IEC 60679-1:2017
(Main)Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
IEC 60679-1:2017 specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability approval or qualification approval procedures.
NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration.
This edition includes the following significant technical changes with respect to the previous edition:
a) the title has been changed;
b) additional matters related to oscillator using SAW or MEMS resonator in "Terms, definitions and general information" have been included;
c) measurement methods of IEC 60679-1:2007 have been removed (they will be moved to IEC 62884 series);
d) the content of Annex A has been extended;
e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been added;
f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added;
g) Annex D has been added.
Oscillateurs piézoélectriques, diélectriques et électrostatiques sous assurance de la qualité - Partie 1: Spécification générique
L’IEC 60679-1:2017 spécifie les exigences générales relatives aux oscillateurs piézoélectriques, diélectriques et électrostatiques, y compris les oscillateurs à résonateur diélectrique (DRO - Dielectric Resonator Oscillators) et les oscillateurs à résonateurs à ondes acoustiques de volume à couches (FBAR) (ci-après dénommés "Oscillateur"), sous assurance qualité par les procédures d’agrément de savoir-faire ou les procédures d’homologation.
NOTE Les oscillateurs DRO et FBAR sont à l’étude.
Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a) le titre a été modifié;
b) des éléments supplémentaires relatifs aux oscillateurs utilisant un résonateur OAS ou MEMS ont été ajoutés dans "Termes, définitions et informations générales";
c) les méthodes de mesure de l’IEC 60679-1:2007 ont été supprimées (elles seront intégrées à la série IEC 62884);
d) le contenu de l’Annexe A a été enrichi;
e) un nouveau terme et sa définition, “DIXO” (digital interfaced crystal oscillator - oscillateur à quartz à interface numérique), ont été ajoutés;
f) un nouveau terme et sa définition, “SSXO” (spread spectrum crystal oscillator - oscillateur à quartz à spectre étalé), ont été ajoutés;
g) l’Annexe D a été ajoutée.
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IEC 60679-1 ®
Edition 4.0 2017-07
INTERNATIONAL
STANDARD
Piezoelectric, dielectric and electrostatic oscillators of assessed quality –
Part 1: Generic specification
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
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IEC 60679-1 ®
Edition 4.0 2017-07
INTERNATIONAL
STANDARD
Piezoelectric, dielectric and electrostatic oscillators of assessed quality –
Part 1: Generic specification
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.140 ISBN 978-2-8322-4608-5
– 2 – IEC 60679-1:2017 © IEC 2017
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms, definitions and general information . 7
3.1 General . 7
3.2 Terms and definitions . 7
3.3 Preferred values for ratings and characteristics . 21
3.3.1 General . 21
3.3.2 Climatic category (40/85/56) . 22
3.3.3 Bump severity . 22
3.3.4 Vibration severity . 22
3.3.5 Shock severity . 22
3.3.6 Leak rate . 22
3.4 Marking . 23
3.4.1 General . 23
3.4.2 Packaging. 23
4 Quality assessment procedures . 23
4.1 General . 23
4.2 Primary stage of manufacture . 23
4.3 Structurally similar components . 23
4.4 Subcontracting . 23
4.5 Incorporated components . 24
4.6 Manufacturer’s approval . 24
4.7 Approval procedures . 24
4.7.1 General . 24
4.7.2 Capability approval . 24
4.7.3 Qualification approval . 24
4.8 Procedures for capability approval . 25
4.8.1 General . 25
4.8.2 Eligibility for capability approval . 25
4.8.3 Application for capability approval . 25
4.8.4 Granting of capability approval . 25
4.8.5 Capability manual . 25
4.9 Procedures for qualification approval . 25
4.9.1 General . 25
4.9.2 Eligibility for qualification approval . 25
4.9.3 Application for qualification approval . 25
4.9.4 Granting of qualification approval . 25
4.9.5 Quality conformance inspection . 26
4.10 Test procedures . 26
4.11 Screening requirements . 26
4.12 Rework and repair work . 26
4.12.1 Rework . 26
4.12.2 Repair work . 26
4.13 Certified test records. 26
4.14 Validity of release . 26
4.15 Release for delivery . 26
4.16 Unchecked parameters . 27
Annex A (normative) Load circuit for logic drive . 28
A.1 TTL and Schottky . 28
A.2 CMOS . 30
A.3 ECL . 30
A.4 LVDS . 31
Annex B (normative) Latch-up test . 32
B.1 Definition . 32
B.1.1 Latch-up . 32
B.1.2 Test procedure . 32
B.2 Test method . 32
Annex C (normative) Electrostatic discharge sensitivity classification . 33
C.1 Definition . 33
C.1.1 Electrostatic discharge (ESD) . 33
C.1.2 Test procedure . 33
C.2 Test methods . 33
C.2.1 General . 33
C.2.2 Leaded oscillator . 33
C.2.3 SMD oscillator . 33
C.2.4 The impact of ESD on Oscillator in steady-state . 33
Annex D (normative) Digital interfaced crystal oscillator’s function . 34
Bibliography . 35
Figure 1 – Basic configurations of SAW resonators . 9
Figure 2 – Example of the use of frequency offset. 11
Figure 3 – Linearity of frequency modulation deviation . 16
Figure 4 – Characteristics of an output waveform . 18
Figure 5 – Definition of start-up time . 19
Figure 6 – Clock signal with period jitter. 19
Figure 7 – Phase jitter measures . 20
Figure 8 – Gaussian distribution of jitter . 20
Figure 9 – Jitter amplitude and period of jitter frequency . 20
Figure 10 – Jitter tolerance according to ITU-T G.825, ATIS-0900101, Telcordia GR-
253 and ETSI EN 300 462 . 21
Figure A.1 – Circuit for TTL . 28
Figure A.2 – Circuit for Schottky logic . 29
Figure A.3 – Circuit for PECL . 30
Figure A.4 – Circuit for LVDS . 31
Table A.1 – Values to be used when calculating R and R . 30
1 2
Table A.2 – Operating condition . 31
Table A.3 – DC Electrical characteristics output load = 50 Ω to Vcc-2V . 31
Table D.1 – Function of the digital interface . 34
– 4 – IEC 60679-1:2017 © IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC
OSCILLATORS OF ASSESSED QUALITY –
Part 1: Generic specification
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The
...
IEC 60679-1 ®
Edition 4.0 2017-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Piezoelectric, dielectric and electrostatic oscillators of assessed quality –
Part 1: Generic specification
Oscillateurs piézoélectriques, diélectriques et électrostatiques sous assurance
de la qualité –
Partie 1: Spécification générique
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.
Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
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les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.
IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary
(IEV) online.
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IEC publications issued since 2002. Some entries have been
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IEC 60679-1 ®
Edition 4.0 2017-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Piezoelectric, dielectric and electrostatic oscillators of assessed quality –
Part 1: Generic specification
Oscillateurs piézoélectriques, diélectriques et électrostatiques sous assurance
de la qualité –
Partie 1: Spécification générique
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-7178-0
– 2 – IEC 60679-1:2017 © IEC 2017
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms, definitions and general information . 7
3.1 General . 7
3.2 Terms and definitions . 7
3.3 Preferred values for ratings and characteristics . 22
3.3.1 General . 22
3.3.2 Climatic category (40/85/56) . 22
3.3.3 Bump severity . 22
3.3.4 Vibration severity . 22
3.3.5 Shock severity . 23
3.3.6 Leak rate . 23
3.4 Marking . 23
3.4.1 General . 23
3.4.2 Packaging. 23
4 Quality assessment procedures . 23
4.1 General . 23
4.2 Primary stage of manufacture . 24
4.3 Structurally similar components . 24
4.4 Subcontracting . 24
4.5 Incorporated components . 24
4.6 Manufacturer’s approval . 24
4.7 Approval procedures . 24
4.7.1 General . 24
4.7.2 Capability approval . 24
4.7.3 Qualification approval . 25
4.8 Procedures for capability approval . 25
4.8.1 General . 25
4.8.2 Eligibility for capability approval . 25
4.8.3 Application for capability approval . 25
4.8.4 Granting of capability approval . 25
4.8.5 Capability manual . 25
4.9 Procedures for qualification approval . 26
4.9.1 General . 26
4.9.2 Eligibility for qualification approval . 26
4.9.3 Application for qualification approval . 26
4.9.4 Granting of qualification approval . 26
4.9.5 Quality conformance inspection . 26
4.10 Test procedures . 26
4.11 Screening requirements . 26
4.12 Rework and repair work . 26
4.12.1 Rework . 26
4.12.2 Repair work . 26
4.13 Certified test records. 27
4.14 Validity of release . 27
4.15 Release for delivery . 27
4.16 Unchecked parameters . 27
Annex A (normative) Load circuit for logic drive . 28
A.1 TTL and Schottky . 28
A.2 CMOS . 30
A.3 ECL . 30
A.4 LVDS . 31
Annex B (normative) Latch-up test . 32
B.1 Definition . 32
B.1.1 Latch-up . 32
B.1.2 Test procedure . 32
B.2 Test method . 32
Annex C (normative) Electrostatic discharge sensitivity classification . 33
C.1 Definition . 33
C.1.1 Electrostatic discharge (ESD) . 33
C.1.2 Test procedure . 33
C.2 Test methods . 33
C.2.1 General . 33
C.2.2 Leaded oscillator . 33
C.2.3 SMD oscillator . 33
C.2.4 The impact of ESD on Oscillator in steady-state . 33
Annex D (normative) Digital interfaced crystal oscillator’s function . 34
Bibliography . 35
Figure 1 – Basic configurations of SAW resonators . 9
Figure 2 – Example of the use of frequency offset.
...
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