IEC 61338-1:2004

IEC 61338-1 ®
Edition 1.0 2004-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Waveguide type dielectric resonators –
Part 1: Generic specification
Résonateurs diélectriques à modes guidés –
Partie 1: Spécification générique

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IEC 61338-1 ®
Edition 1.0 2004-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Waveguide type dielectric resonators –

Part 1: Generic specification
Résonateurs diélectriques à modes guidés –

Partie 1: Spécification générique

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX V
ICS 31.140 ISBN 978-2-8322-1000-0

– 2 – 61338-1Ó IEC:2004
CONTENTS
FOREW ORD . 4
1 General . 6
1.1 Scope . 6
1.2 Normative references . 6
1.3 Order of precedence . 7
2 Terminology and general requirements . 7
2.1 General . 7
2.2 Definitions . 8
2.3 Preferred values for ratings and characteristics . 18
2.4 Marking . 19
3 Quality assessment procedures . 19
3.1 General . 19
3.2 Primary stage of manufacture . 19
3.3 Structurally similar components . 19
3.4 Sub-contracting . 19
3.5 Manufacturer’s approval . 20
3.6 Approval procedures . 20
3.7 Procedures for capability approval . 21
3.8 Procedures for qualification approval . 21
3.9 Test procedures. 22
3.10 Screening requirements . 22
3.11 Rework and repair work . 22
3.12 Certified records of released lots . 22
3.13 Validity of release . 22
3.14 Release for delivery . 22
3.15 Unchecked parameters . 22
4 Test and measurement procedures . 23
4.1 General . 23
4.2 Test and measurement conditions . 23
4.3 Visual inspection . 23
4.4 Dimension and gauging procedure . 23
4.5 Electrical test procedures . 24
4.6 Mechanical and environmental test procedures. . 30
Figure 1 – TE mode dielectric resonator . 10
01d
Figure 2 – TM mode dielectric resonator . 11
Figure 3 – TM mode dielectric resonator. 11
01d
Figure 4 – Hybrid mode dielectric resonator . 12
Figure 5 – Multimode dielectric resonators . 13
Figure 6 – TEM mode coaxial dielectric resonator . 14
Figure 7 – Half wavelength stripline resonator. 15
Figure 8 – Half wavelength microstripline resonator . 16
Figure 9 – Coplanar resonator. 17

61338-1Ó IEC:2004 – 3 –
Figure 10 – Transmission measurement . 25
Figure 11 – Resonator test fixture . 27
Figure 12 – Frequency response for test fixture A, B and D. 28
Figure 13 – Frequency response for test fixture C . 28

– 4 – 61338-1Ó IEC:2004
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
WAVEGUIDE TYPE DIELECTRIC RESONATORS –
Part 1: Generic specification
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in
addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
This International Standard IEC 61338-1 has been prepared by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
IEC 61338-1 cancels and replaces the first edition of IEC 61338-1-1 published in 1996 and
the first edition of IEC 61338-1-2 published in 1998.
This bilingual version (2013-08) corresponds to the monolingual English version, published
in 2004-11.
The text of this standard is based on the following documents:
DIS Report on Voting
49/690/FDIS 49/699/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

61338-1Ó IEC:2004 – 5 –
The French version of this standard has not been voted upon.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
IEC 61338 consists of the following parts, under the general title Waveguide type dielectric
resonators:
Part 1: Generic specification
Part 1-3: General information and test conditions – Measurement method of complex
relative permittivity for dielectric resonator materials at microwave frequency
Part 2: Guidelines for oscillator and filter applications
Part 4: Sectional specification
Part 4-1: Blank detail specification
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
 reconfirmed;
 withdrawn;
 replaced by a revised edition, or
 amended.
– 6 – 61338-1Ó IEC:2004
WAVEGUIDE TYPE DIELECTRIC RESONATORS –
Part 1: Generic specification
1 General
1.1 Scope
This part of IEC 61338 applies to waveguide type dielectric resonators of assessed quality
using either capability approval or qualification approval procedures. It also lists the test
and measurement procedures which may be selected for use in detail specifications for
such resonators.
1.2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest
edition of the referenced document (including any amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology
IEC 60050(561):1991, International Electrotechnical Vocabulary (IEV) – Chapter 561: Piezo-
electric devices for frequency control and selection
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 60068-2-1:1990, Environmental testing – Part 2: Tests – Tests A: Cold
IEC 60068-2-2:1974, Environmental testing – Part 2: Tests – Tests B: Dry Heat
IEC 60068-2-6:1995, Environmental testing – Part 2: Tests – Tests Fc: Vibration (sinusoidal)
IEC 60068-2-7:1983, Environmental testing – Part 2: Tests – Tests Ga and guidance:
Acceleration, steady state
IEC 60068-2-13:1983, Environmental testing – Part 2: Tests – Tests M: Low air pressure
IEC 60068-2-14:1984, Environmental testing – Part 2: Tests – Tests N: Change of
temperature
IEC 60068-2-20:1979, Environmental testing – Part 2: Tests – Tests T: Soldering
IEC 60068-2-21:1999, Environmental testing – Part 2: Tests – Tests U: Robustness of
terminations and integral mounting devices
IEC 60068-2-27:1987, Environmental testing – Part 2: Tests – Tests Ea and guidance:
Shock
IEC 60068-2-29:1987, Environmental testing – Part 2: Tests – Tests Eb and guidance:
Bump
61338-1Ó IEC:2004 – 7 –
IEC 60068-2-30:1980, Environmental testing – Part 2: Tests – Tests Db and guidance:
Damp heat, cyclic (12 +12 hour cycle)
IEC 60068-2-58:2004, Environmental testing – Part 2-58: Tests – Test Td: Test methods for
solderability, resistance to dissolution of metallization and to soldering heat of surface
mounting devices (SMD)
IEC 60068-2-78, Environmental testing – Part 2: Tests – Test Cab: Damp heat, steady state
IEC 60617, Graphical symbols for diagrams
IEC 61338-1-3:1999, Waveguide type dielectric resonators – Part 1-3: General information
and test conditions – Measurement method of complex relative permittivity for dielectric
resonator materials at microwave frequency
IEC 61338-4, Waveguide type dielectric resonators of assessed quality – Part 4: Sectional
specification
ISO 1000:1992, SI units and recommendation for the use of their multiples and of certain
other units
QC 001001:2000, IEC Quality Assessment System for Electronic Components (IECQ) –
Basic Rules
QC 001002-1:1998, IEC Quality Assessment System for Electronic Components (IECQ) –
Rules of Procedure – Part 1: Administration
QC 001002-2:1998, IEC Quality Assessment System for Electronic Components (IECQ) –
Rules of Procedure – Part 2: Documentation
QC 001002-3:1998, IEC Quality Assessment System for Electronic Components (IECQ) –
Rules of Procedure – Part 3: Approval Procedures
QC 001005:2000, Register of Firms, Products and Services approved under the IECQ
System, including ISO 9000
1.3 Order of precedence
Where any discrepancies occur for any reason, documents shall rank in the following order
of priority:
– detail specification;
– sectional specification;
– generic specification;
– any other international documents (for example, of the IEC) to which reference is made.
The same order of preference shall apply to equivalent national documents.
2 Terminology and general requirements
2.1 General
Units, graphical symbols, letter symbols and terminology shall whenever possible, be taken
from the following documents:
ISO 1000 SI units and recommendations for the use of their multiples and of certain
other units
___________
To be published.
– 8 – 61338-1Ó IEC:2004
IEC 60617 Graphical symbols for diagrams
IEC 60027 Letter symbols to be used in electrical technology
IEC 60050 International Electrotechnical Vocabulary
Any other units, symbols and terminology peculiar to one of the components covered by this
generic specification, shall be taken from the relevant IEC or ISO documents listed under
1.2, Normative references.
The following paragraphs contain additional terminology applicable to waveguide type
dielectric resonators.
2.2 Definitions
The following paragraphs contain additional terminology applicable to waveguide type
dielectric resonators.
2.2.1 Dielectric material
Material which predominantly exhibits dielectric properties.
NOTE The dielectric material defined herein is intended to be used for resonator applications at high frequency. i.e.
UHF or SHF range. Therefore, the dielectric material is required to have high dielectric constant, a low loss factor
and a low temperature coefficient of permittivity.
2.2.2 Electric constant (e )
–12 –1 –1
Constant equal to 8,8542´ 10 As V m , defined by the permittivity of vacuum.
2.2.3 Relative permittivity (e )
r
Absolute permittivity of a material or medium divided by the electric constante .
NOTE The complex relative permittivitye is defined as
r
e =e¢ – je²,e’= Re (e),e² = – Im (e)
r
where
e¢ is usually called dielectric constant;
e² corresponds to the dielectric loss of the material.
2.2.4 Absolute permittivity (e)
Quantity which when multiplied by the electric field strength E is equal to the electric flux
density D.
D =eE,e =e e
0 r
2.2.5 Loss angle (d)
Phase displacement between the component of the electric flux density and the electric
field strength.
2.2.6 Loss factor
Tangent of the loss angled.
tand =e²/e¢
NOTE The loss factor can be determined by the ratio of the magnitude of the negative part to the real part of the
complex relative permittivity.

61338-1Ó IEC:2004 – 9 –
2.2.7 Quality factor of a material (Q )
o
Reciprocal of the tangent of the loss angle,
Q =e¢/e² = 1/tand
o
NOTE The quality factor of a material is also defined as 2p times the ratio of the stored electromagnetic energy to
the energy dissipated in the material per cycle. It is frequency dependent.
2.2.8 Temperature coefficient of permittivity (TCe)
Fractional change of permittivity due to a change in temperature divided by the change in
temperature.
e-e
T ref 6æ ö
-6
TCe= ´10 1´10 /K
ç ÷
e()T-T è ø
ref ref
where
e is the permittivity at temperature T;
T
e is the permittivity at reference T .
ref ref
2.2.9 Coefficient of linear thermal expansion (a)
Fractional change of dimension due to a change in temperature divided by the change in
temperature.
l -l
T ref 6 -6
a = ´10 (1´10 /K)
l()T-T
ref ref
where
l is the dimension at temperature T;
T
l is the dimension at reference temperature T .
ref ref
2.2.10 Dielectric resonator
Resonator using dielectrics with a high dielectric constant and the structure of which is a
dielectric waveguide of finite length.
NOTE The dielectric resonators in use are always shielded with conductors.
2.2.11 Dielectric support
Element supporting a dielectric resonator. The support is generally used for TE mode
01d
resonators and has a low dielectric constant (see Figure 1).
2.2.12 TE mode dielectric resonator
Dielectric resonator characterized by a transverse electric mode (TE mode) field distribution
and usually having a high unloaded quality factor Q .
u
– 10 – 61338-1Ó IEC:2004
2.2.13 TE mode dielectric resonator
01d
Dielectric resonator characterized by a dominant TE mode field distribution, whose field
leaks in the direction of wave propagation (see Figure 1).
X
X
X e
r
X
Z
Dielectric
resonator
X
Shielding
X
conductor
Dielectric
support
Electric field
Magnetic field
IEC  1424/04
Figure 1 – TE mode dielectric resonator
01d
2.2.14 TM mode dielectric resonator
Dielectric resonator characterized by a transverse magnetic mode (TM mode) field
distribution (see Figure 2).
e e
r r
Dielectric
Z
resonator Z
Shielding
conductor
X
X X
X
X X
XX X
IEC  1425/04
61338-1Ó IEC:2004 – 11 –
Figure 2 – TM mode dielectric resonator
2.2.15 TM mode dielectric resonator
01d
Dielectric resonator characterized by a dominant TM mode field distribution, whose field
leaks in the direction of wave propagation (see Figure 3).
X
X e X
r
X
Z
X
Shielding
conductor
X
IEC  1426/04
Figure 3 – TM mode dielectric resonator
01d
2.2.16 Hybrid mode dielectric resonator
Dielectric resonator characterized by a hybrid mode field distribution. Hybrid mode is the
mode which has axial components both of the electric and magnetic fields (see Figure 4).

– 12 – 61338-1Ó IEC:2004
X
X
XX
XX
X X
XX
X
X
Shielding
conductor
X
X
X
X
X
X
X
X
IEC  1427/04 IEC  1428/04
Figure 4a- EH mode Figure 4b- HE mode
11d 11d
Figure 4 – Hybrid mode dielectric resonator

61338-1Ó IEC:2004 – 13 –
2.2.17 Multimode dielectric resonator
Dielectric resonator characterized by the existence of several orthogonal resonance modes,
the resonance frequencies of which coincide in such a way that any of which cannot be
obtained by the superposition of others (see Figure 5). Any electromagnetic field
perturbation affects independence of certain of these modes and causes energy coupling
between them. This allows realization of reduced volume filters.
Mode 1
X
X
e
r
Mode 2
Shielding
conductor
Mode 1
Mode 3
Mode 2
e
r
IEC  1429/04 IEC  1430/04
Figure 5b- Triple mode of EH
Figure 5a- TM dual mode 11d
11d
dual mode and TM mode
11d
Figure 5 – Multimode dielectric resonators
2.2.18 TEM mode dielectric resonator
Dielectric resonator characterized by a transverse electromagnetic mode (TEM mode) field
distribution causing significant size reduction effect (see Figure 6).
2.2.19 Coaxial dielectric resonator
Dielectric resonator characterized by a TEM mode field distribution with a coaxial
waveguide structure of finite length (see Figure 6).
2.2.20 Quarter wavelength resonator
Resonator characterized by any guided mode field distribution with standing wave of a
quarter wavelength (see Figure 6a in the case of TEM mode).

– 14 – 61338-1Ó IEC:2004
2.2.21 Half wavelength resonator
Resonator characterized by any guided mode field distribution with standing wave of a half
wavelength (see Figure 6b in the case of TEM mode).
Shielding
conductor
e e
r r
IEC  1431/04
IEC  1432/04
Figure 6a- Quarter wavelength TEM mode Figure 6b- Half wavelength TEM mode
Figure 6 – TEM mode coaxial dielectric resonator

61338-1Ó IEC:2004 – 15 –
2.2.22 Stripline resonator
Dielectric resonator characterized by a TEM mode field distribution. The structure is a
stripline waveguide of finite length (see Figure 7).
X
X
X
X
Conductor
e
r
IEC  1433/04
Figure 7 – Half wavelength stripline resonator

– 16 – 61338-1Ó IEC:2004
2.2.23 Microstripline resonator
Dielectric resonator characterized by a TEM mode field distribution. The structure is a
microstripline waveguide of finite length (see Figure 8).
X
X
X
X
Conductor
e
r
IEC  1434/04
Figure 8 – Half wavelength microstripline resonator

61338-1Ó IEC:2004 – 17 –
2.2.24 Coplanar resonator
Dielectric resonator characterized by a TEM mode field distribution. The structure is a
coplanar-line waveguide of finite length (see Figure 9).
X X
X
X X
Conductor
e
r
IEC  1435/04
Figure 9 – Coplanar resonator
2.2.25 Quality factor (Q)
The value defined as 2p times the ratio of the stored electromagnetic energy to the energy
dissipated per cycle.
Electromagnetic energy stored in the resonator
Q = 2p
Energy dissipated per cycle
2.2.26 Unloaded quality factor (Q )
u
Quality factor for the dielectric resonator with support and shielding conductors, excluding
the energy dissipated in the external circuits.
1 1 1 1 1
= + + +
Q Q Q Q Q
u d s c r
– 18 – 61338-1Ó IEC:2004
where
Q is the quality factor due to the dielectric loss of the dielectric material;
d
Q is the quality factor due to the dielectric loss of the support;
s
Q is the quality factor due to the dielectric loss of the shielding conductors;
c
Q is the quality factor due to the radiation loss.
r
2.2.27 External quality factor (Q )
e
Quality factor due to the energy loss in the external circuit, excluding the energy dissipated
in the resonator.
2.2.28 Loaded quality factor (Q )
L
Actual quality factor for the entire circuit, including all energy losses both in the resonator
and in the external circuit.
1 1 1
= +
Q Q Q
L u e
2.2.29 Resonance frequency
Frequency at which the average electric energy stored in the resonator is equal to the
average magnetic energy stored in the resonator.
2.2.30 Temperature coefficient of resonance frequency (TCF)
The fractional change in frequency divided by the change in temperature.
f - f
T ref
TCF =
f()T- T
ref ref
where
f is the resonance frequency at temperature T;
T
f is the frequency at reference temperature T .
ref ref
2.3 Preferred values for ratings and characteristics
Values should preferably to chosen from the following paragraphs.
2.3.1 Climatic category
40/085/56
For requirements where the operating temperature range of the resonator is greater than
–40 °C to +85 °C a climatic category consistent with the operating temperature range shall
be specified.
2.3.2 Bump severity
4000± 10 bumps at 390 m/s peak acceleration in each direction along three mutually-
perpendicular axes. Pulse duration 6 ms.

61338-1Ó IEC:2004 – 19 –
2.3.3 Vibration severity
ì ü
10Hzto60Hz
ï ï
0,75mmdisplacement
ï ï
ï ï
amplitude(peakvalue
ï ï
ï ï
í ý
10 sweep cycles (10 Hz to 2000 Hz to 10 Hz)
ï ï
60Hzto2000Hz
in each of three mutually-perpendicular axes at 1 octave/min
ï ï
ï ï
98,1m/s acceleration
ï ï
ï
ï amplitude(peakvalue)
î þ
2.3.4 Shock severity
981 m/s peak acceleration for 6 ms duration; three shocks in each direction along three
mutually-perpendicular axes; half sine pulse.
2.4 Marking
Each resonator shall be indelibly and legibly marked with
– nominal frequency (which may be in code form);
– mark of origin (manufacturer’s name, which may be in code form, or trade mark);
– date code;
– any other information necessary to provide a complete definition of the resonator.
NOTE For microminiature enclosures, the marking may be replaced by an alternative marking system, to avoid the
deterioration of electrical performance. The marking should be made on the transport package.
3 Quality assessment procedures
3.1 General
Two methods are available for the approval of waveguide type dielectric resonators of
assessed quality. They are qualification approval and capability approval.
3.2 Primary stage of manufacture
The primary stage of manufacture for a waveguide type dielectric resonator in accordance
with Clause 4 of QC 001002-3 is the powder mix.
3.3 Structurally similar components
The grouping of structurally similar waveguide type dielectric resonators for the purpose of
qualification approval, capability approval and quality conformance inspection shall be
prescribed in the relevant sectional specification.
3.4 Sub-contracting
These procedures shall be in accordance with Clause 3 of QC 001002-3.

– 20 – 61338-1Ó IEC:2004
3.5 Manufacturer’s approval
To obtain the manufacturer’s approval, the manufacturer shall meet the requirements of
Clause 2 of QC 001002-3.
3.6 Approval procedures
3.6.1 General
To qualify a waveguide type dielectric resonator, either capability approval or qualification
approval procedures may be used. These procedures conform to those stated in QC 001001
and QC 001002-3.
3.6.2 Capability approval
Capability approval is appropriate when structurally similar waveguide type dielectric
resonators, based on common design rules, are fabricated by a group of common processes.
Under capability approval, detail specifications fall into the following three categories.
3.6.2.1 Capability Qualifying Components (CQCs)
A detail specification shall be prepared for each CQC as agreed with the National
Supervising Inspectorate (NSI). It shall identify the purpose of the CQC and include all
relevant stress levels and test limits.
3.6.2.2 Standard catalogue items
When a component covered by the capability approval procedure is intended to be offered
as a standard catalogue item, a detail specification complying with the blank detail
specification shall be written. Such specifications shall be registered by the IECQ and the
component may be listed in QC 001005.
3.6.2.3 Custom built waveguide type dielectric resonators
The content of the detail specification shall be by agreement between the manufacturer and
the customer in accordance with 11.7.4.2 of QC 001002-2.
Further information on detail specifications is contained in the sectional specification
IEC 61338-4.
The product and capability qualifying components (CQCs) are tested in combination and
approval given to a manufacturing facility on the basis of validated design rules, processes
and quality control procedures.
Further information is given in 3.7 and in the sectional specification IEC 61338-4.
3.6.3 Qualification approval
Qualification approval is appropriate for components manufactured to a standard design
and established production process and conforming to a published detail specification.
The programme of tests defined in the detail specification for the appropriate assessment
and severity level applies directly to the waveguide type dielectric resonator to be qualified,
as prescribed in 3.8 and the sectional specification IEC 61338-4.

61338-1Ó IEC:2004 – 21 –
3.7 Procedures for capability approval
3.7.1 General
The procedures for capability approval shall be in accordance with QC 001002-3.
3.7.2 Eligibility for capability approval
The manufacturer shall comply with the requirements of Clause 4 of QC 001002-3 and the
primary stage of manufacture as defined in 3.1 of this generic specification.
3.7.3 Application for capability approval
In order to obtain capability approval the manufacturer shall apply the rules of procedure
given in Clause 4 of QC 001002-3.
3.7.4 Granting of capability approval
Capability approval shall be granted when the procedures in accordance with Clause 4 of
QC 001002-3 have been successfully completed.
3.7.5 Description of capability
The contents of the description of capability shall be in accordance with the requirements of
the sectional specification.
The NSI shall treat the description of capability as a confidential document. The
manufacturer may, if he so wishes, disclose part or all of it to a third party.
3.8 Procedures for qualification approval
3.8.1 General
The procedures for qualification approval shall be in accordance with Clause 3 of QC 001002-3.
3.8.2 Eligibility for qualification approval
The manufacturer shall comply with the requirements of Clause 3 of QC 001002-3 and the
primary stage of manufacture as defined in 3.1 of this generic specification.
3.8.3 Application for qualification approval
In order to obtain qualification approval the manufacturer shall apply the rules of procedure
given in Clause 3 of QC 001002-3.
3.8.4 Granting of qualification approval
Qualification approval shall be granted when the procedures in accordance with Clause 3 of
QC 001002-3 have been successfully completed.
3.8.5 Quality conformance inspection
The blank detail specification associated with the sectional specification shall prescribe the
test schedule for quality conformance inspection.

– 22 – 61338-1Ó IEC:2004
3.9 Test procedures
The test procedures to be used shall be selected from this generic specification. If any
required test is not included in this generic specification, then it shall be defined in the
detail specification.
3.10 Screening requirements
Where screening is required by the customer for waveguide type dielectric resonators, this
shall be specified in the detail specification.
3.11 Rework and repair work
3.11.1 Rework
Rework is the rectification of processing errors and shall not be carried out if prohibited by
the sectional specification. The sectional specification shall state if there is a restriction on
the number of occasions that rework may take place on a specific component.
All rework shall be carried out prior to the formation of the inspection lot offered for
inspection to the requirements of the detail specification.
Such rework procedures shall be fully described in the relevant documentation produced by
the manufacturer and shall be carried out under the direct control of the chief inspector.
Subcontracting of rework is not permitted.
3.11.2 Repair work
Repair work is the correction of defects in a component after release to the customer.
Components that have been repaired can no longer be considered as representative of the
manufacturer’s production and may not be released under the IECQ system.
3.12 Certified records of released lots
When certified records of released lots (CRRL) are prescribed in the sectional specification
for qualification approval and are requested by the customer the results of the specified
tests shall be summarised (see Clause 14 of QC 001002-2).
3.13 Validity of release
Waveguide type dielectric resonators held for a period exceeding two years following
acceptance inspection shall be re-inspected for the electrical tests detailed in 4.5.2 and
4.5.3, with a sample tested as described in 4.5.4 prior to release.
3.14 Release for delivery
Waveguide type dielectric resonators shall be released in accordance with Clauses 3 and 4
of QC 001002-3.
3.15 Unchecked parameters
Only those parameters of a component which have been specified in a detail specification
and which were subject to testing can be assumed to be within the specified limits. It should
not be assumed that any parameter not specified will remain unchanged from one
component to another. Should it be necessary for further parameters to be controlled, then
a new, more extensive, detail specification should be used. The additional test method(s)
shall be fully described and appropriate limits, quality and inspection levels specified.

61338-1Ó IEC:2004 – 23 –
4 Test and measurement procedures
4.1 General
The test and measurement procedures shall be carried out in accordance with the relevant
detail specification.
4.2 Test and measurement conditions
4.2.1 Standard conditions for testing
Unless otherwise specified all tests shall be carried out under standard atmospheric
conditions for testing as specified in 5.3 of IEC 60068-1.
Temperature 15 °C to 35 °C
Relative Humidity 25 % to 75 %
Air pressure 86 kPa to 106 kPa
In case of dispute, the reference conditions are:
Temperature (23 ± 1) °C
Relative Humidity 48 % to 52 %
Air pressure 86 kPa to 106 kPa
Before measurements are made, the resonator shall be stored at the measuring
temperature for a time sufficient to allow the resonator to reach thermal equilibrium.
Controlled recovery conditions and standard conditions for assisted drying are given in 5.4
of IEC 60068-1.
When measurements are made at a temperature other then the standard temperature, the
results shall, where necessary, be corrected to the specified temperature. The ambient
temperature during measurements shall be recorded and stated in the test report.
4.2.2 Precision of measurement
The limits given in detail specifications are true values. Measurement inaccuracies shall be
taken into account when evaluating the results. Precautions shall be taken to reduce
measurement errors to a minimum.
4.2.3 Alternative test methods
Measurements shall preferably be carried out using the methods specified. Any other
method giving equivalent results may be used except in case of dispute.
NOTE By “equivalent” is meant that the value of the characteristic established by such other method falls within the
specified limits when measured by the specified method.
4.3 Visual inspection
Unless otherwise specified the visual examination shall be performed under normal factory
lighting and visual conditions.
The resonator shall be visually examined to ensure that the condition, workmanship and
finish are satisfactory. The marking shall be legible.
4.4 Dimension and gauging procedure
The dimensions shall be measured and shall comply with the specified values.

– 24 – 61338-1Ó IEC:2004
4.5 Electrical test procedures
4.5.1 General
The resonator measurement is made to determine, (1) the transmission characteristics of
dielectric resonators; resonance frequency f , unloaded quality factor Q and temperature
0 u
coefficient of resonance frequency TCF, and (2) the dielectric characteristics of dielectric
resonators, relative permittivitye¢, loss factor tand and TCF.
The electrical properties can be tested with conventional measurement methods for the
transmission characteristics of TE or TEM mode resonators and of TE mode reaction
01d 01d
type resonator for the usage as dielectric oscillators. The reflection measurement method is
also available, but is not preferred due to its larger measurement error.
NOTE A new measurement method for the dielectric properties, which is based on a transmission measurement of
TE mode resonance, is proposed by IEC 61338-1-3.
Dielectric resonators are distinguished from the other resonators such as quartz crystal,
ceramic or SAW resonators, because they are dealt in without metal case or connectors.
As the electrical properties of the TE and TEM mode resonators are dependent on their
01d
size of shielding conductors, the size of the test fixture and the insertion attenuation to be
tested should be determined in advance between the supplier and purchaser.
4.5.2 Transmission characteristics of TE and TEM mode band-pass type
01d
resonators
4.5.2.1 Measurement circuit
Figure 10 shows the transmission measurement set-up with a network analyzer. The RF
signal is fed from port 1 to port 2 through the resonator test fixture. All of these connections
have to be made with RF coaxial cables, whose nominal impedance should be exactly equal
to the system impedance.
NOTE A vector impedance meter or other resonator test equipment can be used instead of the network analyzer.
Connector
Resonator
under test
Port 1
Port 2
test cable
test cable
Port 2
Port 1
Network
Analyzer
IEC  1436/04
61338-1Ó IEC:2004 – 25 –
Figure 10 – Transmission measurement
4.5.2.2 Test fixture
Test fixtures A and B in Figure 11 are used for the transmission measurement of TE and
01d
TEM mode resonators, respectively. The distance between a dielectric resonator and
coupling loop antenna, or coupling mono-pole antenna for TEM mode, at the top of semi-
rigid cable is adjusted so that the minimum insertion attenuation should be around 30 dB to
decrease the coupling loss.
For the TE mode resonator, the size of test fixtures, i.e. shielding conductors, should be
01d
determined in advance between supplier and purchaser. The material of test fixtures should
be chosen from a high conductivity metal such as copper or silver as the unloaded quality
factor is dependent on the conductivity.
4.5.2.3 Measurement method
Connect port 1 and port 2 directly by a coaxial cable and determine the reference level by
calibration procedure of the network analyzer. Insert the test fixture with resonator. The
attenuation relative to the reference level is the insertion attenuation.
4.5.2.4 Resonator electrical characteristics
An example of insertion attenuation is shown in Figure 12. The minimum insertion
attenuation is the minimum value of the insertion attenuation in the vicinity of the nominal
frequency.
The centre frequency f is the arithmetic mean of the two frequencies at which the
c
attenuation relative to the minimum insertion attenuation reaches a specified value (e.g.
3 dB). The centre frequency is substituted for resonance frequency f .
The loaded quality factor Q is calculated by the following equation:
L
f
Q =
L
Df
whereDf is the difference between the two frequencies at which the attenuation relative to
the minimum insertion attenuation reaches 3 dB.
The unloaded quality factor Q is calculated by the following equation:
u
Q
L
Q =
u
-()IA / 20
min
1- 10
where IA (
...