IEC 61788-16:2013

IEC 61788-16 ®
Edition 1.0 2013-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Superconductivity –
Part 16: Electronic characteristic measurements – Power-dependent surface
resistance of superconductors at microwave frequencies

Supraconductivité –
Partie 16: Mesures de caractéristiques électroniques – Résistance de surface
des supraconducteurs aux hyperfréquences en fonction de la puissance

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IEC 61788-16 ®
Edition 1.0 2013-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Superconductivity –
Part 16: Electronic characteristic measurements – Power-dependent surface

resistance of superconductors at microwave frequencies

Supraconductivité –
Partie 16: Mesures de caractéristiques électroniques – Résistance de surface

des supraconducteurs aux hyperfréquences en fonction de la puissance

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX V
ICS 17.220.20; 29.050 ISBN 978-2-83220-582-2

– 2 – 61788-16 © IEC:2013
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Requirements . 8
5 Apparatus . 8
5.1 Measurement system . 8
5.1.1 Measurement system for the tan δ of the sapphire rod . 8
5.1.2 Measurement system for the power dependence of the surface
resistance of superconductors at microwave frequencies . 9
5.2 Measurement apparatus . 10
5.2.1 Sapphire resonator . 10
5.2.2 Sapphire rod . 10
5.2.3 Superconductor films . 11
6 Measurement procedure . 11
6.1 Set-up . 11
6.2 Measurement of the tan δ of the sapphire rod . 11
6.2.1 General . 11
6.2.2 Measurement of the frequency response of the TE mode . 11
6.2.3 Measurement of the frequency response of the TE mode . 13
6.2.4 Determination of tan δ of the sapphire rod . 13
6.3 Power dependence measurement . 14
6.3.1 General . 14
6.3.2 Calibration of the incident microwave power to the resonator. 15
6.3.3 Measurement of the reference level . 15
6.3.4 Surface resistance measurement as a function of the incident
microwave power . 15
6.3.5 Determination of the maximum surface magnetic flux density . 15
7 Uncertainty of the test method . 16
7.1 Surface resistance. 16
7.2 Temperature . 17
7.3 Specimen and holder support structure . 18
7.4 Specimen protection . 18
8 Test report . 18
8.1 Identification of the test specimen . 18
8.2 Report of power dependence of R values. 18
s
8.3 Report of test conditions . 18
Annex A (informative) Additional information relating to Clauses 1 to 7 . 19
Annex B (informative) Uncertainty considerations . 24
Bibliography . 29

Figure 1 – Measurement system for tan δ of the sapphire rod . 9
Figure 2 – Measurement system for the microwave power dependence of the surface
resistance . 9

61788-16 © IEC:2013 – 3 –
Figure 3 – Sapphire resonator (open type) to measure the surface resistance of
superconductor films . 10
Figure 4 – Reflection scattering parameters (|S | and |S |) . 13
11 22
Figure 5 – Term definitions in Table 3 . 17
Figure A.1 – Three types of sapphire rod resonators . 19
Figure A.2 – Mode chart for a sapphire resonator (see IEC 61788-15) . 20
Figure A.3 – Loaded quality factor Q measurements using the conventional 3 dB
L
method and the circle fit method . 21
Figure A.4 – Temperature dependence of tan δ of a sapphire rod measured using the
two-resonance mode dielectric resonator method [3] . 22
Figure A.5 – Dependence of the surface resistance R on the maximum surface magnetic
s
flux density B [3] . 23
s max
Table 1 – Typical dimensions of the sapphire rod . 11
Table 2 – Specifications of the vector network analyzer . 16
Table 3 – Specifications of the sapphire rods . 17
Table B.1 – Output signals from two nominally identical extensometers . 25
Table B.2 – Mean values of two output signals . 25
Table B.3 – Experimental standard deviations of two output signals . 25
Table B.4 – Standard uncertainties of two output signals . 26
Table B.5 – Coefficient of Variations of two output signals . 26

– 4 – 61788-16 © IEC:2013
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SUPERCONDUCTIVITY –
Part 16: Electronic characteristic measurements –
Power-dependent surface resistance
of superconductors at microwave frequencies

FOREWORD
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interested IEC National Committees.
3) IEC Publica
...