IEC 61000-4-25:2001

IEC 61000-4-25 ®
Edition 1.2 2019-12
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Electromagnetic compatibility (EMC) –
Part 4-25: Testing and measurement techniques – HEMP immunity test methods
for equipment and systems
Compatibilité électromagnétique (CEM) –
Partie 4-25: Techniques d’essai et de mesure – Méthodes d’essai d’immunité à
l’IEMN-HA des appareils et des systèmes

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IEC 61000-4-25 ®
Edition 1.2 2019-12
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Electromagnetic compatibility (EMC) –

Part 4-25: Testing and measurement techniques – HEMP immunity test methods

for equipment and systems
Compatibilité électromagnétique (CEM) –

Partie 4-25: Techniques d’essai et de mesure – Méthodes d’essai d’immunité à

l’IEMN-HA des appareils et des systèmes

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.99 ISBN 978-2-8322-7734-8

IEC 61000-4-25 ®
Edition 1.2 2019-12
CONSOLIDATED VERSION
REDLINE VERSION
VERSION REDLINE
colour
inside
Electromagnetic compatibility (EMC) –
Part 4-25: Testing and measurement techniques – HEMP immunity test methods
for equipment and systems
Compatibilité électromagnétique (CEM) –
Partie 4-25: Techniques d’essai et de mesure – Méthodes d’essai d’immunité à
l’IEMN-HA des appareils et des systèmes

– 2 – IEC 61000-4-25:2001+AMD1:2012
+AMD2:2019 CSV  IEC 2019
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Definitions . 8
4 General . 12
5 Immunity tests and immunity test levels . 12
5.1 Introduction . 12
5.2 Immunity tests . 12
5.3 Immunity test levels . 12
5.4 Radiated disturbance tests . 12
5.4.1 Radiated immunity test levels . 12
5.4.2 Radiated immunity test specifications . 13
5.4.3 Small radiated test facilities . 14
5.4.4 Large HEMP simulators . 14
5.4.5 Frequency domain spectrum requirements . 16
5.5 Conducted disturbance tests . 16
5.5.1 Conducted immunity test levels . 16
5.5.2 Conducted immunity test specifications . 20
6 Test equipment . 21
6.1 Radiated field tests. 21
6.1.1 Radiated field generator . 21
6.1.2 Instrumentation. 21
6.2 Conducted disturbance tests . 22
6.2.1 Test generator . 22
6.2.2 Instrumentation. 23
7 Test set-up . 24
7.1 Radiated disturbance test . 24
7.2 Conducted disturbance test . 24
8 Test procedure . 25
8.1 Climatic conditions . 25
8.2 Immunity test level and test exposures . 25
8.3 Radiated disturbance test procedure . 26
8.3.1 Test parameter measurements . 26
8.3.2 Radiated test procedure . 26
8.4 Conducted disturbance immunity test procedure. 28
8.5 Test execution . 28
8.5.1 Execution of the radiated immunity test . 28
8.5.2 Execution of the conducted immunity test . 29
9 Test results and test reports . 29
Annex A (informative) Rationale for the immunity test levels . 30
Annex B (informative) Conducted immunity tests for antennas . 38
Annex C (informative) Conducted disturbance immunity tests . 40
Annex D (normative informative) Damped oscillatory wave test . 44

+AMD2:2019 CSV  IEC 2019
Figure 1 – Frequency domain spectral magnitude between 100 kHz and 300 MHz. . 14
Figure C.1 – Block diagram for EC10 and EC11 immunity tests . 41
Figure C.2 – Example of a simplified circuit diagram of a fast transient/burst generator . 41
Figure C.3 – Waveshape of an EC10 pulse into a 50 Ω load . 42
Figure C.4 – Example of an EC11 generator (see clause C.1 for details) . 42
Figure C.5 – Waveshape of an EC11 pulse into a 50 Ω load . 43
Figure C.6 – Simplified block diagram for LC immunity test levels . 43
Figure C.7 – Waveshape of the LC slow pulse . 43

Table 1 – Radiated immunity test levels defined in the present standard . 13
Table 2 – Early time conducted immunity test levels . 18
Table 3 – Intermediate time HEMP conducted immunity test levels . 19
Table 4 – Conducted environment immunity test levels for late-time HEMP . 20
Table 5 – Late time HEMP conducted environment effects tests for low-voltage a.c.
power ports . 20
Table 6 – Conducted HEMP immunity test specifications . 21
Table A.1 – Radiated immunity test levels . 31
Table A.2 – Conducted common-mode early time HEMP environments . 32
Table A.3 – Early time HEMP conducted environments on LV circuits (low-voltage
circuits up to 1 000 V) . 33
Table A.4 – Conducted environments for early time HEMP . 34
Table A.5 – Early time HEMP conducted environments immunity test levels for LV
circuits (low-voltage circuits up to 1000 V) . 35
Table A.6 – Example early time HEMP immunity test levels for various applications. . 36
Table D.1 – ISO 7137 test procedure
...

IEC 61000-4-25 ®
Edition 1.1 2012-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Electromagnetic compatibility (EMC)
Part 4-25: Testing and measurement techniques – HEMP immunity test methods
for equipment and systems
Compatibilité électromagnétique (CEM)
Partie 4-25: Techniques d’essai et de mesure – Méthodes d’essai d’immunité à
l’IEMN-HA des appareils et des systèmes

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite ni
utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie et les
microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé Fax: +41 22 919 03 00
CH-1211 Geneva 20 info@iec.ch
Switzerland www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

Useful links:
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The advanced search enables you to find IEC publications The world's leading online dictionary of electronic and
by a variety of criteria (reference number, text, technical electrical terms containing more than 30 000 terms and
committee,…). definitions in English and French, with equivalent terms in
It also gives information on projects, replaced and additional languages. Also known as the International
withdrawn publications. Electrotechnical Vocabulary (IEV) on-line.

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also once a month by email. Customer Service Centre: csc@iec.ch.

A propos de la CEI
La Commission Electrotechnique Internationale (CEI) est la première organisation mondiale qui élabore et publie des
Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

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référence, texte, comité d’études,…). termes et définitions en anglais et en français, ainsi que
Elle donne aussi des informations sur les projets et les les termes équivalents dans les langues additionnelles.
publications remplacées ou retirées. Egalement appelé Vocabulaire Electrotechnique
International (VEI) en ligne.
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contactez-nous: csc@iec.ch.
IEC 61000-4-25 ®
Edition 1.1 2012-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Electromagnetic compatibility (EMC)

Part 4-25: Testing and measurement techniques – HEMP immunity test methods

for equipment and systems
Compatibilité électromagnétique (CEM)

Partie 4-25: Techniques d’essai et de mesure – Méthodes d’essai d’immunité à

l’IEMN-HA des appareils et des systèmes

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX CN
ICS 33.100.99 ISBN 978-2-88912-055-0

– 2 – 61000-4-25  IEC:2001+A1:2012
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references. 7
3 Definitions . 8
4 General . 11
5 Immunity tests and immunity test levels . 12
5.1 Introduction . 12
5.2 Immunity tests . 12
5.3 Immunity test levels . 12
5.4 Radiated disturbance tests . 12
5.4.1 Radiated immunity test levels . 12
5.4.2 Radiated immunity test specifications . 13
5.4.3 Small radiated test facilities . 14
5.4.4 Large HEMP simulators . 14
5.4.5 Frequency domain spectrum requirements . 16
5.5 Conducted disturbance tests . 16
5.5.1 Conducted immunity test levels . 16
5.5.2 Conducted immunity test specifications . 19
6 Test equipment . 20
6.1 Radiated field tests . 20
6.1.1 Radiated field generator . 20
6.1.2 Instrumentation . 20
6.2 Conducted disturbance tests . 21
6.2.1 Test generator . 21
6.2.2 Instrumentation . 23
7 Test set-up . 23
7.1 Radiated disturbance test . 23
7.2 Conducted disturbance test . 23
8 Test procedure . 24
8.1 Climatic conditions. 24
8.2 Immunity test level and test exposures . 25
8.3 Radiated disturbance test procedure . 25
8.3.1 Test parameter measurements . 25
8.3.2 Radiated test procedure . 25
8.4 Conducted disturbance immunity test procedure . 27
8.5 Test execution . 27
8.5.1 Execution of the radiated immunity test . 27
8.5.2 Execution of the conducted immunity test . 28
9 Test results and test reports . 28

61000-4-25  IEC:2001+A1:2012 – 3 –
Annex A (informative) Rationale for the immunity test levels . 29
Annex B (informative) Conducted immunity tests for antennas . 38
Annex C (informative) Conducted disturbance immunity tests . 40
Annex D (normative informative) Damped oscillatory wave test . 44

Figure 1 – Frequency domain spectral magnitude between 100 kHz and 300 MHz. 14
Figure C.1 – Block diagram for EC10 and EC11 immunity tests . 41
Figure C.2 – Example of a simplified circuit diagram of a fast transient/burst generator . 41
Figure C.3 – Waveshape of an EC10 pulse into a 50 Ω load . 42
Figure C.4 – Example of an EC11 generator (see clause C.1 for details) . 42
Figure C.5 – Waveshape of an EC11 pulse into a 50 Ω load . 43
Figure C.6 – Simplified block diagram for LC immunity test levels . 43
Figure C.7 – Waveshape of the LC slow pulse . 43

Table 1 – Radiated immunity test levels defined in the present standard . 13
Table 2 – Early time conducted immunity test levels . 17
Table 3 – Intermediate time HEMP conducted immunity test levels . 18
Table 4 – Conducted environment immunity test levels for late-time HEMP . 19
Table 5 – Late time HEMP conducted environment effects tests for low-voltage a.c.
power ports . 19
Table 6 – Conducted HEMP immunity test specifications . 20
Table A.1 – Radiated immunity test levels . 30
Table A.2 – Conducted common-mode early time HEMP environments . 31
Table A.3 – Early time HEMP conducted environments on LV circuits
(low-voltage circuits up to 1 000 V) . 32
Table A.4 – Conducted environments for early time HEMP . 33
Table A.5 – Early time HEMP conducted environments immunity test levels for LV
circuits (low-voltage circuits up to 1000 V) . 34
Table A.6 – Example early time HEMP immunity test levels for various applications. . 35
Table D.1 – ISO 7137 test procedure reference number 3.8 . 44
Table D.2 – VG current injection test . 45
Table D3 – MIL-STD-461-E . 45

– 4 – 61000-4-25  IEC:2001+A1:2012
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-25: Testing and measurement techniques –
HEMP immunity test methods for equipment and systems

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specificati
...