IEC 62884-2:2017

IEC 62884-2 ®
Edition 1.0 2017-08
INTERNATIONAL
STANDARD
colour
inside
Measurement techniques of piezoelectric, dielectric and electrostatic
oscillators –
Part 2: Phase jitter measurement method

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé Fax: +41 22 919 03 00
CH-1211 Geneva 20 info@iec.ch
Switzerland www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

IEC Catalogue - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
The stand-alone application for consulting the entire The world's leading online dictionary of electronic and
bibliographical information on IEC International Standards, electrical terms containing 20 000 terms and definitions in
Technical Specifications, Technical Reports and other English and French, with equivalent terms in 16 additional
documents. Available for PC, Mac OS, Android Tablets and languages. Also known as the International Electrotechnical
iPad. Vocabulary (IEV) online.

IEC publications search - www.iec.ch/searchpub IEC Glossary - std.iec.ch/glossary
The advanced search enables to find IEC publications by a 65 000 electrotechnical terminology entries in English and
variety of criteria (reference number, text, technical French extracted from the Terms and Definitions clause of
committee,…). It also gives information on projects, replaced IEC publications issued since 2002. Some entries have been
and withdrawn publications. collected from earlier publications of IEC TC 37, 77, 86 and

CISPR.
IEC Just Published - webstore.iec.ch/justpublished

Stay up to date on all new IEC publications. Just Published IEC Customer Service Centre - webstore.iec.ch/csc
details all new publications released. Available online and If you wish to give us your feedback on this publication or
also once a month by email. need further assistance, please contact the Customer Service
Centre: csc@iec.ch.
IEC 62884-2 ®
Edition 1.0 2017-08
INTERNATIONAL
STANDARD
colour
inside
Measurement techniques of piezoelectric, dielectric and electrostatic

oscillators –
Part 2: Phase jitter measurement method

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.140 ISBN 978-2-8322-4762-4

– 2 – IEC 62884-2:2017 © IEC 2017
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Test and measurement procedures . 8
4.1 General . 8
4.2 Test methods of phase jitter . 8
4.2.1 General . 8
4.2.2 Measurement in the time domain . 8
4.2.3 Measurement in the data domain . 9
4.2.4 Measurement in the frequency domain . 9
4.3 Input and output impedances of the measurement system . 13
4.4 Measurement equipment . 13
4.4.1 General . 13
4.4.2 Jitter floor . 13
4.4.3 Output wave form . 13
4.4.4 Output voltage . 14
4.5 Test fixture. 14
4.6 Cable, tools and instruments, and so on . 14
5 Measurement and the measurement environment . 14
5.1 Set-up before taking measurements . 14
5.2 Points to be considered and noted at the time of measurement . 14
5.3 Treatment after the measurement . 14
6 Measurement . 15
6.1 Reference temperature . 15
6.2 Measurement of temperature characteristics . 15
6.3 Measurement under vibration . 15
6.4 Measurement at the time of impact . 15
6.5 Measurement in accelerated ageing . 15
7 Other points to be noted . 15
8 Miscellaneous . 15
Annex A (normative)  Calculation method for the amount of phase jitter . 16
A.1 General . 16
A.2 Explanation . 16
A.3 Relations between phase noise and phase jitter . 16
A.4 Commentary on theoretical positioning of phase jitter . 18
A.5 Description . 18
A.5.1 General . 18
A.5.2 RMS jitter . 19
A.5.3 Peak-to-peak jitter . 19
A.5.4 Random jitter . 20
A.5.5 Deterministic jitter . 20
A.5.6 Period (periodic) jitter . 20
A.5.7 Data-dependent jitter . 20
A.5.8 Total jitter . 21

A.6 Points to be considered for measurement . 21
A.6.1 Measurement equipment . 21
A.6.2 Factors of measurement errors . 22
Bibliography . 24

Figure 1 – Phase jitter measurement with sampling oscilloscope . 9
Figure 2 – Block diagram of a jitter and wander analyser according to ITU-T O.172 . 11
Figure 3 – Equivalent block diagram . 13
Figure A.1 – Concept diagram of SSB phase noise . 18
Figure A.2 – Voltage versus time . 19
Figure A.3 – Explanatory diagram of the amount of jitter applied to RMS jitter . 21
Figure A.4 – Explanatory diagrams of random jitter, deterministic jitter, and total jitter . 22

Table 1 – Fourier frequency range for phase noise test . 10
Table 2 – Standard bit rates for various applications . 12

– 4 – IEC 62884-2:2017 © IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC,
DIELECTRIC AND ELECTROSTATIC OSCILLATORS –

Part 2: Phase jitter measurement method

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62884-2 has been prepared by IEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
The text of this International Standard is based on the following documents:
CDV Report on voting
49/1212/CDV 49/1243/RVC
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
...