ISO/TS 7637-4:2020

TECHNICAL ISO/TS
SPECIFICATION 7637-4
First edition
2020-05
Road Vehicles — Electrical
disturbance by conduction and
coupling —
Part 4:
Electrical transient conduction along
shielded high voltage supply lines only
Vehicules routiers — Perturbations electriques par conduction et par
couplage —
Partie 4: Conduction transitoire electrique seulement le long des
lignes à haute tension blindées
Reference number
©
ISO 2020
© ISO 2020
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Fax: +41 22 749 09 47
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO 2020 – All rights reserved

Contents Page
Foreword .iv
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Test methods . 1
4.1 General . 1
4.2 Standard test conditions . 2
4.3 Ground plane . 2
4.4 General test setup conditions . 2
4.5 Voltage transient emissions test along high voltage supply lines . 3
4.5.1 General - Test methodology. 3
4.5.2 Test set-up for emission test . 3
4.5.3 Test procedure for emission test. 4
4.6 Transient immunity test along high voltage supply lines . 5
4.6.1 General - Test methodology. 5
4.6.2 Immunity test for pulsed sinusoidal disturbances (pulse A) . 5
4.6.3 Immunity test for pulsed sinusoidal disturbances (pulse B) . 9
5 Test instrument description and specifications .12
5.1 High voltage artificial network (HV-AN) .12
5.2 HV power supply .15
5.3 Measurement instrumentation .15
5.4 Load for high voltage battery or power supply .16
Annex A (normative) Example of test severity levels associated with functional
performance status classification .17
Annex B (normative) Transient voltage waveform evaluation .19
Annex C (informative) Test pulse generators and verification .22
Bibliography .24
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www .iso .org/ patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to the
World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see www .iso .org/
iso/ foreword .html.
This document was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee SC 32,
Electrical and electronic components and general system aspects.
A list of all parts in the ISO 7637 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www .iso .org/ members .html.
iv © ISO 2020 – All rights reserved

TECHNICAL SPECIFICATION ISO/TS 7637-4:2020(E)
Road Vehicles — Electrical disturbance by conduction and
coupling —
Part 4:
Electrical transient conduction along shielded high voltage
supply lines only
1 Scope
This document specifies test methods and procedures to ensure the compatibility to conducted
electrical transients along shielded high voltage supply lines of equipment installed on passenger cars
and commercial vehicles fitted with electrical systems with voltages higher than 60 V d.c. and lower
than 1 500 V d.c. and a power supply isolated from the vehicle body. It describes bench tests for both,
injection and measurement of transients. It is applicable to all types of electrical independent driven,
road vehicles (e.g. battery electrical vehicle (BEV) or hybrid electrical vehicle (HEV), plugin hybrid
electric vehicle (PHEV)).
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO 7637-1, Road vehicles — Electrical disturbances from conduction and coupling — Part 1: Definitions
and general considerations
3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 7637-1 apply.
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
4 Test methods
4.1 General
Various types of transients appear on the high voltage supply lines generated by the switching of various
devices. Pulse A represents ringing caused by switching operations of high voltage semiconductors.
Pulse B represents sinusoidal waves generated by harmonics from the grid and revolutions from, for
example, electric propulsion motors.
Methods for measuring the transient emission on shielded high-voltage supply lines and test methods for
the immunity of devices against transients are given in this document. These tests, called "bench tests",
are performed in a laboratory.
The bench-test methods provide comparable and reproducible results between laboratories. They also
give a test basis for the development of devices and systems and may be used during the production phase.
A bench-test method for the evaluation of the immunity of a device against supply-line transients may
be performed by a test pulse generator. This might not cover all types of transients which can occur in a
vehicle. Therefore, all described test pulses are typical pulses.
In special cases, it may be necessary to apply additional test pulses. However, some test pulses may
be omitted, if a device, depending on its function or its connection, is not influenced by comparable
transients in the vehicle. It is part of the vehicle manufacturer's responsibility to define the test pulses
required for a specific device.
There are two types of disturbances:
— Pulsed sinusoidal disturbances (Waveform A);
— Low frequency sinusoidal disturbances (Waveform B).
Pulsed sinusoidal disturbances on high voltage supply lines are caused by overshoots on square
wave signals, e.g. produced by interaction of switching IGBTs in high voltage systems with parasitic
capacities and inductivities of electrical engine systems, DC-DC-converters and any other kind of high
voltage switching/commutation system. Pulsed sinusoidal disturbances on high voltage supply lines
can be both common mode [line-to-ground (HV+ or/and HV- to ground)] and differential mode [line-to-
line (HV+ to HV-)].
Test pulse A is used for testing high frequency oscillations, e.g. fast switching.
Test pulse B is used to test equipment against transient voltages.
The device under test (DUT) shall be operated under typical conditions which cause the maximum
disturbance and sensitivity during the measurement. This is the worst-case mode for every test and
frequency step. Conditions shall be agreed between the vehicle manufacturer and the supplier and shall
be documented in the test plan.
4.2 Standard test conditions
Standard test conditions according to ISO 7637-1 shall be used for test temperature and supply voltage
(low voltage).
The high supply voltage U can vary in a range from 60 V d.c. up to 1 500 V d.c. The used high voltage and
N
its allowed tolerances of battery/generator in operation shall be agreed between vehicle manufacturer
and supplier and shall be documented in the test plan.
4.3 Ground plane
The ground plane shall be made of 0,5 mm thick (minimum) copper, brass or galvanized steel.
Unless otherwise specified in the test plan, the minimum width of the ground plane shall be 1 000 mm,
or underneath the entire setup width (excluding power supply and transient pulse generator) plus
200 mm, whichever is larger.
Unless otherwise specified in the test plan, the minimum length of the ground plane shall be 2 000 mm,
or underneath the entire setup length (excluding power supply and transient pulse generator) plus
200 mm, whichever is larger.
4.4 General test setup conditions
The DUT is arranged and connected according to its requirements. The DUT should be connected to the
original operating devices (loads, sensors, etc.) and the test setup described in 4.5.2, 4.6.2.1 and 4.6.3.1
shall be used, unless otherwise agreed between the vehicle manufacturer and the supplier.
If the actual DUT operating signal sources are not available, they may be simulated.
2 © ISO 2020 – All rights reserved

Unless otherwise specified in the test plan, all loads, sensors, grounds (lines, metallic cases) are
connected to the ground plane.
To minimize extraneous capacitive coupling to the DUT, it is advisable that the minimum distance
between the DUT and all other conductive structures, such as walls of a shielded enclosure (with the
exception of the ground plane underneath the test setup), should be more than 0,5 m.
4.5 Voltage transient emissions test along high vol
...