IEC 60679-1:1997/AMD1:2002
(Amendment)Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Amendement 1 - Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 1: Spécification générique
General Information
- Status
- Published
- Publication Date
- 14-Jan-2002
- Technical Committee
- TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
- Drafting Committee
- WG 7 - TC 49/WG 7
- Current Stage
- DELPUB - Deleted Publication
- Start Date
- 11-Apr-2007
- Completion Date
- 26-Oct-2025
Relations
- Effective Date
- 05-Sep-2023
- Effective Date
- 05-Sep-2023
Overview
IEC 60679-1:1997/AMD1:2002 is an important international amendment to the generic specification for quartz crystal controlled oscillators of assessed quality. Developed by the IEC Technical Committee 49, which specializes in piezoelectric and dielectric devices for frequency control, this amendment enhances the original 1997 standard by incorporating critical updates on testing and classification protocols. The amendment focuses on reliability, immunity, and performance characterization of quartz oscillators, especially those constructed with CMOS integrated circuits.
This update introduces integral annexes on load circuits for logic drives, latch-up testing, and electrostatic discharge (ESD) sensitivity classification, emphasizing stringent quality assurance and robust device performance in demanding electronic systems.
Key Topics
Quartz Crystal Controlled Oscillators
Focus on devices that use quartz crystals for frequency control, widely used in precision timing and frequency applications.Latch-up Test (Annex B)
Defines a destructive static test to detect latch-up susceptibility in CMOS-based quartz oscillators.- Ensures immunity against low-impedance conductive paths caused by overvoltage conditions.
- Test conforms to IEC 60748-2 standards and is used for device characterization, not production testing.
Electrostatic Discharge Sensitivity Classification (Annex C)
Establishes methods to classify oscillators by their susceptibility or immunity to electrostatic discharge damage.- Applies Human Body Model (HBM) testing for leaded devices (IEC/PAS 62179), and Machine Model (MM) testing for surface-mount devices (IEC/PAS 62180).
- Recommended maximum test voltage is 2000 V, adjustable by manufacturer-user agreement.
- Important for specifying packaging, handling, and reliability in real-world operating environments.
Load Circuit for Logic Drive (Annex A)
Describes optimized load circuits for quartz oscillators interfacing with digital logic circuits to enhance signal integrity.
Applications
Quartz crystal controlled oscillators compliant with IEC 60679-1:1997/AMD1:2002 ensure high-quality frequency stability and operational robustness necessary for:
Telecommunications Systems
Critical timing and synchronization in cellular networks, satellites, and internet infrastructure.Consumer Electronics
Reliable frequency references for devices such as smartphones, computers, and gaming consoles.Industrial Automation
Precise frequency timing in automation controllers, robotics, and measurement instruments.Medical Devices
Stable timing oscillators for diagnostic and monitoring equipment requiring tested ESD immunity.Aerospace and Defense
High-reliability oscillators that withstand harsh environments with stringent testing protocols to prevent latch-up and ESD failures.
Related Standards
Users and manufacturers working with IEC 60679-1:1997/AMD1:2002 should also consider these complementary standards for comprehensive device qualification:
IEC 60748-2:1997
Semiconductor Devices - Digital Integrated Circuits - Pertinent for latch-up test procedures involving CMOS ICs.IEC/PAS 62179
Electrostatic Discharge (ESD) Sensitivity Testing - Human Body Model (HBM) - Basis for testing leaded quartz oscillators.IEC/PAS 62180
Electrostatic Discharge (ESD) Sensitivity Testing - Machine Model (MM) - Applies to surface-mount device ESD testing.
These related standards provide essential test methods for validating the robustness of quartz oscillators under ESD and latch-up stress, ensuring reliable performance across diverse electronic applications.
Keywords: Quartz crystal oscillators, IEC 60679-1 amendment, latch-up test, electrostatic discharge classification, CMOS integrated circuits, frequency control, oscillator reliability, ESD sensitivity, piezoelectric devices, electronic component standards.
Frequently Asked Questions
IEC 60679-1:1997/AMD1:2002 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification". This standard covers: Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
IEC 60679-1:1997/AMD1:2002 is classified under the following ICS (International Classification for Standards) categories: 31.140 - Piezoelectric devices. The ICS classification helps identify the subject area and facilitates finding related standards.
IEC 60679-1:1997/AMD1:2002 has the following relationships with other standards: It is inter standard links to IEC 60679-1:1997, IEC 60679-1:2007. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
You can purchase IEC 60679-1:1997/AMD1:2002 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of IEC standards.
Standards Content (Sample)
NORME CEI
INTERNATIONALE IEC
60679-1
INTERNATIONAL
STANDARD
AMENDEMENT 1
AMENDMENT 1
2002-01
Amendement 1
Oscillateurs pilotés par quartz
sous assurance de la qualité –
Partie 1:
Spécification générique
Amendment 1
Quartz crystal controlled oscillators
of assessed quality –
Part 1:
Generic specification
IEC 2002 Droits de reproduction réservés Copyright - all rights reserved
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http://www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
E
PRICE CODE
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue
– 2 – 60679-1 Amend. 1 © CEI:2002
AVANT-PROPOS
Le présent amendement a été établi par le comité d'études 49 de la CEI: Dispositifs piézo-
électriques et diélectriques pour la commande et le choix de la fréquence.
Le texte de cet amendement est issu des documents suivants:
FDIS Rapport de vote
49/523/FDIS 49/531/RVD
Le rapport de vote indiqué dans le tableau ci-dessus donne toute information sur le vote ayant
abouti à l'approbation de cet amendement.
___________
Page 6
SOMMAIRE
Remplacer les titres des annexes par ce qui suit:
Annexe A Circuit de charge pour circuits logiques
Annexe B Essai de verrouillage
Annexe C Classification selon la sensibilité à la décharge électrostatique
Bibliographie
Page 8
AVANT-PROPOS
Remplacer, à la page 10, la phrase «L’annexe A fait partie intégrante de cette norme» par ce
qui suit :
Les annexes A, B et C font partie intégrante de cette norme.
Supprimer, à la page 10, la phrase «L’annexe B est donné uniquement à titre d’information».
Page 12
1.2 Références normatives
Insérer, à la page 14, les nouvelles normes suivantes:
CEI 60748-2:1997, Dispositifs à semiconducteurs – Circuits intégrés – Partie 2: Circuits
intégrés numériques
IEC/PAS 62179, Electrostatic discharge (ESD) sensitivity testing human body model (HBM)
(en anglais seulement)
IEC/PAS 62180, Electrostatic discharge (ESD) sensitivity testing machine model (MM) (en
anglais seulement)
Page 156
Insérer, après l’annexe A, les nouvelles annexes B et C.
60679-1 Amend.1 IEC:2002 – 3 –
FOREWORD
This amendment has been prepared by IEC technical committee 49: Piezoelectric and
dielectric devices for frequency control and selection.
The text of this amendment is based on the following documents:
FDIS Report on voting
49/523/FDIS 49/531/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
___________
Page 7
CONTENTS
Replace the titles of the annexes by the following:
Annex A Load circuit for logic drive
Annex B Latch-up test
Annex C Electrostatic discharge sensitivity classification
Bibliography
Page 9
FOREWORD
Replace, on page 11, the sentence ‘Annex A forms an integral part of this standard’ by the
following:
Annexes A, B and C form an integral part of this standard.
Delete, on page 11, the sentence ‘Annex B is for information only’.
Page 13
1.2 Normative references
Insert, on page 15, the following new standards:
IEC 60748-2:1997, Semiconductor devices – Integrated circuits – Part 2: Digital integrated
circuits
IEC/PAS 62179, Electrostatic discharge (ESD) sensitivity testing human body model (HBM)
IEC/PAS 62180, Electrostatic discharge (ESD) sensitivity testing machine model (MM)
Page 157
Insert, after annex A, the new annexes B and C.
– 4 – 60679-1 Amend. 1 © CEI:2002
Annexe B
(normative)
Essai de verrouillage
B.1 Définition
B.1.1 Verrouillage
Etat caractérisé par un chemin conducteur de faible impédance qui résulte (et persiste après)
d’une surtension à l’entrée, à la sortie ou à la source d’alimentation.
B.1.2 Procédure d’essai
L’essai de verrouillage dans les conditions statiques soumet le dispositif à des tensions
supérieures à celles qu’il rencontrerait dans les conditions normales de fonctionnement, et il
est même plus sévère que les méthodes d’essai dynamiques utilisant des niveaux de courant
et de tension similaires.
Cet essai, s’il est effectué conformément aux procédés définis dans cette norme, est une
méthode nécessaire et suffisante pour la caractérisation de la susceptibilité de verrouillage ou
de l’immunité des oscillateurs pilotés par quartz réalisés avec des circuits intégrés CMOS.
B.2 Méthode d’essai
B.2.1 Cet essai est destructif.
B.2.2 Cet essai est applicable seulement aux oscillateurs pilotés par quartz réalisés avec
des circuits intégrés CMOS.
B.2.3 Cet essai doit être effectué conformément à la CEI 60748-2.
B.2.4 Cet essai est une méthode recommandée. Il n’est pas une spécification. Les limites
d’essai ne sont pas données.
B.2.5 Cet essai est effectué uniquement dans un but de caractérisation et de contrôle. Il
n’est pas un essai de production en série.
60679-1 Amend.1 IEC:2002 – 5 –
Annex B
(normative)
Latch-up test
B.1 Definition
B.1.1 Latch-up
A state in which a low-impedance path results from (and persists following)
...
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