IEC 62529:2012

IEC 62529
Edition 2.0 2012-06
™
IEEE Std 1641
INTERNATIONAL
STANDARD
colour
inside
Standard for Signal and Test Definition

All rights reserved. IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by the Institute of
Electrical and Electronics Engineers, Inc.

Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means,

electronic or mechanical, including photocopying and microfilm, without permission in writing from the IEC Central
Office.
Any questions about IEEE copyright should be addressed to the IEEE. Enquiries about obtaining additional rights to
this publication and other information requests should be addressed to the IEC or your local IEC member National
Committee.
IEC Central Office Institute of Electrical and Electronics Engineers, Inc.
3, rue de Varembé 3 Park Avenue
CH-1211 Geneva 20 New York, NY 10016-5997
Switzerland United States of America
Tel.: +41 22 919 02 11 stds.info@ieee.org
Fax: +41 22 919 03 00 www.ieee.org
info@iec.ch
www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

Useful links:
IEC publications search - www.iec.ch/searchpub Electropedia - www.electropedia.org
The advanced search enables you to find IEC publications The world's leading online dictionary of electronic and
by a variety of criteria (reference number, text, technical electrical terms containing more than 30 000 terms and
committee,…). definitions in English and French, with equivalent terms in
It also gives information on projects, replaced and additional languages. Also known as the International
withdrawn publications. Electrotechnical Vocabulary (IEV) on-line.

IEC Just Published - webstore.iec.ch/justpublished Customer Service Centre - webstore.iec.ch/csc
Stay up to date on all new IEC publications. Just Published If you wish to give us your feedback on this publication
details all new publications released. Available on-line and or need further assistance, please contact the
also once a month by email. Customer Service Centre: csc@iec.ch.

IEC 62529
Edition 2.0 2012-06
IEEE Std 1641™
INTERNATIONAL
STANDARD
colour
inside
Standard for Signal and Test Definition

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XH
ICS 25.040; 35.060 ISBN 978-2-83220-103-9

– ii – IEEE Std 1641-2010
Contents
1. Overview . 1
1.1 Scope . 1
1.2 Purpose . 1
1.3 Application . 1
1.4 Annexes . 2
2. Definitions, abbreviations, and acronyms. 2
2.1 Definitions . 2
2.2 Abbreviations and acronyms . 4
3. Structure of this standard . 5
3.1 Layers . 5
3.2 Signal Modeling Language (SML) layer . 6
3.3 BSC layer . 6
3.4 TSF layer . 6
3.5 Test requirement layer . 6
3.6 Using the layers . 7
4. Signals and SignalFunctions . 7
4.1 Introduction . 7
4.2 Physical signal states . 8
4.3 Event states . 9
4.4 Digital stream states . 9
5. SML layer . 10
6. BSC layer . 11
6.1 BSC layer base classes . 11
6.2 General description of BSCs. 11
6.3 SignalFunction template . 12
7. TSF layer . 12
7.1 TSF classes . 13
7.2 TSF signals defined by a model . 13
7.3 TSF signals defined by an external reference . 16
8. Test procedure language (TPL) . 16
8.1 Goals of the TPL . 16
8.2 Elements of the TPL . 16
8.3 Use of the TPL . 17
9. Maximizing test platform independence. 17
Annex A (normative) Signal modeling language (SML) . 18
A.1 Use of the SML . 18
A.2 Introduction. 18
A.3 Physical types . 19
A.4 Signal definitions . 22
A.5 Pure signals . 24
A.6 Pure signal-combining mechanisms. 26
A.7 Pure function transformations . 32
Published by IEC under license from IEEE. © 2010 IEEE. All rights reserved.

IEEE Std 1641-2010 – iii –
A.8 Measuring, limiting, and sampling signals . 32
A.9 Digital signals . 34
A.10 Basic component SML . 38
A.11 Fast Fourier analysis support . 63
Annex B (normative) Basic signal components (BSC) layer . 65
B.1 BSC layer base classes . 65
B.2 BSC subclasses . 65
B.3 Description of a BSC . 69
B.4 Physical class . 76
B.5 PulseDefns class . 87
B.6 SignalFunction class . 89
Annex C (normative) Dynamic signal descriptions . 143
C.1 Introduction . 143
C.2 Basic classes . 144
C.3 Dynamic signal goals and use cases . 152
Annex D (normative) Interface definition language (IDL) basic components . 153
D.1 Introduction. 153
D.2 IDL BSC library . 153
Annex E (informative) Test signal framework (TSF) for C/ATLAS . 154
E.1 Introduction . 154
E.2 TSF library definition in extensible markup language (XML) . 154
E.3 Interface definition language (IDL) for the TSF for C/ATLAS . 154
E.4 AC_SIGNAL . 155
E.5 AM_SIGNAL . 157
E.6 DC_SIGNAL . 159
E.7 DIGITAL_PARALLEL . 161
E.8 DIGITAL_SERIAL . 163
E.9 DIGITAL_TEST . 165
E.10 DME_INTERROGATION . 168
E.11 DME_RESPONSE . 171
E.12 FM_SIGNAL . 174
E.13 ILS_GLIDE_SLOPE . 177
E.14 ILS_LOCALIZER . 180
E.15 ILS_MARKER . 183
E.16 PM_SIGNAL . 186
E.17 PULSED_AC_SIGNAL .
...