IEC 61747-3:1998

INTERNATIONAL IEC
STANDARD
61747-3
QC 720200
First edition
1998-02
Liquid crystal and solid state display devices –
Part 3:
Sectional specification for liquid crystal
display (LCD) cells
Dispositifs d’affichage à cristaux liquides
et à semiconducteurs –
Partie 3:
Spécification intermédiaire pour les cellules
pour dispositifs d’affichage à cristaux liquides

Reference number
Numbering
As from 1 January 1997 all IEC publications are issued with a designation in

the 60000 series.
Consolidated publications
Consolidated versions of some IEC publications including amendments are

available. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively,

to the base publication, the base publication incorporating amendment 1 and
the base publication incorporating amendments 1 and 2.

Validity of this publication
The technical content of IEC publications is kept under constant review by
the IEC, thus ensuring that the content reflects current technology.
Information relating to the date of the reconfirmation of the publication is
available in the IEC catalogue.
Information on the revision work, the issue of revised editions and
amendments may be obtained from IEC National Committees and from the
following IEC sources:
• IEC Bulletin
• IEC Yearbook
On-line access*
• Catalogue of IEC publications
Published yearly with regular updates
(On-line access)*
Terminology, graphical and letter symbols
For general terminology, readers are referred to IEC 60050: International
Electrotechnical Vocabulary (IEV).
For graphical symbols, and letter symbols and signs approved by the IEC for
general use, readers are referred to publications IEC 60027: Letter symbols to be
used in electrical technology, IEC 60417: Graphical symbols for use on equipment.
Index, survey and compilation of the single sheets and IEC 60617: Graphical
symbols for diagrams.
IEC publications prepared by the same technical
committee
The attention of readers is drawn to the end pages of this publication which
list the IEC publications issued by the technical committee which has
prepared the present publication.
* See web site address on title page.

INTERNATIONAL IEC
STANDARD
61747-3
QC 720200
First edition
1998-02
Liquid crystal and solid state display devices –
Part 3:
Sectional specification for liquid crystal
display (LCD) cells
Dispositifs d’affichage à cristaux liquides
et à semiconducteurs –
Partie 3:
Spécification intermédiaire pour les cellules
pour dispositifs d’affichage à cristaux liquides

 IEC 1998 Copyright - all rights reserved  Droits de reproduction réservés
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun any form or by any means, electronic or mechanical,
procédé, électronique ou mécanique, y compris la photo- including photocopying and microfilm, without permission in
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Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http: //www.iec.ch
Commission Electrotechnique Internationale
PRICE CODE
M
International Electrotechnical Commission
For price, see current catalogue

– 2 – 61747-3 © IEC:1998(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION

___________
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES –

Part 3: Sectional specification for liquid crystal display (LCD) cells

FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61747-3 has been prepared by subcommittee 47C: Optoelectronic,
display and imaging devices, of IEC technical committee 47: Semiconductor devices.
This part of IEC 61747 is a sectional specification for liquid crystal display cells. It should be
read together with the generic specification to which it refers.
The text of this standard is based on the following documents:

FDIS Report on voting
47C/196/FDIS 47C/201/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The QC number that appears on the front cover of this publication is the specification number
in the IECQ Quality Assessment System for Electronic Components (IECQ).

61747-3 © IEC:1998(E) – 3 –
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES –

Part 3: Sectional specification for liquid crystal display (LCD) cells

1 Scope
This sectional specification applies to liquid crystal cells of the segment type monochrome

liquid crystal display cells. It gives details of the quality assessment procedures, the inspection
requirements, screening sequences, sampling requirements and test and measurement
procedures required for the assessment of liquid crystal display cells.
Instead of the qualification approval procedure, it is allowed to apply the capability approval
procedure (see rules of procedure QC 001002, subclause 11.7, but at present capability
approval procedure for the liquid crystal display cells is under consideration) for all products
manufactured in a defined process.
All the requirements of this specification remain valid, unless modified by the requirements set
out in 4.7.
2 Normative reference
The following normative document contains provisions which, through reference in this text,
constitute provisions of this part of IEC 61747. At the time of publication, the edition indicated
was valid. All normative documents are subject to revision, and parties to agreements based
on this part of IEC 61747 are encouraged to investigate the possibility of applying the most
recent edition of the normative document indicated below. Members of IEC and ISO maintain
registers of currently valid International Standards.
1)
IEC 61747-1: Liquid crystal and solid-state display devices – Part 1: Generic specification
3 Definitions (related to manufacturing operations)
For the purpose of this part of IEC 61747, the following definitions apply.
3.1
production line
a single set of process operations including one or several of the following manufacturing
phases:
a) electrode patterning process;
b) alignment treatment process;
c) assembly process;
d) liquid crystal material filling process;
e) finishing process;
f) inspection process.
NOTE – Quality assessment procedures are not included in these phases.
–––––––––
1)
To be published.
– 4 – 61747-3 © IEC:1998(E)
3.2
production lot
devices of the same type, manufactured in the same production lines and passing through the

same nominated process, normally within one month

3.3 Changes in manufacturing operations

3.3.1
major changes
any change in the manufacturing process or technology which could affect the quality or

performance of a product supplied to an approved specification, or which could require a
product to be transferred from one similarity group to another group (see 4.4.1 below). It is the
responsibility of the chief inspector to decide whether the change is major or not
Any major change is only to be implemented with notification and demonstration by test
evidence of quality to the National Supervising Inspectorate (NSI)
Examples of major changes are
a) electrode patterning: complete different pattern;
b) material of substrate: thickness of glass substrate;
c) type of LC material: type of electro-optical effect, e.g. TN, STAN, etc.;
d) pin assignment change.
NOTE – Not considered as a major change: equipment change without changing the technology.
4 Quality assessment procedure
Quality assessment procedure is defined as outlined below.
4.1 Primary stage of manufacture
For the purpose of this sectional specification, the primary stage of manufacture of liquid
crystal display cells is the first process of the patterning of electrodes.
4.2 Manufacturing process
The manufacturing process of liquid crystal display cells is classified as given below.
a) Electrode patterning process

This process is the set of manufacturing process operations from the primary stage to the
last step for the patterning electrodes.
b) Alignment treatment process
This process is the set of manufacturing process operations to form the alignment layer
onto the glass substrate and to treat the controlling of the liquid crystal molecular direction.
c) Assembly process
This process is the set of manufacturing process operations comprising the seal printing
and the transfer plate assembling.
d) Liquid crystal material filling process
This process is the set of manufacturing process operations comprising the filling of liquid
crystal material between the two parallel glass substrates, and the sealing.

61747-3 © IEC:1998(E) – 5 –
e) Finishing process
This process is the final set of manufacturing process operations comprising the fitting of

polarizer and reflector, and the marking.

f) Inspection process
This process is the final set of process operations before lot release, comprising visual

inspection of dimensions, electrical and optical characteristics.

4.3 Subcontracting
When the approved manufacturer invokes the rules of procedure 11.1.2 of IEC QC001002

concerning subcontracting, he shall ensure that the following conditions are satisfied:
– the subcontracted manufacturing process may be either a part of or a whole of the cell
and/or module manufacturing process, unconditionally, including screening steps which are
incorporated in them. Screening operations applied after the assembly process may also be
independently subcontracted.
The NSI shall be satisfied that the chief inspector who is certifying the components under the
IECQ system
– has been provided with the full quality assessment and inspection documentation of any
operation outside the IECQ geographical area. The documentation shall include the
inspection records for each sample of the product which undergoes inspection;
– regularly verifies that the quality assessment and inspection is applied in accordance with
the agreed requirements.
The chief inspector shall be provided and shall agree with the procedures for the transfer of the
parts from the place of manufacture within the IECQ geographical area which is certifying the
components. The NSI shall be informed and have access to the applicable documents.
Any changes in inspection requirements and manufacturing procedures shall be reported back
to the chief inspector who is certifying the modules. The major changes shall be reported by an
approved chief inspector to the NS (see 3.3.1 above).
The approved manufacturer shall perform the acceptance tests prescribed by the detail
specification for the components he is certifying. He can perform the acceptance tests in a
facility outside the IECQ geographical area, provided that this facility is supervised by the NSI.
Acceptance tests can be subcontracted to approved test laboratories within the IECQ
geographical area.
4.4 Structural similarity procedures

Structural similarity procedures are intended to permit a reduction in the number of inspection
lots for quality assessment that shall be tested.
Therefore, in case of reassessment by the extension of approved types or the change of the
design, the testing data which was performed within the same grouping products may be used.
4.4.1 Structurally similar cells
Structurally similar cells are produced by one manufacturer, essentially to the same design,
with the same material, manufacturing process and method.
The crucial criterion for the grouping of types of cells as structurally similar is that the
differences between the various types have no influence on the results of the test for which the
group has been formed.
– 6 – 61747-3 © IEC:1998(E)
4.4.2 Test-dependent criteria for structural similarity

The test-dependent criteria for structural similarity applicable to group B, lot-by-lot inspections,

and group C, periodic tests, are given in table 1.

Subclause 4.4.2 a) to 4.4.2 i) specify the interpretation of these criteria for structural similarity.

a) Materials
Glass substrate: the material for glass substrate shall be the same.

Material of alignment layer: the material for alignment layer shall be the same.

Sealing material: the sealing material shall be the same.
Liquid crystal material: the liquid crystal material shall be the same.
Materials of polarizer and reflector: the materials of polarizer and reflector shall be the
same.
b) Cell size
Where the cells have within 150 % to 50 % area, they can be considered as structurally
similar.
c) Electrode construction
The material and the basic design shall be the same.
d) Process (common)
The basic process and process materials shall be the same.
e) Production lines (common)
The cells shall be made along the same lines.
f) Methods and measures
Essential technical methods and measures used shall be the same,
e.g.: type of electro-optical effect (TN/STN, etc.), optical mode of operation (reflective,
transflective, etc.)
g) Structure
Thickness of glass substrate, gap of the cell, etc. shall be the same.
h) Marking
The same material shall be used for marking, and the essential process condition of
marking shall be the same.
i) Rating
The rating values as specified on the detail specification shall be the same, except for the
items dependent on the cell dimensions, such as current consumption, electrical

capacitance, etc.
4.5 Qualification approval procedure
4.5.1 Qualification approval tests
Qualification approval shall normally be granted when satisfactory results have been achieved
on completion of method a) of the rules of procedure (11.3.1 of QC 001002), and the
inspection requirements (including testing items, condition, final sampling size, etc.) to be used
as specified in table 2 of this specification.
However, in case of request, method b) of the rules of procedure (11.3.1 of QC 001002), may
be used, with the sampling requirements in accordance with those stated in table 7 and table 8.

61747-3 © IEC:1998(E) – 7 –
4.6 Quality conformance test
Quality conformance test is defined in 3.6 of IEC 61747-1/QC 720000.

4.6.1 Division into groups and subgroups

Division into groups and subgroups shall be in conformance with IEC 60747-10/QC 700000,

subclause 3.7. In addition, the groups and subgroups shall satisfy the following conditions:

– groups A and B: one test lot contains devices produced within a period of one month or four
weeks as indicated by the used date code(s);

– group C: samples from productions submitted for periodic testing shall have been
manufactured within a period of three months as indicated by three consecutive month date
codes or by 13 consecutive week date codes;
– group D: samples from productions submitted for periodic testing shall have been
manufactured within a period of 12 months as indicated by 12 consecutive month date
codes or by 52 consecutive week date codes.
4.6.2 Groups and categories
The groups shall be in accordance with table 3.
4.6.3 Group A – Lot-by-lot tests
These tests shall be prescribed in accordance with table 4.
4.6.4 Group B – Lot-by-lot tests
These tests shall be prescribed in accordance with table 5.
4.6.5 Group C – Periodic tests
These tests shall be prescribed in accordance with table 6.
4.6.6 Group D – Periodic tests
These tests shall be performed for qualification approval, and thereafter annually where
required only.
They shall be prescribed in the detail specification.

4.6.7 Dimensions to be checked
Dimensions to be checked as part of groups B and C shall be prescribed in the detail
specification.
Also, where applicable, optical related dimensions and the group in which they are tested shall
be given in the detail specifications.

– 8 – 61747-3 © IEC:1998(E)
4.6.8 Sampling requirements (fixed sampling sizes)

Table 7 gives sampling requirements for group A tests and table 8 gives sampling require-

ments for group B and C tests, both for the lot size between 501 and 3 200.

The other sampling sizes shall be specified in the blank detail specification (BDS) for different

lot sizes.
4.7 Capability approval procedure

Under consideration.
4.8 Screening
When screening is specified in the detail specification or the order, it shall be applied to all
devices in the production.
Screening is normally performed before group A, B and C tests. When screening is performed
after meeting the requirements of group A and B on a lot-by-lot basis and group C on a periodic
basis, the soldering, sealing and group A tests shall be repeated.
Additional post-screening tests may be required as specified in the detail specification.
The test shall be prescribed in accordance with table 9.
4.9 Delayed deliveries
Before delivery of lots which have been in store for more than one year, the lots or the
quantities to be delivered shall undergo the specified group A tests and the soldering tests of
group B. Once this has been done for the complete lot, no further retesting is required for one
year.
5 Test and measurement procedures
The testing and measuring methods of electrical and optical characteristics for liquid crystal
display cells shall be in conformance with IEC 61747-1. These tests shall be referred to in the
detail specification when required.

Table 1 – Test dependent criteria for structural similarity
Substrate Electrode patterning Alignment treatment Assembly Liquid crystal Finishing Ratings
material filling
Test item
External visual examination X X XX X XXXX X
Display cosmetics X XXXXXX X X X XXXXX XXX
Electrical characteristics at 25 °C XXXX XXXXXXXX X
Electrical characteristics XXXX XXXXXXXXX XXX XX
at T amb max. and T amb min.
Optical characteristics at 25 °C XXXX XXXXXX X XXX X
Optical characteristics XXXX XXXXXX X XXX X X
at T amb max. and T amb min.
Dimensions X X X XXXXX X
1)
Robustness of terminations XX
Storage at high temperature XXXXXXXXX XXX X
Storage at low temperature XXXXXXXXX XXX X
Damp heat, cyclic (12+12-hour cycle) XXXXXXXXX XXX X
Electrical endurance or equivalent
accelerated stress testing X X XX XX X
Light exposure XX X X
Permanence of marking X
1)
Soldering
1)
Resistance to soldering heat
and rapid change of temperature,
followed by either
– damp heat, cyclic or low air pressure
– electrical and optical characteristics test
Mechanical shock or vibration, followed by X X XXXX X X X
– acceleration, steady state
– electrical and optical characteristics test
NOTE – A cross (X) in the table denotes that the criterion is mandatory for the corresponding test.
1)
This item depends on the termination method.
Criteria
4.4.2 a) Materials
4.4.2 g) Structure
4.4.2 a) Materials
4.4.2 c) Electrode construction
4.4.2 d) Process (common)
4.4.2 e) Production lines (common)
4.4.2 a) Materials
4.4.2 d) Process (common)
4.4.2 e) Production lines (common)
4.4.2 f) Methods and measures
4.4.2 a) Materials
4.4.2 d) Process (common)
4.4.2 e) Production lines (common)
4.4.2 g) Structure
4.4.2 a) Materials
4.4.2 d) Process (common)
4.4.2 e) Production lines (common)
4.4.2 f) Methods and measures
4.4.2 a) Materials
4.4.2 b) Cell size
4.4.2 d) Process (common)
4.4.2 e) Production lines (common)
4.4.2 f) Methods and measures
4.4.2 h) Marking
4.4.2 i) Damp, temperature characteristics
4.4.2 i) Electrical characteristics
4.4.2 i) Optical characteristics
4.4.2 i) Mechanical characteristics

– 10 – 61747-3 © IEC:1998(E)
Table 2 – Qualification approval tests

Sub- IEC publi- Condition of tests Category I Category II Category III

Group group Tests cation
nc n c n c
1)
0-1 External visual
61747-5
examination
0-2 Visual defects Black spot and
open, short
1)
00-3A Electrical To be specified 24040 0 40 0
61747-6
0-3B characteristics in the detail

specification
0-4 Optical characteristics
at 25 °C
1-1 Dimensions 61747-5
1)
1 1-2 Robustness of 305 0 5 0
61747-5
terminations (D)
1-3 Soldering (D)
2-1 Resistance to soldering 305 0 5 0
heat and change of
temperature, followed
by either:
– damp heat, cyclic
or low air pressure
– electrical and optical
characteristics test
2 (D)
2-2 Shocks or vibration, 305 0 5 0
followed by
– acceleration, steady
state
– electrical and optical
characteristics test
(D)
3-1 Electrical endurance or Condition to be 305 0 5 0
equivalent accelerated specified in the
stress testing (D) detail specification
3-2 Storage (at high 240 h for CAT.I 305 0 5 0
temperature) (D) 500 h for CAT.II
3 1 000 h for CAT.III
3-3 Storage (at low 240 h for CAT.I 305 0 5 0
temperature) (D) 500 h for CAT.II
1 000 h for CAT.III
3-4 Light exposure 305 0 5 0
To be specified in
(D)
the detail
specification
3-5 Permanence of marking 30 5 0 5 0
(D)
NOTE 1 – In this table:
n = sample size
c = group acceptance criterion (permitted number of defectives per group or subgroup)
D = destructive
NOTE 2 – The following items are not applied to the panel without the terminal leads:
1-2, 1-3 and resistance to soldering heat of 2-1.
–––––––––
1)
To be published.
61747-3 © IEC:1998(E) – 11 –
Table 3 – Groups and categories of assessed quality

Group Category I Category II Category III

Screening X
AXX X
BX (NOTE) X X
CX (NOTE) X X
NOTE – Annually, one lot meets the B and C group inspection requirements.

Table 4 – Group A – Lot-by-lot tests
Subgroup Tests IEC publication Details and conditions
1)
A1 External visual examination 61747-5
A2 Display cosmetics To be specified
1)
A3 Electrical and optical 61747-6 To be specified in accordance with
A4 characteristics the applicable methods
NOTE – Those tests which are not specified in this specification shall be specified in the detail specification.
Table 5 – Group B – Lot-by-lot tests
Subgroup Tests IEC publication Details and conditions
1)
B1 Dimensions 61747-5 In accordance with the drawing given
(interchangeability) in the detail specification
1)
B4 Soldering (D) To be specified
61747-5
B5 Change of To be specified (detection of intermittent
temperature (D) failures)
B6 Acceleration, steady state To be specified, depending on encapsulation
(D) (if required by the blank detail specification)
B8 Electrical endurance – 168 h (method to be specified)
(D)
1)
B9 Storage (at high 61747-5 168 h (at maximum storage temperature)
temperature) (D)
Subgroup Certified record of Attributes information as specified in the blank
CRRL released lots detail specifications

NOTE – In case of category I, see 2.6 in the generic specification.
Those tests which are not specified in this specification shall be specified in the detail specification.
The item (D) means the destructive tests.
–––––––––
1)
To be published.
– 12 – 61747-3 © IEC:1998(E)
Table 6 – Group C: Periodic tests

Subgroup Tests IEC Details and conditions

publication
1)
C1 Dimensions 61747-5 In accordance with the drawing given

in the detail specification
1)
C2a Electrical and optical characteristics To be specified in the detail specification
61747-5
(design parameter)
1)
C2b Electrical and optical characteristics To be specified, for example, measurements
61747-6
(different condition) at temperature limits

C2c Electrical and optical rating verification To be specified in the detail specification

1)
C3 Robustness of terminations (D) 61747-5
C4 Soldering
C5 Resistance to soldering heat and rapid
change of temperature, followed by
– low air pressure
– electrical and optical
characteristics test (D)
C6 Mechanical shock or vibration,
followed by
– acceleration, steady state
– electrical and optical
characteristics test (D)
C7 Damp heat cyclic (D)
C8 Electrical endurance or equivalent –
accelerated stress testing (D)
1)
C9a Storage (at high temperature) (D) 61747-5
C9b Storage (at low temperature) (D)
C11a Light exposure (D)
C11b Permanence of marking (D)
CRRL Certified records of released lots Attributes inform
...