ISO 17987-7:2016

DRAFT INTERNATIONAL STANDARD
ISO/DIS 17987-7.2
ISO/TC 22/SC 31 Secretariat: DIN
Voting begins on: Voting terminates on:
2015-12-10 2016-03-10
Road vehicles — Local Interconnect Network (LIN) —
Part 7:
Electrical Physical Layer (EPL) conformance test
specification
Véhicules routiers — Réseau Internet local (LIN) —
Partie 7: Spécification d’essai de conformité de la couche électrique physique (EPL)
ICS: 43.040.15
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ISO/DIS 17987-7.2:2015(E)
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NOTIFICATION OF ANY RELEVANT PATENT
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PROVIDE SUPPORTING DOCUMENTATION. ISO 2015

ISO/DIS 17987-7.2:2015(E)
© ISO 2015, Published in Switzerland
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ii © ISO 2015 – All rights reserved

ISO/DIS 17987-7
Contents Page
Foreword . iv
Introduction . v
1 Scope . 1
2 Normative references . 1
3 Terms, definitions, symbols and abbreviated terms . 1
3.1 Terms and definitions . 1
3.2 Symbols . 2
3.3 Abbreviated terms . 5
4 Conventions . 6
5 Document overview . 7
6 LIN devices with RX and TX access . 8
6.1 Test specification overview . 8
6.2 Operational conditions – Calibration . 9
6.3 Static test cases . 32
7 LIN devices without RX and TX access . 36
7.1 Test specification overview . 36
7.2 Communication scheme . 36
7.3 Test case organisation . 40
7.4 Measurement and signal generation – Requirements . 40
7.5 Operational conditions – Calibration . 43
7.6 Operation mode termination . 86
7.7 Static test cases . 88
8 EPL 24V LIN devices with RX and TX access . 92
8.1 Test specification overview . 92
8.2 Operational conditions – Calibration . 93
8.3 Static test cases . 120
9 EPL 24 V LIN devices without RX and TX access . 124
9.1 Test specification overview . 124
9.2 Communication scheme . 124
9.3 Test case organisation . 128
9.4 Measurement and signal generation – Requirements . 128
9.5 Operational conditions – Calibration . 131
9.6 Static test cases . 178
Bibliography . 182
Bibliography . 183

ISO/DIS 17987-7
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies
(ISO member bodies). The work of preparing International Standards is normally carried out through ISO
technical committees. Each member body interested in a subject for which a technical committee has been
established has the right to be represented on that committee. International organizations, governmental and
non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the
International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of technical committees is to prepare International Standards. Draft International Standards
adopted by the technical committees are circulated to the member bodies for voting. Publication as an
International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO shall not be held responsible for identifying any or all such patent rights.
ISO 17987-7 was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee SC 3,
Electrical and electronic equipment.
ISO 17987 consists of the following parts, under the general title Road vehicles — Local interconnect network
(LIN):
 Part 1: General information and use case definition
 Part 2: Transport protocol and network layer services
 Part 3: Protocol specification
 Part 4: Electrical Physical Layer (EPL) specification 12 V / 24 V
 Part 5: Application Programmers Interface (API)
 Part 6: Protocol conformance test specification
 Part 7: Electrical Physical Layer (EPL) conformance test specification
iv © ISO 2013 – All rights reserved

ISO/DIS 17987-7
Introduction
This document set specifies the use cases, the communication protocol and physical layer requirements of an
in-vehicle communication network called "Local Interconnect Network (LIN)".
The Local interconnect network (LIN) protocol as proposed is an automotive focused low speed UART-based
network (Universal Asynchronous Receiver Transmitter). Some of the key characteristics of the LIN protocol
are signal based communication, schedule table based frame transfer, master/slave communication with error
detection, node configuration and diagnostic service transportation.
The LIN protocol is for low cost automotive control applications, for example door module and air condition
systems. It serves as a communication infrastructure for low-speed control applications in vehicles by
providing:
 Signal based communication to exchange information between applications in different nodes;
 Bitrate support from 1 kbps to 20 kbps;
 Deterministic schedule table based frame communication;
 Network management that wakes up and puts the LIN cluster into sleep mode in a controlled manner;
 Status management that provides error handling and error signalling;
 Transport layer that allows large amount of data to be transported (such as diagnostic services);
 Specification of how to handle diagnostic services;
 Electrical physical layer specifications;
 Node description language describing properties of slave nodes;
 Network description file describing behaviour of communication;
 Application programmer's interface;
To achieve this, it is based on the Open Systems Interconnection (OSI) Basic Reference Model specified in
ISO/IEC 7498-1 and ISO/IEC 10731, which structures communication systems into seven layers. When
mapped on this model, the protocol and physical layer requirements specified by ISO 17987 are structured
according to Table°1.
ISO/DIS 17987-7
Table°1°—°LIN specifications applicable to the OSI layers
Vehicle manufacturer enhanced
Applicability OSI seven layer LIN
diagnostics
Application (layer 7) ISO 17987-1, ISO 17987-5 ISO°14229-1, ISO°14229-7
Presentation (layer 6) ISO 17987-5 vehicle manufacturer specific
Session (layer 5) ISO 17987-3 ISO°14229-2
Seven layer according
to ISO°7498-1 and Transport (layer 4)
ISO 17987-2
ISO/IEC 10731
Network (layer 3)
Data link (layer 2) ISO 17987-3, ISO 17987-6
Physical (layer 1) ISO 17987-4, ISO 17987-7

ISO 17987 Parts 2, 3, 4, 6 and 7 being the common standards for the OSI layers 1 through 3 for LIN and the
vehicle manufacturer enhanced diagnostics.
The vehicle manufacturer enhanced diagnostics column shows application layer services covered by
ISO 14229-7 which have been defined in compliance with diagnostic services established in ISO 14229-1, but
are not limited to use only with them. ISO 14229-7 is also compatible with most diagnostic services defined in
national standards or vehicle manufacturer's specifications. The presentation layer is defined vehicle
manufacturer specific. The session layer services are covered by ISO 14229-2. The transport protocol and
network layer services are specified in ISO 17987-2.

vi © ISO 2013 – All rights reserved

DRAFT INTERNATIONAL STANDARD ISO/DIS 17987-7

Road vehicles — Local interconnect network (LIN) — Part 7:
Electrical Physical Layer (EPL) conformance test specification
1 Scope
This part of ISO 17987 specifies the conformance test for the electrical physical layer of the LIN
communications system.
It is part of this document to define a test that considers ISO 9646 and ISO 17987-4.
The purpose of this document is to provide a standardized way to verify whether a LIN bus driver is compliant
to ISO 17987-4. The primary motivation is to ensure a level of interoperability of LIN bus drivers from different
sources in a system environment.
This document shall provide all necessary technical information to ensure that test results will be identical
even on different test systems, provided that the particular test suite and the test system are compliant to the
content of this document.
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
ISO 17987-1, Road vehicles – Local interconnect network (LIN) – Part 1: General information and use case
definition
ISO 17987-2, Road vehicles – Local interconnect network (LIN) – Part 2: Transport protocol and network layer
services
ISO 17987-3, Road vehicles – Local interconnect network (LIN) – Part 3: Protocol specification
ISO 17987-4, Road vehicles – Local interconnect network (LIN) – Part 4: Electrical Physical Layer (EPL)
specification 12V/24V
ISO 17987-5, Road vehicles – Local interconnect network (LIN) – Part 5: Application Programmers Interface
(API)
ISO 17987-6, Road vehicles – Local interconnect network (LIN) – Part 6: Protocol conformance test
specification
3 Terms, definitions, symbols and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the terms and definition defined in ISO 17987-4 apply.
ISO/DIS 17987-7
3.2 Symbols
% percentage
µs microsecond
C1/2 capacitance
C capacitance in the communication line
COMMON
C` line capacitance
LINE
C total bus capacitance
BUS
C capacitance of master node
MASTER
C reference capacitance
REF
C RXD capacitance (LIN receiver, RXD capacitive load condition)
RXD
C capacitance of slave node
SLAVE
∈ mathematical symbol: replacement for “is an element of”
d²V/dt² second derivative of Voltage (Volt² per second²)
di/dt instantaneous rate of current change (amps per second)
D1/2 diode
D serial internal diode at Transceiver IC
ser_int
D serial master diode
ser_master
F master bit rate tolerances of resonator relative to nominal bitrate in class A systems
TOL_RES_MSTR_A
F master bit rate tolerances of resonator relative to nominal bitrate in class B systems
TOL_RES_MSTR_B
F slave bit rate tolerances of resonator relative to nominal bitrate in class A systems
TOL_RES_SLV_A
F slave bit rate tolerances of resonator relative to nominal bitrate in class B systems
TOL_RES_SLV_B
F slave node bit rate tolerance relative to master node bit rate after synchronization in
TOL_SYNCH_A
class A systems
F slave node bit rate tolerance relative to master node bit rate after synchronization in
TOL_SYNCH_B
class B systems
F slave node bit rate tolerance relative to nominal bit rate before synchronization in class A
TOL_UNSYNCH_A
systems
F slave node bit rate tolerance relative to nominal bit rate before synchronization in class B
TOL_UNSYNCH_B
systems
I current into the ECU bus line
BUS
ISO/DIS 17987-7
I current limitation for driver dominant state driver on V = V into ECU bus line
BUS_LIM BUS BAT_max
I current at ECU bus line when V is disconnected
BUS_NO_BAT BAT
I current at ECU bus line when V is disconnected
BUS_NO_GND GND_ECU
I current at ECU bus line when driver off (passive) at dominant LIN-bus-level
BUS_PAS_dom
(V = 0 V and V = 12 V)
BUS BAT
I current at ECU bus line when driver off (passive) at recessive LIN-bus-level
BUS_PAS_rec
(8 V < V < 18 V; 8 V < V < 18 V; V ≥ V
BAT BUS BUS BAT
GND GND of ECU
Device
kΩ kilo ohm
kBit/s kilo bit per second
LEN total length of bus line
BUS
LIN LIN network
Bus
ms millisecond
nF nano farad
pF pico farad
pF/m pico farad per meter (line capacitance)
R1/2 resistor
R resistor in the communication line
COMMON
R total bus-resistor including all slave and master resistors
BUS
R = R || R || R || . || R
BUS Master Slave1 Slave2 SlaveN
R reference resistor
REF
R master resistor
master
R pull-up resistor
pull_up
R slave resistor
slave
t byte field synchronization time
BFS
t basic bit times
BIT
t earliest bit sample time
EBS
t propagation delay of receiver
rx_pd
t symmetry of receiver propagation delay rsising edgepropagation delay of receiver
rx_sym
t latest bit sample time
LBS
ISO/DIS 17987-7
t propagation delay time of receiving node 1 at falling (recessive to dominant ) LIN bus
rx_pdf(1)
edge
t propagation delay time of receiving node 2 at falling (recessive to dominant ) LIN bus
rx_pdf(2)
edge
t propagation delay time of receiving node 1 at rising (dominant to recessive) LIN bus
rx_pdr(1)
edge
t propagation delay time of receiving node 2 at rising (dominant to recessive) LIN bus
rx_pdr(2)
edge
t sample window repetition time
SR
TH maximum dominant threshold of receiving node (Volt)
Dom(max)
TH minimum dominant threshold of receiving node (Volt)
Dom(min)
TH maximum recessive threshold of receiving node (Volt)
Rec(max)
TH minimum recessive threshold of receiving node (Volt)
Rec(min)
V voltage
V voltage at the anode of the diode
ANODE
V voltage across the ECU supply connectors
BAT
V voltage across the vehicle battery connectors
BATTERY
V battery shift
BS1/2
V voltage on the LIN bus
BUS
V center point of receiver threshold
BUS_CNT
V receiver dominant voltage
BUS_dom
V receiver recessive voltage
BUS_rec
V voltage at the cathode of the diode
CATHODE
V positive power supply voltage (e.g. 5 V)
CC1/2
V voltage at diode between anode and cathode
D1/2
V dominant voltage
Dom
V ground shift
GND1/2
V battery ground voltage
GND_BATTERY
V voltage on the local ECU ground connector with respect to vehicle battery ground
GND_ECU
connector (V )
GND_BATTERY
V receiver hysteresis voltage
HYS
ISO/DIS 17987-7
V voltage at IUT supply pins
IUT
V voltage at remote power supply no.1/no.2
PS1/2
V recessive voltage
Rec
V
SerDiode
voltage drop at the serial diodes
V battery shift
Shift_BAT
V difference between battery shift and GND shift
Shift_Difference
V GND shift
Shift_GND
V voltage at transceiver supply pins
SUP
V voltage at ECU supply pins
SUP_Device
V voltage which the device is not destroyed; no guarantee of correct operation
SUP_NON_OP
V receiver threshold voltage of the recessive to dominant LIN bus edge
th_dom
V receiver threshold voltage of the dominant to recessive LIN bus edge
th_rec
ΔF/F deviation from nominal bit rate
Nom
τ time constant
Ω ohm
3.3 Abbreviated terms
AC alternate current
API application programmers interface
ASIC application specific integrated circuit
BFS byte field synchronization
DC direct current
EBS earliest bit sample
EMC electromagnetic compatibility
EMI electromagnetic interference
EPL electrical physical layer
ESD electrostatic discharge
GND ground
ISO/DIS 17987-7
IUT implementation under test
LBS latest bit sample
Max maximum
Min minimum
no. number
OSI open systems interconnection
PDU protocol data unit
RC RC time constant τ (τ = C * R )
BUS BUS
RX RX pin of the transceiver
RXD receive data
SBC system basis chip
SR sample window repetition
TRX transceiver
TX TX pin of the transceiver
TXD transmit data
Typ typical
UART universal asynchronous receiver transmitter

4 Conventions
ISO 17987 and ISO 14229-7 [5] are based on the conventions specified in the OSI Service Conventions
(ISO/IEC°10731) [2] as they apply for physical layer, protocol, network & transport protocol and diagnostic
services.
ISO/DIS 17987-7
5 Document overview
Figure°1 illustrates the document reference according to OSI model.

ISO 17987-1
LIN - General
information and
use case definition
Enhanced Diagnostics
LIN
ISO 17987-5
ISO 14229-1 UDS
LIN – Application
ISO 14229-7
Specification and subset
OSI Layer 7
Programmers
UDSonLIN
requirements
Application
Interface (API)
ISO 17987-5
Vehicle
LIN – Application
manufacturer
OSI Layer 6
Programmers
specific
Presentation
Interface (API)
ISO 17987-3
ISO 14229-2 UDS ISO 14229-2 UDS
1 : 1 Session layer LIN – Protocol
Session layer
OSI Layer 5
specification
services services
Session
Standardized Service Primitive Interface
Local interconnect network (LIN)
OSI Layer 4
Transport
ISO 17987-2
LIN –
Transport protocol and network layer services
OSI Layer 3
Network
ISO 17987-6
ISO 17987-3
LIN – Protocol
LIN – Protocol
OSI Layer 2
conformance test
specification
Data Link
specification
ISO 17987-4 ISO 17987-7
LIN – Electrical LIN – Electrical
Physical Layer (EPL) Physical Layer (EPL)
OSI Layer 1
specification conformance test
Physical
12V/24V specification
Figure°1°— LIN document reference according to OSI model
ISO/DIS 17987-7
6 LIN devices with RX and TX access
6.1 Test specification overview
6.1.1 Test case organisation
The intention of each test case is described at first, with a short textual explanation. Before tests are executed
the test system shall be set to its initial state as described in 6.2.
The test procedure and the expected results are described in the form of a chart for each test case. The table
below is a typical test description.
Table 2 defines the test case organisation.
Table 2 — Test case organisation
IUT node as Test for master, slave or both Corresponding test number TC x, TC y, where x, y are the test
case number
Initial State Parameters:
Number of nodes number of node in the test implementation
Bus loads in order to simulate a LIN network
Operational conditions:
-
IUT mode Operation mode for the IUT (e.g. normal mode, low power mode, .).
TX signal State of TX pin at the beginning of the test.
RX signal Logical output voltages of the Rx pin corresponding to
recessive/dominant level at the LIN pin are taken from the data
sheet of the IUT.
V , V , V V , V , V Value in Volt
BAT SUP IUT, CC PS1/2 BUS
Failure In order to set failure at
GND Shift Value in Volt
Test steps Describe the test stages.
Response Describe the result expected in order to decide if the test passed or failed.
Reference Corresponding number in ISO 17987-4.

NOTE IUT can be a master or slave ECU or an individual transceiver chip. The RX, TX and V signals shall be
SUP
accessible for proper test execution. It is recommended to test with RX/TX access, if not possible testing according the
specification without RX/TX access (see 7) is accepted. Depending on the type of IUT the supply voltage is V for ECU
BAT
or V for a chip – called V in this description.
SUP IUT
6.1.2 Measurement and signal generation – Requirements
Table 3 defines the measurement and signal generation – Requirements.
ISO/DIS 17987-7
Table 3 — Measurement and signal generation - Requirements
Signal Generation:
Rise / Fall Time < 20 ns (Square Wave)
< 40 ns (Triangle)
Frequency 20 ppm
Jitter < 25 ns
Signal Measurement: Dynamic Signals: Oscilloscope 100 MHz Rise Time ≤ 3,5ns
Static Signals: DC Voltage 0,5 %
DC Current 0,6 %
Resistance 0,5 %
Power Supply Resolution 10 mV / 1 mA
(V , V , V , V ,
BAT SUP IUT CC
Accuracy 0,2 % of value
V V )
PS1/2, BUS
6.2 Operational conditions – Calibration
6.2.1 Electrical input/output, LIN protocol
The initial configuration for each test case is defined here. Any requirements for individual tests are specified
with the test case.
Table 4 defines the initial state of electrical input/output.
Table 4 — Initial state of electrical input/output
Initial State Parameters
-
Number of nodes 1
Bus loads -
Operational conditions -
IUT mode set to normal / active mode
TX signal recessive
V , V , V V , V , V specified for each test
BAT SUP IUT, CC PS1/2 BUS
Failure no failure
GND shift 0 V
6.2.2 [EPL-CT 1] Operating voltage range
This test shall ensure the correct operation in the valid supply voltage ranges, by correct reception of
dominant bits. The IUT is therefore supplied with an increasing/decreasing voltage ramp.
Figure 2 shows the test configuration of the test system 'Operating voltage range with RX and TX access'.

ISO/DIS 17987-7
Remote-Controlled
Power Supply
V
PS
V : [V / V ]
IUT SUP BAT
Implementation
Under Test
RX Pulse Generator
LIN
TX
GND
Measurement
Figure 2 — Test system: Operating voltage range with RX and TX access

Table 5 defines the test system 'Operating voltage range with RX and TX access'.
Table 5 — Test system: Operating voltage range with RX and TX access
IUT node as Master and slave ECU [EPL-CT 1].1, [EPL-CT 1].2
Transceiver
Initial State Operational conditions -
V : [V / V ] Table 6
IUT SUP BAT
Test Steps A voltage ramp is set on the V / V as defined on Table 6. The LIN signal is driven with a 10 kHz
SUP BAT
rectangular signal with a duty cycle of 50 % and a voltage swing of 18 V. The IUT shall be in operational
/ active mode
Response The RX pin of the IUT has to show the 10 kHz signal. A maximum deviation of 10 % (time, voltage) is
allowed (see Figure 3).
Reference
ISO 17987-4 (see Table 7 'Electrical DC parameters' Param 9, Param 10).

Figure 3 shows the RX response of the test system 'Operating voltage range'.
trigger point
delta t = +/- 5 µs (t = 50 µs)
BIT
2 * t = 100 µs (20 kBaud)
BIT
Figure 3 — RX response of test system: Operating voltage range

ISO/DIS 17987-7
Table 6 defines the test cases for 'Operating voltage ramp'.
Table 6 — Test cases: Operating voltage ramp
EPL-CT-TC V range: [V range / V range] Signal ramp
IUT SUP BAT
[EPL-CT 1].1 [7,0 V…18 V] / [8,0 V…18 V] 0,1 V/s
[EPL-CT 1].2 [18 V…7,0 V] / [18 V…8,0 V] 0,1 V/s

6.2.3 Threshold voltages
6.2.3.1 General
This group of tests checks whether the receiver threshold voltages of the IUT are implemented correctly within
the entire specified operating supply voltage range. The LIN bus voltage is driven with a voltage ramp
checking the entire dominant and recessive signal area with respect to the applied supply voltage. In 6.2.3.2
and 6.2.3.3 the signal has to stay continuously on recessive or dominant level depending on the test case. In
6.2.3.4 the RX output transition is detected. Figure 4 shows the triangle signal on the LIN bus.

A
period T=1/f
amplitude
(signal range)
t
frequency f=20 Hz
symmetry: 50%
Figure 4 — Triangle signal on the LIN bus

6.2.3.2 [EPL-CT 2] IUT as receiver: V @ V (down)
SUP BUS_dom
Figure 5 shows the test configuration of the test system 'IUT as receiver V @ V (down)'.
SUP BUS_dom
ISO/DIS 17987-7
Remote Controlled
Power Supply
V
PS
V : [V ]
IUT SUP
Implementation
Under Test
RX
Pulse Generator
LIN
TX
GND
Measurement
Figure 5 — Test system: IUT as receiver V @ V (down)
SUP BUS_dom
Table 7 defines the test system 'IUT as receiver V @ V (down)'.
SUP BUS_dom
Table 7 — Test system: IUT as receiver V @ V (down)
SUP BUS_dom
IUT node as Transceiver [EPL-CT 2].1, [EPL-CT 2].2, [EPL-CT 2].3
Initial State Operational conditions -
V : [V ] Table 8
IUT SUP
Test Steps A triangle signal with f=20 Hz and symmetry of 50 % is set on the LIN Bus (see Figure 4).
Response The IUT shall generate a dominant or recessive value on RX as defined on Table 8 during the falling
slope of the triangle signal.
Reference ISO 17987-4 (see Table 7 'Electrical DC parameters' Param 17, Param 18 and signal specification, see
6.3.3 Figure 5).
Table 8 defines the test cases for the falling slope of the triangle signal on the LIN bus.
Table 8 — Test cases: Falling slope of the triangle signal on the LIN bus
EPL-CT-TC V : [V ] Signal range Expected RX signal
IUT SUP
[18 V…4,2 V] recessive
[EPL-CT 2].1
7 V
[2,8 V…-1,05 V] dominant
[18 V…7,8 V] recessive
[EPL-CT 2].2
13 V
[5,2 V…-2,1 V] dominant
[20,7 V…10,8 V] recessive
[EPL-CT 2].3 18 V
[7,2 V…-2,7 V] dominant
ISO/DIS 17987-7
6.2.3.3 [EPL-CT 3] IUT as receiver: V @V (up)
SUP BUS_ rec
Figure 6 shows the test configuration of the test system 'IUT as receiver V @ V (up)'.
SUP BUS_ rec
Remote Controlled
Power Supply
V
PS
V : [V ]
IUT SUP
Implementation
Under Test
RX Pulse Generator
LIN
TX
GND
Measurement
Figure 6 — Test system: IUT as receiver V @ V (up)
SUP BUS_ rec
Table 9 defines the test system 'IUT as receiver V @V (up)'.
SUP BUS_ rec
Table 9 — Test system: IUT as receiver V @V (up)
SUP BUS_ rec
IUT node as
Transceiver [EPL-CT 3].1, [EPL-CT 3].2, [EPL-CT 3].3
Initial State Operational conditions -
V : [V ] Table 10
IUT SUP
Test Steps A triangle signal with f=20 Hz and symmetry of 50 % is set on the LIN Bus (see Figure 4).
Response
The IUT shall generate a dominant or recessive value on RX as defined on Table 10 during the rising
slope of the triangle signal.
Reference ISO 17987-4 (see Table 7 'Electrical DC parameters' Param 17, Param 18 and signal specification, see
6.3.3 Figure 5).
Table 10 defines the test cases for the rising slope of the triangle signal on the LIN bus.
ISO/DIS 17987-7
Table 10 — Test cases: Rising slope of the triangle signal on the LIN bus
EPL-CT-TC V : [V ] Signal range Expected RX signal
IUT SUP
[-1,05 V…2,8 V] dominant
[EPL-CT 3].1 7 V
[4,2 V…18 V] recessive
[-2,1 V…5,2 V] dominant
[EPL-CT 3].2
13 V
[7,8 V…18 V] recessive
[-2,7 V…7,2 V] dominant
[EPL-CT 3].3 18 V
[10,8 V…20,7 V] recessive
6.2.3.4 [EPL-CT 4] IUT as receiver: V @V
SUP BUS
This test shall verify the symmetry of the receiver thresholds. For this purpose a voltage ramp on V shows
BUS
the required threshold values.
Figure 7 shows the test configuration of the test system 'IUT as receiver V @ V '.
SUP BUS
Remote Controlled
Power Supply
V
PS
V : [V ]
IUT SUP
Implementation
Under Test
RX Pulse Generator
LIN
TX
GND
Measurement
Figure 7 — Test system: IUT as receiver V @ V
SUP BUS
Table 11 defines the test system 'IUT as receiver V @ V .
SUP BUS'
ISO/DIS 17987-7
Table 11 — Test system: IUT as receiver V @ V
SUP BUS
IUT node as
Transceiver [EPL-CT 4].1, [EPL-CT 4].2, [EPL-CT 4].3
Initial State Operational conditions

V : [V ] Table 12
IUT SUP
Test Steps
A triangle signal with f=20 Hz and symmetry of 50 % is set on the LIN Bus (see Figure 4).
Response
The RX output of the IUT shall switch from dominant to recessive when the LIN bus voltage ramps
up and it shall switch from recessive to dominant when the LIN bus voltage ramps down.
The RX output transition shall meet the following conditions:
V = (V +V )/2 in the range of [0,475.0,525]*V
BUS_CNT th_dom th_rec SUP
V = V -V shall be less than 0,175*V
HYS th_rec th_dom SUP
Reference
ISO 17987-4 (see Table 7 'Electrical DC parameters' Param 19, Param 20).

Table 12 defines the test cases for ' IUT as receiver V @V '.
SUP BUS
Table 12 — Test cases: IUT as receiver V @V
SUP BUS
EPL-CT-TC V : [V ] Signal range
IUT SUP
[-1,05 V.8,05 V] up
[EPL-CT 4].1 7 V
[8,05 V.-1,05 V] down
[-2,1 V.16,1 V] up
[EPL-CT 4].2 14 V
[16,1 V.-2,1 V] down
[-2,7 V.20,7 V] up
[EPL-CT 4].3 18 V
[20,7 V.-2,7 V] down
6.2.4 [EPL-CT 5] Variation of V
SUP_NON_OP
Within this test it shall be checked, whether the IUT influences the bus during under voltage and over voltage
conditions.
Figure 8 shows the test configuration of the test system 'Variation of V .
SUP_NON_OP'
Remote Controlled Remote Controlled
Power Supply 1 Power Supply 2
V
V PS2
PS1
D
VIUT: [VSUP / VBAT]
R
Implementation
Under Test
RX
LIN
TX
GND
Measurement
Figure 8 — Test system: Variation of V
SUP_NON_OP
ISO/DIS 17987-7
Table 13 defines the test system 'Variation of V .
SUP_NON_OP'
Table 13 — Test system: Variation of V
SUP_NON_OP
IUT node as Master ECU [EPL-CT 5].1
Slave ECU [EPL-CT 5].2
Transceiver [EPL-CT 5].3
Initial State Operational conditions -
V : [V / V ] V Signal with a 1 V/s ramp in the range see Table 14
IUT SUP BAT IUT
VIUT; VPS2 See Table 14
Bus load See Table 14
Test Steps A voltage ramp (up and down) is set on V . The stimulus stays for t=30 s at V =40 V. The TX
IUT1 IUT1
signal has to be left open, if an internal pull-up is provided or applied with a recessive level.
Response
No dominant state on LIN shall occur.
The IUT shall not be destroyed during the test.
The afterward recessive voltage shall have a maximum deviation of ±5 % from the before
recessive voltage.
Reference ISO 17987-4 (see Table 7 'Electrical DC parameters' Param 11).

Table 14 defines the test cases 'Variation of V '.
SUP_NON_OP
Table 14 — Test cases: Variation of V
SUP_NON_OP
EPL-CT-TC V range: [V range / V range] V Bus load
IUT SUP BAT PS2
[EPL-CT 5].1 [-0,3 V…8 V], [18 V…40 V] 18 V 60 k + diode (1N4148)
[EPL-CT 5].2 [-0,3 V…8 V], [18 V…40 V] 18 V 1,1 k + diode (1N4148)
[EPL-CT 5].3 [-0,3 V…7 V], [18 V…40 V] 18 V 1,1 k + diode (1N4148)

6.2.5 I under several conditions
BUS
6.2.5.1 [EPL-CT 6] I @ dominant state (driver on)
BUS_LIM
This test checks the drive capability of the output stage. A LIN driver has to pull the LIN bus below a certain
voltage according to the LIN standard. The current limitation is measured indirectly.
Figure 9 shows the test configuration of the test system 'I @ dominant state (driver on)'.
BUS_LIM
ISO/DIS 17987-7
Remote Controlled
Power Supply
V
PS
V : [V / V ]
IUT SUP BAT
Implementation
I R
BUS MEAS
Under Test
RX
LIN
Pulse Generator
TX
GND
Measurement
Figure 9 — Test system: I @ dominant state (driver on)
BUS_LIM
Table 15 defines the test system 'I @ dominant state (driver on)'.
BUS_LIM
Table 15 — Test system: I @ dominant state (driver on)
BUS_LIM
IUT node as
Master ECU [EPL-CT 6].1
Slave ECU
Transceiver
Initial State Operational conditions
-
V : [V / V ] See Table 16
IUT SUP BAT
R
MEAS
Test Steps The LIN pin is connected via R to VIUT. The TX signal is driven with a rectangular signal
MEAS
(T=10 ms) with a duty cycle of 50 %.
Response
LIN has to show the rectangular Signal.
The dominant state bus level has to be lower than TH_DOM = 0,251 * V = 4,518 V for
IUT
transceiver.
The dominant state bus level has to be lower than TH_DOM = 0,251 * (V – 1 V) = 4,267 V for
IUT
ECU’s.
Reference ISO 17987-4 (see Table 7 'Electrical DC parameters' Param 12).

Table 16 defines the test cases ' I @ dominant state (driver on)'
BUS_LIM
Table 16 — Test cases: I @ dominant state (driver on)
BUS_LIM
EPL-CT-TC V : [V / V ] R
IUT SUP BAT MEAS
[EPL-CT 6].1 18 V 440 Ω (0,1 %)

6.2.5.2 [EPL-CT 7] I : IUT in recessive state: V = 0 V
BUS_PAS_dom BUS
This test case is intended to test the input Leakage Current IBUS_PAS_dom into a node during dominant
state of the LIN bus.
ISO/DIS 17987-7
Figure 10 shows the test configuration of the test system 'I IUT in recessive state V = 0 V'.
BUS_PAS_dom BUS
Remote Controlled
Power Supply
V
PS
V : [V / V ]
IUT SUP BAT
Implementation
R
MEAS
I
BUS
Under Test
RX
LIN
TX
GND
Measurement
Figure 10 — Test system: I IUT in recessive state V = 0 V
BUS_PAS_dom BUS
Table 17 defines the test system 'I IUT in recessive state V = 0 V'.
BUS_PAS_dom BUS
Table 17 — Test system: I IUT in recessive state V = 0 V
BUS_PAS_dom BUS
IUT node as
Slave ECU [EPL-CT 7].1
Transceiver
Initial State Operational conditions -
V : [V / V ] See Table 18
IUT SUP BAT
R
MEAS
Test Steps
The TX signal is set recessive.
Response
The maximum value of voltage drop shall be higher than -500 mV.
Reference ISO 17987-4 (see Table 7 'Electrical DC parameters' Param 13).

Table 18 defines the test cases 'I IUT in recessive state V = 0 V'.
BUS_PAS_dom BUS
Table 18 — Test cases: I IUT in recessive state V = 0 V
BUS_PAS_dom BUS
EPL-CT-TC V : [V / V ] R
IUT SUP BAT MEAS
[EPL-CT 7].1 12 V 499 Ω (0,1 %)

6.2.5.3 [EPL-CT 8] I : IUT in recessive state: V = 7,0 V with variation of V ∈
BUS_PAS_rec SUP BUS
[8,0 V.18 V]
The [EPL-CT 8].1 is checking, whether there is a diode implementation within the termination path of the IUT.
The reverse current should be limited to I from the LIN wire into the IUT even if V is higher
BUS_PAS_rec (Max) BUS
than the IUTs supply voltage V .
IUT
ISO/DIS 17987-7
Figure 11 shows the test configuration of the test system 'I IUT in recessive state'.
BUS_PAS_rec
Remote Controlled Remote Controlled
Power Supply 1 Power Supply 2
V V
PS1 PS2
V : [V / V ]
IUT SUP BAT
Implementation
R
I MEAS
BUS
Under Test
RX
LIN
TX
GND
Measurement
Figure 11 — Test system: I IUT in recessive state
BUS_PAS_rec
Table 19 defines the test system 'I IUT in recessive state'.
BUS_PAS_rec
Table 19 — Test system: I IUT in recessive state
BUS_PAS_rec
IUT node as Master ECU [EPL-CT 8].1
Slave ECU
Transceiver
Initial State Operational conditions -
V : [V / V ] See Table 20
IUT SUP BAT
R
MEAS
Test Steps V = Signal with a 2 V/s ramp in the range [8 V.18 V] up and down.
PS2
The TX signal is set recessive.
Response The maximum value of voltage drop shall be less or equal 20 mV.
Reference ISO 17987-4 (see Table 7 'Electrical DC parameters' Param 14).

Table 20 defines the test cases: I IUT in recessive state'.
BUS_PAS_rec
Table 20 — Test cases: I IUT in recessive state
BUS_PAS_rec
EPL-CT-TC V : [V / V ] R
IUT SUP BAT MEAS
[EPL-CT 8].1 7,0 V / 8,0 V 1 000 Ω (0,1 %)

ISO/DIS 17987-7
6.2.6 Slope control
6.2.6.1 Purpose
Purpose of this test is checking the duty cycle of the driver stage.
6.2.6.2 [EPL-CT 9] Measuring the duty cycle @ 10,4 kbit / s – IUT as transmitter
Figure 12 shows the test configuration of the test system 'Slope control'.

Remote Controlled Remote Controlled
Power Supply 1 Power Supply 2
V V
PS1 PS2
V : [V / V ] R
IUT SUP BAT BUS
Implementation
Under Test
RX LIN
Pulse Generator
C
BUS
TX
GND
Measurement
Figure 12 — Test system: Slope control

Table 21 defines the test system 'Slope control'.
Table 21 — Test system: Slope control
IUT node as Master / Slave ECU [EPL-CT 9].1 . [EPL-CT 9].18
Transceiver
Initial State Operational conditions
-
Bus loads See Table 22
V : [V / V ] See Table 22
IUT SUP BAT
V See Table 22
PS2
Test Steps
TXD is driven with a rectangular signal (T=192 µs) with a duty cycle of 50 %.
TXD slope time < 500 ns, 100 % voltage swing.
Response The measured duty cycle D3 shall be greater or equal than 0,417 for V = [7,0 V.18 V], the
SUP
measured duty cycle D4 shall be less or equal than 0,590 for V = [7,6 V.18 V]. If V is not
SUP SUP
accessible then V – 0,7 V has to be used for calculation of the duty cycle.
BAT
Reference ISO 17987-4 (see Table 9 'Driver electrical AC Parameters' Param 29, Param 30) and Figure 6
'Definition of bus timing parameters 12 V').

ISO/DIS 17987-7
Table 22 defines the test cases 'Slope control'.
Table 22 — Test cases: Slope control
EPL-CT-TC V : [V / V ] V Bus loads Duty cycle
IUT SUP BAT PS2
(PS 1) (PS 2) (C ; R ) D3 min D4 max
BUS BUS
[EPL-CT 9].1
7,0 V / 8,0 V 6,0 V 1 nF (1 %); 1 kΩ (0,1 %) 0,417 -
[EPL-CT 9].2
7,0 V / 8,0 V 6,6 V 1 nF (1 %); 1 kΩ (0,1 %) 0,417 -
[EPL-CT 9].3
7,0 V / 8,0 V 6,0 V 6,8 nF (1 %); 660 Ω (0,1 %) 0,417 -
[EPL-CT 9].4
7,0 V / 8,0 V 6,6 V 6,8 nF (1 %); 660 Ω (0,1 %) 0,417 -
[EPL-CT 9].5
7,0 V / 8,0 V 6,0 V 10 nF (1 %); 500 Ω (0,1 %) 0,417 -
[EPL-CT 9].6
7,0 V / 8,0 V 6,6 V 10 nF (1 %); 500 Ω (0,1 %) 0,417 -
[EPL-CT 9].7
7,6 V / 8,6 V 6,6 V 1 nF (1 %); 1 kΩ (0,1 %) 0,417 0,590
[EPL-CT 9].8
7,6 V / 8,6 V 7,2 V 1 nF (1 %); 1 kΩ (0,1 %) 0,417 0,590
[EPL-CT 9].9
7,6 V / 8,6 V 6,6 V 6,8 nF (1 %); 660 Ω (0,1 %) 0,417 0,590
[EPL-CT 9].10
7,6 V / 8,6 V 7,2 V 6,8 nF (1 %); 660 Ω (0,1 %) 0,417 0,590
[EPL-CT 9].11
7,6 V / 8,6 V 6,6 V 10 nF (1 %); 500 Ω (0,1 %) 0,417 0,590
[EPL-CT 9].12
7,6 V / 8,6 V 7,2 V 10 nF (1 %); 500 Ω (0,1 %) 0,417 0,590
[EPL-CT 9].13
18 V / 18,6 V 17,0 V 1 nF (1 %); 1 kΩ (0,1 %) 0,417 0,590
[EPL-CT 9].14
18 V / 18,6 V 17,6 V 1 nF (1 %); 1 kΩ (0,1 %) 0,417 0,590
[EPL-CT 9].15
18 V / 18,6 V 17,0 V 6,8 nF (1 %); 660 Ω (0,1 %) 0,417 0,590
[EPL-CT 9].16
18 V / 18,6 V 17,6 V 6,8 nF (1 %); 660 Ω (0,1 %) 0,417 0,590
[EPL-CT 9].17
18 V / 18,6 V 17,0 V 10 nF (1 %); 500 Ω (0,1 %) 0,417 0,590
[EPL-CT 9].18
18 V / 18,6 V 17,6 V- 10 nF (1 %); 500 Ω (0,1 %) 0,417 0,590

6.2.6.3 [EPL-CT 10] Measuring the duty cycle @ 20,0 kbit / s – IUT as transmitter
Figure 13 shows the test configuration of the test system 'Measuring the duty cycle'.
Remote Controlled Remote Controlled
Power Supply 1 Power Supply 2
V V
PS1 PS2
R
V : [V / V ] BUS
IUT SUP BAT
Implementation
Under Test
LIN
RX
Pulse Generator
C
BUS
TX
GND
Measurement
Figure 13 — Test system: Measuring the duty cycle
ISO/DIS 17987-7
Table 23 defines the test system 'Measuring the duty cycle'.
Table 23 — Test system: Measuring the duty cycle
IUT node as Master / Slave ECU [EPL-CT 10].1 . [EPL-CT 10].18
Transceiver
Initial State
Operational conditions -
Bus loads See Table 24
V : [V / V ] See Table 24
IUT SUP BAT
V See Table 24
PS2
Test Steps TXD is driven with a rectangular signal (T=100 µs) with a duty cycle of 50 %.
TXD slope time < 500 ns, 100 % voltage swing.
Response The measured duty cycle D1 shall be greater or equal than 0,396 for V = [7,0 V.18 V], the
SUP
measured duty cycle D2 shall be less or equal than 0,581 for V = [7,6 V.18 V].
SUP
If V is not accessible then V – 0,7 V has to be used for calculation of the duty cycle.
SUP BAT
Reference ISO 17987-4 (see Table 9 'Driver electrical AC Parameters' Param 27, Param 28) and Figure 6
'Definition of bus timing parameters 12 V').

Table 24 defines the test cases 'Measuring the duty cycle'.
Table 24 — Test cases: Measuring the duty cycle
EPL-CT-TC VIUT: [VSUP / VBAT] VPS2 Bus loads Duty cycle
(PS 1) (PS 2) (C ; R ) D1 min D2 max
BUS BUS
[EPL-CT 10].1
7,0 V / 8,0 V 6,0 V 1 nF (1 %); 1 kΩ (0,1 %) 0,396 -
[EPL-CT 10].2
7,0 V / 8,0 V 6,6 V 1 nF (1 %); 1 kΩ (0,1 %) 0,396 -
[EPL-CT 10].3
7,0 V / 8,0 V 6,0 V 6,8 nF (1 %); 660 Ω (0,1 %) 0,396 -
[EPL-CT 10].4
7,0 V / 8,0 V 6,6 V 6,8 nF (1 %); 660 Ω (0,1 %) 0,396
...