IEC 60444-7:2004

IEC 60444-7 ®
Edition 1.0 2004-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Measurement of quartz crystal unit parameters –
Part 7: Measurement of activity and frequency dips of quartz crystal units

Mesure des paramètres des résonateurs à quartz –
Partie 7: Mesure des baisses de l'activité et de la fréquence des résonateurs
à quartz
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IEC 60444-7 ®
Edition 1.0 2004-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Measurement of quartz crystal unit parameters –

Part 7: Measurement of activity and frequency dips of quartz crystal units

Mesure des paramètres des résonateurs à quartz –

Partie 7: Mesure des baisses de l'activité et de la fréquence des résonateurs

à quartz
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX H
ICS 31.140 ISBN 978-2-83220-705-5

– 2 – 60444-7  IEC:2004
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –

Part 7: Measurement of activity and frequency dips
of quartz crystal units
FOREWORD
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International Standard IEC 60444-7 has been prepared by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
This bilingual version (2013-05) corresponds to the monolingual English version, published in
2004-04.
The text of this standard is based on the following documents:
FDIS Report on voting
49/637/FDIS 49/664/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
The French version of this standard has not been voted upon.

60444-7  IEC:2004 – 3 –
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
This standard forms Part 7 of a series of publications dealing with measurements of quartz
crystal unit parameters
IEC 60444 consists of the following parts, under the general title Measurement of quartz
crystal unit parameters:
Part 1: Basic method for the measurement of resonance frequency and resonance
resistance of quartz crystal units by zero phase technique in a pi-network
Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Part 4: Method for the measurement of the load resonance frequency f , load resonance
L
resistance R and the calculation of other derived values of quartz crystal units, up to
L
30 MHz
Part 5: Methods for the determination of equivalent electrical parameters using automatic
network analyzer techniques and error correction
Part 6: Measurement of drive level dependence (DLD)
Part 7: Measurement of activity and frequency dips of quartz crystal units
Part 8: Test fixture for surface mounted quartz crystal units
The committee has decided that the contents of this publication will remain unchanged until
2008. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 4 – 60444-7  IEC:2004
INTRODUCTION
The tolerable activity dips of resonant resistance and frequency (Bandbreak) will be specified
in the detail specification. The measurement and evaluation of the activity/frequency dip for
the quartz crystal unit requires special consideration as it uses the linear least squares
method.
60444-7  IEC:2004 – 5 –
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –

Part 7: Measurement of activity and frequency dips
of quartz crystal units
1 Scope
This standard applies to activity and frequency dips for quartz crystal units over a temperature
range.
2 Definitions
2.1
activity dip
undesirable change in the crystal unit’s load resonance frequency and/or resonance
resistance caused by the coupling of different modes in a narrow temperature range and at a
specified load capacitance and level of drive (see Figures 1 and 2)
2.2
frequency dip (bandbreak)
undesirable perturbation or fluctuation in the crystal frequency occurring in a narrow
temperature range as a deviation of the load resonance frequency from the smooth regular
th
frequency temperature characteristic described by a polynomial of up to the 5 order. It
usually shows an associated resistance change (see Figure 2) and the effect is usually drive
level dependent
3 Measurements
The following measurement parameters are necessary and should be given in the detail
specification:
– operating temperature range;
– load capacitance;
– level of drive.
The evaluation of the data is made using a computer and is described in 3.3.
Care shall be taken in selecting a suitable measurement time; this will depend on the type of
crystal unit being measured. The drive current (in microamperes) shall also be correct and
controlled.
The inspection method is selected from the following and specified in the individual
specification:
a) lot inspection and guaranteed by process control;
b) sample inspection.
3.1 Reference method
The measurement system consists of a π-network in accordance with IEC 60444 and a high
precision temperature chamber, which allows to ramp-up the temperature at a constant small
rate.
– 6 – 60444-7  IEC:2004
Each crystal is measured individually within the specified temperature range beginning at the
lowest temperature as defined below. The temperature is then increased with a constant rate
up to the maximum temperature as defined below.
NOTE The temperature performance of the chamber should allow for the appropriate resolution and a monotonic
small temperature ramp.
The minimum/maximum measurement temperature shall be 5 K lower/10 K higher than the
specified minimum/maximum operating temperature.
The number of data points should be such, that the temperature intervals between the
measurement points are less or equal to 0,2 K.
The rate of temperature change shall be 2 K/min ± 10 % within the whole temperature range.
The actual temperature at a location in the vicinity of the crystal under test must be recorded
at each measurement point together with the actual (load) resonance frequency and
resistance.
The frequency and resistance are measured at the specified drive level and at the specified
resonance condition, i.e. load resonance, resonance (zero phase), or series resonance.
The measurement points shall lie within one tenth of the resonance bandwidth.
NOTE Because of the irregular and discontinuous behaviour
...