Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

Amendement 1 - Dispositifs à semiconducteurs - Partie 16-4: Circuits intégrés hyperfréquences - Commutateurs

General Information

Status
Published
Publication Date
09-Mar-2009
Drafting Committee
WG 2 - TC 47/SC 47E/WG 2
Current Stage
PPUB - Publication issued
Start Date
10-Mar-2009
Completion Date
30-Jun-2009

Relations

Effective Date
05-Sep-2023
Effective Date
05-Sep-2023

Overview

IEC 60747-16-4:2004/AMD1:2009 is an important amendment to the international standard focusing on semiconductor devices, specifically microwave integrated circuits (MICs) related to switches. Published by the International Electrotechnical Commission (IEC), this amendment updates key definitions, measurement procedures, and references to improve the accuracy and applicability of the standard in the fast-evolving field of microwave semiconductor technology.

The amendment ensures consistency with other related IEC standards, refines technical terminology, and enhances test methods for critical parameters such as insertion loss, isolation, harmonic distortion, and adjacent channel power ratio. It also integrates updated handling precautions, especially concerning electrostatic sensitive devices.

Key Topics

  • Insertion Loss and Isolation
    Provides precise definitions and measurement principles for insertion loss (ratio of input to output power in the switched-on state) and isolation (ratio in the switched-off state), both typically expressed in decibels (dB).

  • Nth Order Harmonic Distortion Ratio
    Defines and refines measurement procedures for evaluating harmonic distortion in switches, a key factor in assessing microwave circuit performance.

  • Measurement Procedures
    Enhances test methods by specifying bias application under defined conditions and revises relevant mathematical expressions for clarity and accuracy.

  • Reference Updates
    Incorporates references to related standards such as IEC 60617 (graphical symbols), IEC 60747-1 (general semiconductor devices requirements), IEC 60747-16-1 (microwave integrated amplifiers), and electrostatic protection standards IEC 61340-5-1 and IEC 61340-5-2.

  • Package Identification and Environmental Ratings
    Updates packaging descriptions and environmental condition categories including operating, storage, channel, and lead temperatures to align with current industry practices.

  • Handling and Safety
    Emphasizes precautions for handling microwave switches, notably regarding electrostatic discharge (ESD) sensitivity, referencing dedicated IEC standards for ESD protection.

Applications

This amendment is crucial for manufacturers, designers, and testers working with microwave integrated circuit switches in various high-frequency electronic systems, including:

  • Telecommunications Infrastructure
    Enhancing switch reliability and performance in microwave transmission and switching equipment.

  • Radar and Defense Systems
    Ensuring accurate measurement and control of microwave switch parameters for critical defense applications.

  • Aerospace and Satellite Communications
    Supporting the high precision requirements for microwave switching devices in satellites and aircraft.

  • Test and Measurement Equipment
    Improving standardized testing protocols to ensure consistent evaluation of microwave switch components used in electronic test instruments.

  • Semiconductor Manufacturing
    Guiding process controls, quality assurance, and ESD management during semiconductor switch device fabrication and packaging.

Related Standards

  • IEC 60747-1:2006 - Semiconductor devices – Part 1: General requirements
  • IEC 60747-16-1:2001 - Microwave integrated circuits – Amplifiers
  • IEC 60617 - Graphical symbols for diagrams (Replaces IEC 60617-12 and IEC 60617-13)
  • IEC 61340-5-1:2007 - Electrostatics – Protection of electronic devices from electrostatic phenomena – General requirements
  • IEC/TR 61340-5-2:2007 - Electrostatics – User guide for protection of electronic devices from electrostatic phenomena

Practical Value

Implementing the updates from IEC 60747-16-4 Amendment 1 enables stakeholders to:

  • Achieve improved accuracy and repeatability in performance evaluation of microwave switches.
  • Align device specifications with global standards, facilitating international trade and compliance.
  • Enhance protection of sensitive microwave semiconductor components through up-to-date ESD handling procedures.
  • Streamline documentation and testing processes by adopting clarified definitions and measurements.
  • Ensure environmental and mechanical parameters reflect current industry requirements, improving device robustness and reliability.

Keywords: IEC 60747-16-4 amendment, microwave integrated circuits, microwave switches, semiconductor devices standard, insertion loss, isolation, harmonic distortion, microwave switch measurement, ESD protection, IEC semiconductor standards.

Standard

IEC 60747-16-4:2004/AMD1:2009 - Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches Released:3/10/2009 Isbn:9782889102839

English language
6 pages
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Standard

IEC 60747-16-4:2004/AMD1:2009 - Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

English and French language
12 pages
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Frequently Asked Questions

IEC 60747-16-4:2004/AMD1:2009 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches". This standard covers: Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

Amendment 1 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

IEC 60747-16-4:2004/AMD1:2009 is classified under the following ICS (International Classification for Standards) categories: 31.080.99 - Other semiconductor devices. The ICS classification helps identify the subject area and facilitates finding related standards.

IEC 60747-16-4:2004/AMD1:2009 has the following relationships with other standards: It is inter standard links to IEC 60747-16-4/AMD1/FRAGF, IEC 60747-16-4:2004. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.

IEC 60747-16-4:2004/AMD1:2009 is available in PDF format for immediate download after purchase. The document can be added to your cart and obtained through the secure checkout process. Digital delivery ensures instant access to the complete standard document.

Standards Content (Sample)


IEC 60747-16-4 ®
Edition 1.0 2009-03
INTERNATIONAL
STANDARD
AMENDMENT 1
Semiconductor devices –
Part 16-4: Microwave integrated circuits – Switches

IEC 60747-16-4:2004/A1:2009(E)

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: inmail@iec.ch
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
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It also gives information on projects, withdrawn and replaced publications.
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in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
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Centre FAQ or contact us:
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IEC 60747-16-4 ®
Edition 1.0 2009-03
INTERNATIONAL
STANDARD
AMENDMENT 1
Semiconductor devices –
Part 16-4: Microwave integrated circuits – Switches

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
F
ICS 31.080.99 ISBN 978-2-88910-283-9
– 2 – 60747-16-4 Amend. 1 © IEC:2009(E)
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
The text of this amendment is based on the following documents:
CDV Report on voting
47E/358/CDV 47E/373/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the maintenance result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
CONTENTS
5.8 n-th order harmonic distortion ratio (P /P )
nth 1
Replace the title of this subclause by the following new title;
5.8 nth order harmonic distortion ratio (P /P )
1 nth
2 Normative references
Replace the existing references IEC 60617-12, IEC 60617-13 and IEC 60747-1 as follows:
IEC 60617, Graphical symbols for diagrams
IEC 60747-1:2006, Semiconductor devices – Part 1: General
Add, to the existing list, the following new references:
IEC 60747-16-1:2001, Semiconductor devices – Part 16-1: Microwave integrated circuits –
Amplifiers
Amendment 1 (2007)
—————————
There exists a consolidated edition 1.1 published in 2007, including the base publication (2001) and its
Amendment 1 (2007).
60747-16-4 Amend. 1 © IEC:2009(E) – 3 –
IEC 61340-5-1:2007, Electrostatics – Part 5-1: Protection of electronic devices from
electrostatic phenomena – General requirements
IEC/TR 61340-5-2:2007, Electrostatics – Part 5-2: Protection of electronic devices from
electrostatic phenomena – User guide

3 Terms and definitions
Replace the terms, definitions and NOTES 3.1, 3.2 and 3.11 by the following new terms,
definitions and NOTES:
3.1
insertion loss
L
ins
ratio of the input power to the output power at the switched on port, in the linear region of the
power transfer curve P (dBm) = f(P )
i
o
NOTE 1 In this region, ΔP (dBm) = ΔP (dBm).
o i
NOTE 2 Usually the insertion loss is expressed in decibels.
3.2
isolation
L
iso
ratio of the input power to the output power at the switched off port, in the linear region of the
p
...


IEC 60747-16-4 ®
Edition 1.0 2009-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Semiconductor devices –
Part 16-4: Microwave integrated circuits – Switches

Dispositifs à semiconducteurs –
Partie 16-4: Circuits intégrés hyperfréquences – Commutateurs

IEC 60747-16-4:2004/A1:2009
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: inmail@iec.ch
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
 Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
 IEC Just Published: www.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
 Electropedia: www.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
 Customer Service Centre: www.iec.ch/webstore/custserv
If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service
Centre FAQ or contact us:
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IEC 60747-16-4 ®
Edition 1.0 2009-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Semiconductor devices –
Part 16-4: Microwave integrated circuits – Switches

Dispositifs à semiconducteurs –
Partie 16-4: Circuits intégrés hyperfréquences – Commutateurs

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE PRICE CODE
F
CODE PRIX
ICS 31.080.99 ISBN 978-2-88912-575-3

– 2 – 60747-16-4 Amend. 1  IEC:2009
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
This bilingual version, published in 2011-07, corresponds to the English version.
The text of this amendment is based on the following documents:
CDV Report on voting
47E/358/CDV 47E/373/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The French version of this amendment has not been voted upon.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the maintenance result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
CONTENTS
5.8 n-th order harmonic distortion ratio (P /P )
nth 1
Replace the title of this subclause by the following new title;
5.8 nth order harmonic distortion ratio (P /P )
1 nth
2 Normative references
Replace the existing references IEC 60617-12, IEC 60617-13 and IEC 60747-1 as follows:
IEC 60617, Graphical symbols for diagrams
IEC 60747-1:2006, Semiconductor devices – Part 1: General
Add, to the existing list, the following new references:

60747-16-4 Amend. 1  IEC:2009 – 3 –
IEC 60747-16-1:2001, Semiconductor devices – Part 16-1: Microwave integrated circuits –
Amplifiers
Amendment 1 (2007)
IEC 61340-5-1:2007, Electrostatics – Part 5-1: Protection of electronic devices from
electrostatic phenomena – General requirements
IEC/TR 61340-5-2:2007, Electrostatics – Part 5-2: Protection of electronic devices from
electrostatic phenomena – User guide

3 Terms and definitions
Replace the terms, definitions and NOTES 3.1, 3.2 and 3.11 by the following new terms,
definitions and NOTES:
3.1
insertion loss
L
ins
ratio of the input power to the output power at the switched on port, in the linear region of the
power transfer curve P (dBm) = f(P )
i
o
NOTE 1 In this region, ∆P (dBm) = ∆P (dBm).
o i
NOTE 2 Usually the insertion loss is expressed in decibels.
3.2
isolation
L
iso
ratio of the input power to the output power at the switched off port, in the linear region of the
power transfer curve P (dBm) = f(P )
i
o
NOTE 1 In this region, ∆P (dBm) = ∆P (dBm).
o i
NOTE 2 Usually the isolation is expressed in decibels.
3.11
nth order harmonic distortion ratio
P /P
1 nth
See 3.14 of Amendment 1 of IEC 60747-16-1:2007.

4.1.4 Package identification
Replace, in item b), "drawing, of drawing" by "drawing, or drawing".
4.3.1 Detailed block diagram – functional blocks
Replace, in the last paragraph, "IEC 60617-12 or IEC 60617-13" by "IEC 60617".
4.4.2 Temperatures
Replace the existing all items, a) to e), by the following new items:
—————————
There exists a consolidated edition 1.1 published in 2007, including the base publication (2001) and its
Amendment 1 (2007).
– 4 – 60747-16-4 Amend. 1  IEC:2009
a) Operating temperature (ambient or reference-point temperature)
b) Storage temperature
c) Channel temperature
d) Lead temperature (for soldering).
4.6 Electrical characteristics
Delete, in the first paragraph, “of 4.6.1 and 4.6.2”.
Replace, in the table, the parameters 4.6.12 and 4.6.13 by the following new parameters.
a
Subclause Parameters Min. Typical Max.
4.6.12 Adjacent channel power ratio (where appropriate) + +
4.6.13 nth order harmonic distortion ratio (where appropriate) + +

4.7 Mechanical and environmental ratings, characteristics and data
Replace "IEC 60747-1, Chapter VI, clause 7" by "5.10 and 5.11 of IEC 60747-1".
4.8.8 Handling precautions
Replace the existing text by the following amended text;
Where appropriate, handling precautions specific to the circuit should be stated (see also
IEC 61340-5-1 and IEC 61340-5-2, concerning electrostatic-sensitive devices.

5.1.1 General precautions
Replace "Clause 2 of IEC 60747-1, Chapter VII, Section One apply" by "6.3, 6.4 and 6.6 of
IEC 60747-1:2006 apply".
5.1.3 Handling precautions
Replace "Clause 1 of IEC 60747-1, Chapter IX" by "IEC 61340-5-1 and IEC 61340-5-2".

5.2.3 Principle of measurement
Replace Equation (1) by the following equation:
= P – P (1)
L
ins i o
5.2.6 Measurement procedure
Replace the second paragraph by the following new paragraph:
The bias under specified conditions is applied.
Replace, in the last paragraph, “Equations (3) and (1)” by “Equations (2), (3) and (1)”.

60747-16-4 Amend. 1  IEC:2009 – 5 –

5.3.6 Measurement procedure
Replace the second paragraph by the following new paragraph:
The bias under specified conditions is applied.
Replace, in the last paragraph, “Equations (6) and (4)” by “Equations (5), (6) and (4)”.

5.4.3 Principle of measurement
Replace Equation (7) by the following new equation:
L = P – P (7)
ret 1 2
5.4.6 Measurement procedure
Replace the seventh paragraph by the following new paragraph:
The bias under specified conditions is applied.

5.5.3 Principle of mea
...

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