
Surface chemical analysis — Auger
Secretariat: BSI
electron spectroscopy and X-ray
Voting begins on:
2023-11-09 photoelectron spectroscopy —
Guide to the use of experimentally
Voting terminates on:
2024-01-04
determined relative sensitivity
factors for the quantitative analysis of
homogeneous materials
Analyse chimique des surfaces — Spectroscopie des électrons
Auger et spectroscopie de photoélectrons — Lignes directrices pour
l'utilisation de facteurs expérimentaux de sensibilité relative pour
l'analyse quantitative de matériaux homogènes
RECIPIENTS OF THIS DRAFT ARE INVITED TO
SUBMIT, WITH THEIR COMMENTS, NOTIFICATION
OF ANY RELEVANT PATENT RIGHTS OF WHICH
THEY ARE AWARE AND TO PROVIDE SUPPOR TING
DOCUMENTATION.
IN ADDITION TO THEIR EVALUATION AS
Reference number
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO-
ISO/FDIS 18118:2023(E)
LOGICAL, COMMERCIAL AND USER PURPOSES,
DRAFT INTERNATIONAL STANDARDS MAY ON
OCCASION HAVE TO BE CONSIDERED IN THE
LIGHT OF THEIR POTENTIAL TO BECOME STAN-
DARDS TO WHICH REFERENCE MAY BE MADE IN
NATIONAL REGULATIONS. © ISO 2023

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ISO/FDIS 18118:2023(E)
FINAL
INTERNATIONAL ISO/FDIS
DRAFT
STANDARD 18118
ISO/TC 201/SC 7
Surface chemical analysis — Auger
Secretariat: BSI
electron spectroscopy and X-ray
Voting begins on:
photoelectron spectroscopy —
Guide to the use of experimentally
Voting terminates on:
determined relative sensitivity
factors for the quantitative analysis of
homogeneous materials
Analyse chimique des surfaces — Spectroscopie des électrons
Auger et spectroscopie de photoélectrons — Lignes directrices pour
l'utilisation de facteurs expérimentaux de sensibilité relative pour
l'analyse quantitative de matériaux homogènes
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© ISO 2023
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
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or ISO’s member body in the country of the requester.
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DOCUMENTATION.
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IN ADDITION TO THEIR EVALUATION AS
Reference number
Email: copyright@iso.org
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO­
ISO/FDIS 18118:2023(E)
Website: www.iso.org
LOGICAL, COMMERCIAL AND USER PURPOSES,
DRAFT INTERNATIONAL STANDARDS MAY ON
Published in Switzerland
OCCASION HAVE TO BE CONSIDERED IN THE
LIGHT OF THEIR POTENTIAL TO BECOME STAN­
DARDS TO WHICH REFERENCE MAY BE MADE IN
ii
  © ISO 2023 – All rights reserved
NATIONAL REGULATIONS. © ISO 2023

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ISO/FDIS 18118:2023(E)
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Symbols and abbreviated terms.4
5 General information . 6
6 Measurement conditions . 7
6.1 General .
...

ISO/DISFDIS 18118: 2023(E)
ISO/TC 201/SC 7
Secretariat: BSI
2023-06-0510-26
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron
spectroscopy — Guide to the use of experimentally determined relative sensitivity
factors for the quantitative analysis of homogeneous materials
Analyse chimique des surfaces — Spectroscopie des électrons Auger et spectroscopie de
photoélectrons — Lignes directrices pour l'utilisation de facteurs expérimentaux de
sensibilité relative pour l'analyse quantitative de matériaux homogènes

---------------------- Page: 1 ----------------------
ISO/DISFDIS 18118:2023(E)
Copyright notice
This© ISO document is a Draft International Standard and is copyright-protected by ISO. Except as
permitted under 2023
All rights reserved. Unless otherwise specified, or required in the applicable lawscontext of the user's
country, neither its implementation, no part of this ISO draft nor any extract from itpublication may be
reproduced, stored in a retrieval system or transmitted or utilized otherwise in any form or by any
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ISO at the address below or ISO's member body in the country of the requester.
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Email: copyright@iso.org
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Published in Switzerland.
ii © ISO 2023 – All rights reserved

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ISO/DISFDIS 18118:2023(E)
Contents Page
Foreword . 6
Introduction . 8
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Symbols and abbreviated terms . 4
5 General information . 6
6 Measurement conditions . 7
6.1 General . 7
6.2 Excitation source . 7
6.3 Energy resolution . 7
6.4 Energy step and scan rate . 7
6.5 Signal intensity . 7
6.6 Gain and time constant (for AES instruments with analogue detection systems) . 8
6.7 Modulation to generate a derivative spectrum . 8
7 Data-analysis procedures . 8
8 Spectrometer response function . 8
9 Determination of chemical composition using relative sensitivity factors . 9
9.1 Calculation of chemical composition . 9
9.2 Uncertainties in calculated compositions . 10
Annex A (normative) Formulae for relative sensitivity factors . 11
A.1 Symbols and abbreviated terms .
...