IEC 61338-1-5:2015

IEC 61338-1-5 ®
Edition 1.0 2015-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Waveguide type dielectric resonators –
Part 1-5: General information and test conditions – Measurement method of
conductivity at interface between conductor layer and dielectric substrate at
microwave frequency
Résonateurs diélectriques à modes guidés –
Partie 1-5: Informations générales et conditions d'essais – Méthode de mesure
de la conductivité au niveau de l'interface entre une couche conductrice et un
substrat diélectrique fonctionnant aux hyperfréquences

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IEC 61338-1-5 ®
Edition 1.0 2015-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Waveguide type dielectric resonators –

Part 1-5: General information and test conditions – Measurement method of

conductivity at interface between conductor layer and dielectric substrate at

microwave frequency
Résonateurs diélectriques à modes guidés –

Partie 1-5: Informations générales et conditions d'essais – Méthode de mesure

de la conductivité au niveau de l'interface entre une couche conductrice et un

substrat diélectrique fonctionnant aux hyperfréquences

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-2721-3

– 2 – IEC 61338-1-5:2015 © IEC 2015
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references. 6
3 Measurement and related parameters . 6
4 Calculation equations for R and σ . 8
i i
5 Preparation of specimen . 12
6 Measurement equipment and apparatus . 12
6.1 Measurement equipment . 12
6.2 Measurement apparatus . 12
7 Measurement procedure . 13
7.1 Set-up of measurement equipment and apparatus . 13
7.2 Measurement of reference level . 13
7.3 Measurement procedure of Q . 13
u
7.4 Determination of σ and measurement uncertainty . 15
i
8 Example of measurement result . 15
Annex A (informative) Derivation of Equation (4) for R . 17
i
Annex B (informative) Calculation uncertainty of parameters in Figure 3 . 19
Bibliography . 20

Figure 1 – Surface resistance R , surface conductivity σ , interface resistance R , and
s s i
interface conductivity σ . . 7
i
Figure 2 – TE mode dielectric rod resonator to measure σ . . 8
01δ i
Figure 3 – Parameters chart of f , g, P and P for reference sapphire rod . 10
0 rod sub
Figure 4 – Parameters chart of f , g, P and P for reference (Zr,Sn)TiO rod . 11
0 rod sub 4
Figure 5 – Schematic diagram of measurement equipments . 12
Figure 6 – Schematic diagram of measurement apparatus for σ . . 13
i
Figure 7 – Frequency response for reference sapphire rod with two dielectric
substrates as shown in Figure 2. . 14
Figure 8 – Resonance frequency f , insertion attenuation IA and half-power band
0 0
width f . 15
BW
Table 1 – Specifications of reference rods . 9
Table 2 – ε’ and tanδ of reference rods measured by the method of IEC 61338-1-
rod rod
3 15
Table 3 – ε’ and tanδ of an LTCC test substrate measured by the method of
sub sub
IEC 62562 . 16
Table 4 – Measurement results of σ and σ of a copper layer in LTCC substrate . 16
i ri
Table B 1 – Parameters obtained by FEM and rigorous analysis of IEC 61338-1-3 for
the TE mode resonator . 19
Table B.2 – Calculated parameters f , g, P , P , R , σ and σ for the TE mode
0 rod sub i i ri 01δ
resonator . 19

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
WAVEGUIDE TYPE DIELECTRIC RESONATORS –

Part 1-5: General information and test conditions –
Measurement method of conductivity at interface between
conductor layer and dielectric substrate at microwave frequency

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