IEC 61338-1-4:2005
(Main)Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
IEC 61338-1-4:2005-11(en-fr) describes the measurement method of dielectric properties for dielectric resonator materials at millimetre-wave frequency. This standard consists of two measurement methods:
a) the dielectric rod resonator method excited by NRD-guide (Non-Radiative Dielectric waveguide) and
b) the cut-off waveguide method excited by coaxial cables with small loops.
Résonateurs diélectriques à modes guidés - Partie 1-4: Informations générales et conditions d'essais - Méthode de mesure de la permittivité relative complexe des matériaux des résonateurs diélectriques fonctionnant à des fréquences millimétriques
IEC 61338-1-4:2005-11(en-fr) décrit la méthode de mesure des propriétés diélectriques des matériaux des résonateurs diélectriques fonctionnant à des fréquences millimétriques. La présente norme aborde deux méthodes de mesure:
a) la méthode du résonateur diélectrique en barreau excité par un guide NRD (guide d'ondes diélectrique non radiatif) et
b) la méthode de guide d'ondes de coupure excité par des câbles coaxiaux présentant de petites boucles.
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INTERNATIONAL IEC
STANDARD 61338-1-4
First edition
2005-11
Waveguide type dielectric resonators –
Part 1-4:
General information and test conditions –
Measurement method of complex relative
permittivity for dielectric resonator materials
at millimetre-wave frequency
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INTERNATIONAL IEC
STANDARD 61338-1-4
First edition
2005-11
Waveguide type dielectric resonators –
Part 1-4:
General information and test conditions –
Measurement method of complex relative
permittivity for dielectric resonator materials
at millimetre-wave frequency
IEC 2005 Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
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International Electrotechnical Commission
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For price, see current catalogue
– 2 – 6133814 ¤ IEC:2005(E)
CONTENTS
FOREWORD.4
1 Scope and object.6
2 Normative references.6
3 Measurement parameter.7
4 Dielectric rod resonator method excited by NRDguide .8
4.1 Measurement equipment and apparatus .8
4.2 Theory and calculation equations. 11
4.3 Measurement procedure . 16
4.4 Example of measurement result. 19
5 Cutoff waveguide method excited by coaxial cables with small loops . 21
5.1 Measurement equipment and apparatus . 21
5.2 Theory and calculation equations. 23
5.3 Measurement procedure . 28
Annex A (informative) Errors on H caused by air gap between dielectric specimen
r
and upper conducting plate . 30
Annex B (informative) Derivation of equation (15) for V . 31
r
Bibliography. 33
Figure 1 – Schematic diagram of measurement equipment .8
Figure 2 – Measurement apparatus of dielectric rod resonator method excited by
NRDguide.9
Figure 3 – Waveguide transducer from NRDguide to waveguide. 11
Figure 4 – Configuration of a cylindrical dielectric rod resonator shortcircuited at both
ends by two parallel conducting plates. 12
2 2
Figure 5 –Calculations of u and W as a function of v for TE , TE and TE
011 021 031
resonance modes . 13
Figure 6 –Configuration of reference dielectric resonator for measurement of V of
r
conducting plates . 15
Figure 7 – Diameter d of TE , TE and TE mode resonators with resonance
011 021 031
frequency of 60 GHz. 18
Figure 8 – Diameter d of TE , TE and TE mode resonators with resonance
011 021 031
frequency of 77 GHz. 19
Figure 9 – Example of TE mode resonant peak . 20
Figure 10 – Measurement result of temperature dependence of f and of sapphire. 21
H'
Figure 11 – Measurement apparatus for cutoff waveguide method. 22
Figure 12 – Frequency response for the empty cavity with dimensions of d = 7 mm and
h = 31 mm . 24
Figure 13 – Correction term 'H /H . 26
a
Figure 14 – Correction terms and . 27
'A/ A 'B / B
6133814 ¤ IEC:2005(E) – 3 –
Figure 15 – Measurement apparatus for temperature coefficient of relative permittivity. 28
Figure 16 – Mode chart of TE and TE modes for an empty cavity. 29
011 013
Figure A.1 – Error on caused by air gap between dielectric specimen and upper
H'
conducting plates . 30
Table 1 – Diameter of conducting plate. 10
Table 2 – Dimension of dielectric strip of NRDguide. 10
Table 3 – Dimensions of waveguide transducer . 10
Table 4 – Dimensions of reference sapphire resonators and their partial electric energy
filling factor P and geometric factor G . 15
e
Table 5 – Diameter d of test specimens for 60 and 77 GHz measurement. Height h is
fixed to 2,25 mm and 1,80 mm for 60 GHz and 77 GHz measurement, respectively . 17
Table 6 – Measurement results of V of conducting plates. 20
r
Table 7 – Measurement results of H' and tan G of sapphire and PTFE specimen. 20
Table 8 – Recommended dimensions for conducting cylinder. 23
– 4 – 6133814 ¤ IEC:2005(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
WAVEGUIDE TYPE DIELECTRIC RESONATORS –
Part 14: General information and test conditions –
Measurement method of complex relative permittivity for
dielectric resonator materials at millimetrewave frequency
FOREWORD
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International Standard IEC 6133814 has been prepared by IEC Technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
The text of this standard is based on the following documents:
FDIS Report on voting
49/748/FDIS 49/751/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
6133814 ¤ IEC:2005(E) – 5 –
IEC 61338 consists of the following parts, under the general title Waveguide type dielectric
resonators:
Part 1: Generic specification
Part 13: General information and test conditions Measurement method of complex
relative permittivity for dielectric resonator materials at microwave frequency
Part 14: General information and test conditions Measurement method of complex
relative permittivity for dielectric resonator materials at millimetrewave frequency
Part 2: Guidelines for oscillator and filter applications
Part 4: Sectional specification
Part 41: Blank detail specification
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
reconfirmed,
withdrawn,
replaced by a revised edition, or
amended.
A bilingual version of this publication may be issued at a later date.
– 6 – 6133814 ¤ IEC:2005(E)
WAVEGUIDE TYPE DIELECTRIC RESONATORS –
Part 14: General information and test conditions –
Measurement method of complex relative permittivity for
dielectric resonator materials at millimetrewave frequency
1 Scope and object
This part of IEC 61338 describes the measurement method of dielectric properties for
dielectric resonator materials at millimetrewave frequency.
This standard consists of two measurement methods: a) the dielectric rod resonator method
excited by NRDguide (NonRadiative Dielectric waveguide) and b) the cutoff waveguide
method excited by coaxial cables with small loops.
a) The dielectric rod resonator method excited by NRDguide is similar to the dielectric rod
resonator method giv
...
IEC 61338-1-4 ®
Edition 1.0 2005-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Waveguide type dielectric resonators –
Part 1-4: General information and test conditions – Measurement method of
complex relative permittivity for dielectric resonator materials at millimetre-wave
frequency
Résonateurs diélectriques à modes guidés –
Partie 1-4: Informations générales et conditions d'essais – Méthode de mesure
de la permittivité relative complexe des matériaux des résonateurs diélectriques
fonctionnant à des fréquences millimétriques
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IEC 61338-1-4 ®
Edition 1.0 2005-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Waveguide type dielectric resonators –
Part 1-4: General information and test conditions – Measurement method of
complex relative permittivity for dielectric resonator materials at millimetre-
wave frequency
Résonateurs diélectriques à modes guidés –
Partie 1-4: Informations générales et conditions d'essais – Méthode de mesure
de la permittivité relative complexe des matériaux des résonateurs diélectriques
fonctionnant à des fréquences millimétriques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX V
ICS 31.140 ISBN 978-2-8322-1000-0
– 2 – 61338-1-4 IEC:2005
CONTENTS
FOREWORD . 4
1 Scope and object . 6
2 Normative references . 6
3 Measurement parameter . 7
4 Dielectric rod resonator method excited by NRD-guide . 8
4.1 Measurement equipment and apparatus . 8
4.2 Theory and calculation equations . 11
4.3 Measurement procedure . 16
4.4 Example of measurement result . 19
5 Cut-off waveguide method excited by coaxial cables with small loops . 21
5.1 Measurement equipment and apparatus . 21
5.2 Theory and calculation equations . 23
5.3 Measurement procedure . 28
Annex A (informative) Errors on ε caused by air gap between dielectric specimen
r
and upper conducting plate . 30
Annex B (informative) Derivation of equation (15) for σ . 31
r
Bibliography . 33
Figure 1 – Schematic diagram of measurement equipment . 8
Figure 2 – Measurement apparatus of dielectric rod resonator method excited by
NRD-guide . 9
Figure 3 – Waveguide transducer from NRD-guide to waveguide . 11
Figure 4 – Configuration of a cylindrical dielectric rod resonator short-circuited at both
ends by two parallel conducting plates . 12
2 2
Figure 5 –Calculations of u and W as a function of v for TE , TE and TE
011 021 031
resonance modes . 13
Figure 6 –Configuration of reference dielectric resonator for measurement of σ of
r
conducting plates . 15
Figure 7 – Diameter d of TE , TE and TE mode resonators with resonance
011 021 031
frequency of 60 GHz . 18
Figure 8 – Diameter d of TE , TE and TE mode resonators with resonance
011 021 031
frequency of 77 GHz . 19
Figure 9 – Example of TE mode resonant peak . 20
Figure 10 – Measurement result of temperature dependence of f and ε' of sapphire . 21
Figure 11 – Measurement apparatus for cut-off waveguide method . 22
Figure 12 – Frequency response for the empty cavity with dimensions of d = 7 mm and
h = 31 mm . 24
Figure 13 – Correction term ∆ε /ε . 26
a
Figure 14 – Correction terms ∆A/ A and ∆B / B . 27
61338-1-4 IEC:2005 – 3 –
Figure 15 – Measurement apparatus for temperature coefficient of relative permittivity . 28
Figure 16 – Mode chart of TE and TE modes for an empty cavity . 29
011 013
Figure A.1 – Error on caused by air gap between dielectric specimen and upper
ε'
conducting plates . 30
Table 1 – Diameter of conducting plate . 10
Table 2 – Dimension of dielectric strip of NRD-guide . 10
Table 3 – Dimensions of waveguide transducer . 10
Table 4 – Dimensions of reference sapphire resonators and their partial electric energy
filling factor P and geometric factor G . 15
e
Table 5 – Diameter d of test specimens for 60 and 77 GHz measurement. Height h is
fixed to 2,25 mm and 1,80 mm for 60 GHz and 77 GHz measurement, respectively . 17
Table 6 – Measurement results of σ of conducting plates . 20
r
Table 7 – Measurement results of ε' and tan δ of sapphire and PTFE specimen . 20
Table 8 – Recommended dimensions for conducting cylinder. 23
– 4 – 61338-1-4 IEC:2005
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
WAVEGUIDE TYPE DIELECTRIC RESONATORS –
Part 1-4: General information and test conditions –
Measurement method of complex relative permittivity for
dielectric resonator materials at millimetre-wave frequency
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested
...
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