Optics and photonics — Test methods for telescopic systems — Part 9: Test methods for field curvature

This document specifies the test method for the determination of the deviation from a flat image surface, i.e. the sagittal and tangential field curvature of telescopic systems and observational telescopic instruments.

Optique et instruments d'optique — Méthodes d'essai pour systèmes télescopiques — Partie 9: Méthodes d'essai pour la courbure de champ

General Information

Status
Published
Publication Date
17-Sep-2019
Current Stage
9020 - International Standard under periodical review
Start Date
15-Jul-2024
Completion Date
15-Jul-2024
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INTERNATIONAL ISO
STANDARD 14490-9
First edition
2019-09
Optics and photonics — Test methods
for telescopic systems —
Part 9:
Test methods for field curvature
Reference number
©
ISO 2019
© ISO 2019
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Fax: +41 22 749 09 47
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO 2019 – All rights reserved

Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Requirements . 1
4.1 General . 1
4.2 Test arrangement . 2
4.3 Preparation and carrying out of measurements . 3
4.4 Determination of results . 4
4.5 Test report . 4
Bibliography . 5
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www .iso .org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to the
World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see www .iso
.org/iso/foreword .html.
This document was prepared by Technical Committee ISO/TC 172, Optics and photonics, Subcommittee
SC 4, Telescopic systems.
A list of all parts in the ISO 14490 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www .iso .org/members .html.
iv © ISO 2019 – All rights reserved

Introduction
As mentioned in ISO 14490-7, there are several characteristics which determine image quality, besides
the limit of resolution. One unmentioned characteristic there is field curvature which can be noted
by the user as a field dependent defocus, which however could be refocused using the test specimen’s
focusing facility.
The intermediate image surface of a telescopic system (except Galilean systems) usually exhibits a
curvature instead of being a plane surface, depending on the optical characteristics of the objective
lens system. In addition, the surface can be split into two separate surfaces, the sagittal and tangential
image surfaces.
This surface, in turn, is being imaged by the eyepiece onto a virtual image surface (looked at by the user)
which also can be split into two separate surfaces. Due to the optical characteristics of the eyepiece,
the slope of the curvature of these surfaces might be different from those of the intermediate image
surfaces.
INTERNATIONAL STANDARD ISO 14490-9:2019(E)
Optics and photonics — Test methods for telescopic
systems —
Part 9:
Test methods for field curvature
1 Scope
This document specifies the test method for the determination of the deviation from a flat image
surface, i.e. the sagittal and tangential field curvature of telescopic systems and observational telescopic
instruments.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO 14132-1, Optics and photonics — Vocabulary for telescopic systems — Part 1: General terms and
alphabetical indexes of terms in ISO 14132
ISO 14490-1:2005, Optics and optical instruments — Test methods for telescopic systems — Part 1: Test
methods for basic characteristics
3 Terms and definitions
For the purposes of this document, the terms and definitions defined in ISO 14132-1 and the
following apply.
ISO and IEC maintain terminological databases for use in standardization at the following address:
— ISO Online browsing platform: available at https: //www .iso .org/obp
— IEC Electro
...


INTERNATIONAL ISO
STANDARD 14490-9
First edition
2019-09
Optics and photonics — Test methods
for telescopic systems —
Part 9:
Test methods for field curvature
Reference number
©
ISO 2019
© ISO 2019
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Fax: +41 22 749 09 47
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO 2019 – All rights reserved

Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Requirements . 1
4.1 General . 1
4.2 Test arrangement . 2
4.3 Preparation and carrying out of measurements . 3
4.4 Determination of results . 4
4.5 Test report . 4
Bibliography . 5
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www .iso .org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to the
World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see www .iso
.org/iso/foreword .html.
This document was prepared by Technical Committee ISO/TC 172, Optics and photonics, Subcommittee
SC 4, Telescopic systems.
A list of all parts in the ISO 14490 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www .iso .org/members .html.
iv © ISO 2019 – All rights reserved

Introduction
As mentioned in ISO 14490-7, there are several characteristics which determine image quality, besides
the limit of resolution. One unmentioned characteristic there is field curvature which can be noted
by the user as a field dependent defocus, which however could be refocused using the test specimen’s
focusing facility.
The intermediate image surface of a telescopic system (except Galilean systems) usually exhibits a
curvature instead of being a plane surface, depending on the optical characteristics of the objective
lens system. In addition, the surface can be split into two separate surfaces, the sagittal and tangential
image surfaces.
This surface, in turn, is being imaged by the eyepiece onto a virtual image surface (looked at by the user)
which also can be split into two separate surfaces. Due to the optical characteristics of the eyepiece,
the slope of the curvature of these surfaces might be different from those of the intermediate image
surfaces.
INTERNATIONAL STANDARD ISO 14490-9:2019(E)
Optics and photonics — Test methods for telescopic
systems —
Part 9:
Test methods for field curvature
1 Scope
This document specifies the test method for the determination of the deviation from a flat image
surface, i.e. the sagittal and tangential field curvature of telescopic systems and observational telescopic
instruments.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO 14132-1, Optics and photonics — Vocabulary for telescopic systems — Part 1: General terms and
alphabetical indexes of terms in ISO 14132
ISO 14490-1:2005, Optics and optical instruments — Test methods for telescopic systems — Part 1: Test
methods for basic characteristics
3 Terms and definitions
For the purposes of this document, the terms and definitions defined in ISO 14132-1 and the
following apply.
ISO and IEC maintain terminological databases for use in standardization at the following address:
— ISO Online browsing platform: available at https: //www .iso .org/obp
— IEC Electro
...

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