IEC 60747-5-9:2019

IEC 60747-5-9 ®
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-9: Optoelectronic devices – Light emitting diodes – Test method of the
internal quantum efficiency based on the temperature-dependent
electroluminescence
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IEC 60747-5-9 ®
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-9: Optoelectronic devices – Light emitting diodes – Test method of the

internal quantum efficiency based on the temperature-dependent

electroluminescence
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-7656-3

– 2 – IEC 60747-5-9:2019 © IEC:2019
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and abbreviated terms . 5
3.1 Terms and definitions . 5
3.2 Abbreviated terms . 7
4 Measuring methods . 7
4.1 Basic requirements . 7
4.1.1 Measuring conditions . 7
4.1.2 Measuring instruments and equipment . 7
4.2 Purpose . 7
4.3 Measurement . 8
4.3.1 Measurement setup . 8
4.3.2 Measurement principle. 8
4.3.3 Measurement sequence . 11
5 Test report . 12
Annex A (informative) Test examples . 13
A.1 Test example (category 1) . 13
A.2 Test example (category 2) . 16
Bibliography . 19

Figure 1 – Example of the measurement setup with the TDEL . 8
Figure 2 – Schematic diagram of radiant power as a function of forward current at
various temperatures . 9
Figure 3 – Examples of relative EQEs showing whether the IQE is measurable or not . 10
Figure 4 – IQE measurement with TDEL . 10
Figure 5 – Sequence of IQE determination with TDEL . 12
Figure A.1 – Radiant power as a function of forward current at various temperatures
(category 1) . 13
Figure A.2 – Relative EQE as a function of forward current at various temperatures
(category 1) . 14
Figure A.3 – Check T in relative EQE curves (category 1) . 14
c
Figure A.4 – Evaluation of the relative EQE (category 1) . 15
Figure A.5 – IQE as a function of forward current at various temperatures including an
operating temperature (category 1) . 15
Figure A.6 – Radiant power as a function of forward current at various temperatures
(category 2) . 16
Figure A.7 – Relative EQE as a function of forward current at various temperatures
(category 2) . 17
Figure A.8 – Check T in relative EQE curves (category 2) . 17
c
Table A.1 – Summary of test report . 18

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 5-9: Optoelectronic devices – Light emitting diodes –
Test method of the internal quantum efficiency based
on the temperature-dependent electroluminescence

FOREWORD
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International Standard IEC 60747-5-9 has been prepared by subcommittee 47E: Discrete
semiconductor devices, of IEC technical committee 47: Semiconductor devices.
The text of this International Standard is based on the following documents:
CDV Report on voting
47E/651/CDV 47E/676/RVC
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

– 4 – IEC 60747-5-9:2019 © IEC:2019
A list of all parts in the IEC 60747 series, published under the general title Semiconductor
devices, can be found on the IEC website.
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SEMICONDUCTOR DEVICES –
Part 5-9: Optoelectronic devices – Light emitting diodes –
Test method of the internal quantum efficiency based
on the temperature-dependent electroluminescence

1 Scope
This part of IEC 60747 specifies the measuring method of the internal quantum efficiency
(IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for
lighting applications are out of the scope of this document. This document utilizes the relative
external quantum efficiencies (EQEs) measured at cryogenic temperatures and at an
operating temperature, which is called temperature-dependent electroluminescence (TDEL).
In order to identify the reference IQE of 100 %, the maximum values of the peak EQE are
found by varying the environmental temperature and current.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60747-5-6:2016, Semiconductor devices – Part 5-6: Optoelectronic devices – Light
emitting diodes
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions
...