IEC 62529:2024

IEC 62529 ®
Edition 3.0 2024-06
™
IEEE Std 1641
INTERNATIONAL
STANDARD
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Standard for Signal and Test Definition

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IEC 62529 ®
Edition 3.0 2024-06
IEEE Std 1641™
INTERNATIONAL
STANDARD
colour
inside
Standard for Signal and Test Definition

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 25.040.01; 35.060 ISBN 978-2-8322-8703-3

IEEE Std 1641™-2022
Contents
1. Overview . 12
1.1 Scope . 12
1.2 Purpose . 12
1.3 Word Usage . 12
1.4 Application . 13
1.5 Annexes . 13
2. Definitions, abbreviations, and acronyms . 13
2.1 Definitions . 13
2.2 Abbreviations and acronyms . 15
3. Structure of this standard . 16
3.1 Layers . 16
3.2 Signal Modeling Language (SML) layer . 17
3.3 BSC layer . 17
3.4 TSF layer . 18
3.5 Test requirement layer . 18
3.6 Using the layers . 18
4. Signals and SignalFunctions . 18
4.1 Introduction . 18
4.2 Physical signal states . 19
4.3 Event states . 20
4.4 Digital stream states . 21
5. SML layer . 22
6. BSC layer . 23
6.1 BSC layer base classes. 23
6.2 General description of BSCs . 23
6.3 SignalFunction template . 24
7. TSF layer . 25
7.1 TSF classes . 25
7.2 TSF signals defined by a model . 26
7.3 TSF signals defined by an external reference . 28
8. Test procedure language (TPL) . 28
8.1 Goals of the TPL . 28
8.2 Elements of the TPL . 29
8.3 Use of the TPL . 29
9. Maximizing test platform independence . 29
Annex A (normative) Signal modeling language (SML) . 30
A.1 Use of the SML . 30
A.2 Introduction . 30
A.3 Physical types . 31
A.4 Signal definitions . 34
A.5 Pure signals . 36
A.6 Pure signal-combining mechanisms . 38
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IEEE Std 1641™-2022
A.7 Pure function transformations . 44
A.8 Measure, limiting, and sampling signals . 44
A.9 Digital signals . 46
A.10 Basic component SML. 50
A.11 Fast Fourier analysis support . 76
Annex B (normative) Basic signal components (BSC) layer . 78
B.1 BSC layer base classes . 78
B.2 BSC subclasses . 78
B.3 Description of a BSC . 83
B.4 Physical class . 91
B.5 PulseDefns class .103
B.6 SignalFunction class .104
Annex C (normative) Dynamic signal descriptions .163
C.1 Introduction .163
C.2 Basic classes .164
C.3 Dynamic signal goals and use cases .172
Annex D (normative) Interface definition language (IDL) basic components .174
D.1 Introduction .174
D.2 IDL BSC library .174
Annex E (informative) Test signal framework (TSF) for C/ATLAS .175
E.1 Introduction .175
E.2 TSF library definition in extensible markup language (XML) .175
E.3 Interface definition language (IDL) for the TSF for C/ATLAS .175
E.4 AC_SIGNAL .176
E.5 AM_SIGNAL .178
E.6 DC_SIGNAL .180
E.7 DIGITAL_PARALLEL .182
E.8 DIGITAL_SERIAL .184
E.9 DIGITAL_TEST .186
E.10 DME_INTERROGATION .189
E.11 DME_RESPONSE .192
E.12 FM_SIGNAL .195
E.13 ILS_GLIDE_SLOPE .198
E.14 ILS_LOCALIZER .201
E.15 ILS_MARKER .204
E.16 PM_SIGNAL .207
E.17 PULSED_AC_SIGNAL .209
E.18 PULSED_AC_TRAIN .211
E.19 PULSED_DC_SIGNAL .213
E.20 PULSED_DC_TRAIN .216
E.21 RADAR_RX_SIGNAL .218
E.22 RADAR_TX_SIGNAL .220
E.23 RAMP_SIGNAL .222
E.24 RANDOM_NOISE .224
E.25 RESOLVER .226
E.26 RS_232 .229
E.27 SQUARE_WAVE .230
E.28 SSR_INTERROGATION .232
E.29 SSR_RESPONSE .235
E.30 STEP_SIGNAL .239
E.31 SUP_CAR_SIGNAL .241
E.32 SYNCHRO .243
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IEEE Std 1641™-2022
E.33 TACAN .247
E.34 TRIANGULAR_WAVE_SIGNAL .251
E.35 VOR .253
Annex F (informative) Test signal framework (TSF) library for digital pulse classes .257
F.1 Introduction .257
F.2 TSF library definition in extensible markup language (XML) .257
F.3 Graphical models of TSFs .257
F.4 Pulse class family of TSFs .257
F.5 DTIF .274
Annex G (normative) Carrier language requirements .276
G.1 Carrier language requirements .276
G.2 Interface definition language (IDL) .276
G.3 Datatypes .276
Annex H (normative) Test procedure language (TPL) .282
H.1 TPL layer .282
H.2 Elements of the TPL .282
H.3 Structure of test requirements .282
H.4 Carrier language .282
H.5 Signal statements .282
H.6 Mapping of test statements to carrier language .284
H.7 Test statement definitions .285
H.8 Elements used in test statement definitions .303
H.9 Attributes with multiple properties .306
H.10 Transferring data in digital signals .310
H.11 Creating test requirements .314
H.12 Delimiting TPL statements .316
Annex I (normative) Extensible markup language (XML) signal descriptions .318
I.1 Introduction .318
I.2 XSD for BSCs .319
I.3 XSD for TSFs .325
Annex J (informative) Support for ATLAS nouns and modifiers .333
J.1 Signal and test definition (STD) support for ATLAS signals .333
J.2 STD support for ATLAS nouns .333
J.3 STD support for C/ATLAS noun modifiers .336
J.4 Support for C/ATLAS extensions .344
Annex K (informative) Guide for maximizing test platform independence .345
K.1 Introduction .345
K.2 Guiding principles .345
K.3 Best practice rules .345
Annex L (informative) IEEE download web-site material associated with this document .349
Annex M (informative) Bibliography .350
Annex N (informative) Participants . .352
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– i – IEEE Std 1641™-2022
Standard for Signal and Test Definition
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IEEE Std 1641™-2022 – ii –
The text of this International Standard is based on the following documents:
IEEE Std FDIS Report on voting
1641 (2022) 91/1933/FDIS 91/1945/RVD
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– iii – IEEE Std 1641™-2022
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IEEE Std 1641™-2022 – iv –
IEEE Std 1641™-2022
(Revision of IEEE Std 1641-2010)
IEEE Standard for Signal and Test
Definition
Developed by the
Test and Diagnosis for Electronic Systems Standards Committee (SCC20)
on
IEEE Standards and Standards Innovations (S&SI)
Strategic Management and Delivery Committee (SMDC)
Approved 21 September 2022
IEEE SA Standards Board
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– v – IEEE Std 1641™-2022
Abstract: The means to define and describe signals used in testing ae provided in this standard.
It also provides a set of common basic signals, built upon formal mathematical specifications so
that signals can be combined to form complex signals usable across all test platforms.
Keywords: ATE, ATLAS, automatic test equipment, IEEE 1641™, signal definitions, test
definitions, test requirements, test signals, unit under test, UUT
•
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IEEE Std 1641™-2022 – vi –
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– vii – IEEE Std 1641™-2022
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IEEE Std 1641™-2022 – viii –
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– ix – IEEE Std 1641™-2022
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